## Abstract

The angle of incidence $\varphi ={\varphi}_{u\text{\hspace{0.17em}}\mathrm{min}}$ of minimum reflectance for incident unpolarized or circularly polarized light at a dielectric-conductor interface is determined for any complex relative refractive index $N=(n,k)$, and contours of constant ${\varphi}_{u\text{\hspace{0.17em}}\mathrm{min}}$ in the $nk$ plane are presented. The minimum reflectance ${R}_{u\text{\hspace{0.17em}}\mathrm{min}}$ at ${\varphi}_{u\text{\hspace{0.17em}}\mathrm{min}}$ is also plotted as a function of the polar angle $0\le \theta =\mathrm{arg}(N)\le 90\xb0$ along each constant ${\varphi}_{u\text{\hspace{0.17em}}\mathrm{min}}$ contour. Also presented are families of ${R}_{u}$-versus-$\varphi $ curves for values of complex $N$ at $\theta =30\xb0$, ${\varphi}_{u\text{\hspace{0.17em}}\mathrm{min}}=45\xb0$ to 85° in steps of 10°, and values of complex $N$ at ${\varphi}_{u\text{\hspace{0.17em}}\mathrm{min}}=75\xb0$, $\theta =0\xb0$ to 90° in steps of 10°. Finally, a nonpolarimetric method for the determination of $n$ and $k$ of optical materials, which is based on measurements of ${\varphi}_{u\text{\hspace{0.17em}}\mathrm{min}}$ and the normal-incidence reflectance ${R}_{0}$, is proposed.

© 2014 Optical Society of America

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