Abstract

A mathematical description of the absolute surface height distribution in generalized fringe projection profilometry under large measuring depth range is presented. Based on least-squares polynomial fitting, a nonlinear calibration to determine the mapping between phase change and surface height is proposed by considering the unequal height arrangement of the projector and the camera. To solve surface height from phase change, an iteration method is brought forward. Experiments are implemented to demonstrate the validity of the proposed calibration and an accuracy of 0.3 mm for surface profile under 300 mm measuring depth can be achieved.

© 2013 Optical Society of America

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