Abstract
This paper describes a custom, material-type-independent
laser-triangulation-based measurement
system that utilizes a high-quality
ultraviolet laser beam. Laser structuring applications demand material surface
alignment regarding the laser focus position, where fabrication conditions are
optimal. Robust alignment of various material types was solved by introducing
dynamic symmetrical pattern
projection, and a “double
curve fitting” centroid detection algorithm with subsurface scattering
compensation. Experimental results have shown that the measurement system proves
robust to laser intensity variation, with measurement bias lower than
50 μm and standard deviation lower than for all materials. The developed probe has been
integrated into a PCB prototyping system for material referencing purposes.
© 2013 Optical Society of America
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