Z. Luo, X. Liu, and S. Zhang, “Dispersive white-light spectral interferometer for optical properties measurement of optical thin film,” Chin. Opt. Lett. 8 supplement, 94–99(2010).

[CrossRef]

H. Lei, K. Qian, P. Bing, and A. Asundia, “Comparison of Fourier transform, windowed Fourier transform, and wavelet transform methods for phase extraction from a single fringe pattern in fringe projection profilometry,” Opt. Lasers Eng. 48, 141–148 (2010).

[CrossRef]

T. V. Amotchkina, A. V. Tikhonravov, M. K. Trubetskov, D. Grupe, A. Apolonski, and V. Pervak, “Measurement of group delay of dispersive mirrors with white-light interferometer,” Appl. Opt. 48, 949–956 (2009).

[CrossRef]
[PubMed]

Y. Deng, W. Yang, C. Zhou, X. Wang, J. Tao, W. Kong, and Z. Zhang, “Wavelet-transform analysis for group delay extraction of white light spectral interferograms,” Opt. Express 17, 6038–6043 (2009).

[CrossRef]
[PubMed]

V. Pervak, I. Ahmad, M. K. Trubetskov, A. V. Tikhonravov, and F. Krausz, “Double-angle multilayer mirrors with smooth dispersion characteristics,” Opt. Express 17, 7943–7951 (2009).

[CrossRef]
[PubMed]

P. Hlubina, J. Lunacek, D. Ciprian, and R. Chlebus, “Windowed Fourier transform applied in the wavelength domain to process the spectral interference signals,” Opt. Commun. 281, 2349–2354 (2008).

[CrossRef]

J. Luo, J. Bai, and J. Shao, “Application of the wavelet transforms on axial strain calculation in ultrasound elastography,” Prog. Nat. Sci. 16, 942–947 (2006).

[CrossRef]

D. Reolon, M. Jacquot, I. Verrier, G. Brun, and C. Veillas, “High resolution group refractive index measurement by broadband supercontinuum interferometry and wavelet-transform analysis,” Opt. Express 14, 12744–12750 (2006).

[CrossRef]
[PubMed]

P. Hlubina, D. Ciprian, J. Lunácek, and M. Lesnák, “Dispersive white-light spectral interferometry with absolute phase retrieval to measure thin film,” Opt. Express 14, 7678–7685(2006).

[CrossRef]
[PubMed]

K. Alexander, F. Chau, and J. Gao, “Wavelet transform: a method for derivative calculation in analytical chemistry,” Anal. Chem. 70, 5222–5229 (1998).

[CrossRef]

K. Alexander, F. Chau, and J. Gao, “Wavelet transform: a method for derivative calculation in analytical chemistry,” Anal. Chem. 70, 5222–5229 (1998).

[CrossRef]

H. Lei, K. Qian, P. Bing, and A. Asundia, “Comparison of Fourier transform, windowed Fourier transform, and wavelet transform methods for phase extraction from a single fringe pattern in fringe projection profilometry,” Opt. Lasers Eng. 48, 141–148 (2010).

[CrossRef]

J. Luo, J. Bai, and J. Shao, “Application of the wavelet transforms on axial strain calculation in ultrasound elastography,” Prog. Nat. Sci. 16, 942–947 (2006).

[CrossRef]

H. Lei, K. Qian, P. Bing, and A. Asundia, “Comparison of Fourier transform, windowed Fourier transform, and wavelet transform methods for phase extraction from a single fringe pattern in fringe projection profilometry,” Opt. Lasers Eng. 48, 141–148 (2010).

[CrossRef]

K. Alexander, F. Chau, and J. Gao, “Wavelet transform: a method for derivative calculation in analytical chemistry,” Anal. Chem. 70, 5222–5229 (1998).

[CrossRef]

P. Hlubina, J. Lunacek, D. Ciprian, and R. Chlebus, “Windowed Fourier transform applied in the wavelength domain to process the spectral interference signals,” Opt. Commun. 281, 2349–2354 (2008).

[CrossRef]

P. Hlubina, J. Lunacek, D. Ciprian, and R. Chlebus, “Windowed Fourier transform applied in the wavelength domain to process the spectral interference signals,” Opt. Commun. 281, 2349–2354 (2008).

[CrossRef]

P. Hlubina, D. Ciprian, J. Lunácek, and M. Lesnák, “Dispersive white-light spectral interferometry with absolute phase retrieval to measure thin film,” Opt. Express 14, 7678–7685(2006).

[CrossRef]
[PubMed]

K. Alexander, F. Chau, and J. Gao, “Wavelet transform: a method for derivative calculation in analytical chemistry,” Anal. Chem. 70, 5222–5229 (1998).

[CrossRef]

P. Hlubina, J. Lunacek, D. Ciprian, and R. Chlebus, “Windowed Fourier transform applied in the wavelength domain to process the spectral interference signals,” Opt. Commun. 281, 2349–2354 (2008).

[CrossRef]

P. Hlubina, D. Ciprian, J. Lunácek, and M. Lesnák, “Dispersive white-light spectral interferometry with absolute phase retrieval to measure thin film,” Opt. Express 14, 7678–7685(2006).

[CrossRef]
[PubMed]

H. Lei, K. Qian, P. Bing, and A. Asundia, “Comparison of Fourier transform, windowed Fourier transform, and wavelet transform methods for phase extraction from a single fringe pattern in fringe projection profilometry,” Opt. Lasers Eng. 48, 141–148 (2010).

[CrossRef]

Z. Luo, X. Liu, and S. Zhang, “Dispersive white-light spectral interferometer for optical properties measurement of optical thin film,” Chin. Opt. Lett. 8 supplement, 94–99(2010).

[CrossRef]

Z. Luo, S. Zhang, W. Shen, and X. Liu, “Direct measurement of group-delay properties for dispersive mirrors,” in Optical Interference Coatings, OSA Technical Digest (Optical Society of America, 2010), paper FB4.

P. Hlubina, J. Lunacek, D. Ciprian, and R. Chlebus, “Windowed Fourier transform applied in the wavelength domain to process the spectral interference signals,” Opt. Commun. 281, 2349–2354 (2008).

[CrossRef]

J. Luo, J. Bai, and J. Shao, “Application of the wavelet transforms on axial strain calculation in ultrasound elastography,” Prog. Nat. Sci. 16, 942–947 (2006).

[CrossRef]

Z. Luo, X. Liu, and S. Zhang, “Dispersive white-light spectral interferometer for optical properties measurement of optical thin film,” Chin. Opt. Lett. 8 supplement, 94–99(2010).

[CrossRef]

Z. Luo, S. Zhang, W. Shen, and X. Liu, “Direct measurement of group-delay properties for dispersive mirrors,” in Optical Interference Coatings, OSA Technical Digest (Optical Society of America, 2010), paper FB4.

T. V. Amotchkina, A. V. Tikhonravov, M. K. Trubetskov, D. Grupe, A. Apolonski, and V. Pervak, “Measurement of group delay of dispersive mirrors with white-light interferometer,” Appl. Opt. 48, 949–956 (2009).

[CrossRef]
[PubMed]

V. Pervak, I. Ahmad, M. K. Trubetskov, A. V. Tikhonravov, and F. Krausz, “Double-angle multilayer mirrors with smooth dispersion characteristics,” Opt. Express 17, 7943–7951 (2009).

[CrossRef]
[PubMed]

H. Lei, K. Qian, P. Bing, and A. Asundia, “Comparison of Fourier transform, windowed Fourier transform, and wavelet transform methods for phase extraction from a single fringe pattern in fringe projection profilometry,” Opt. Lasers Eng. 48, 141–148 (2010).

[CrossRef]

J. Luo, J. Bai, and J. Shao, “Application of the wavelet transforms on axial strain calculation in ultrasound elastography,” Prog. Nat. Sci. 16, 942–947 (2006).

[CrossRef]

Z. Luo, S. Zhang, W. Shen, and X. Liu, “Direct measurement of group-delay properties for dispersive mirrors,” in Optical Interference Coatings, OSA Technical Digest (Optical Society of America, 2010), paper FB4.

T. V. Amotchkina, A. V. Tikhonravov, M. K. Trubetskov, D. Grupe, A. Apolonski, and V. Pervak, “Measurement of group delay of dispersive mirrors with white-light interferometer,” Appl. Opt. 48, 949–956 (2009).

[CrossRef]
[PubMed]

V. Pervak, I. Ahmad, M. K. Trubetskov, A. V. Tikhonravov, and F. Krausz, “Double-angle multilayer mirrors with smooth dispersion characteristics,” Opt. Express 17, 7943–7951 (2009).

[CrossRef]
[PubMed]

V. Pervak, I. Ahmad, M. K. Trubetskov, A. V. Tikhonravov, and F. Krausz, “Double-angle multilayer mirrors with smooth dispersion characteristics,” Opt. Express 17, 7943–7951 (2009).

[CrossRef]
[PubMed]

T. V. Amotchkina, A. V. Tikhonravov, M. K. Trubetskov, D. Grupe, A. Apolonski, and V. Pervak, “Measurement of group delay of dispersive mirrors with white-light interferometer,” Appl. Opt. 48, 949–956 (2009).

[CrossRef]
[PubMed]

Z. Luo, X. Liu, and S. Zhang, “Dispersive white-light spectral interferometer for optical properties measurement of optical thin film,” Chin. Opt. Lett. 8 supplement, 94–99(2010).

[CrossRef]

Z. Luo, S. Zhang, W. Shen, and X. Liu, “Direct measurement of group-delay properties for dispersive mirrors,” in Optical Interference Coatings, OSA Technical Digest (Optical Society of America, 2010), paper FB4.

K. Alexander, F. Chau, and J. Gao, “Wavelet transform: a method for derivative calculation in analytical chemistry,” Anal. Chem. 70, 5222–5229 (1998).

[CrossRef]

J. Zhong and H. Zeng, “Multiscale windowed Fourier transform for phase extraction of fringe patterns,” Appl. Opt. 46, 2670–2675 (2007).

[CrossRef]
[PubMed]

T. V. Amotchkina, A. V. Tikhonravov, M. K. Trubetskov, D. Grupe, A. Apolonski, and V. Pervak, “Measurement of group delay of dispersive mirrors with white-light interferometer,” Appl. Opt. 48, 949–956 (2009).

[CrossRef]
[PubMed]

Z. Luo, X. Liu, and S. Zhang, “Dispersive white-light spectral interferometer for optical properties measurement of optical thin film,” Chin. Opt. Lett. 8 supplement, 94–99(2010).

[CrossRef]

P. Hlubina, J. Lunacek, D. Ciprian, and R. Chlebus, “Windowed Fourier transform applied in the wavelength domain to process the spectral interference signals,” Opt. Commun. 281, 2349–2354 (2008).

[CrossRef]

Y. Deng, W. Yang, C. Zhou, X. Wang, J. Tao, W. Kong, and Z. Zhang, “Wavelet-transform analysis for group delay extraction of white light spectral interferograms,” Opt. Express 17, 6038–6043 (2009).

[CrossRef]
[PubMed]

V. Pervak, I. Ahmad, M. K. Trubetskov, A. V. Tikhonravov, and F. Krausz, “Double-angle multilayer mirrors with smooth dispersion characteristics,” Opt. Express 17, 7943–7951 (2009).

[CrossRef]
[PubMed]

P. Hlubina, D. Ciprian, J. Lunácek, and M. Lesnák, “Dispersive white-light spectral interferometry with absolute phase retrieval to measure thin film,” Opt. Express 14, 7678–7685(2006).

[CrossRef]
[PubMed]

D. Reolon, M. Jacquot, I. Verrier, G. Brun, and C. Veillas, “High resolution group refractive index measurement by broadband supercontinuum interferometry and wavelet-transform analysis,” Opt. Express 14, 12744–12750 (2006).

[CrossRef]
[PubMed]

H. Lei, K. Qian, P. Bing, and A. Asundia, “Comparison of Fourier transform, windowed Fourier transform, and wavelet transform methods for phase extraction from a single fringe pattern in fringe projection profilometry,” Opt. Lasers Eng. 48, 141–148 (2010).

[CrossRef]

J. Luo, J. Bai, and J. Shao, “Application of the wavelet transforms on axial strain calculation in ultrasound elastography,” Prog. Nat. Sci. 16, 942–947 (2006).

[CrossRef]

Z. Luo, S. Zhang, W. Shen, and X. Liu, “Direct measurement of group-delay properties for dispersive mirrors,” in Optical Interference Coatings, OSA Technical Digest (Optical Society of America, 2010), paper FB4.