Abstract

We report the application of interferometry to the form measurement of a family of highly astigmatic optical surfaces. These measurements are based on a null test that employs a double-pass off-axis test arrangement with a tilted test surface and a reference sphere. This arrangement provides a perfect null test for an ellipsoid of revolution, or prolate spheroid. Its application is illustrated in detail in the presentation of results for the measurement of a specific family of eight differing surfaces that are incorporated into the K-Band Multi-Object Spectrometer Integral Field Unit. All surfaces measured here are sufficiently close to a prolate spheroid to justify its practical application. We discuss the application of the technique as a flexible low-cost approach for the generation of null interferograms in the measurement of a variety of complex surfaces.

© 2011 Optical Society of America

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