Abstract

Quality control of micro–nano structured and freeform surfaces is becoming increasingly important, which leads to challenging requirements in the measurement and characterization of rough and highly reflective surfaces. As an important measurement technique, white light scanning interferometry (WLSI) is a fast noncontact method to measure three-dimensional (3D) surface profiles. Nevertheless, the existing WLSI 3D surface reconstruction algorithms are prone to environmental vibrations and phase changes caused by reflections on the tested surface. A novel peak detecting algorithm that combines the white light phase-shifting interferometry (WLPSI) method and fast Fourier transform (FFT) coherence-peak-sensing technique is proposed in this paper, which can accurately determine the local fringe peak and improve the vertical resolution of the measurement. A microcomponent (10 μm standard step height) and a spherical surface were used as test specimens to evaluate the proposed method. Both simulated and experimental results show that the proposed algorithm improves the precision and anti-interference ability of the WLPSI and FFT methods, which can effectively reduce the batwing effects at the edges and solve the problem of positioning error in the maximum modulation.

© 2017 Optical Society of America

Full Article  |  PDF Article
OSA Recommended Articles
High-precision shape measurement by white-light interferometry with real-time scanner error correction

Joanna Schmit and Artur Olszak
Appl. Opt. 41(28) 5943-5950 (2002)

Fringe modulation skewing effect in white-light vertical scanning interferometry

Akiko Harasaki and James C. Wyant
Appl. Opt. 39(13) 2101-2106 (2000)

Efficient nonlinear algorithm for envelope detection in white light interferometry

Kieran G. Larkin
J. Opt. Soc. Am. A 13(4) 832-843 (1996)

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Figures (18)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Tables (3)

You do not have subscription access to this journal. Article tables are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Equations (11)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Metrics

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription