Abstract

We demonstrate that it is possible to measure the local geometrical thickness and the refractive index of a transparent pellicle in air by combining the diffractive properties of a Gaussian beam with the analytical equations of the light that propagates through a thin layer. We show that our measurement technique is immune to inherent piston-like vibrations present in the pellicle. As our measurements are based on characterizing properly the Gaussian beam in a plane of detection, a homodyne technique for this purpose is devised and described. The feasibility of our proposal is confirmed by measuring local geometrical thicknesses and the refractive index of a commercially available stretch film.

© 2014 Optical Society of America

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References

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2009 (1)

2007 (2)

2006 (1)

2000 (1)

M. Cywiak, J. Murakowski, and G. Wade, “Beam blocking method for optical characterization of surfaces,” Int. J. Imaging Syst. Technol. 11, 164–169 (2000).
[CrossRef]

1996 (1)

1989 (1)

Azzam, R.

Castro, D.

Ciprian, D.

Cui, Y.

Cywiak, M.

M. Cywiak, A. Morales, J. Flores, and M. Servín, “Fresnel-Gaussian shape invariant for optical ray tracing,” Opt. Express 17, 10564–10572 (2009).
[CrossRef]

M. Cywiak, J. Murakowski, and G. Wade, “Beam blocking method for optical characterization of surfaces,” Int. J. Imaging Syst. Technol. 11, 164–169 (2000).
[CrossRef]

Flores, J.

Hecht, E.

E. Hecht, Optics, 2nd ed. (Addison-Wesley, 1987), pp. 426–431.

Hlubina, P.

Jenkins, F. A.

F. A. Jenkins and H. E. White, “Interference involving multiple reflections,” in Fundamentals of Optics, 3rd ed. (McGraw-Hill, 1957), Chap. 14, pp. 260–264.

Jian, H.

Lee, C.

Lesnák, M.

Lin, J.

Lunácek, J.

Morales, A.

Murakowski, J.

M. Cywiak, J. Murakowski, and G. Wade, “Beam blocking method for optical characterization of surfaces,” Int. J. Imaging Syst. Technol. 11, 164–169 (2000).
[CrossRef]

Ramsteiner, M.

Servín, M.

Vargas, W.

Wade, G.

M. Cywiak, J. Murakowski, and G. Wade, “Beam blocking method for optical characterization of surfaces,” Int. J. Imaging Syst. Technol. 11, 164–169 (2000).
[CrossRef]

Wagner, J.

Wang, C.

White, H. E.

F. A. Jenkins and H. E. White, “Interference involving multiple reflections,” in Fundamentals of Optics, 3rd ed. (McGraw-Hill, 1957), Chap. 14, pp. 260–264.

Wild, C.

Appl. Opt. (4)

Int. J. Imaging Syst. Technol. (1)

M. Cywiak, J. Murakowski, and G. Wade, “Beam blocking method for optical characterization of surfaces,” Int. J. Imaging Syst. Technol. 11, 164–169 (2000).
[CrossRef]

Opt. Express (2)

Other (3)

www.filmetrics.com .

E. Hecht, Optics, 2nd ed. (Addison-Wesley, 1987), pp. 426–431.

F. A. Jenkins and H. E. White, “Interference involving multiple reflections,” in Fundamentals of Optics, 3rd ed. (McGraw-Hill, 1957), Chap. 14, pp. 260–264.

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