Abstract

A broadband transmission filter from 400 to 1100 nm was selected for the manufacturing problem contest. The purpose of the contest is to test the state of the art of current optical thin film manufacturing capabilities. A total of 37 people from 15 teams participated in the contest and submitted 17 samples. Diverse approaches were taken by participants to tackle the problem. A range of different solutions was obtained where the number of layers varied from 22 to 608, and the total layer thickness ranged from 1.859 to 23.099 μm. Two independent laboratories performed sample evaluation measurements. Three teams shared the best result with the lowest average measured merit function.

© 2014 Optical Society of America

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References

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  1. J. A. Dobrowolski, L. Li, M. Jacobson, and D. W. Allen, “2010 topical meeting on optical interference coatings: manufacturing problem,” Appl. Opt. 50, C408–C419 (2011).
    [CrossRef]
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    [CrossRef]
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    [CrossRef]
  4. J. A. Dobrowolski, S. Browning, M. Jacobson, and M. Nadal, “Topical meeting on optical interference coatings (OIC’2001): manufacturing problem,” Appl. Opt. 41, 3039–3052 (2002).
    [CrossRef]
  5. L. Li and J. A. Dobrowolski, “2013 OIC Manufacturing Problem Contest,” in Optical Interference Coatings, M. Tilsch and D. Ristau, eds., OSA Technical Digest (online) (Optical Society of America, 2013), paper WC.1.

2011

2008

2006

2002

Allen, D. W.

Browning, S.

Dobrowolski, J. A.

Jacobson, M.

Jacobson, M. R.

Li, L.

J. A. Dobrowolski, L. Li, M. Jacobson, and D. W. Allen, “2010 topical meeting on optical interference coatings: manufacturing problem,” Appl. Opt. 50, C408–C419 (2011).
[CrossRef]

L. Li and J. A. Dobrowolski, “2013 OIC Manufacturing Problem Contest,” in Optical Interference Coatings, M. Tilsch and D. Ristau, eds., OSA Technical Digest (online) (Optical Society of America, 2013), paper WC.1.

Nadal, M.

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Figures (9)

Fig. 1.
Fig. 1.

Filter transmittance target for the 2013 OIC Manufacturing Problem Contest.

Fig. 2.
Fig. 2.

Summary of the filter designs (rows 1–3) and error simulations (rows 4 and 5). Column A, Design 1; column B, Design 2; column C, Design 3. Row 1, refractive index profiles of the filter designs; row 2, calculated transmittance of filter design and targets; row 3, transmittance difference between the calculated transmittance and target; row 4, error simulation transmittance differences (RMS thickness error = 0.25 nm ); row 5, error simulation transmittances (RMS layer thickness errors = 1.0 nm ).

Fig. 3.
Fig. 3.

Evaluation results of samples S01–S05. Column A, target and measured transmittance by participants, ODA, and NIST; column B, transmittance differences by participants, ODA, and NIST; column C, filter designs and index profiles of samples S01–S05.

Fig. 4.
Fig. 4.

Evaluation results of samples S06–S10. Column A, target and measured transmittance by participants, ODA, and NIST; column B, transmittance differences by participants, ODA, and NIST; column C, filter designs and index profiles of samples S06–S10.

Fig. 5.
Fig. 5.

Evaluation results of samples S11–S15. Column A, target and measured transmittance by participants, ODA, and NIST; column B, transmittance differences by participants, ODA, and NIST; column C, filter designs and index profiles of samples S11–S15.

Fig. 6.
Fig. 6.

Evaluation results of samples S16 to S17. Column A, target and measured transmittance by participants, ODA, and NIST; column B, transmittance differences by participants, ODA, and NIST; column C, filter designs and index profiles of samples S16 to S17.

Fig. 7.
Fig. 7.

Calculated MFs plotted against the average measured MFs for samples S01–S17.

Fig. 8.
Fig. 8.

Total layer thickness (left axis) and the number of layers (right axis) for samples 01 to 17.

Fig. 9.
Fig. 9.

Samples with the best result S01, S07, and S09.

Tables (3)

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Table 1. Participating Teams in the 2013 OIC Manufacturing Problem Contest

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Table 2. Summary of Measurement Equipment

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Table 3. Summary of Filter Designs, MFs, and Ranks

Equations (1)

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MF = { 1 N i = 1 N ( T i T i D Δ T i ) 2 } 1 / 2 ,

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