Ronald Driggers, Editor-in-Chief
Kazuya Nakano, Masafumi Takeda, and Hiroyuki Suzuki
Kazuya Nakano,1,* Masafumi Takeda,2 and Hiroyuki Suzuki3
1Faculty of Science, Division 2, Tokyo University of Science, 1-3
Kagurazaka, Shinjiku-ku, Tokyo, Japan
2SanDisk Limited, 800 Yamanoisshiki-cho, Yokkaichi, Mie, Japan
3Laboratory for Future Interdisciplinary Research of Science and
Technology, Institute of Innovative Research, Tokyo Institute of Technology, 4259, Nagatsutacho,
Midoriku, Yokohama, Kanagawa, Japan
*Corresponding author: email@example.com
This publisher’s note corrects a value in Table 3 in [Appl. Opt. 56, 4474 (2017) [CrossRef] ].
© 2017 Optical Society of America
K. Nakano, M. Takeda, and H. Suzuki, “Key-length analysis of double random phase
encoding,” Appl. Opt. 56, 4474–4479 (2017).
OSA participates in Crossref's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.
Alert me when this article is cited.
Click here to see a list of articles that cite this paper
Table 3. Estimated Confidence Intervals of the Population Mean (Image Size Is Constant)