Abstract

We present a simple technique for simultaneous determination of thickness and refractive index of plane-parallel samples in the terahertz radiation domain. The technique uses time-of-flight measurements of the terahertz pulse. It has been employed on nine different polymers and semiconductor materials, which are transparent for terahertz frequencies. Our results of thickness measurement are in good agreement with micrometer reading. The accuracy in the determination of refractive index is on the order of two decimal points.

© 2012 Optical Society of America

Full Article  |  PDF Article
OSA Recommended Articles
Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement

Federico Sanjuan, Alexander Bockelt, and Borja Vidal
Appl. Opt. 53(22) 4910-4913 (2014)

A terahertz time-domain spectrometer for simultaneous transmission and reflection measurements at normal incidence

Fabian D. J. Brunner, Arno Schneider, and Peter Günter
Opt. Express 17(23) 20684-20693 (2009)

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Figures (6)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Tables (1)

You do not have subscription access to this journal. Article tables are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Equations (5)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Metrics

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription