Abstract

The 2010 Measurement Problem comprised the determination of the reflectance of high-reflective dielectric mirrors at 1064nm.

© 2011 Optical Society of America

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References

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  1. A. Duparré and D. Ristau, “2004 Topical Meeting on Optical Interference Coatings: Measurement Problem,” in Optical Interference Coatings, OSA Technical Digest Series (Optical Society of America, 2004), paper WD1.
  2. A. Duparré and D. Ristau, “Optical Interference Coatings 2007 Measurement Problem,” Appl. Opt. 47, C179–C184 (2008).
    [CrossRef] [PubMed]
  3. S. Schröder, T. Herffurth, H. Blaschke, and A. Duparré, “Angle resolved scattering: an effective method for characterizing thin film coatings,” Appl. Opt. 50, C164–C171 (2011).
  4. A. Duparré, J. Ferre-Borull, S. Gliech, G. Notni, J. Steinert, and J. M. Bennett, “Surface characterization techniques for determining the rms roughness and power spectral densities of optical components,” Appl. Opt. 41, 154–171(2002).
    [CrossRef] [PubMed]
  5. “Optics and optical instruments—test methods for radiation scattered by optical components,” ISO 13696:2002 (International Organization for Standardization, 2002).

2011 (1)

2008 (1)

2002 (1)

Bennett, J. M.

Blaschke, H.

Duparré, A.

Ferre-Borull, J.

Gliech, S.

Herffurth, T.

Notni, G.

Ristau, D.

A. Duparré and D. Ristau, “Optical Interference Coatings 2007 Measurement Problem,” Appl. Opt. 47, C179–C184 (2008).
[CrossRef] [PubMed]

A. Duparré and D. Ristau, “2004 Topical Meeting on Optical Interference Coatings: Measurement Problem,” in Optical Interference Coatings, OSA Technical Digest Series (Optical Society of America, 2004), paper WD1.

Schröder, S.

Steinert, J.

Appl. Opt. (3)

Other (2)

“Optics and optical instruments—test methods for radiation scattered by optical components,” ISO 13696:2002 (International Organization for Standardization, 2002).

A. Duparré and D. Ristau, “2004 Topical Meeting on Optical Interference Coatings: Measurement Problem,” in Optical Interference Coatings, OSA Technical Digest Series (Optical Society of America, 2004), paper WD1.

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Figures (7)

Fig. 1
Fig. 1

Locations of participating laboratories.

Fig. 2
Fig. 2

(a) R values submitted by the participants for type A samples (asterisk denotes CRD measurement), (b) zoom into (a), (c) zoom into (b) (all CRD measurement).

Fig. 3
Fig. 3

(a) R values submitted by the participants for type B, (b) zoom into (a) (asterisk denotes CRD measurement).

Fig. 4
Fig. 4

Postscreening microscopy images of samples 2A, 21A, 3A, and 17B (from upper left to lower right).

Fig. 5
Fig. 5

Postscreening fast TS mappings at 546 nm of samples 21A, 3A, and 15A (from left to right).

Fig. 6
Fig. 6

ARS measurements at 1064 nm of type A samples (samples not shipped to participants, measurement under clean room conditions); light blue middle curve, modeled ARS.

Fig. 7
Fig. 7

BRDF measurements of laboratory 21.

Tables (3)

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Table 1 Results of Prescreening CRD Measurements (Six Samples for Each Type): Average Losses with Standard Deviations and Reflectances

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Table 2 Participating Laboratories (in Alphabetical Order, Not Identical with OIC Sample/Laboratory Number)

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Table 3 Results of Reflectance Measurements Submitted by the Participants for Sample Types A and B Together with Uncertainty Budgets (if Provided)

Metrics