Abstract

Controlling thin film formation is technologically challenging. The knowledge of physical properties of the film and of the atoms in the surface vicinity can help improve control over the film growth. We investigate the use of the well-established selective reflection technique to probe the thin film during its growth, simultaneously monitoring the film thickness, the atom–surface van der Waals interaction, and the vapor properties in the surface vicinity.

© 2013 Optical Society of America

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  1. H. G. Craighead, R. E. Howard, L. D. Jackel, and P. M. Mankiewich, “10 nm linewidth electron beam lithography on GsAs,” Appl. Phys. Lett. 42, 38–40 (1983).
    [CrossRef]
  2. W. Chen and H. Ahmed, “Fabrication of 5–7 nm wide etched line in silicon using 100 keV electron beam lithography and polymethylmethacrylate resist,” Appl. Phys. Lett. 62, 1499–1501 (1993).
    [CrossRef]
  3. V. Bouchiat and D. Esteve, “Liftoff lithography using an atomic force microscope,” Appl. Phys. Lett. 69, 3098–3100 (1996).
    [CrossRef]
  4. R. Folman, P. Krüger, D. Cassettari, B. Hessmo, T. Maier, and J. Schmiedmayer, “Controlling cold atoms using nanofabricated surfaces: atom chips,” Phys. Rev. Lett. 84, 4749–4752 (2000).
    [CrossRef]
  5. T. Schumm, S. Hofferberth, L. M. Andersson, D. Wildemurth, S. Groth, I. Bar-Joseph, J. Schmiedmayer, and P. Krüger, “Matter-wave interferometry in a double well on an atom chip,” Nat. Phys. 1, 57–62 (2005).
    [CrossRef]
  6. J. M. McGuirk, D. M. Harber, J. M. Obrecht, and E. A. Cornell, “Alkali–metal adsorbate polarization on conducting and insulating surfaces probed with Bose–Einstein condensates,” Phys. Rev. A 69, 062905 (2004).
    [CrossRef]
  7. V. G. Bordo and H.-G. Rubahn, “Nonlinear evanescent wave spectroscopies: a close look at the gas-solid interface,” J. Phys. 19, 10–19 (2005).
    [CrossRef]
  8. T. Passerat de Silans, B. Farias, M. Oriá, and M. Chevrollier, “Laser-induced quantum adsorption of neutral atoms in dielectric surfaces,” Appl. Phys. B 82, 367–371 (2006).
    [CrossRef]
  9. V. G. Bordo and H.-G. Rubahn, “Laser-controlled adsorption of Na atoms in evanescent wave spectroscopy,” Opt. Express 4, 59–66 (1999).
    [CrossRef]
  10. D. Meschede and H. Metcalf, “Atomic nanofabrication: atomic deposition and lithography by laser and magnetic forces,” J. Phys. D 36, R17–R18 (2003).
    [CrossRef]
  11. A. E. Afanasiev, P. N. Melentiev, and V. I. Balykin, “Laser-induced quantum adsorption of atoms on a surface,” JETP Lett. 86, 172–177 (2007).
    [CrossRef]
  12. A. Burchianti, A. Boge, C. Marinelli, E. Mariotti, and L. Moi, “Light-induced atomic desorption and related phenomena,” Phys. Scripta T135014012 (2009).
    [CrossRef]
  13. E. Proehl, R. Nitche, T. Dienel, K. Leo, and T. Fritz, “In situ differential reflectance spectroscopy of thin crystalline films of PTCDA on different subtrates,” Phys. Rev. B 71, 016207 (2005).
    [CrossRef]
  14. M. Oriá, M. Chevrollier, D. Bloch, M. Fichet, and M. Ducloy, “Spectral observation of surface-induced van der Waals attraction on atomic vapour,” Europhys. Lett. 14, 527–532 (1991).
    [CrossRef]
  15. M. Chevrollier, M. Fichet, M. Oriá, G. Rahmat, D. Bloch, and M. Ducloy, “High resolution selective reflection spectroscopy as a probe of long-range surface interaction: measurement of the surface van der Waals attraction exerted on excited Cs atoms,” J. Phys. II 2, 631–657 (1992).
    [CrossRef]
  16. H. Failache, S. Saltiel, M. Fichet, D. Bloch, and M. Ducloy, “Resonant van der Waals repulsion between excited Cs atoms and sapphire surface,” Phys. Rev. Lett. 83, 5467–5470 (1999).
    [CrossRef]
  17. M.-P. Gorza and M. Ducloy, “Van der Waals interactions between atoms and dispersive surfaces at finite temperature,” Eur. Phys. J. D 40, 343–356 (2006).
    [CrossRef]
  18. A. M. Akul’shin, V. L. Velichanskĭĭ, A. S. Zibrov, V. V. Nikitin, V. V. Sautenkov, E. K. Yurkin, and N. V. Senkov, “Collisional broadening of intra-Doppler resonances of selective reflection on the D2 line of cesium,” JETP Lett. 36, 303–307 (1983).
  19. V. A. Sautenkov, “Line shapes of atomic transitions in excited dense gas,” Laser Phys. Lett. 8, 771–781 (2011).
    [CrossRef]
  20. T. A. Vartanyan and F. Träger, “Line shapes of resonances recorded in selective reflection: influence of an antireflection coating,” Opt. Commun. 110, 315–320 (1994).
    [CrossRef]
  21. M. Chevrollier, M. Oriá, J. G. de Souza, D. Bloch, M. Fichet, and M. Ducloy, “Selective reflection spectroscopy of a resonant vapor at the interface with a metallic layer,” Phys. Rev. E 63, 046610 (2001).
    [CrossRef]
  22. M. Ducloy and M. Fichet, “General theory of frequency modulated selective reflection: influence of atom surface interactions,” J. Phys. II 1, 1429–1446 (1991).
    [CrossRef]
  23. S. G. Tomlin, “Optical reflection and transmission formulae for thin films,” J. Phys. D 1, 1667–1671 (1968).
    [CrossRef]
  24. Notice that part of the He–Ne laser might be absorbed by Cs2 formed by three-atom collisions at those densities. Since the atomic density is not modified during the experiment, the Cs2 absorption does not influence the thickness measurement.
  25. T. Inagaki and E. T. Arakawa, “Cesium(Cs),” in Handbook of Optical Constants of Solids, E. P. Palik, ed. (Academic, 1988), pp. 341–350.
  26. A. M. Bonch-Bruevich, T. A. Vartanyan, Y. N. Maksimov, S. G. Przhibel’skiĭ, and V. V. Khromov, “Adsorption of cesium atoms at structural defects on sapphire surfaces,” JETP 85, 200–204 (1997).
    [CrossRef]
  27. M. Brause, J. Günster, T. Mayer, B. Braun, V. Puchin, W. Maus-Friedrichs, and V. Kempter, “Cs adsorption on oxide films (Al2O3, MgO, SiO2),” Surf. Sci. 383, 216–225 (1997).
    [CrossRef]
  28. F. Balzer, S. D. Jett, and H.-G. Rubahn, “Alkali cluster films on insulating substrates: comparison between scanning force microscopy and extinction data,” Chem. Phys. Lett. 297, 273–280 (1998).
    [CrossRef]
  29. M. Rasigni and G. Rasigni, “Anomalies of the optical properties of thin lithium layers and their relation to similar anomalies observed with other alkali metals,” J. Opt. Soc. Am. 63, 775–785 (1973).
    [CrossRef]
  30. A. M. Bonch-Bruevich, T. A. Vartanyan, N. B. Leonov, S. G. Przhibel’skiœ, and V. V. Khromov, “Optical method for measuring structural parameters of island films,” Opt. Spectrosc. 89, 402–407 (2000).
    [CrossRef]
  31. A. Laliotis, I. Maurin, M. Fichet, D. Bloch, M. Ducloy, N. Balasanyan, A. Sarkisyan, and D. Sarkisyan, “Selective reflection spectroscopy at the interface between a calcium fluoride window and Cs vapour,” Appl. Phys. B 90, 415–420 (2008).
    [CrossRef]
  32. P. C. de S. Segundo, I. Hamdi, M. Fichet, D. Bloch, and M. Ducloy, “Selective reflection spectroscopy on the UV third-resonance line of Cs: simultaneous probing of a van der Waals atom-surface interaction sensitive to far IR couplings and interatomic collisions,” Laser Phys. 17, 983–992 (2007).
    [CrossRef]

2011 (1)

V. A. Sautenkov, “Line shapes of atomic transitions in excited dense gas,” Laser Phys. Lett. 8, 771–781 (2011).
[CrossRef]

2009 (1)

A. Burchianti, A. Boge, C. Marinelli, E. Mariotti, and L. Moi, “Light-induced atomic desorption and related phenomena,” Phys. Scripta T135014012 (2009).
[CrossRef]

2008 (1)

A. Laliotis, I. Maurin, M. Fichet, D. Bloch, M. Ducloy, N. Balasanyan, A. Sarkisyan, and D. Sarkisyan, “Selective reflection spectroscopy at the interface between a calcium fluoride window and Cs vapour,” Appl. Phys. B 90, 415–420 (2008).
[CrossRef]

2007 (2)

P. C. de S. Segundo, I. Hamdi, M. Fichet, D. Bloch, and M. Ducloy, “Selective reflection spectroscopy on the UV third-resonance line of Cs: simultaneous probing of a van der Waals atom-surface interaction sensitive to far IR couplings and interatomic collisions,” Laser Phys. 17, 983–992 (2007).
[CrossRef]

A. E. Afanasiev, P. N. Melentiev, and V. I. Balykin, “Laser-induced quantum adsorption of atoms on a surface,” JETP Lett. 86, 172–177 (2007).
[CrossRef]

2006 (2)

M.-P. Gorza and M. Ducloy, “Van der Waals interactions between atoms and dispersive surfaces at finite temperature,” Eur. Phys. J. D 40, 343–356 (2006).
[CrossRef]

T. Passerat de Silans, B. Farias, M. Oriá, and M. Chevrollier, “Laser-induced quantum adsorption of neutral atoms in dielectric surfaces,” Appl. Phys. B 82, 367–371 (2006).
[CrossRef]

2005 (3)

V. G. Bordo and H.-G. Rubahn, “Nonlinear evanescent wave spectroscopies: a close look at the gas-solid interface,” J. Phys. 19, 10–19 (2005).
[CrossRef]

T. Schumm, S. Hofferberth, L. M. Andersson, D. Wildemurth, S. Groth, I. Bar-Joseph, J. Schmiedmayer, and P. Krüger, “Matter-wave interferometry in a double well on an atom chip,” Nat. Phys. 1, 57–62 (2005).
[CrossRef]

E. Proehl, R. Nitche, T. Dienel, K. Leo, and T. Fritz, “In situ differential reflectance spectroscopy of thin crystalline films of PTCDA on different subtrates,” Phys. Rev. B 71, 016207 (2005).
[CrossRef]

2004 (1)

J. M. McGuirk, D. M. Harber, J. M. Obrecht, and E. A. Cornell, “Alkali–metal adsorbate polarization on conducting and insulating surfaces probed with Bose–Einstein condensates,” Phys. Rev. A 69, 062905 (2004).
[CrossRef]

2003 (1)

D. Meschede and H. Metcalf, “Atomic nanofabrication: atomic deposition and lithography by laser and magnetic forces,” J. Phys. D 36, R17–R18 (2003).
[CrossRef]

2001 (1)

M. Chevrollier, M. Oriá, J. G. de Souza, D. Bloch, M. Fichet, and M. Ducloy, “Selective reflection spectroscopy of a resonant vapor at the interface with a metallic layer,” Phys. Rev. E 63, 046610 (2001).
[CrossRef]

2000 (2)

R. Folman, P. Krüger, D. Cassettari, B. Hessmo, T. Maier, and J. Schmiedmayer, “Controlling cold atoms using nanofabricated surfaces: atom chips,” Phys. Rev. Lett. 84, 4749–4752 (2000).
[CrossRef]

A. M. Bonch-Bruevich, T. A. Vartanyan, N. B. Leonov, S. G. Przhibel’skiœ, and V. V. Khromov, “Optical method for measuring structural parameters of island films,” Opt. Spectrosc. 89, 402–407 (2000).
[CrossRef]

1999 (2)

V. G. Bordo and H.-G. Rubahn, “Laser-controlled adsorption of Na atoms in evanescent wave spectroscopy,” Opt. Express 4, 59–66 (1999).
[CrossRef]

H. Failache, S. Saltiel, M. Fichet, D. Bloch, and M. Ducloy, “Resonant van der Waals repulsion between excited Cs atoms and sapphire surface,” Phys. Rev. Lett. 83, 5467–5470 (1999).
[CrossRef]

1998 (1)

F. Balzer, S. D. Jett, and H.-G. Rubahn, “Alkali cluster films on insulating substrates: comparison between scanning force microscopy and extinction data,” Chem. Phys. Lett. 297, 273–280 (1998).
[CrossRef]

1997 (2)

A. M. Bonch-Bruevich, T. A. Vartanyan, Y. N. Maksimov, S. G. Przhibel’skiĭ, and V. V. Khromov, “Adsorption of cesium atoms at structural defects on sapphire surfaces,” JETP 85, 200–204 (1997).
[CrossRef]

M. Brause, J. Günster, T. Mayer, B. Braun, V. Puchin, W. Maus-Friedrichs, and V. Kempter, “Cs adsorption on oxide films (Al2O3, MgO, SiO2),” Surf. Sci. 383, 216–225 (1997).
[CrossRef]

1996 (1)

V. Bouchiat and D. Esteve, “Liftoff lithography using an atomic force microscope,” Appl. Phys. Lett. 69, 3098–3100 (1996).
[CrossRef]

1994 (1)

T. A. Vartanyan and F. Träger, “Line shapes of resonances recorded in selective reflection: influence of an antireflection coating,” Opt. Commun. 110, 315–320 (1994).
[CrossRef]

1993 (1)

W. Chen and H. Ahmed, “Fabrication of 5–7 nm wide etched line in silicon using 100 keV electron beam lithography and polymethylmethacrylate resist,” Appl. Phys. Lett. 62, 1499–1501 (1993).
[CrossRef]

1992 (1)

M. Chevrollier, M. Fichet, M. Oriá, G. Rahmat, D. Bloch, and M. Ducloy, “High resolution selective reflection spectroscopy as a probe of long-range surface interaction: measurement of the surface van der Waals attraction exerted on excited Cs atoms,” J. Phys. II 2, 631–657 (1992).
[CrossRef]

1991 (2)

M. Oriá, M. Chevrollier, D. Bloch, M. Fichet, and M. Ducloy, “Spectral observation of surface-induced van der Waals attraction on atomic vapour,” Europhys. Lett. 14, 527–532 (1991).
[CrossRef]

M. Ducloy and M. Fichet, “General theory of frequency modulated selective reflection: influence of atom surface interactions,” J. Phys. II 1, 1429–1446 (1991).
[CrossRef]

1983 (2)

H. G. Craighead, R. E. Howard, L. D. Jackel, and P. M. Mankiewich, “10 nm linewidth electron beam lithography on GsAs,” Appl. Phys. Lett. 42, 38–40 (1983).
[CrossRef]

A. M. Akul’shin, V. L. Velichanskĭĭ, A. S. Zibrov, V. V. Nikitin, V. V. Sautenkov, E. K. Yurkin, and N. V. Senkov, “Collisional broadening of intra-Doppler resonances of selective reflection on the D2 line of cesium,” JETP Lett. 36, 303–307 (1983).

1973 (1)

1968 (1)

S. G. Tomlin, “Optical reflection and transmission formulae for thin films,” J. Phys. D 1, 1667–1671 (1968).
[CrossRef]

Afanasiev, A. E.

A. E. Afanasiev, P. N. Melentiev, and V. I. Balykin, “Laser-induced quantum adsorption of atoms on a surface,” JETP Lett. 86, 172–177 (2007).
[CrossRef]

Ahmed, H.

W. Chen and H. Ahmed, “Fabrication of 5–7 nm wide etched line in silicon using 100 keV electron beam lithography and polymethylmethacrylate resist,” Appl. Phys. Lett. 62, 1499–1501 (1993).
[CrossRef]

Akul’shin, A. M.

A. M. Akul’shin, V. L. Velichanskĭĭ, A. S. Zibrov, V. V. Nikitin, V. V. Sautenkov, E. K. Yurkin, and N. V. Senkov, “Collisional broadening of intra-Doppler resonances of selective reflection on the D2 line of cesium,” JETP Lett. 36, 303–307 (1983).

Andersson, L. M.

T. Schumm, S. Hofferberth, L. M. Andersson, D. Wildemurth, S. Groth, I. Bar-Joseph, J. Schmiedmayer, and P. Krüger, “Matter-wave interferometry in a double well on an atom chip,” Nat. Phys. 1, 57–62 (2005).
[CrossRef]

Arakawa, E. T.

T. Inagaki and E. T. Arakawa, “Cesium(Cs),” in Handbook of Optical Constants of Solids, E. P. Palik, ed. (Academic, 1988), pp. 341–350.

Balasanyan, N.

A. Laliotis, I. Maurin, M. Fichet, D. Bloch, M. Ducloy, N. Balasanyan, A. Sarkisyan, and D. Sarkisyan, “Selective reflection spectroscopy at the interface between a calcium fluoride window and Cs vapour,” Appl. Phys. B 90, 415–420 (2008).
[CrossRef]

Balykin, V. I.

A. E. Afanasiev, P. N. Melentiev, and V. I. Balykin, “Laser-induced quantum adsorption of atoms on a surface,” JETP Lett. 86, 172–177 (2007).
[CrossRef]

Balzer, F.

F. Balzer, S. D. Jett, and H.-G. Rubahn, “Alkali cluster films on insulating substrates: comparison between scanning force microscopy and extinction data,” Chem. Phys. Lett. 297, 273–280 (1998).
[CrossRef]

Bar-Joseph, I.

T. Schumm, S. Hofferberth, L. M. Andersson, D. Wildemurth, S. Groth, I. Bar-Joseph, J. Schmiedmayer, and P. Krüger, “Matter-wave interferometry in a double well on an atom chip,” Nat. Phys. 1, 57–62 (2005).
[CrossRef]

Bloch, D.

A. Laliotis, I. Maurin, M. Fichet, D. Bloch, M. Ducloy, N. Balasanyan, A. Sarkisyan, and D. Sarkisyan, “Selective reflection spectroscopy at the interface between a calcium fluoride window and Cs vapour,” Appl. Phys. B 90, 415–420 (2008).
[CrossRef]

P. C. de S. Segundo, I. Hamdi, M. Fichet, D. Bloch, and M. Ducloy, “Selective reflection spectroscopy on the UV third-resonance line of Cs: simultaneous probing of a van der Waals atom-surface interaction sensitive to far IR couplings and interatomic collisions,” Laser Phys. 17, 983–992 (2007).
[CrossRef]

M. Chevrollier, M. Oriá, J. G. de Souza, D. Bloch, M. Fichet, and M. Ducloy, “Selective reflection spectroscopy of a resonant vapor at the interface with a metallic layer,” Phys. Rev. E 63, 046610 (2001).
[CrossRef]

H. Failache, S. Saltiel, M. Fichet, D. Bloch, and M. Ducloy, “Resonant van der Waals repulsion between excited Cs atoms and sapphire surface,” Phys. Rev. Lett. 83, 5467–5470 (1999).
[CrossRef]

M. Chevrollier, M. Fichet, M. Oriá, G. Rahmat, D. Bloch, and M. Ducloy, “High resolution selective reflection spectroscopy as a probe of long-range surface interaction: measurement of the surface van der Waals attraction exerted on excited Cs atoms,” J. Phys. II 2, 631–657 (1992).
[CrossRef]

M. Oriá, M. Chevrollier, D. Bloch, M. Fichet, and M. Ducloy, “Spectral observation of surface-induced van der Waals attraction on atomic vapour,” Europhys. Lett. 14, 527–532 (1991).
[CrossRef]

Boge, A.

A. Burchianti, A. Boge, C. Marinelli, E. Mariotti, and L. Moi, “Light-induced atomic desorption and related phenomena,” Phys. Scripta T135014012 (2009).
[CrossRef]

Bonch-Bruevich, A. M.

A. M. Bonch-Bruevich, T. A. Vartanyan, N. B. Leonov, S. G. Przhibel’skiœ, and V. V. Khromov, “Optical method for measuring structural parameters of island films,” Opt. Spectrosc. 89, 402–407 (2000).
[CrossRef]

A. M. Bonch-Bruevich, T. A. Vartanyan, Y. N. Maksimov, S. G. Przhibel’skiĭ, and V. V. Khromov, “Adsorption of cesium atoms at structural defects on sapphire surfaces,” JETP 85, 200–204 (1997).
[CrossRef]

Bordo, V. G.

V. G. Bordo and H.-G. Rubahn, “Nonlinear evanescent wave spectroscopies: a close look at the gas-solid interface,” J. Phys. 19, 10–19 (2005).
[CrossRef]

V. G. Bordo and H.-G. Rubahn, “Laser-controlled adsorption of Na atoms in evanescent wave spectroscopy,” Opt. Express 4, 59–66 (1999).
[CrossRef]

Bouchiat, V.

V. Bouchiat and D. Esteve, “Liftoff lithography using an atomic force microscope,” Appl. Phys. Lett. 69, 3098–3100 (1996).
[CrossRef]

Braun, B.

M. Brause, J. Günster, T. Mayer, B. Braun, V. Puchin, W. Maus-Friedrichs, and V. Kempter, “Cs adsorption on oxide films (Al2O3, MgO, SiO2),” Surf. Sci. 383, 216–225 (1997).
[CrossRef]

Brause, M.

M. Brause, J. Günster, T. Mayer, B. Braun, V. Puchin, W. Maus-Friedrichs, and V. Kempter, “Cs adsorption on oxide films (Al2O3, MgO, SiO2),” Surf. Sci. 383, 216–225 (1997).
[CrossRef]

Burchianti, A.

A. Burchianti, A. Boge, C. Marinelli, E. Mariotti, and L. Moi, “Light-induced atomic desorption and related phenomena,” Phys. Scripta T135014012 (2009).
[CrossRef]

Cassettari, D.

R. Folman, P. Krüger, D. Cassettari, B. Hessmo, T. Maier, and J. Schmiedmayer, “Controlling cold atoms using nanofabricated surfaces: atom chips,” Phys. Rev. Lett. 84, 4749–4752 (2000).
[CrossRef]

Chen, W.

W. Chen and H. Ahmed, “Fabrication of 5–7 nm wide etched line in silicon using 100 keV electron beam lithography and polymethylmethacrylate resist,” Appl. Phys. Lett. 62, 1499–1501 (1993).
[CrossRef]

Chevrollier, M.

T. Passerat de Silans, B. Farias, M. Oriá, and M. Chevrollier, “Laser-induced quantum adsorption of neutral atoms in dielectric surfaces,” Appl. Phys. B 82, 367–371 (2006).
[CrossRef]

M. Chevrollier, M. Oriá, J. G. de Souza, D. Bloch, M. Fichet, and M. Ducloy, “Selective reflection spectroscopy of a resonant vapor at the interface with a metallic layer,” Phys. Rev. E 63, 046610 (2001).
[CrossRef]

M. Chevrollier, M. Fichet, M. Oriá, G. Rahmat, D. Bloch, and M. Ducloy, “High resolution selective reflection spectroscopy as a probe of long-range surface interaction: measurement of the surface van der Waals attraction exerted on excited Cs atoms,” J. Phys. II 2, 631–657 (1992).
[CrossRef]

M. Oriá, M. Chevrollier, D. Bloch, M. Fichet, and M. Ducloy, “Spectral observation of surface-induced van der Waals attraction on atomic vapour,” Europhys. Lett. 14, 527–532 (1991).
[CrossRef]

Cornell, E. A.

J. M. McGuirk, D. M. Harber, J. M. Obrecht, and E. A. Cornell, “Alkali–metal adsorbate polarization on conducting and insulating surfaces probed with Bose–Einstein condensates,” Phys. Rev. A 69, 062905 (2004).
[CrossRef]

Craighead, H. G.

H. G. Craighead, R. E. Howard, L. D. Jackel, and P. M. Mankiewich, “10 nm linewidth electron beam lithography on GsAs,” Appl. Phys. Lett. 42, 38–40 (1983).
[CrossRef]

de S. Segundo, P. C.

P. C. de S. Segundo, I. Hamdi, M. Fichet, D. Bloch, and M. Ducloy, “Selective reflection spectroscopy on the UV third-resonance line of Cs: simultaneous probing of a van der Waals atom-surface interaction sensitive to far IR couplings and interatomic collisions,” Laser Phys. 17, 983–992 (2007).
[CrossRef]

de Souza, J. G.

M. Chevrollier, M. Oriá, J. G. de Souza, D. Bloch, M. Fichet, and M. Ducloy, “Selective reflection spectroscopy of a resonant vapor at the interface with a metallic layer,” Phys. Rev. E 63, 046610 (2001).
[CrossRef]

Dienel, T.

E. Proehl, R. Nitche, T. Dienel, K. Leo, and T. Fritz, “In situ differential reflectance spectroscopy of thin crystalline films of PTCDA on different subtrates,” Phys. Rev. B 71, 016207 (2005).
[CrossRef]

Ducloy, M.

A. Laliotis, I. Maurin, M. Fichet, D. Bloch, M. Ducloy, N. Balasanyan, A. Sarkisyan, and D. Sarkisyan, “Selective reflection spectroscopy at the interface between a calcium fluoride window and Cs vapour,” Appl. Phys. B 90, 415–420 (2008).
[CrossRef]

P. C. de S. Segundo, I. Hamdi, M. Fichet, D. Bloch, and M. Ducloy, “Selective reflection spectroscopy on the UV third-resonance line of Cs: simultaneous probing of a van der Waals atom-surface interaction sensitive to far IR couplings and interatomic collisions,” Laser Phys. 17, 983–992 (2007).
[CrossRef]

M.-P. Gorza and M. Ducloy, “Van der Waals interactions between atoms and dispersive surfaces at finite temperature,” Eur. Phys. J. D 40, 343–356 (2006).
[CrossRef]

M. Chevrollier, M. Oriá, J. G. de Souza, D. Bloch, M. Fichet, and M. Ducloy, “Selective reflection spectroscopy of a resonant vapor at the interface with a metallic layer,” Phys. Rev. E 63, 046610 (2001).
[CrossRef]

H. Failache, S. Saltiel, M. Fichet, D. Bloch, and M. Ducloy, “Resonant van der Waals repulsion between excited Cs atoms and sapphire surface,” Phys. Rev. Lett. 83, 5467–5470 (1999).
[CrossRef]

M. Chevrollier, M. Fichet, M. Oriá, G. Rahmat, D. Bloch, and M. Ducloy, “High resolution selective reflection spectroscopy as a probe of long-range surface interaction: measurement of the surface van der Waals attraction exerted on excited Cs atoms,” J. Phys. II 2, 631–657 (1992).
[CrossRef]

M. Oriá, M. Chevrollier, D. Bloch, M. Fichet, and M. Ducloy, “Spectral observation of surface-induced van der Waals attraction on atomic vapour,” Europhys. Lett. 14, 527–532 (1991).
[CrossRef]

M. Ducloy and M. Fichet, “General theory of frequency modulated selective reflection: influence of atom surface interactions,” J. Phys. II 1, 1429–1446 (1991).
[CrossRef]

Esteve, D.

V. Bouchiat and D. Esteve, “Liftoff lithography using an atomic force microscope,” Appl. Phys. Lett. 69, 3098–3100 (1996).
[CrossRef]

Failache, H.

H. Failache, S. Saltiel, M. Fichet, D. Bloch, and M. Ducloy, “Resonant van der Waals repulsion between excited Cs atoms and sapphire surface,” Phys. Rev. Lett. 83, 5467–5470 (1999).
[CrossRef]

Farias, B.

T. Passerat de Silans, B. Farias, M. Oriá, and M. Chevrollier, “Laser-induced quantum adsorption of neutral atoms in dielectric surfaces,” Appl. Phys. B 82, 367–371 (2006).
[CrossRef]

Fichet, M.

A. Laliotis, I. Maurin, M. Fichet, D. Bloch, M. Ducloy, N. Balasanyan, A. Sarkisyan, and D. Sarkisyan, “Selective reflection spectroscopy at the interface between a calcium fluoride window and Cs vapour,” Appl. Phys. B 90, 415–420 (2008).
[CrossRef]

P. C. de S. Segundo, I. Hamdi, M. Fichet, D. Bloch, and M. Ducloy, “Selective reflection spectroscopy on the UV third-resonance line of Cs: simultaneous probing of a van der Waals atom-surface interaction sensitive to far IR couplings and interatomic collisions,” Laser Phys. 17, 983–992 (2007).
[CrossRef]

M. Chevrollier, M. Oriá, J. G. de Souza, D. Bloch, M. Fichet, and M. Ducloy, “Selective reflection spectroscopy of a resonant vapor at the interface with a metallic layer,” Phys. Rev. E 63, 046610 (2001).
[CrossRef]

H. Failache, S. Saltiel, M. Fichet, D. Bloch, and M. Ducloy, “Resonant van der Waals repulsion between excited Cs atoms and sapphire surface,” Phys. Rev. Lett. 83, 5467–5470 (1999).
[CrossRef]

M. Chevrollier, M. Fichet, M. Oriá, G. Rahmat, D. Bloch, and M. Ducloy, “High resolution selective reflection spectroscopy as a probe of long-range surface interaction: measurement of the surface van der Waals attraction exerted on excited Cs atoms,” J. Phys. II 2, 631–657 (1992).
[CrossRef]

M. Oriá, M. Chevrollier, D. Bloch, M. Fichet, and M. Ducloy, “Spectral observation of surface-induced van der Waals attraction on atomic vapour,” Europhys. Lett. 14, 527–532 (1991).
[CrossRef]

M. Ducloy and M. Fichet, “General theory of frequency modulated selective reflection: influence of atom surface interactions,” J. Phys. II 1, 1429–1446 (1991).
[CrossRef]

Folman, R.

R. Folman, P. Krüger, D. Cassettari, B. Hessmo, T. Maier, and J. Schmiedmayer, “Controlling cold atoms using nanofabricated surfaces: atom chips,” Phys. Rev. Lett. 84, 4749–4752 (2000).
[CrossRef]

Fritz, T.

E. Proehl, R. Nitche, T. Dienel, K. Leo, and T. Fritz, “In situ differential reflectance spectroscopy of thin crystalline films of PTCDA on different subtrates,” Phys. Rev. B 71, 016207 (2005).
[CrossRef]

Gorza, M.-P.

M.-P. Gorza and M. Ducloy, “Van der Waals interactions between atoms and dispersive surfaces at finite temperature,” Eur. Phys. J. D 40, 343–356 (2006).
[CrossRef]

Groth, S.

T. Schumm, S. Hofferberth, L. M. Andersson, D. Wildemurth, S. Groth, I. Bar-Joseph, J. Schmiedmayer, and P. Krüger, “Matter-wave interferometry in a double well on an atom chip,” Nat. Phys. 1, 57–62 (2005).
[CrossRef]

Günster, J.

M. Brause, J. Günster, T. Mayer, B. Braun, V. Puchin, W. Maus-Friedrichs, and V. Kempter, “Cs adsorption on oxide films (Al2O3, MgO, SiO2),” Surf. Sci. 383, 216–225 (1997).
[CrossRef]

Hamdi, I.

P. C. de S. Segundo, I. Hamdi, M. Fichet, D. Bloch, and M. Ducloy, “Selective reflection spectroscopy on the UV third-resonance line of Cs: simultaneous probing of a van der Waals atom-surface interaction sensitive to far IR couplings and interatomic collisions,” Laser Phys. 17, 983–992 (2007).
[CrossRef]

Harber, D. M.

J. M. McGuirk, D. M. Harber, J. M. Obrecht, and E. A. Cornell, “Alkali–metal adsorbate polarization on conducting and insulating surfaces probed with Bose–Einstein condensates,” Phys. Rev. A 69, 062905 (2004).
[CrossRef]

Hessmo, B.

R. Folman, P. Krüger, D. Cassettari, B. Hessmo, T. Maier, and J. Schmiedmayer, “Controlling cold atoms using nanofabricated surfaces: atom chips,” Phys. Rev. Lett. 84, 4749–4752 (2000).
[CrossRef]

Hofferberth, S.

T. Schumm, S. Hofferberth, L. M. Andersson, D. Wildemurth, S. Groth, I. Bar-Joseph, J. Schmiedmayer, and P. Krüger, “Matter-wave interferometry in a double well on an atom chip,” Nat. Phys. 1, 57–62 (2005).
[CrossRef]

Howard, R. E.

H. G. Craighead, R. E. Howard, L. D. Jackel, and P. M. Mankiewich, “10 nm linewidth electron beam lithography on GsAs,” Appl. Phys. Lett. 42, 38–40 (1983).
[CrossRef]

Inagaki, T.

T. Inagaki and E. T. Arakawa, “Cesium(Cs),” in Handbook of Optical Constants of Solids, E. P. Palik, ed. (Academic, 1988), pp. 341–350.

Jackel, L. D.

H. G. Craighead, R. E. Howard, L. D. Jackel, and P. M. Mankiewich, “10 nm linewidth electron beam lithography on GsAs,” Appl. Phys. Lett. 42, 38–40 (1983).
[CrossRef]

Jett, S. D.

F. Balzer, S. D. Jett, and H.-G. Rubahn, “Alkali cluster films on insulating substrates: comparison between scanning force microscopy and extinction data,” Chem. Phys. Lett. 297, 273–280 (1998).
[CrossRef]

Kempter, V.

M. Brause, J. Günster, T. Mayer, B. Braun, V. Puchin, W. Maus-Friedrichs, and V. Kempter, “Cs adsorption on oxide films (Al2O3, MgO, SiO2),” Surf. Sci. 383, 216–225 (1997).
[CrossRef]

Khromov, V. V.

A. M. Bonch-Bruevich, T. A. Vartanyan, N. B. Leonov, S. G. Przhibel’skiœ, and V. V. Khromov, “Optical method for measuring structural parameters of island films,” Opt. Spectrosc. 89, 402–407 (2000).
[CrossRef]

A. M. Bonch-Bruevich, T. A. Vartanyan, Y. N. Maksimov, S. G. Przhibel’skiĭ, and V. V. Khromov, “Adsorption of cesium atoms at structural defects on sapphire surfaces,” JETP 85, 200–204 (1997).
[CrossRef]

Krüger, P.

T. Schumm, S. Hofferberth, L. M. Andersson, D. Wildemurth, S. Groth, I. Bar-Joseph, J. Schmiedmayer, and P. Krüger, “Matter-wave interferometry in a double well on an atom chip,” Nat. Phys. 1, 57–62 (2005).
[CrossRef]

R. Folman, P. Krüger, D. Cassettari, B. Hessmo, T. Maier, and J. Schmiedmayer, “Controlling cold atoms using nanofabricated surfaces: atom chips,” Phys. Rev. Lett. 84, 4749–4752 (2000).
[CrossRef]

Laliotis, A.

A. Laliotis, I. Maurin, M. Fichet, D. Bloch, M. Ducloy, N. Balasanyan, A. Sarkisyan, and D. Sarkisyan, “Selective reflection spectroscopy at the interface between a calcium fluoride window and Cs vapour,” Appl. Phys. B 90, 415–420 (2008).
[CrossRef]

Leo, K.

E. Proehl, R. Nitche, T. Dienel, K. Leo, and T. Fritz, “In situ differential reflectance spectroscopy of thin crystalline films of PTCDA on different subtrates,” Phys. Rev. B 71, 016207 (2005).
[CrossRef]

Leonov, N. B.

A. M. Bonch-Bruevich, T. A. Vartanyan, N. B. Leonov, S. G. Przhibel’skiœ, and V. V. Khromov, “Optical method for measuring structural parameters of island films,” Opt. Spectrosc. 89, 402–407 (2000).
[CrossRef]

Maier, T.

R. Folman, P. Krüger, D. Cassettari, B. Hessmo, T. Maier, and J. Schmiedmayer, “Controlling cold atoms using nanofabricated surfaces: atom chips,” Phys. Rev. Lett. 84, 4749–4752 (2000).
[CrossRef]

Maksimov, Y. N.

A. M. Bonch-Bruevich, T. A. Vartanyan, Y. N. Maksimov, S. G. Przhibel’skiĭ, and V. V. Khromov, “Adsorption of cesium atoms at structural defects on sapphire surfaces,” JETP 85, 200–204 (1997).
[CrossRef]

Mankiewich, P. M.

H. G. Craighead, R. E. Howard, L. D. Jackel, and P. M. Mankiewich, “10 nm linewidth electron beam lithography on GsAs,” Appl. Phys. Lett. 42, 38–40 (1983).
[CrossRef]

Marinelli, C.

A. Burchianti, A. Boge, C. Marinelli, E. Mariotti, and L. Moi, “Light-induced atomic desorption and related phenomena,” Phys. Scripta T135014012 (2009).
[CrossRef]

Mariotti, E.

A. Burchianti, A. Boge, C. Marinelli, E. Mariotti, and L. Moi, “Light-induced atomic desorption and related phenomena,” Phys. Scripta T135014012 (2009).
[CrossRef]

Maurin, I.

A. Laliotis, I. Maurin, M. Fichet, D. Bloch, M. Ducloy, N. Balasanyan, A. Sarkisyan, and D. Sarkisyan, “Selective reflection spectroscopy at the interface between a calcium fluoride window and Cs vapour,” Appl. Phys. B 90, 415–420 (2008).
[CrossRef]

Maus-Friedrichs, W.

M. Brause, J. Günster, T. Mayer, B. Braun, V. Puchin, W. Maus-Friedrichs, and V. Kempter, “Cs adsorption on oxide films (Al2O3, MgO, SiO2),” Surf. Sci. 383, 216–225 (1997).
[CrossRef]

Mayer, T.

M. Brause, J. Günster, T. Mayer, B. Braun, V. Puchin, W. Maus-Friedrichs, and V. Kempter, “Cs adsorption on oxide films (Al2O3, MgO, SiO2),” Surf. Sci. 383, 216–225 (1997).
[CrossRef]

McGuirk, J. M.

J. M. McGuirk, D. M. Harber, J. M. Obrecht, and E. A. Cornell, “Alkali–metal adsorbate polarization on conducting and insulating surfaces probed with Bose–Einstein condensates,” Phys. Rev. A 69, 062905 (2004).
[CrossRef]

Melentiev, P. N.

A. E. Afanasiev, P. N. Melentiev, and V. I. Balykin, “Laser-induced quantum adsorption of atoms on a surface,” JETP Lett. 86, 172–177 (2007).
[CrossRef]

Meschede, D.

D. Meschede and H. Metcalf, “Atomic nanofabrication: atomic deposition and lithography by laser and magnetic forces,” J. Phys. D 36, R17–R18 (2003).
[CrossRef]

Metcalf, H.

D. Meschede and H. Metcalf, “Atomic nanofabrication: atomic deposition and lithography by laser and magnetic forces,” J. Phys. D 36, R17–R18 (2003).
[CrossRef]

Moi, L.

A. Burchianti, A. Boge, C. Marinelli, E. Mariotti, and L. Moi, “Light-induced atomic desorption and related phenomena,” Phys. Scripta T135014012 (2009).
[CrossRef]

Nikitin, V. V.

A. M. Akul’shin, V. L. Velichanskĭĭ, A. S. Zibrov, V. V. Nikitin, V. V. Sautenkov, E. K. Yurkin, and N. V. Senkov, “Collisional broadening of intra-Doppler resonances of selective reflection on the D2 line of cesium,” JETP Lett. 36, 303–307 (1983).

Nitche, R.

E. Proehl, R. Nitche, T. Dienel, K. Leo, and T. Fritz, “In situ differential reflectance spectroscopy of thin crystalline films of PTCDA on different subtrates,” Phys. Rev. B 71, 016207 (2005).
[CrossRef]

Obrecht, J. M.

J. M. McGuirk, D. M. Harber, J. M. Obrecht, and E. A. Cornell, “Alkali–metal adsorbate polarization on conducting and insulating surfaces probed with Bose–Einstein condensates,” Phys. Rev. A 69, 062905 (2004).
[CrossRef]

Oriá, M.

T. Passerat de Silans, B. Farias, M. Oriá, and M. Chevrollier, “Laser-induced quantum adsorption of neutral atoms in dielectric surfaces,” Appl. Phys. B 82, 367–371 (2006).
[CrossRef]

M. Chevrollier, M. Oriá, J. G. de Souza, D. Bloch, M. Fichet, and M. Ducloy, “Selective reflection spectroscopy of a resonant vapor at the interface with a metallic layer,” Phys. Rev. E 63, 046610 (2001).
[CrossRef]

M. Chevrollier, M. Fichet, M. Oriá, G. Rahmat, D. Bloch, and M. Ducloy, “High resolution selective reflection spectroscopy as a probe of long-range surface interaction: measurement of the surface van der Waals attraction exerted on excited Cs atoms,” J. Phys. II 2, 631–657 (1992).
[CrossRef]

M. Oriá, M. Chevrollier, D. Bloch, M. Fichet, and M. Ducloy, “Spectral observation of surface-induced van der Waals attraction on atomic vapour,” Europhys. Lett. 14, 527–532 (1991).
[CrossRef]

Passerat de Silans, T.

T. Passerat de Silans, B. Farias, M. Oriá, and M. Chevrollier, “Laser-induced quantum adsorption of neutral atoms in dielectric surfaces,” Appl. Phys. B 82, 367–371 (2006).
[CrossRef]

Proehl, E.

E. Proehl, R. Nitche, T. Dienel, K. Leo, and T. Fritz, “In situ differential reflectance spectroscopy of thin crystalline films of PTCDA on different subtrates,” Phys. Rev. B 71, 016207 (2005).
[CrossRef]

Przhibel’skii, S. G.

A. M. Bonch-Bruevich, T. A. Vartanyan, Y. N. Maksimov, S. G. Przhibel’skiĭ, and V. V. Khromov, “Adsorption of cesium atoms at structural defects on sapphire surfaces,” JETP 85, 200–204 (1997).
[CrossRef]

Przhibel’skiœ, S. G.

A. M. Bonch-Bruevich, T. A. Vartanyan, N. B. Leonov, S. G. Przhibel’skiœ, and V. V. Khromov, “Optical method for measuring structural parameters of island films,” Opt. Spectrosc. 89, 402–407 (2000).
[CrossRef]

Puchin, V.

M. Brause, J. Günster, T. Mayer, B. Braun, V. Puchin, W. Maus-Friedrichs, and V. Kempter, “Cs adsorption on oxide films (Al2O3, MgO, SiO2),” Surf. Sci. 383, 216–225 (1997).
[CrossRef]

Rahmat, G.

M. Chevrollier, M. Fichet, M. Oriá, G. Rahmat, D. Bloch, and M. Ducloy, “High resolution selective reflection spectroscopy as a probe of long-range surface interaction: measurement of the surface van der Waals attraction exerted on excited Cs atoms,” J. Phys. II 2, 631–657 (1992).
[CrossRef]

Rasigni, G.

Rasigni, M.

Rubahn, H.-G.

V. G. Bordo and H.-G. Rubahn, “Nonlinear evanescent wave spectroscopies: a close look at the gas-solid interface,” J. Phys. 19, 10–19 (2005).
[CrossRef]

V. G. Bordo and H.-G. Rubahn, “Laser-controlled adsorption of Na atoms in evanescent wave spectroscopy,” Opt. Express 4, 59–66 (1999).
[CrossRef]

F. Balzer, S. D. Jett, and H.-G. Rubahn, “Alkali cluster films on insulating substrates: comparison between scanning force microscopy and extinction data,” Chem. Phys. Lett. 297, 273–280 (1998).
[CrossRef]

Saltiel, S.

H. Failache, S. Saltiel, M. Fichet, D. Bloch, and M. Ducloy, “Resonant van der Waals repulsion between excited Cs atoms and sapphire surface,” Phys. Rev. Lett. 83, 5467–5470 (1999).
[CrossRef]

Sarkisyan, A.

A. Laliotis, I. Maurin, M. Fichet, D. Bloch, M. Ducloy, N. Balasanyan, A. Sarkisyan, and D. Sarkisyan, “Selective reflection spectroscopy at the interface between a calcium fluoride window and Cs vapour,” Appl. Phys. B 90, 415–420 (2008).
[CrossRef]

Sarkisyan, D.

A. Laliotis, I. Maurin, M. Fichet, D. Bloch, M. Ducloy, N. Balasanyan, A. Sarkisyan, and D. Sarkisyan, “Selective reflection spectroscopy at the interface between a calcium fluoride window and Cs vapour,” Appl. Phys. B 90, 415–420 (2008).
[CrossRef]

Sautenkov, V. A.

V. A. Sautenkov, “Line shapes of atomic transitions in excited dense gas,” Laser Phys. Lett. 8, 771–781 (2011).
[CrossRef]

Sautenkov, V. V.

A. M. Akul’shin, V. L. Velichanskĭĭ, A. S. Zibrov, V. V. Nikitin, V. V. Sautenkov, E. K. Yurkin, and N. V. Senkov, “Collisional broadening of intra-Doppler resonances of selective reflection on the D2 line of cesium,” JETP Lett. 36, 303–307 (1983).

Schmiedmayer, J.

T. Schumm, S. Hofferberth, L. M. Andersson, D. Wildemurth, S. Groth, I. Bar-Joseph, J. Schmiedmayer, and P. Krüger, “Matter-wave interferometry in a double well on an atom chip,” Nat. Phys. 1, 57–62 (2005).
[CrossRef]

R. Folman, P. Krüger, D. Cassettari, B. Hessmo, T. Maier, and J. Schmiedmayer, “Controlling cold atoms using nanofabricated surfaces: atom chips,” Phys. Rev. Lett. 84, 4749–4752 (2000).
[CrossRef]

Schumm, T.

T. Schumm, S. Hofferberth, L. M. Andersson, D. Wildemurth, S. Groth, I. Bar-Joseph, J. Schmiedmayer, and P. Krüger, “Matter-wave interferometry in a double well on an atom chip,” Nat. Phys. 1, 57–62 (2005).
[CrossRef]

Senkov, N. V.

A. M. Akul’shin, V. L. Velichanskĭĭ, A. S. Zibrov, V. V. Nikitin, V. V. Sautenkov, E. K. Yurkin, and N. V. Senkov, “Collisional broadening of intra-Doppler resonances of selective reflection on the D2 line of cesium,” JETP Lett. 36, 303–307 (1983).

Tomlin, S. G.

S. G. Tomlin, “Optical reflection and transmission formulae for thin films,” J. Phys. D 1, 1667–1671 (1968).
[CrossRef]

Träger, F.

T. A. Vartanyan and F. Träger, “Line shapes of resonances recorded in selective reflection: influence of an antireflection coating,” Opt. Commun. 110, 315–320 (1994).
[CrossRef]

Vartanyan, T. A.

A. M. Bonch-Bruevich, T. A. Vartanyan, N. B. Leonov, S. G. Przhibel’skiœ, and V. V. Khromov, “Optical method for measuring structural parameters of island films,” Opt. Spectrosc. 89, 402–407 (2000).
[CrossRef]

A. M. Bonch-Bruevich, T. A. Vartanyan, Y. N. Maksimov, S. G. Przhibel’skiĭ, and V. V. Khromov, “Adsorption of cesium atoms at structural defects on sapphire surfaces,” JETP 85, 200–204 (1997).
[CrossRef]

T. A. Vartanyan and F. Träger, “Line shapes of resonances recorded in selective reflection: influence of an antireflection coating,” Opt. Commun. 110, 315–320 (1994).
[CrossRef]

Velichanskii, V. L.

A. M. Akul’shin, V. L. Velichanskĭĭ, A. S. Zibrov, V. V. Nikitin, V. V. Sautenkov, E. K. Yurkin, and N. V. Senkov, “Collisional broadening of intra-Doppler resonances of selective reflection on the D2 line of cesium,” JETP Lett. 36, 303–307 (1983).

Wildemurth, D.

T. Schumm, S. Hofferberth, L. M. Andersson, D. Wildemurth, S. Groth, I. Bar-Joseph, J. Schmiedmayer, and P. Krüger, “Matter-wave interferometry in a double well on an atom chip,” Nat. Phys. 1, 57–62 (2005).
[CrossRef]

Yurkin, E. K.

A. M. Akul’shin, V. L. Velichanskĭĭ, A. S. Zibrov, V. V. Nikitin, V. V. Sautenkov, E. K. Yurkin, and N. V. Senkov, “Collisional broadening of intra-Doppler resonances of selective reflection on the D2 line of cesium,” JETP Lett. 36, 303–307 (1983).

Zibrov, A. S.

A. M. Akul’shin, V. L. Velichanskĭĭ, A. S. Zibrov, V. V. Nikitin, V. V. Sautenkov, E. K. Yurkin, and N. V. Senkov, “Collisional broadening of intra-Doppler resonances of selective reflection on the D2 line of cesium,” JETP Lett. 36, 303–307 (1983).

Appl. Phys. B (2)

T. Passerat de Silans, B. Farias, M. Oriá, and M. Chevrollier, “Laser-induced quantum adsorption of neutral atoms in dielectric surfaces,” Appl. Phys. B 82, 367–371 (2006).
[CrossRef]

A. Laliotis, I. Maurin, M. Fichet, D. Bloch, M. Ducloy, N. Balasanyan, A. Sarkisyan, and D. Sarkisyan, “Selective reflection spectroscopy at the interface between a calcium fluoride window and Cs vapour,” Appl. Phys. B 90, 415–420 (2008).
[CrossRef]

Appl. Phys. Lett. (3)

H. G. Craighead, R. E. Howard, L. D. Jackel, and P. M. Mankiewich, “10 nm linewidth electron beam lithography on GsAs,” Appl. Phys. Lett. 42, 38–40 (1983).
[CrossRef]

W. Chen and H. Ahmed, “Fabrication of 5–7 nm wide etched line in silicon using 100 keV electron beam lithography and polymethylmethacrylate resist,” Appl. Phys. Lett. 62, 1499–1501 (1993).
[CrossRef]

V. Bouchiat and D. Esteve, “Liftoff lithography using an atomic force microscope,” Appl. Phys. Lett. 69, 3098–3100 (1996).
[CrossRef]

Chem. Phys. Lett. (1)

F. Balzer, S. D. Jett, and H.-G. Rubahn, “Alkali cluster films on insulating substrates: comparison between scanning force microscopy and extinction data,” Chem. Phys. Lett. 297, 273–280 (1998).
[CrossRef]

Eur. Phys. J. D (1)

M.-P. Gorza and M. Ducloy, “Van der Waals interactions between atoms and dispersive surfaces at finite temperature,” Eur. Phys. J. D 40, 343–356 (2006).
[CrossRef]

Europhys. Lett. (1)

M. Oriá, M. Chevrollier, D. Bloch, M. Fichet, and M. Ducloy, “Spectral observation of surface-induced van der Waals attraction on atomic vapour,” Europhys. Lett. 14, 527–532 (1991).
[CrossRef]

J. Opt. Soc. Am. (1)

J. Phys. (1)

V. G. Bordo and H.-G. Rubahn, “Nonlinear evanescent wave spectroscopies: a close look at the gas-solid interface,” J. Phys. 19, 10–19 (2005).
[CrossRef]

J. Phys. D (2)

D. Meschede and H. Metcalf, “Atomic nanofabrication: atomic deposition and lithography by laser and magnetic forces,” J. Phys. D 36, R17–R18 (2003).
[CrossRef]

S. G. Tomlin, “Optical reflection and transmission formulae for thin films,” J. Phys. D 1, 1667–1671 (1968).
[CrossRef]

J. Phys. II (2)

M. Ducloy and M. Fichet, “General theory of frequency modulated selective reflection: influence of atom surface interactions,” J. Phys. II 1, 1429–1446 (1991).
[CrossRef]

M. Chevrollier, M. Fichet, M. Oriá, G. Rahmat, D. Bloch, and M. Ducloy, “High resolution selective reflection spectroscopy as a probe of long-range surface interaction: measurement of the surface van der Waals attraction exerted on excited Cs atoms,” J. Phys. II 2, 631–657 (1992).
[CrossRef]

JETP (1)

A. M. Bonch-Bruevich, T. A. Vartanyan, Y. N. Maksimov, S. G. Przhibel’skiĭ, and V. V. Khromov, “Adsorption of cesium atoms at structural defects on sapphire surfaces,” JETP 85, 200–204 (1997).
[CrossRef]

JETP Lett. (2)

A. E. Afanasiev, P. N. Melentiev, and V. I. Balykin, “Laser-induced quantum adsorption of atoms on a surface,” JETP Lett. 86, 172–177 (2007).
[CrossRef]

A. M. Akul’shin, V. L. Velichanskĭĭ, A. S. Zibrov, V. V. Nikitin, V. V. Sautenkov, E. K. Yurkin, and N. V. Senkov, “Collisional broadening of intra-Doppler resonances of selective reflection on the D2 line of cesium,” JETP Lett. 36, 303–307 (1983).

Laser Phys. (1)

P. C. de S. Segundo, I. Hamdi, M. Fichet, D. Bloch, and M. Ducloy, “Selective reflection spectroscopy on the UV third-resonance line of Cs: simultaneous probing of a van der Waals atom-surface interaction sensitive to far IR couplings and interatomic collisions,” Laser Phys. 17, 983–992 (2007).
[CrossRef]

Laser Phys. Lett. (1)

V. A. Sautenkov, “Line shapes of atomic transitions in excited dense gas,” Laser Phys. Lett. 8, 771–781 (2011).
[CrossRef]

Nat. Phys. (1)

T. Schumm, S. Hofferberth, L. M. Andersson, D. Wildemurth, S. Groth, I. Bar-Joseph, J. Schmiedmayer, and P. Krüger, “Matter-wave interferometry in a double well on an atom chip,” Nat. Phys. 1, 57–62 (2005).
[CrossRef]

Opt. Commun. (1)

T. A. Vartanyan and F. Träger, “Line shapes of resonances recorded in selective reflection: influence of an antireflection coating,” Opt. Commun. 110, 315–320 (1994).
[CrossRef]

Opt. Express (1)

Opt. Spectrosc. (1)

A. M. Bonch-Bruevich, T. A. Vartanyan, N. B. Leonov, S. G. Przhibel’skiœ, and V. V. Khromov, “Optical method for measuring structural parameters of island films,” Opt. Spectrosc. 89, 402–407 (2000).
[CrossRef]

Phys. Rev. A (1)

J. M. McGuirk, D. M. Harber, J. M. Obrecht, and E. A. Cornell, “Alkali–metal adsorbate polarization on conducting and insulating surfaces probed with Bose–Einstein condensates,” Phys. Rev. A 69, 062905 (2004).
[CrossRef]

Phys. Rev. B (1)

E. Proehl, R. Nitche, T. Dienel, K. Leo, and T. Fritz, “In situ differential reflectance spectroscopy of thin crystalline films of PTCDA on different subtrates,” Phys. Rev. B 71, 016207 (2005).
[CrossRef]

Phys. Rev. E (1)

M. Chevrollier, M. Oriá, J. G. de Souza, D. Bloch, M. Fichet, and M. Ducloy, “Selective reflection spectroscopy of a resonant vapor at the interface with a metallic layer,” Phys. Rev. E 63, 046610 (2001).
[CrossRef]

Phys. Rev. Lett. (2)

H. Failache, S. Saltiel, M. Fichet, D. Bloch, and M. Ducloy, “Resonant van der Waals repulsion between excited Cs atoms and sapphire surface,” Phys. Rev. Lett. 83, 5467–5470 (1999).
[CrossRef]

R. Folman, P. Krüger, D. Cassettari, B. Hessmo, T. Maier, and J. Schmiedmayer, “Controlling cold atoms using nanofabricated surfaces: atom chips,” Phys. Rev. Lett. 84, 4749–4752 (2000).
[CrossRef]

Phys. Scripta (1)

A. Burchianti, A. Boge, C. Marinelli, E. Mariotti, and L. Moi, “Light-induced atomic desorption and related phenomena,” Phys. Scripta T135014012 (2009).
[CrossRef]

Surf. Sci. (1)

M. Brause, J. Günster, T. Mayer, B. Braun, V. Puchin, W. Maus-Friedrichs, and V. Kempter, “Cs adsorption on oxide films (Al2O3, MgO, SiO2),” Surf. Sci. 383, 216–225 (1997).
[CrossRef]

Other (2)

Notice that part of the He–Ne laser might be absorbed by Cs2 formed by three-atom collisions at those densities. Since the atomic density is not modified during the experiment, the Cs2 absorption does not influence the thickness measurement.

T. Inagaki and E. T. Arakawa, “Cesium(Cs),” in Handbook of Optical Constants of Solids, E. P. Palik, ed. (Academic, 1988), pp. 341–350.

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Figures (5)

Fig. 1.
Fig. 1.

Theoretical FM-SR spectra as a function of the detuning normalized by the homogeneous linewidth (δ/Γ). The spectra were calculated (a) for different values of parameter A in the absence of metallic film (L=0) and (b) in the absence of vW interaction (A=0) and for different film thicknesses (values of kL).

Fig. 2.
Fig. 2.

Experimental setup scheme. The near-resonant pump beam induces the metallic film growth (the angle of incidence is enhanced for visualization). The FM-SR and the He–Ne laser are sent perpendicular to the sapphire window internal surface. The reflected FM-SR beam is detected and sent to the homodyne detection apparatus. The transmitted He–Ne beam is used as a second measurement of the film thickness. PD1 and PD2 are photodetectors.

Fig. 3.
Fig. 3.

Change of the FM-SR spectra during the metallic thin film growth. Experimental spectra for four different film thicknesses are shown in solid (black) lines. The respective theoretical fits are shown in dashed (red) lines. The film thicknesses are measured using the He–Ne laser transmission.

Fig. 4.
Fig. 4.

Quadratic error as a function of (a) the vW coefficient C3 and (b) the film thickness L, which are obtained from the fitting of different theoretical curves to an experimental spectrum. The film thickness for this spectrum was measured with He–Ne beam transmission to be 28 nm. (c) Evolution of the thickness during film growth, obtained from fitting FM-SR spectra and from He–Ne transmission. (d) Gray scale plot of the quadratic error as a function of the vW coefficient C3 and of the film thickness obtained from fitting distinct theoretical curves to experimental FM-SR spectra. Those spectra correspond to thicknesses of (d) 8 nm, (e) 28 nm, and (f) 48 nm, measured from He–Ne transmission. The dashed horizontal line indicates the theoretical prediction for C3 (C3=1.2kHzμm3 [15]).

Fig. 5.
Fig. 5.

Changes of (a) the transition homogeneous width Γ, (b) the pressure shift, and (c) the atomic density in the surface vicinity, obtained from fitting theoretical FM-SR curves to experimental spectra, as a function of the film thickness obtained from measuring He–Ne transmission.

Equations (3)

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χ=2ikNμϵ0E0dzdvzW(vz)σge(z,vz)exp(2ikz),
ΔR=2R0Re(Fδn),
F(L)=8n1n22e2in2kL(1+n2)2(n22n12)+2e2in2kL(1n22)(n22+n12)+e4in2kL(1n2)2(n22n12).

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