This study compares and quantifies the simulated effects of noise, index errors, and photometric level errors on different optical monitoring layer termination strategies. A computer program to simulate optical thin film monitoring has been written for this work. The study looked at these termination methods: quartz crystal monitoring, photometric level cut, two types of turning point termination, and percent of optical extrema monitoring. A narrow bandpass filter and a four-layer antireflection coating design were simulated as examples.
© 2013 Optical Society of AmericaFull Article | PDF Article