Abstract

The 2013 Measurement Problem comprised the determination of the reflectance of a broadband antireflection (AR) coating in the spectral region from 400 to 700 nm at near 0° angle of incidence.

© 2014 Optical Society of America

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References

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  1. A. Duparré and D. Ristau, “2004 topical meeting on optical interference coatings: measurement problem,” in Optical Interference Coatings, OSA Technical Digest Series (Optical Society of America, 2004), paper WD1.
  2. A. Duparré and D. Ristau, “Optical interference coatings 2007 measurement problem,” Appl. Opt. 47, C-179–C-184 (2008).
    [CrossRef]
  3. A. Duparré and D. Ristau, “Optical interference coatings 2010 measurement problem,” Appl. Opt. 50, C-172–C-177 (2011).
    [CrossRef]
  4. , “Optics and optical instruments—test methods for radiation scattered by optical components,” (International Organization for Standardization, 2002).

2011

A. Duparré and D. Ristau, “Optical interference coatings 2010 measurement problem,” Appl. Opt. 50, C-172–C-177 (2011).
[CrossRef]

2008

A. Duparré and D. Ristau, “Optical interference coatings 2007 measurement problem,” Appl. Opt. 47, C-179–C-184 (2008).
[CrossRef]

Duparré, A.

A. Duparré and D. Ristau, “Optical interference coatings 2010 measurement problem,” Appl. Opt. 50, C-172–C-177 (2011).
[CrossRef]

A. Duparré and D. Ristau, “Optical interference coatings 2007 measurement problem,” Appl. Opt. 47, C-179–C-184 (2008).
[CrossRef]

A. Duparré and D. Ristau, “2004 topical meeting on optical interference coatings: measurement problem,” in Optical Interference Coatings, OSA Technical Digest Series (Optical Society of America, 2004), paper WD1.

Ristau, D.

A. Duparré and D. Ristau, “Optical interference coatings 2010 measurement problem,” Appl. Opt. 50, C-172–C-177 (2011).
[CrossRef]

A. Duparré and D. Ristau, “Optical interference coatings 2007 measurement problem,” Appl. Opt. 47, C-179–C-184 (2008).
[CrossRef]

A. Duparré and D. Ristau, “2004 topical meeting on optical interference coatings: measurement problem,” in Optical Interference Coatings, OSA Technical Digest Series (Optical Society of America, 2004), paper WD1.

Appl. Opt.

A. Duparré and D. Ristau, “Optical interference coatings 2007 measurement problem,” Appl. Opt. 47, C-179–C-184 (2008).
[CrossRef]

A. Duparré and D. Ristau, “Optical interference coatings 2010 measurement problem,” Appl. Opt. 50, C-172–C-177 (2011).
[CrossRef]

Other

, “Optics and optical instruments—test methods for radiation scattered by optical components,” (International Organization for Standardization, 2002).

A. Duparré and D. Ristau, “2004 topical meeting on optical interference coatings: measurement problem,” in Optical Interference Coatings, OSA Technical Digest Series (Optical Society of America, 2004), paper WD1.

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Figures (12)

Fig. 1.
Fig. 1.

Results of prescreening to check comparability of samples ( R refers to samples on the whole).

Fig. 2.
Fig. 2.

Locations of participating labs, 2013.

Fig. 3.
Fig. 3.

R results of participants (AOI near 0°). Curves below the // mark actually refer to the AR coating, above // to R , including the rear side of sample.

Fig. 4.
Fig. 4.

Example of R results (AOI near 0°), participant No. 16.

Fig. 5.
Fig. 5.

Example of R results (AOI near 0°), participant No. 12.

Fig. 6.
Fig. 6.

Measurement of ellipsometry parameters by participant No. 11.

Fig. 7.
Fig. 7.

R deviations (AR coating) of results in Fig. 3.

Fig. 8.
Fig. 8.

R deviations of results in Fig. 7, averaged over all wavelengths.

Fig. 9.
Fig. 9.

R deviations (box plot). I–I, lower/upper whisker; dots, arithmetic mean; box center line, median; +, breakaway data.

Fig. 10.
Fig. 10.

Additional investigation: R for AOI 45°. As in Fig. 3, curves below // mark refer to AR coating, above // to R , including rear side of sample.

Fig. 11.
Fig. 11.

Absorption measurement at 532 nm, photothermal PCI.

Fig. 12.
Fig. 12.

Determination of optical losses.

Tables (1)

Tables Icon

Table 1. Participating Laboratories (in Alphabetical Order, not Identical with OIC Sample/Lab Number)

Metrics