Abstract

Examining spectral regions outside of the band where an antireflection coating is specified can aid in finding optimal design solutions. The reflectance versus wavenumber plots at low frequencies indicate the overall thickness of the design. These plots also point to whether the design will provide the minimum possible average reflectance in the specified band. It has been discovered that these patterns are nearly replicated by the plot of a quarter-wave stack at peak frequency. It is also found that optimal solutions exist only at quantized intervals.

© 2011 Optical Society of America

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References

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  1. R. R. Willey, Practical Design of Optical Thin Films, 2nd ed. (Willey Optical Consultants, 2007), App. C.
  2. R. R. Willey, Practical Design of Optical Thin Films, 2nd ed. (Willey Optical Consultants, 2007), Sec. 2.2.4.
  3. F. T. Goldstein, “FilmStar,” FTG Software Associates, P.O. Box 579, Princeton, N.J. 08542.
  4. Numerical Optimization Library (NOL), DSNL Version 2.0, Technologix Corporation, 12020 113th Avenue NE, Kirkland, Wash. 98034-6938.
  5. P. G. Verly, J. A. Dobrowolski, and R. R. Willey, “Fourier-transform method for the design of wideband antireflection coatings,” Appl. Opt. 31, 3836–3846 (1992).
    [CrossRef] [PubMed]

1992 (1)

Appl. Opt. (1)

Other (4)

R. R. Willey, Practical Design of Optical Thin Films, 2nd ed. (Willey Optical Consultants, 2007), App. C.

R. R. Willey, Practical Design of Optical Thin Films, 2nd ed. (Willey Optical Consultants, 2007), Sec. 2.2.4.

F. T. Goldstein, “FilmStar,” FTG Software Associates, P.O. Box 579, Princeton, N.J. 08542.

Numerical Optimization Library (NOL), DSNL Version 2.0, Technologix Corporation, 12020 113th Avenue NE, Kirkland, Wash. 98034-6938.

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Figures (12)

Fig. 1
Fig. 1

QWOT stack at 308 nm as a starting design for the AR band.

Fig. 2
Fig. 2

Optimized design for the AR band from the start in Fig. 1.

Fig. 3
Fig. 3

AR band plus the extended range.

Fig. 4
Fig. 4

QWOT stack ( 0.5 L 1 H 0.5 L ) 3 at 4953 cm 1 (upper curve) and design similar to Fig. 3 (lower curve).

Fig. 5
Fig. 5

Reflectance versus thickness at the longest wavelength of the AR band ( 1540 nm or 6500 cm 1 ) for the rugate design.

Fig. 6
Fig. 6

Reflectance versus thickness of the QWOT design of Fig. 4 related to the rugate design.

Fig. 7
Fig. 7

R ave % for the best designs at controlled overall thicknesses for AR band 385 1540 nm ( n sub = 1.52 , n H = 2.35 , and n L = 1.46 ).

Fig. 8
Fig. 8

Low-frequency spectra of the best 1, 2, and 3 × minimum thickness designs, shown as triangles in Fig. 7.

Fig. 9
Fig. 9

Low-frequency spectra of the best four designs on high- index (2.35) substrate for AR band of 385 to 1540 nm ( n sub = 1.52 , n H = 2.35 , and n L = 1.46 ).

Fig. 10
Fig. 10

Reflectance versus thickness at the longest wavelength of the AR band for a one-cycle design on a low-index (1.52) substrate.

Fig. 11
Fig. 11

Reflectance versus thickness at the longest wavelength of the AR band for a half-cycle (step-down) design on a high-index (2.35) substrate.

Fig. 12
Fig. 12

R ave % for the best designs at controlled thicknesses designs on 1.52 (dots) and 2.35 (diamonds) substrates.

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