Abstract

We describe the optical properties of gold island films embedded between SiO2 and/or TiO2 layers. Plasmonic properties of gold films have been characterized using spectrometry and variable angle spectroscopic ellipsometry for various combinations of the embedding media. The obtained refractive indices of embedded gold island films have been used in the design of several types of multilayer reflectors.

© 2011 Optical Society of America

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  1. U. Kreibig and M. Vollmer, Optical Properties of Metal Clusters, Springer Series in Material Science (Springer, 1995), Vol.  25.
  2. H. Zorc, M. Lončarić, J. Sancho, and V. Janicki, “Optical properties of plasmonic nanomaterials in thin film,” presented at the 6th Scientific Meeting of the Croatian Physical Society, Primošten, Croatia, 8–11 Oct 2009.
  3. M. Lončarić, J. Sancho-Parramon, M. Pavlović, H. Zorc, P. Dubček, A. Turković, S. Bernstorff, G. Jakopic, and A. Haase, “Optical and structural characterization of silver islands films on glass substrates,” Vacuum 84, 188–192 (2009).
    [CrossRef]
  4. M. Lončarić, J. Sancho-Parramon, and H. Zorc, “Optical properties of gold island films—a spectroscopic ellipsometry study,” Thin Solid Films (to be published).
  5. J. N. Hilfiker, N. Singh, T. Tiwald, D. Convey, S. M. Smith, J. H. Baker, and H. G. Tompkins, “Survey of methods to characterize thin absorbing films with spectroscopic ellipsometry,” Thin Solid Films 516, 7979–7989 (2008).
    [CrossRef]
  6. P. Heger, O. Stenzel, and N. Kaiser, “Metal island films for optics,” Proc. SPIE 5250, 21–28 (2004).
    [CrossRef]

2009 (1)

M. Lončarić, J. Sancho-Parramon, M. Pavlović, H. Zorc, P. Dubček, A. Turković, S. Bernstorff, G. Jakopic, and A. Haase, “Optical and structural characterization of silver islands films on glass substrates,” Vacuum 84, 188–192 (2009).
[CrossRef]

2008 (1)

J. N. Hilfiker, N. Singh, T. Tiwald, D. Convey, S. M. Smith, J. H. Baker, and H. G. Tompkins, “Survey of methods to characterize thin absorbing films with spectroscopic ellipsometry,” Thin Solid Films 516, 7979–7989 (2008).
[CrossRef]

2004 (1)

P. Heger, O. Stenzel, and N. Kaiser, “Metal island films for optics,” Proc. SPIE 5250, 21–28 (2004).
[CrossRef]

Baker, J. H.

J. N. Hilfiker, N. Singh, T. Tiwald, D. Convey, S. M. Smith, J. H. Baker, and H. G. Tompkins, “Survey of methods to characterize thin absorbing films with spectroscopic ellipsometry,” Thin Solid Films 516, 7979–7989 (2008).
[CrossRef]

Bernstorff, S.

M. Lončarić, J. Sancho-Parramon, M. Pavlović, H. Zorc, P. Dubček, A. Turković, S. Bernstorff, G. Jakopic, and A. Haase, “Optical and structural characterization of silver islands films on glass substrates,” Vacuum 84, 188–192 (2009).
[CrossRef]

Convey, D.

J. N. Hilfiker, N. Singh, T. Tiwald, D. Convey, S. M. Smith, J. H. Baker, and H. G. Tompkins, “Survey of methods to characterize thin absorbing films with spectroscopic ellipsometry,” Thin Solid Films 516, 7979–7989 (2008).
[CrossRef]

Dubcek, P.

M. Lončarić, J. Sancho-Parramon, M. Pavlović, H. Zorc, P. Dubček, A. Turković, S. Bernstorff, G. Jakopic, and A. Haase, “Optical and structural characterization of silver islands films on glass substrates,” Vacuum 84, 188–192 (2009).
[CrossRef]

Haase, A.

M. Lončarić, J. Sancho-Parramon, M. Pavlović, H. Zorc, P. Dubček, A. Turković, S. Bernstorff, G. Jakopic, and A. Haase, “Optical and structural characterization of silver islands films on glass substrates,” Vacuum 84, 188–192 (2009).
[CrossRef]

Heger, P.

P. Heger, O. Stenzel, and N. Kaiser, “Metal island films for optics,” Proc. SPIE 5250, 21–28 (2004).
[CrossRef]

Hilfiker, J. N.

J. N. Hilfiker, N. Singh, T. Tiwald, D. Convey, S. M. Smith, J. H. Baker, and H. G. Tompkins, “Survey of methods to characterize thin absorbing films with spectroscopic ellipsometry,” Thin Solid Films 516, 7979–7989 (2008).
[CrossRef]

Jakopic, G.

M. Lončarić, J. Sancho-Parramon, M. Pavlović, H. Zorc, P. Dubček, A. Turković, S. Bernstorff, G. Jakopic, and A. Haase, “Optical and structural characterization of silver islands films on glass substrates,” Vacuum 84, 188–192 (2009).
[CrossRef]

Janicki, V.

H. Zorc, M. Lončarić, J. Sancho, and V. Janicki, “Optical properties of plasmonic nanomaterials in thin film,” presented at the 6th Scientific Meeting of the Croatian Physical Society, Primošten, Croatia, 8–11 Oct 2009.

Kaiser, N.

P. Heger, O. Stenzel, and N. Kaiser, “Metal island films for optics,” Proc. SPIE 5250, 21–28 (2004).
[CrossRef]

Kreibig, U.

U. Kreibig and M. Vollmer, Optical Properties of Metal Clusters, Springer Series in Material Science (Springer, 1995), Vol.  25.

Loncaric, M.

M. Lončarić, J. Sancho-Parramon, M. Pavlović, H. Zorc, P. Dubček, A. Turković, S. Bernstorff, G. Jakopic, and A. Haase, “Optical and structural characterization of silver islands films on glass substrates,” Vacuum 84, 188–192 (2009).
[CrossRef]

H. Zorc, M. Lončarić, J. Sancho, and V. Janicki, “Optical properties of plasmonic nanomaterials in thin film,” presented at the 6th Scientific Meeting of the Croatian Physical Society, Primošten, Croatia, 8–11 Oct 2009.

M. Lončarić, J. Sancho-Parramon, and H. Zorc, “Optical properties of gold island films—a spectroscopic ellipsometry study,” Thin Solid Films (to be published).

Pavlovic, M.

M. Lončarić, J. Sancho-Parramon, M. Pavlović, H. Zorc, P. Dubček, A. Turković, S. Bernstorff, G. Jakopic, and A. Haase, “Optical and structural characterization of silver islands films on glass substrates,” Vacuum 84, 188–192 (2009).
[CrossRef]

Sancho, J.

H. Zorc, M. Lončarić, J. Sancho, and V. Janicki, “Optical properties of plasmonic nanomaterials in thin film,” presented at the 6th Scientific Meeting of the Croatian Physical Society, Primošten, Croatia, 8–11 Oct 2009.

Sancho-Parramon, J.

M. Lončarić, J. Sancho-Parramon, M. Pavlović, H. Zorc, P. Dubček, A. Turković, S. Bernstorff, G. Jakopic, and A. Haase, “Optical and structural characterization of silver islands films on glass substrates,” Vacuum 84, 188–192 (2009).
[CrossRef]

M. Lončarić, J. Sancho-Parramon, and H. Zorc, “Optical properties of gold island films—a spectroscopic ellipsometry study,” Thin Solid Films (to be published).

Singh, N.

J. N. Hilfiker, N. Singh, T. Tiwald, D. Convey, S. M. Smith, J. H. Baker, and H. G. Tompkins, “Survey of methods to characterize thin absorbing films with spectroscopic ellipsometry,” Thin Solid Films 516, 7979–7989 (2008).
[CrossRef]

Smith, S. M.

J. N. Hilfiker, N. Singh, T. Tiwald, D. Convey, S. M. Smith, J. H. Baker, and H. G. Tompkins, “Survey of methods to characterize thin absorbing films with spectroscopic ellipsometry,” Thin Solid Films 516, 7979–7989 (2008).
[CrossRef]

Stenzel, O.

P. Heger, O. Stenzel, and N. Kaiser, “Metal island films for optics,” Proc. SPIE 5250, 21–28 (2004).
[CrossRef]

Tiwald, T.

J. N. Hilfiker, N. Singh, T. Tiwald, D. Convey, S. M. Smith, J. H. Baker, and H. G. Tompkins, “Survey of methods to characterize thin absorbing films with spectroscopic ellipsometry,” Thin Solid Films 516, 7979–7989 (2008).
[CrossRef]

Tompkins, H. G.

J. N. Hilfiker, N. Singh, T. Tiwald, D. Convey, S. M. Smith, J. H. Baker, and H. G. Tompkins, “Survey of methods to characterize thin absorbing films with spectroscopic ellipsometry,” Thin Solid Films 516, 7979–7989 (2008).
[CrossRef]

Turkovic, A.

M. Lončarić, J. Sancho-Parramon, M. Pavlović, H. Zorc, P. Dubček, A. Turković, S. Bernstorff, G. Jakopic, and A. Haase, “Optical and structural characterization of silver islands films on glass substrates,” Vacuum 84, 188–192 (2009).
[CrossRef]

Vollmer, M.

U. Kreibig and M. Vollmer, Optical Properties of Metal Clusters, Springer Series in Material Science (Springer, 1995), Vol.  25.

Zorc, H.

M. Lončarić, J. Sancho-Parramon, M. Pavlović, H. Zorc, P. Dubček, A. Turković, S. Bernstorff, G. Jakopic, and A. Haase, “Optical and structural characterization of silver islands films on glass substrates,” Vacuum 84, 188–192 (2009).
[CrossRef]

H. Zorc, M. Lončarić, J. Sancho, and V. Janicki, “Optical properties of plasmonic nanomaterials in thin film,” presented at the 6th Scientific Meeting of the Croatian Physical Society, Primošten, Croatia, 8–11 Oct 2009.

M. Lončarić, J. Sancho-Parramon, and H. Zorc, “Optical properties of gold island films—a spectroscopic ellipsometry study,” Thin Solid Films (to be published).

Proc. SPIE (1)

P. Heger, O. Stenzel, and N. Kaiser, “Metal island films for optics,” Proc. SPIE 5250, 21–28 (2004).
[CrossRef]

Thin Solid Films (1)

J. N. Hilfiker, N. Singh, T. Tiwald, D. Convey, S. M. Smith, J. H. Baker, and H. G. Tompkins, “Survey of methods to characterize thin absorbing films with spectroscopic ellipsometry,” Thin Solid Films 516, 7979–7989 (2008).
[CrossRef]

Vacuum (1)

M. Lončarić, J. Sancho-Parramon, M. Pavlović, H. Zorc, P. Dubček, A. Turković, S. Bernstorff, G. Jakopic, and A. Haase, “Optical and structural characterization of silver islands films on glass substrates,” Vacuum 84, 188–192 (2009).
[CrossRef]

Other (3)

M. Lončarić, J. Sancho-Parramon, and H. Zorc, “Optical properties of gold island films—a spectroscopic ellipsometry study,” Thin Solid Films (to be published).

U. Kreibig and M. Vollmer, Optical Properties of Metal Clusters, Springer Series in Material Science (Springer, 1995), Vol.  25.

H. Zorc, M. Lončarić, J. Sancho, and V. Janicki, “Optical properties of plasmonic nanomaterials in thin film,” presented at the 6th Scientific Meeting of the Croatian Physical Society, Primošten, Croatia, 8–11 Oct 2009.

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