We present a powerful spectral photoluminescence measurement method for thin films that utilizes the enhanced absorption of the fluorescent thin films on metal thin films with attenuated total reflection (ATR). The photoluminescence measurement has the advantageous effects of avoiding transmitted light and preventing the loss of luminescence through waveguiding in the film substrates. The ATR modes excited by low-power incident light provide fluorescence intensities that are considerably larger than that of conventional photoluminescence measurements and preserve the spectral profile of the photoluminescence.
© 2011 Optical Society of AmericaPDF Article
OSA Recommended Articles
Takashi Wakamatsu and Kazuhiro Saito
J. Opt. Soc. Am. B 24(9) 2307-2313 (2007)
Appl. Opt. 53(21) 4742-4746 (2014)
Keiko Tawa, Hironobu Hori, Kenji Kintaka, Kazuyuki Kiyosue, Yoshiro Tatsu, and Junji Nishii
Opt. Express 16(13) 9781-9790 (2008)