Abstract

We describe the optical properties of gold island films embedded between SiO2 and/or TiO2 layers. Plasmonic properties of gold films have been characterized using spectrometry and variable angle spectroscopic ellipsometry for various combinations of the embedding media. The obtained refractive indices of embedded gold island films have been used in the design of several types of multilayer reflectors.

© 2011 Optical Society of America

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