Q. Kemao, W. Gao, and H. Wang, “Windowed Fourier filtered and quality guided phase unwrapping algorithm: on locally high-order polynomial phase,” Appl. Opt. 49, 1075–1079 (2010).

[CrossRef]
[PubMed]

T. D. Visser, T. van Dijk, H. F. Schouten, and W. Ubachs, “The Pancharatnam–Berry phase for non-cyclic polarization changes,” Opt. Express 18, 10796–10804 (2010).

[CrossRef]
[PubMed]

Y. J. Zhu, Z. Luan, Q. G. Yang, D. S. Li, W. Lu, and L. R. Liu, “Improved reliability-guided phase unwrapping algorithm based on the fringe modulation and second-order phase difference,” Optik (Jena) 118, 175–180 (2007).

[CrossRef]

Y. Watanabe, Y. Hayasaka, M. Sato, and N. Tanno, “Full-field optical coherence tomography by achromatic phase shifting with a rotating polarizer,” Appl. Opt. 44, 1387–1392 (2005).

[CrossRef]
[PubMed]

M. Roy, G. Cox, and P. Hariharan, “Low-coherence interference microscopy with an improved switchable achromatic phase-shifter,” Opt. Express 13, 9125–9130 (2005).

[CrossRef]
[PubMed]

M. Roy, P. Svahn, L. Cherel, and C. J. R. Sheppard, “Geometric phase-shifting for low-coherence interference microscopy,” Opt. Lasers Eng. 37, 631–641 (2002).

[CrossRef]

P. de Groot, X. C. de Lega, J. Kramer, and M. Turzhitsky, “Determination of fringe order in white-light interference microscopy,” Appl. Opt. 41, 4571–4578 (2002).

[CrossRef]
[PubMed]

S. S. Helen, M. P. Kothiyal, and R. S. Sirohi, “White-light interferometry with polarization phase-shifter at the input of the interferometer,” J. Mod. Opt. 47, 1137–1145 (2000).

[CrossRef]

A. Harasaki, J. Schmit, and J. C. Wyant, “Improved vertical-scanning interferometry,” Appl. Opt. 39, 2107–2115 (2000).

[CrossRef]

S. S. Helen, M. P. Kothiyal, and R. S. Sirohi, “Achromatic phase shifting by a rotating polarizer,” Opt. Commun. 154, 249–254 (1998).

[CrossRef]

N. Baba and K. Shibayama, “Geometric phase observation with dispersed fringes,” Opt. Rev. 4, 593–595 (1997).

[CrossRef]

P. Sandoz, R. Devillers, and A. Plata, “Unambiguous profilometry by fringe-order identification in white-light phase-shifting interferometry,” J. Mod. Opt. 44, 519–534 (1997).

[CrossRef]

P. Hariharan and M. Roy, “White-light phase-stepping interferometry for surface profiling,” J. Mod. Opt. 41, 2197–2201 (1994).

[CrossRef]

P. Hariharan, K. G. Larkin, and M. Roy, “The geometric phase: interferometric observations with white light,” J. Mod. Opt. 41, 663–667 (1994).

[CrossRef]

P. Hariharan and P. E. Ciddor, “An achromatic phase-shifter operating on the geometric phase,” Opt. Commun. 110, 113–117 (1994).

[CrossRef]

J. Samuel and R. Bhandari, “General setting for Berry’s phase,” Phys. Rev. Lett. 60, 2339–2342 (1988).

[CrossRef]
[PubMed]

M. V. Berry, “The adiabatic phase and Pancharatnam’s phase for polarized light,” J. Mod. Opt. 34, 1401–1407 (1987).

[CrossRef]

S. Pancharatnam, “Generalized theory of interference and its applications,” Proc. Ind. Acad. Sci. A 44, 247–262 (1956).

N. Baba and K. Shibayama, “Geometric phase observation with dispersed fringes,” Opt. Rev. 4, 593–595 (1997).

[CrossRef]

M. V. Berry, “The adiabatic phase and Pancharatnam’s phase for polarized light,” J. Mod. Opt. 34, 1401–1407 (1987).

[CrossRef]

J. Samuel and R. Bhandari, “General setting for Berry’s phase,” Phys. Rev. Lett. 60, 2339–2342 (1988).

[CrossRef]
[PubMed]

M. Born and E. Wolf, Principles of Optics (Pergamon, 1980), pp. 30–32.

H. Schreiber and J. H. Bruning, “Phase shifting interferometry,” in Optical Shop Testing, D.Malacara, ed. (Wiley2007), pp. 559–560.

X. Y. Su and W. J. Chen, “Reliability-guided phase unwrapping algorithm: a review,” Opt. Lasers Eng. 42, 245–261(2004).

[CrossRef]

M. Roy, P. Svahn, L. Cherel, and C. J. R. Sheppard, “Geometric phase-shifting for low-coherence interference microscopy,” Opt. Lasers Eng. 37, 631–641 (2002).

[CrossRef]

P. Hariharan and P. E. Ciddor, “An achromatic phase-shifter operating on the geometric phase,” Opt. Commun. 110, 113–117 (1994).

[CrossRef]

P. Sandoz, R. Devillers, and A. Plata, “Unambiguous profilometry by fringe-order identification in white-light phase-shifting interferometry,” J. Mod. Opt. 44, 519–534 (1997).

[CrossRef]

Q. Kemao, W. Gao, and H. Wang, “Windowed Fourier filtered and quality guided phase unwrapping algorithm: on locally high-order polynomial phase,” Appl. Opt. 49, 1075–1079 (2010).

[CrossRef]
[PubMed]

Q. Kemao, W. Gao, and H. Wang, “Windowed Fourier-filtered and quality-guided phase-unwrapping algorithm,” Appl. Opt. 47, 5420–5428 (2008).

[CrossRef]
[PubMed]

M. Roy, J. Schmit, and P. Hariharan, “White-light interference microscopy: minimization of spurious diffraction effects by geometric phase-shifting,” Opt. Express 17, 4495–4499 (2009).

[CrossRef]
[PubMed]

M. Roy, G. Cox, and P. Hariharan, “Low-coherence interference microscopy with an improved switchable achromatic phase-shifter,” Opt. Express 13, 9125–9130 (2005).

[CrossRef]
[PubMed]

M. Roy, C. J. R. Sheppard, and P. Hariharan, “Low-coherence interference microscopy using a ferro-electric liquid crystal phase-modulator,” Opt. Express 12, 2512–2516 (2004).

[CrossRef]
[PubMed]

P. Hariharan, “Achromatic and apochromatic halfwave and quarterwave retarders,” Opt. Eng. 35, 3335–3337 (1996).

[CrossRef]

P. Hariharan, “Achromatic phase-shifting for white-light interferometry,” Appl. Opt. 35, 6823–6824 (1996).

[CrossRef]
[PubMed]

P. Hariharan and P. E. Ciddor, “An achromatic phase-shifter operating on the geometric phase,” Opt. Commun. 110, 113–117 (1994).

[CrossRef]

P. Hariharan and M. Roy, “White-light phase-stepping interferometry for surface profiling,” J. Mod. Opt. 41, 2197–2201 (1994).

[CrossRef]

P. Hariharan, K. G. Larkin, and M. Roy, “The geometric phase: interferometric observations with white light,” J. Mod. Opt. 41, 663–667 (1994).

[CrossRef]

S. S. Helen, M. P. Kothiyal, and R. S. Sirohi, “White-light interferometry with polarization phase-shifter at the input of the interferometer,” J. Mod. Opt. 47, 1137–1145 (2000).

[CrossRef]

S. S. Helen, M. P. Kothiyal, and R. S. Sirohi, “Phase shifting by a rotating polarizer in white-light interferometry for surface profiling,” J. Mod. Opt. 46, 993–1001 (1999).

S. S. Helen, M. P. Kothiyal, and R. S. Sirohi, “Achromatic phase shifting by a rotating polarizer,” Opt. Commun. 154, 249–254 (1998).

[CrossRef]

Q. Kemao, W. Gao, and H. Wang, “Windowed Fourier filtered and quality guided phase unwrapping algorithm: on locally high-order polynomial phase,” Appl. Opt. 49, 1075–1079 (2010).

[CrossRef]
[PubMed]

Q. Kemao, W. Gao, and H. Wang, “Windowed Fourier-filtered and quality-guided phase-unwrapping algorithm,” Appl. Opt. 47, 5420–5428 (2008).

[CrossRef]
[PubMed]

S. S. Helen, M. P. Kothiyal, and R. S. Sirohi, “White-light interferometry with polarization phase-shifter at the input of the interferometer,” J. Mod. Opt. 47, 1137–1145 (2000).

[CrossRef]

S. S. Helen, M. P. Kothiyal, and R. S. Sirohi, “Phase shifting by a rotating polarizer in white-light interferometry for surface profiling,” J. Mod. Opt. 46, 993–1001 (1999).

S. S. Helen, M. P. Kothiyal, and R. S. Sirohi, “Achromatic phase shifting by a rotating polarizer,” Opt. Commun. 154, 249–254 (1998).

[CrossRef]

Y. J. Zhu, Z. Luan, Q. G. Yang, D. S. Li, W. Lu, and L. R. Liu, “Improved reliability-guided phase unwrapping algorithm based on the fringe modulation and second-order phase difference,” Optik (Jena) 118, 175–180 (2007).

[CrossRef]

Y. J. Zhu, Z. Luan, Q. G. Yang, D. S. Li, W. Lu, and L. R. Liu, “Improved reliability-guided phase unwrapping algorithm based on the fringe modulation and second-order phase difference,” Optik (Jena) 118, 175–180 (2007).

[CrossRef]

Y. J. Zhu, Z. Luan, Q. G. Yang, D. S. Li, W. Lu, and L. R. Liu, “Improved reliability-guided phase unwrapping algorithm based on the fringe modulation and second-order phase difference,” Optik (Jena) 118, 175–180 (2007).

[CrossRef]

Y. J. Zhu, Z. Luan, Q. G. Yang, D. S. Li, W. Lu, and L. R. Liu, “Improved reliability-guided phase unwrapping algorithm based on the fringe modulation and second-order phase difference,” Optik (Jena) 118, 175–180 (2007).

[CrossRef]

S. Pancharatnam, “Generalized theory of interference and its applications,” Proc. Ind. Acad. Sci. A 44, 247–262 (1956).

P. Sandoz, R. Devillers, and A. Plata, “Unambiguous profilometry by fringe-order identification in white-light phase-shifting interferometry,” J. Mod. Opt. 44, 519–534 (1997).

[CrossRef]

M. Roy, J. Schmit, and P. Hariharan, “White-light interference microscopy: minimization of spurious diffraction effects by geometric phase-shifting,” Opt. Express 17, 4495–4499 (2009).

[CrossRef]
[PubMed]

M. Roy, G. Cox, and P. Hariharan, “Low-coherence interference microscopy with an improved switchable achromatic phase-shifter,” Opt. Express 13, 9125–9130 (2005).

[CrossRef]
[PubMed]

M. Roy, C. J. R. Sheppard, and P. Hariharan, “Low-coherence interference microscopy using a ferro-electric liquid crystal phase-modulator,” Opt. Express 12, 2512–2516 (2004).

[CrossRef]
[PubMed]

M. Roy, P. Svahn, L. Cherel, and C. J. R. Sheppard, “Geometric phase-shifting for low-coherence interference microscopy,” Opt. Lasers Eng. 37, 631–641 (2002).

[CrossRef]

P. Hariharan and M. Roy, “White-light phase-stepping interferometry for surface profiling,” J. Mod. Opt. 41, 2197–2201 (1994).

[CrossRef]

P. Hariharan, K. G. Larkin, and M. Roy, “The geometric phase: interferometric observations with white light,” J. Mod. Opt. 41, 663–667 (1994).

[CrossRef]

C. J. R. Sheppared and M. Roy, “Low-coherence interference microscopy,” in Optical Imaging and Microscopy: Techniques and Advanced Systems, P.Török and F.-J.Kao, eds. (Springer2003), p. 336.

J. Samuel and R. Bhandari, “General setting for Berry’s phase,” Phys. Rev. Lett. 60, 2339–2342 (1988).

[CrossRef]
[PubMed]

P. Sandoz, R. Devillers, and A. Plata, “Unambiguous profilometry by fringe-order identification in white-light phase-shifting interferometry,” J. Mod. Opt. 44, 519–534 (1997).

[CrossRef]

Y. Watanabe, Y. Hayasaka, M. Sato, and N. Tanno, “Full-field optical coherence tomography by achromatic phase shifting with a rotating polarizer,” Appl. Opt. 44, 1387–1392 (2005).

[CrossRef]
[PubMed]

Y. Watanabe and M. Sato, “High-speed high-resolution full-field optical coherence tomography using achromatic phase shifting by a rotating polarizer,” in Pacific Rim Conference on Lasers and Electro-Optics (2005), Vol. 30, pp. 985–986.

[CrossRef]

M. Roy, J. Schmit, and P. Hariharan, “White-light interference microscopy: minimization of spurious diffraction effects by geometric phase-shifting,” Opt. Express 17, 4495–4499 (2009).

[CrossRef]
[PubMed]

A. Harasaki, J. Schmit, and J. C. Wyant, “Improved vertical-scanning interferometry,” Appl. Opt. 39, 2107–2115 (2000).

[CrossRef]

H. Schreiber and J. H. Bruning, “Phase shifting interferometry,” in Optical Shop Testing, D.Malacara, ed. (Wiley2007), pp. 559–560.

M. Roy, C. J. R. Sheppard, and P. Hariharan, “Low-coherence interference microscopy using a ferro-electric liquid crystal phase-modulator,” Opt. Express 12, 2512–2516 (2004).

[CrossRef]
[PubMed]

M. Roy, P. Svahn, L. Cherel, and C. J. R. Sheppard, “Geometric phase-shifting for low-coherence interference microscopy,” Opt. Lasers Eng. 37, 631–641 (2002).

[CrossRef]

C. J. R. Sheppared and M. Roy, “Low-coherence interference microscopy,” in Optical Imaging and Microscopy: Techniques and Advanced Systems, P.Török and F.-J.Kao, eds. (Springer2003), p. 336.

N. Baba and K. Shibayama, “Geometric phase observation with dispersed fringes,” Opt. Rev. 4, 593–595 (1997).

[CrossRef]

S. S. Helen, M. P. Kothiyal, and R. S. Sirohi, “White-light interferometry with polarization phase-shifter at the input of the interferometer,” J. Mod. Opt. 47, 1137–1145 (2000).

[CrossRef]

S. S. Helen, M. P. Kothiyal, and R. S. Sirohi, “Phase shifting by a rotating polarizer in white-light interferometry for surface profiling,” J. Mod. Opt. 46, 993–1001 (1999).

S. S. Helen, M. P. Kothiyal, and R. S. Sirohi, “Achromatic phase shifting by a rotating polarizer,” Opt. Commun. 154, 249–254 (1998).

[CrossRef]

M. Roy, P. Svahn, L. Cherel, and C. J. R. Sheppard, “Geometric phase-shifting for low-coherence interference microscopy,” Opt. Lasers Eng. 37, 631–641 (2002).

[CrossRef]

Q. Kemao, W. Gao, and H. Wang, “Windowed Fourier filtered and quality guided phase unwrapping algorithm: on locally high-order polynomial phase,” Appl. Opt. 49, 1075–1079 (2010).

[CrossRef]
[PubMed]

Q. Kemao, W. Gao, and H. Wang, “Windowed Fourier-filtered and quality-guided phase-unwrapping algorithm,” Appl. Opt. 47, 5420–5428 (2008).

[CrossRef]
[PubMed]

Y. Watanabe, Y. Hayasaka, M. Sato, and N. Tanno, “Full-field optical coherence tomography by achromatic phase shifting with a rotating polarizer,” Appl. Opt. 44, 1387–1392 (2005).

[CrossRef]
[PubMed]

Y. Watanabe and M. Sato, “High-speed high-resolution full-field optical coherence tomography using achromatic phase shifting by a rotating polarizer,” in Pacific Rim Conference on Lasers and Electro-Optics (2005), Vol. 30, pp. 985–986.

[CrossRef]

M. Born and E. Wolf, Principles of Optics (Pergamon, 1980), pp. 30–32.

Y. J. Zhu, Z. Luan, Q. G. Yang, D. S. Li, W. Lu, and L. R. Liu, “Improved reliability-guided phase unwrapping algorithm based on the fringe modulation and second-order phase difference,” Optik (Jena) 118, 175–180 (2007).

[CrossRef]

Y. J. Zhu, Z. Luan, Q. G. Yang, D. S. Li, W. Lu, and L. R. Liu, “Improved reliability-guided phase unwrapping algorithm based on the fringe modulation and second-order phase difference,” Optik (Jena) 118, 175–180 (2007).

[CrossRef]

L. Xue and X. Y. Su, “Phase-unwrapping algorithm based on frequency analysis for measurement of a complex object by the phase-measuring-profilometry method,” Appl. Opt. 40, 1207–1215 (2001).

[CrossRef]

P. Hariharan, “Achromatic phase-shifting for white-light interferometry,” Appl. Opt. 35, 6823–6824 (1996).

[CrossRef]
[PubMed]

P. de Groot, X. C. de Lega, J. Kramer, and M. Turzhitsky, “Determination of fringe order in white-light interference microscopy,” Appl. Opt. 41, 4571–4578 (2002).

[CrossRef]
[PubMed]

A. Harasaki, J. Schmit, and J. C. Wyant, “Improved vertical-scanning interferometry,” Appl. Opt. 39, 2107–2115 (2000).

[CrossRef]

Y. Watanabe, Y. Hayasaka, M. Sato, and N. Tanno, “Full-field optical coherence tomography by achromatic phase shifting with a rotating polarizer,” Appl. Opt. 44, 1387–1392 (2005).

[CrossRef]
[PubMed]

Q. Kemao, W. Gao, and H. Wang, “Windowed Fourier-filtered and quality-guided phase-unwrapping algorithm,” Appl. Opt. 47, 5420–5428 (2008).

[CrossRef]
[PubMed]

Q. Kemao, W. Gao, and H. Wang, “Windowed Fourier filtered and quality guided phase unwrapping algorithm: on locally high-order polynomial phase,” Appl. Opt. 49, 1075–1079 (2010).

[CrossRef]
[PubMed]

P. Sandoz, R. Devillers, and A. Plata, “Unambiguous profilometry by fringe-order identification in white-light phase-shifting interferometry,” J. Mod. Opt. 44, 519–534 (1997).

[CrossRef]

S. S. Helen, M. P. Kothiyal, and R. S. Sirohi, “Phase shifting by a rotating polarizer in white-light interferometry for surface profiling,” J. Mod. Opt. 46, 993–1001 (1999).

P. Hariharan and M. Roy, “White-light phase-stepping interferometry for surface profiling,” J. Mod. Opt. 41, 2197–2201 (1994).

[CrossRef]

S. S. Helen, M. P. Kothiyal, and R. S. Sirohi, “White-light interferometry with polarization phase-shifter at the input of the interferometer,” J. Mod. Opt. 47, 1137–1145 (2000).

[CrossRef]

P. Hariharan, K. G. Larkin, and M. Roy, “The geometric phase: interferometric observations with white light,” J. Mod. Opt. 41, 663–667 (1994).

[CrossRef]

M. V. Berry, “The adiabatic phase and Pancharatnam’s phase for polarized light,” J. Mod. Opt. 34, 1401–1407 (1987).

[CrossRef]

P. Hariharan and P. E. Ciddor, “An achromatic phase-shifter operating on the geometric phase,” Opt. Commun. 110, 113–117 (1994).

[CrossRef]

S. S. Helen, M. P. Kothiyal, and R. S. Sirohi, “Achromatic phase shifting by a rotating polarizer,” Opt. Commun. 154, 249–254 (1998).

[CrossRef]

P. Hariharan, “Achromatic and apochromatic halfwave and quarterwave retarders,” Opt. Eng. 35, 3335–3337 (1996).

[CrossRef]

X. Y. Su and L. Xue, “Phase unwrapping algorithm based on fringe frequency analysis in Fourier-transform profilometry,” Opt. Eng. 40, 637–643 (2001).

[CrossRef]

M. Roy, G. Cox, and P. Hariharan, “Low-coherence interference microscopy with an improved switchable achromatic phase-shifter,” Opt. Express 13, 9125–9130 (2005).

[CrossRef]
[PubMed]

M. Roy, C. J. R. Sheppard, and P. Hariharan, “Low-coherence interference microscopy using a ferro-electric liquid crystal phase-modulator,” Opt. Express 12, 2512–2516 (2004).

[CrossRef]
[PubMed]

T. D. Visser, T. van Dijk, H. F. Schouten, and W. Ubachs, “The Pancharatnam–Berry phase for non-cyclic polarization changes,” Opt. Express 18, 10796–10804 (2010).

[CrossRef]
[PubMed]

M. Roy, J. Schmit, and P. Hariharan, “White-light interference microscopy: minimization of spurious diffraction effects by geometric phase-shifting,” Opt. Express 17, 4495–4499 (2009).

[CrossRef]
[PubMed]

X. Y. Su and W. J. Chen, “Reliability-guided phase unwrapping algorithm: a review,” Opt. Lasers Eng. 42, 245–261(2004).

[CrossRef]

M. Roy, P. Svahn, L. Cherel, and C. J. R. Sheppard, “Geometric phase-shifting for low-coherence interference microscopy,” Opt. Lasers Eng. 37, 631–641 (2002).

[CrossRef]

N. Baba and K. Shibayama, “Geometric phase observation with dispersed fringes,” Opt. Rev. 4, 593–595 (1997).

[CrossRef]

Y. J. Zhu, Z. Luan, Q. G. Yang, D. S. Li, W. Lu, and L. R. Liu, “Improved reliability-guided phase unwrapping algorithm based on the fringe modulation and second-order phase difference,” Optik (Jena) 118, 175–180 (2007).

[CrossRef]

J. Samuel and R. Bhandari, “General setting for Berry’s phase,” Phys. Rev. Lett. 60, 2339–2342 (1988).

[CrossRef]
[PubMed]

S. Pancharatnam, “Generalized theory of interference and its applications,” Proc. Ind. Acad. Sci. A 44, 247–262 (1956).

Y. Watanabe and M. Sato, “High-speed high-resolution full-field optical coherence tomography using achromatic phase shifting by a rotating polarizer,” in Pacific Rim Conference on Lasers and Electro-Optics (2005), Vol. 30, pp. 985–986.

[CrossRef]

“The CVI Melles Griot technical guide,” 2 (CVI Melles Griot Inc., 2009), pp. 58, 104.

H. Schreiber and J. H. Bruning, “Phase shifting interferometry,” in Optical Shop Testing, D.Malacara, ed. (Wiley2007), pp. 559–560.

M. Born and E. Wolf, Principles of Optics (Pergamon, 1980), pp. 30–32.

C. J. R. Sheppared and M. Roy, “Low-coherence interference microscopy,” in Optical Imaging and Microscopy: Techniques and Advanced Systems, P.Török and F.-J.Kao, eds. (Springer2003), p. 336.