Abstract

Using polarization measurements in remote sensing and optical studies allows for the retrieval of more information. We consider the relationship between the reflection coefficients of plane and rough surfaces for linearly polarized waves. Certain polarization properties of reflected waves and polarization invariants, in particular at the incident angle of 45°, allow finding amplitude and phase characteristics of the reflected waves. Based on this study, we introduce methods for finding dielectric permittivity, temperature, and geometric characteristics of the observed surfaces. Experimental results prove that these methods can be used for different practical purposes in technological and remote sensing applications, in a broad range of the electromagnetic spectrum.

© 2011 Optical Society of America

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