S. Ri, T. Muramatsu, M. Saka, K. Nanbara, and D. Kobayashi, “Accuracy of the sampling moiré method and its application to deflection measurements of large-scale structures,” Exp. Mech. 52, 331–340 (2012).

[Crossref]

M. Fujigaki, K. Shimo, A. Masaya, and Y. Morimoto, “Dynamic shape and strain measurements of rotating tire using a sampling moiré method,” Opt. Eng. 50, 101506(2011).

[Crossref]

S. Ri and T. Muramatsu, “A simple technique for measuring thickness distribution of transparent plates from a single image by using the sampling moiré method,” Meas. Sci. Technol. 21, 025305 (2010).

[Crossref]

L. Huang, Q. Kemao, B. Pan, and A. K. Asundi, “Comparison of Fourier transform, windowed Fourier transform, and wavelet transform methods for phase extraction from a single fringe pattern in fringe projection profilometry,” Opt. Lasers Eng. 48, 141–148 (2010).

[Crossref]

S. Ri, M. Fujigaki, and Y. Morimoto, “Sampling moiré method for accurate small deformation distribution measurement,” Exp. Mech. 50, 501–508 (2010).

[Crossref]

S. Zhang, “Recent progresses on real-time 3-D shape measurement using digital fringe projection techniques,” Opt. Lasers Eng. 48, 149–158 (2010).

[Crossref]

Y. Morimoto, M. Fujigaki, A. Masaya, H. Kondo, and T. Inuzuka, “Accurate displacement measurement for landslide prediction by sampling moiré method,” Adv. Mater. Res. 79–82, 1731–1734 (2009).

[Crossref]

Q. Kemao, “Two-dimensional windowed Fourier transform for fringe pattern analysis: principles, applications, and implementations,” Opt. Lasers Eng. 45, 304–317 (2007).

[Crossref]

X. Su and W. Chen, “Fourier transform profilometry: a review,” Opt. Laser Eng. 35, 263–284 (2001).

[Crossref]

P. Hariharan, “Phase-shifting interferometry: minimization of systematic errors,” Opt. Eng. 39, 967–969 (2000).

[Crossref]

Y. Arai, S. Yokozeki, K. Shiraki, and T. Yamada, “High precision two-dimensional spatial fringe analysis method,” J. Mod. Opt. 44, 739–751 (1997).

[Crossref]

Y. Morimoto and M. Fujisawa, “Fringe pattern analysis by a phase-shifting method using Fourier transform,” Opt. Eng. 33, 224–231 (1994).

M. Kujawinska and J. Wojciak, “Spatial-carrier phase shifting technique of fringe pattern analysis,” Proc SPIE 1508, 61–67 (1991).

[Crossref]

Y. Arai, S. Yokozeki, K. Shiraki, and T. Yamada, “High precision two-dimensional spatial fringe analysis method,” J. Mod. Opt. 44, 739–751 (1997).

[Crossref]

L. Huang, Q. Kemao, B. Pan, and A. K. Asundi, “Comparison of Fourier transform, windowed Fourier transform, and wavelet transform methods for phase extraction from a single fringe pattern in fringe projection profilometry,” Opt. Lasers Eng. 48, 141–148 (2010).

[Crossref]

P. H. Chan, P. J. Bryanston-Cross, and S. C. Parker, “Spatial phase stepping method of fringe-pattern analysis,” Opt. Lasers Eng. 23, 343–354 (1995).

[Crossref]

P. H. Chan, P. J. Bryanston-Cross, and S. C. Parker, “Spatial phase stepping method of fringe-pattern analysis,” Opt. Lasers Eng. 23, 343–354 (1995).

[Crossref]

X. Su and W. Chen, “Fourier transform profilometry: a review,” Opt. Laser Eng. 35, 263–284 (2001).

[Crossref]

M. Fujigaki, K. Shimo, A. Masaya, and Y. Morimoto, “Dynamic shape and strain measurements of rotating tire using a sampling moiré method,” Opt. Eng. 50, 101506(2011).

[Crossref]

S. Ri, M. Fujigaki, and Y. Morimoto, “Sampling moiré method for accurate small deformation distribution measurement,” Exp. Mech. 50, 501–508 (2010).

[Crossref]

Y. Morimoto, M. Fujigaki, A. Masaya, H. Kondo, and T. Inuzuka, “Accurate displacement measurement for landslide prediction by sampling moiré method,” Adv. Mater. Res. 79–82, 1731–1734 (2009).

[Crossref]

S. Ri, M. Fujigaki, T. Matui, and Y. Morimoto, “Accurate pixel-to-pixel correspondence adjustment in a digital micromirror device camera by using the phase-shifting moiré method,” Appl. Opt. 45, 6940–6946 (2006).

[Crossref]

Y. Morimoto and M. Fujisawa, “Fringe pattern analysis by a phase-shifting method using Fourier transform,” Opt. Eng. 33, 224–231 (1994).

L. Huang, Q. Kemao, B. Pan, and A. K. Asundi, “Comparison of Fourier transform, windowed Fourier transform, and wavelet transform methods for phase extraction from a single fringe pattern in fringe projection profilometry,” Opt. Lasers Eng. 48, 141–148 (2010).

[Crossref]

Y. Morimoto, M. Fujigaki, A. Masaya, H. Kondo, and T. Inuzuka, “Accurate displacement measurement for landslide prediction by sampling moiré method,” Adv. Mater. Res. 79–82, 1731–1734 (2009).

[Crossref]

L. Huang, Q. Kemao, B. Pan, and A. K. Asundi, “Comparison of Fourier transform, windowed Fourier transform, and wavelet transform methods for phase extraction from a single fringe pattern in fringe projection profilometry,” Opt. Lasers Eng. 48, 141–148 (2010).

[Crossref]

Q. Kemao, “Two-dimensional windowed Fourier transform for fringe pattern analysis: principles, applications, and implementations,” Opt. Lasers Eng. 45, 304–317 (2007).

[Crossref]

Q. Kemao, “Windowed Fourier transform for fringe pattern analysis,” Appl. Opt. 43, 2695–2702 (2004).

[Crossref]

S. Ri, T. Muramatsu, M. Saka, K. Nanbara, and D. Kobayashi, “Accuracy of the sampling moiré method and its application to deflection measurements of large-scale structures,” Exp. Mech. 52, 331–340 (2012).

[Crossref]

J. Endo, J. Chen, D. Kobayashi, Y. Wada, and H. Fujita, “Transmission laser microscope using the phase-shifting technique and its application to measurement of optical waveguides,” Appl. Opt. 41, 1308–1314 (2002).

[Crossref]

Y. Morimoto, M. Fujigaki, A. Masaya, H. Kondo, and T. Inuzuka, “Accurate displacement measurement for landslide prediction by sampling moiré method,” Adv. Mater. Res. 79–82, 1731–1734 (2009).

[Crossref]

M. Kujawinska and J. Wojciak, “Spatial-carrier phase shifting technique of fringe pattern analysis,” Proc SPIE 1508, 61–67 (1991).

[Crossref]

M. Fujigaki, K. Shimo, A. Masaya, and Y. Morimoto, “Dynamic shape and strain measurements of rotating tire using a sampling moiré method,” Opt. Eng. 50, 101506(2011).

[Crossref]

Y. Morimoto, M. Fujigaki, A. Masaya, H. Kondo, and T. Inuzuka, “Accurate displacement measurement for landslide prediction by sampling moiré method,” Adv. Mater. Res. 79–82, 1731–1734 (2009).

[Crossref]

M. Fujigaki, K. Shimo, A. Masaya, and Y. Morimoto, “Dynamic shape and strain measurements of rotating tire using a sampling moiré method,” Opt. Eng. 50, 101506(2011).

[Crossref]

S. Ri, M. Fujigaki, and Y. Morimoto, “Sampling moiré method for accurate small deformation distribution measurement,” Exp. Mech. 50, 501–508 (2010).

[Crossref]

Y. Morimoto, M. Fujigaki, A. Masaya, H. Kondo, and T. Inuzuka, “Accurate displacement measurement for landslide prediction by sampling moiré method,” Adv. Mater. Res. 79–82, 1731–1734 (2009).

[Crossref]

S. Ri, M. Fujigaki, T. Matui, and Y. Morimoto, “Accurate pixel-to-pixel correspondence adjustment in a digital micromirror device camera by using the phase-shifting moiré method,” Appl. Opt. 45, 6940–6946 (2006).

[Crossref]

Y. Morimoto and M. Fujisawa, “Fringe pattern analysis by a phase-shifting method using Fourier transform,” Opt. Eng. 33, 224–231 (1994).

S. Ri, T. Muramatsu, M. Saka, K. Nanbara, and D. Kobayashi, “Accuracy of the sampling moiré method and its application to deflection measurements of large-scale structures,” Exp. Mech. 52, 331–340 (2012).

[Crossref]

S. Ri and T. Muramatsu, “A simple technique for measuring thickness distribution of transparent plates from a single image by using the sampling moiré method,” Meas. Sci. Technol. 21, 025305 (2010).

[Crossref]

S. Ri, T. Muramatsu, M. Saka, K. Nanbara, and D. Kobayashi, “Accuracy of the sampling moiré method and its application to deflection measurements of large-scale structures,” Exp. Mech. 52, 331–340 (2012).

[Crossref]

L. Huang, Q. Kemao, B. Pan, and A. K. Asundi, “Comparison of Fourier transform, windowed Fourier transform, and wavelet transform methods for phase extraction from a single fringe pattern in fringe projection profilometry,” Opt. Lasers Eng. 48, 141–148 (2010).

[Crossref]

P. H. Chan, P. J. Bryanston-Cross, and S. C. Parker, “Spatial phase stepping method of fringe-pattern analysis,” Opt. Lasers Eng. 23, 343–354 (1995).

[Crossref]

S. Ri, T. Muramatsu, M. Saka, K. Nanbara, and D. Kobayashi, “Accuracy of the sampling moiré method and its application to deflection measurements of large-scale structures,” Exp. Mech. 52, 331–340 (2012).

[Crossref]

S. Ri, M. Fujigaki, and Y. Morimoto, “Sampling moiré method for accurate small deformation distribution measurement,” Exp. Mech. 50, 501–508 (2010).

[Crossref]

S. Ri and T. Muramatsu, “A simple technique for measuring thickness distribution of transparent plates from a single image by using the sampling moiré method,” Meas. Sci. Technol. 21, 025305 (2010).

[Crossref]

S. Ri, M. Fujigaki, T. Matui, and Y. Morimoto, “Accurate pixel-to-pixel correspondence adjustment in a digital micromirror device camera by using the phase-shifting moiré method,” Appl. Opt. 45, 6940–6946 (2006).

[Crossref]

S. Ri, T. Muramatsu, M. Saka, K. Nanbara, and D. Kobayashi, “Accuracy of the sampling moiré method and its application to deflection measurements of large-scale structures,” Exp. Mech. 52, 331–340 (2012).

[Crossref]

M. Fujigaki, K. Shimo, A. Masaya, and Y. Morimoto, “Dynamic shape and strain measurements of rotating tire using a sampling moiré method,” Opt. Eng. 50, 101506(2011).

[Crossref]

Y. Arai, S. Yokozeki, K. Shiraki, and T. Yamada, “High precision two-dimensional spatial fringe analysis method,” J. Mod. Opt. 44, 739–751 (1997).

[Crossref]

X. Su and W. Chen, “Fourier transform profilometry: a review,” Opt. Laser Eng. 35, 263–284 (2001).

[Crossref]

M. Kujawinska and J. Wojciak, “Spatial-carrier phase shifting technique of fringe pattern analysis,” Proc SPIE 1508, 61–67 (1991).

[Crossref]

Y. Arai, S. Yokozeki, K. Shiraki, and T. Yamada, “High precision two-dimensional spatial fringe analysis method,” J. Mod. Opt. 44, 739–751 (1997).

[Crossref]

Y. Arai, S. Yokozeki, K. Shiraki, and T. Yamada, “High precision two-dimensional spatial fringe analysis method,” J. Mod. Opt. 44, 739–751 (1997).

[Crossref]

S. Zhang, “Recent progresses on real-time 3-D shape measurement using digital fringe projection techniques,” Opt. Lasers Eng. 48, 149–158 (2010).

[Crossref]

Y. Morimoto, M. Fujigaki, A. Masaya, H. Kondo, and T. Inuzuka, “Accurate displacement measurement for landslide prediction by sampling moiré method,” Adv. Mater. Res. 79–82, 1731–1734 (2009).

[Crossref]

V. Srinivasan, H. C. Liu, and M. Halioua, “Automated phase-measuring profilometry of 3-D diffuse objects,” Appl. Opt. 23, 3105–3108 (1984).

[Crossref]

J. Endo, J. Chen, D. Kobayashi, Y. Wada, and H. Fujita, “Transmission laser microscope using the phase-shifting technique and its application to measurement of optical waveguides,” Appl. Opt. 41, 1308–1314 (2002).

[Crossref]

M. Takeda and K. Mutoh, “Fourier transform profilometry for the automatic measurement of 3-D object shapes,” Appl. Opt. 22, 3977–3982 (1983).

[Crossref]

J. H. Bruning, D. R. Herriott, J. E. Gallagher, D. P. Rosenfeld, A. D. White, and D. J. Brangaccio, “Digital wavefront measuring interferometer for testing optical surface and lenses,” Appl. Opt. 13, 2693–2703 (1974).

[Crossref]

P. Hariharan, B. F. Oreb, and T. Eiju, “Digital phase-shifting interferometry: a simple error-compensation phase calculating algorithm,” Appl. Opt. 26, 2504–2506 (1987).

[Crossref]

P. D. Groot, “Derivation of algorithms for phase-shifting interferometry using the concept of a data-sampling window,” Appl. Opt. 34, 4723–4730 (1995).

[Crossref]

J. Zong and J. Weng, “Spatial carrier-fringe pattern analysis by means of wavelet transform: wavelet transform profilometry,” Appl. Opt. 43, 4993–4998 (2004).

[Crossref]

Q. Kemao, “Windowed Fourier transform for fringe pattern analysis,” Appl. Opt. 43, 2695–2702 (2004).

[Crossref]

S. Ri, M. Fujigaki, T. Matui, and Y. Morimoto, “Accurate pixel-to-pixel correspondence adjustment in a digital micromirror device camera by using the phase-shifting moiré method,” Appl. Opt. 45, 6940–6946 (2006).

[Crossref]

S. Ri, M. Fujigaki, and Y. Morimoto, “Sampling moiré method for accurate small deformation distribution measurement,” Exp. Mech. 50, 501–508 (2010).

[Crossref]

S. Ri, T. Muramatsu, M. Saka, K. Nanbara, and D. Kobayashi, “Accuracy of the sampling moiré method and its application to deflection measurements of large-scale structures,” Exp. Mech. 52, 331–340 (2012).

[Crossref]

Y. Arai, S. Yokozeki, K. Shiraki, and T. Yamada, “High precision two-dimensional spatial fringe analysis method,” J. Mod. Opt. 44, 739–751 (1997).

[Crossref]

S. Ri and T. Muramatsu, “A simple technique for measuring thickness distribution of transparent plates from a single image by using the sampling moiré method,” Meas. Sci. Technol. 21, 025305 (2010).

[Crossref]

M. Fujigaki, K. Shimo, A. Masaya, and Y. Morimoto, “Dynamic shape and strain measurements of rotating tire using a sampling moiré method,” Opt. Eng. 50, 101506(2011).

[Crossref]

Y. Morimoto and M. Fujisawa, “Fringe pattern analysis by a phase-shifting method using Fourier transform,” Opt. Eng. 33, 224–231 (1994).

P. Hariharan, “Phase-shifting interferometry: minimization of systematic errors,” Opt. Eng. 39, 967–969 (2000).

[Crossref]

X. Su and W. Chen, “Fourier transform profilometry: a review,” Opt. Laser Eng. 35, 263–284 (2001).

[Crossref]

S. Zhang, “Recent progresses on real-time 3-D shape measurement using digital fringe projection techniques,” Opt. Lasers Eng. 48, 149–158 (2010).

[Crossref]

P. H. Chan, P. J. Bryanston-Cross, and S. C. Parker, “Spatial phase stepping method of fringe-pattern analysis,” Opt. Lasers Eng. 23, 343–354 (1995).

[Crossref]

Q. Kemao, “Two-dimensional windowed Fourier transform for fringe pattern analysis: principles, applications, and implementations,” Opt. Lasers Eng. 45, 304–317 (2007).

[Crossref]

L. Huang, Q. Kemao, B. Pan, and A. K. Asundi, “Comparison of Fourier transform, windowed Fourier transform, and wavelet transform methods for phase extraction from a single fringe pattern in fringe projection profilometry,” Opt. Lasers Eng. 48, 141–148 (2010).

[Crossref]

M. Kujawinska and J. Wojciak, “Spatial-carrier phase shifting technique of fringe pattern analysis,” Proc SPIE 1508, 61–67 (1991).

[Crossref]