Abstract

Silver and gold films with thicknesses in the range of 120–450nm were evaporated onto glass substrates. A sequence of slits with widths varying between 70 and 270nm was milled in the films using a focused gallium ion beam. We have undertaken high-resolution measurements of the optical transmission through the single slits with 488.0nm (for Ag) and 632.8nm (for Au) laser sources aligned to the optical axis of a microscope. Based on the present experimental results, it was possible to observe that (1) the slit transmission is notably affected by the film thickness, which presents a damped oscillatory behavior as the thickness is augmented, and (2) the transmission increases linearly with increasing slit width for a fixed film thickness.

© 2011 Optical Society of America

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