Abstract

Measurement of antireflection coating of witness samples from across the worldwide industry has been shown to have excess variability from a sampling taken for the OSA Topical Meeting on Optical Interference Coatings: Measurement Problem. Various sample preparation techniques have been discussed with their limitations, and a preferred technique is recommended with its justification, calibration procedures, and limitations. The common practice of grinding the second side to reduce its reflection is less than satisfactory. One recommended practice is to paint the polished second side, which reduces its reflection to almost zero. A method to evaluate the suitability of given paints is also described.

© 2013 Optical Society of America

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References

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  1. A. Duparre, “OSA topical meeting on optical interference coatings: measurement problem,” presented at the Optical Interference Coatings (OIC), OSA Topical Meeting, Whistler, Canada, June20, 2013, paper ThC.1.
  2. D. J. Hayton and T. E. Jenkins, “On the frustration of back-surface reflection from transparent substrates in ellipsometry,” Meas. Sci. Technol. 15, N17–N21 (2004).
    [CrossRef]
  3. R. A. Synowicki, “Suppression of back-side reflections from transparent substrates,” Phys. Status Solidi C 5, 1085–1088 (2008).
    [CrossRef]
  4. Cargille Labs, http://www.cargille.com/refractivestandards.shtml .

2008 (1)

R. A. Synowicki, “Suppression of back-side reflections from transparent substrates,” Phys. Status Solidi C 5, 1085–1088 (2008).
[CrossRef]

2004 (1)

D. J. Hayton and T. E. Jenkins, “On the frustration of back-surface reflection from transparent substrates in ellipsometry,” Meas. Sci. Technol. 15, N17–N21 (2004).
[CrossRef]

Duparre, A.

A. Duparre, “OSA topical meeting on optical interference coatings: measurement problem,” presented at the Optical Interference Coatings (OIC), OSA Topical Meeting, Whistler, Canada, June20, 2013, paper ThC.1.

Hayton, D. J.

D. J. Hayton and T. E. Jenkins, “On the frustration of back-surface reflection from transparent substrates in ellipsometry,” Meas. Sci. Technol. 15, N17–N21 (2004).
[CrossRef]

Jenkins, T. E.

D. J. Hayton and T. E. Jenkins, “On the frustration of back-surface reflection from transparent substrates in ellipsometry,” Meas. Sci. Technol. 15, N17–N21 (2004).
[CrossRef]

Synowicki, R. A.

R. A. Synowicki, “Suppression of back-side reflections from transparent substrates,” Phys. Status Solidi C 5, 1085–1088 (2008).
[CrossRef]

Meas. Sci. Technol. (1)

D. J. Hayton and T. E. Jenkins, “On the frustration of back-surface reflection from transparent substrates in ellipsometry,” Meas. Sci. Technol. 15, N17–N21 (2004).
[CrossRef]

Phys. Status Solidi C (1)

R. A. Synowicki, “Suppression of back-side reflections from transparent substrates,” Phys. Status Solidi C 5, 1085–1088 (2008).
[CrossRef]

Other (2)

Cargille Labs, http://www.cargille.com/refractivestandards.shtml .

A. Duparre, “OSA topical meeting on optical interference coatings: measurement problem,” presented at the Optical Interference Coatings (OIC), OSA Topical Meeting, Whistler, Canada, June20, 2013, paper ThC.1.

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Figures (4)

Fig. 1.
Fig. 1.

AR coating examples: typical 4-layer design for eyeglasses, a 4-layer design to optimize photopic response, and a 2-layer V-Coat for AR at 555 nm.

Fig. 2.
Fig. 2.

Various means of dealing with second side reflections for measuring an AR coating on the first side.

Fig. 3.
Fig. 3.

Geometry for comparing the indices of paint samples by observing the critical angle for TIR.

Fig. 4.
Fig. 4.

Residual %R back-surface reflection from a universal light trap oiled to a witness substrate with a given index of refraction.

Equations (1)

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%R=100×((nsnp)÷(ns+np))2.

Metrics