C. Towers, D. Towers, and J. Jones, “Absolute fringe order calculation using optimised multi-frequency selection in full-field profilometry,” Opt. Lasers Eng. 43, 788–800 (2005).

[CrossRef]

S. Seebacher, W. Osten, T. Baumbach, and W. Jüptner, “The determination of material parameters of microcomponents using digital holography,” Opt. Lasers Eng. 36, 103–126 (2001).

[CrossRef]

I. Yamaguchi, S. Ohta, and J. Kato, “Surface contouring by phase-shifting digital holography,” Opt. Lasers Eng. 36, 417–428 (2001).

[CrossRef]

C. Wagner, W. Osten, and S. Seebacher, “Direct shape measurement by digital wavefront reconstruction and multi-wavelength contouring,” Opt. Eng. 39, 79–85 (2000).

[CrossRef]

C. Wykes, “De-correlation effects in speckle-pattern interferometry. 1. wavelength change dependent de-correlation with application to contouring and surface roughness measurement,” J. Mod. Opt. 24, 517–532 (1977).

[CrossRef]

N. George and A. Jain, “Space and wavelength dependence of speckle intensity,” Appl. Phys. A 4, 201–212 (1974).

[CrossRef]

D. Tichenor and J. Goodman, “Coherent transfer function,” J. Opt. Soc. Am. A 62, 293–295 (1972).

[CrossRef]

K. Haines and B. P. Hildebrand, “Contour generation by wavefront reconstruction,” Phys. Lett. 19, 10–11 (1965).

[CrossRef]

S. Seebacher, W. Osten, T. Baumbach, and W. Jüptner, “The determination of material parameters of microcomponents using digital holography,” Opt. Lasers Eng. 36, 103–126 (2001).

[CrossRef]

T. Colomb, J. Kühn, F. Charrière, C. Depeursinge, P. Marquet, and N. Aspert, “Total aberrations compensation in digital holographic microscopy with a reference conjugated hologram,” Opt. Express 14, 4300–4306 (2006).

[CrossRef]

E. Cuche, P. Marquet, and C. Depeursinge, “Simultaneous amplitude-contrast and quantitative phase-contrast microscopy by numerical reconstruction of Fresnel off-axis holograms,” Appl. Opt. 38, 6994–7001 (1999).

[CrossRef]

N. George and A. Jain, “Space and wavelength dependence of speckle intensity,” Appl. Phys. A 4, 201–212 (1974).

[CrossRef]

D. Tichenor and J. Goodman, “Coherent transfer function,” J. Opt. Soc. Am. A 62, 293–295 (1972).

[CrossRef]

J. Goodman, “Statistical properties of laser speckle patterns,” in Laser Speckle and related Phenomena, J. Dainty, ed. (Springer, 1975), pp. 9–75.

J. W. Goodman, Introduction To Fourier Optics, 2nd ed. (McGraw-Hill, 1996).

K. Haines and B. P. Hildebrand, “Contour generation by wavefront reconstruction,” Phys. Lett. 19, 10–11 (1965).

[CrossRef]

K. Haines and B. P. Hildebrand, “Contour generation by wavefront reconstruction,” Phys. Lett. 19, 10–11 (1965).

[CrossRef]

N. George and A. Jain, “Space and wavelength dependence of speckle intensity,” Appl. Phys. A 4, 201–212 (1974).

[CrossRef]

C. Towers, D. Towers, and J. Jones, “Absolute fringe order calculation using optimised multi-frequency selection in full-field profilometry,” Opt. Lasers Eng. 43, 788–800 (2005).

[CrossRef]

S. Seebacher, W. Osten, T. Baumbach, and W. Jüptner, “The determination of material parameters of microcomponents using digital holography,” Opt. Lasers Eng. 36, 103–126 (2001).

[CrossRef]

U. Schnars and W. Jüptner, Digital Holography (Springer, 2005).

I. Yamaguchi, S. Ohta, and J. Kato, “Surface contouring by phase-shifting digital holography,” Opt. Lasers Eng. 36, 417–428 (2001).

[CrossRef]

T. Colomb, J. Kühn, F. Charrière, C. Depeursinge, P. Marquet, and N. Aspert, “Total aberrations compensation in digital holographic microscopy with a reference conjugated hologram,” Opt. Express 14, 4300–4306 (2006).

[CrossRef]

E. Cuche, P. Marquet, and C. Depeursinge, “Simultaneous amplitude-contrast and quantitative phase-contrast microscopy by numerical reconstruction of Fresnel off-axis holograms,” Appl. Opt. 38, 6994–7001 (1999).

[CrossRef]

I. Yamaguchi, S. Ohta, and J. Kato, “Surface contouring by phase-shifting digital holography,” Opt. Lasers Eng. 36, 417–428 (2001).

[CrossRef]

S. Seebacher, W. Osten, T. Baumbach, and W. Jüptner, “The determination of material parameters of microcomponents using digital holography,” Opt. Lasers Eng. 36, 103–126 (2001).

[CrossRef]

C. Wagner, W. Osten, and S. Seebacher, “Direct shape measurement by digital wavefront reconstruction and multi-wavelength contouring,” Opt. Eng. 39, 79–85 (2000).

[CrossRef]

U. Schnars and W. Jüptner, Digital Holography (Springer, 2005).

S. Seebacher, W. Osten, T. Baumbach, and W. Jüptner, “The determination of material parameters of microcomponents using digital holography,” Opt. Lasers Eng. 36, 103–126 (2001).

[CrossRef]

C. Wagner, W. Osten, and S. Seebacher, “Direct shape measurement by digital wavefront reconstruction and multi-wavelength contouring,” Opt. Eng. 39, 79–85 (2000).

[CrossRef]

D. Tichenor and J. Goodman, “Coherent transfer function,” J. Opt. Soc. Am. A 62, 293–295 (1972).

[CrossRef]

C. Towers, D. Towers, and J. Jones, “Absolute fringe order calculation using optimised multi-frequency selection in full-field profilometry,” Opt. Lasers Eng. 43, 788–800 (2005).

[CrossRef]

C. Towers, D. Towers, and J. Jones, “Absolute fringe order calculation using optimised multi-frequency selection in full-field profilometry,” Opt. Lasers Eng. 43, 788–800 (2005).

[CrossRef]

C. Wagner, W. Osten, and S. Seebacher, “Direct shape measurement by digital wavefront reconstruction and multi-wavelength contouring,” Opt. Eng. 39, 79–85 (2000).

[CrossRef]

C. Wykes, “De-correlation effects in speckle-pattern interferometry. 1. wavelength change dependent de-correlation with application to contouring and surface roughness measurement,” J. Mod. Opt. 24, 517–532 (1977).

[CrossRef]

I. Yamaguchi, S. Ohta, and J. Kato, “Surface contouring by phase-shifting digital holography,” Opt. Lasers Eng. 36, 417–428 (2001).

[CrossRef]

E. Cuche, P. Marquet, and C. Depeursinge, “Simultaneous amplitude-contrast and quantitative phase-contrast microscopy by numerical reconstruction of Fresnel off-axis holograms,” Appl. Opt. 38, 6994–7001 (1999).

[CrossRef]

P. Ferraro, S. D. Nicola, A. Finizio, G. Coppola, S. Grilli, C. Magro, and G. Pierattini, “Compensation of the inherent wave front curvature in digital holographic coherent microscopy for quantitative phase-contrast imaging,” Appl. Opt. 42, 1938–1946 (2003).

[CrossRef]

N. George and A. Jain, “Space and wavelength dependence of speckle intensity,” Appl. Phys. A 4, 201–212 (1974).

[CrossRef]

C. Wykes, “De-correlation effects in speckle-pattern interferometry. 1. wavelength change dependent de-correlation with application to contouring and surface roughness measurement,” J. Mod. Opt. 24, 517–532 (1977).

[CrossRef]

C. Wagner, W. Osten, and S. Seebacher, “Direct shape measurement by digital wavefront reconstruction and multi-wavelength contouring,” Opt. Eng. 39, 79–85 (2000).

[CrossRef]

S. Seebacher, W. Osten, T. Baumbach, and W. Jüptner, “The determination of material parameters of microcomponents using digital holography,” Opt. Lasers Eng. 36, 103–126 (2001).

[CrossRef]

I. Yamaguchi, S. Ohta, and J. Kato, “Surface contouring by phase-shifting digital holography,” Opt. Lasers Eng. 36, 417–428 (2001).

[CrossRef]

C. Towers, D. Towers, and J. Jones, “Absolute fringe order calculation using optimised multi-frequency selection in full-field profilometry,” Opt. Lasers Eng. 43, 788–800 (2005).

[CrossRef]

K. Haines and B. P. Hildebrand, “Contour generation by wavefront reconstruction,” Phys. Lett. 19, 10–11 (1965).

[CrossRef]

U. Schnars and W. Jüptner, Digital Holography (Springer, 2005).

J. W. Goodman, Introduction To Fourier Optics, 2nd ed. (McGraw-Hill, 1996).

J. Goodman, “Statistical properties of laser speckle patterns,” in Laser Speckle and related Phenomena, J. Dainty, ed. (Springer, 1975), pp. 9–75.