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P. Lehmann, “Systematic effects in coherence peak and phase evaluation of signals obtained with a vertical scanning white-light Mirau interferometer,” Proc. SPIE 6188, 618811 (2006).

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R. Berger, T. Sure, and W. Osten, “Measurement errors of mirrorlike, tilted objects in white-light interferometry,” Proc. SPIE 6616, 66162E (2007).

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J. Niehues and P. Lehmann, “Dual-wavelength vertical scanning low-coherence interference microscope,” Proc. SPIE 6616, 661606 (2007).

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P. de Groot, X. C. de Lega, J. Kramer, and M. Turzhitsky, “High precision surface inspection on the microscale by broadband interferometry,” in Fringe 2001: The 4th International Workshop on Automatic Processing of Fringe Patterns, W. Osten and W. Jüptner, eds. (2001), pp. 47–55.