Transparency and stability of Ag-based metal–dielectric multilayers

Abstract

We fabricated and tested periodic metal (Ag)–dielectric (${\mathrm{SiO}}_2$ or ${\mathrm{TiO}}_2$) multilayers with transparency bands in the visible range. For samples with $\mathrm{Ag}–{\mathrm{TiO}}_2$ interfaces, the optical properties exhibited relatively poor predictability, likely due to oxidation of the Ag layers. $\mathrm{Ag}/{\mathrm{SiO}}_2$-based multilayers were found to be more predictable and stable, but the relatively low refractive index of ${\mathrm{SiO}}_2$ limits their inherent transparency and pass-band bandwidth. We show that termination of the multilayer with a single high-index layer reduces the admittance mismatch with the ambient media, and thus improves the properties of the transparency band.

© 2013 Optical Society of America

Fabry-Perot based metal-dielectric multilayered filters and metamaterials

Yi-Jun Jen, Cheng-Chung Lee, Kun-Han Lu, Ci-Yao Jheng, and Yu-Jen Chen
Opt. Express 23(26) 33008-33017 (2015)

Tuning the optical response in sputtered multilayered metal-dielectric thin films

Joel Briones and Edgar Briones
OSA Continuum 3(11) 3061-3069 (2020)

Assessing the maximum transmittance of periodic metal-dielectric multilayers

T. W. Allen and R. G. DeCorby
J. Opt. Soc. Am. B 28(10) 2529-2536 (2011)

Postanalyses of an optical multilayer interference filter using numerical reverse synthesis and Rutherford backscattering spectrometry

Naba Kishore Sahoo, Sanjiv Kumar, Raj Bahadur Tokas, Shuvendu Jena, Sudhakar Thakur, and Gundlapally Laxmi Narasimha Reddy
Appl. Opt. 52(10) 2102-2115 (2013)

Conditions for admittance-matched tunneling through symmetric metal-dielectric stacks

T.W. Allen and R.G. DeCorby
Opt. Express 20(S5) A578-A588 (2012)