Abstract

The angle of incidence ϕ=ϕumin of minimum reflectance for incident unpolarized or circularly polarized light at a dielectric-conductor interface is determined for any complex relative refractive index N=(n,k), and contours of constant ϕumin in the nk plane are presented. The minimum reflectance Rumin at ϕumin is also plotted as a function of the polar angle 0θ=arg(N)90° along each constant ϕumin contour. Also presented are families of Ru-versus-ϕ curves for values of complex N at θ=30°, ϕumin=45° to 85° in steps of 10°, and values of complex N at ϕumin=75°, θ=0° to 90° in steps of 10°. Finally, a nonpolarimetric method for the determination of n and k of optical materials, which is based on measurements of ϕumin and the normal-incidence reflectance R0, is proposed.

© 2014 Optical Society of America

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