Abstract
We propose a reliable reverse engineering approach for a postproduction characterization of complicated optical coatings for ultrafast laser applications. We perform the postproduction characterization on the basis of in situ broadband monitoring data and validate the results using ex situ transmittance data and group delay measurements.
© 2013 Optical Society of America
Full Article | PDF ArticleMore Like This
Tatiana V. Amotchkina, Michael K. Trubetskov, Vladimir Pervak, Boris Romanov, and Alexander V. Tikhonravov
Appl. Opt. 51(22) 5543-5551 (2012)
Tatiana V. Amotchkina, Michael K. Trubetskov, Alexander V. Tikhonravov, Sebastian Schlichting, Henrik Ehlers, Detlev Ristau, David Death, Robert J. Francis, and Vladimir Pervak
Opt. Express 21(18) 21508-21522 (2013)
Tatiana V. Amotchkina, Michael K. Trubetskov, Vladimir Pervak, and Alexander V. Tikhonravov
Appl. Opt. 50(35) 6468-6475 (2011)