Abstract

A method to study the solar flux distributions of the solar images reflected by mirrors with different dielectric thicknesses is proposed in this paper. An optical scanner, also known as a flux mapping system, capable of acquiring the flux distribution pattern of a light source in a two-dimensional flat surface, has been designed and constructed. The optical scanner can measure the profile of flux distribution at reasonably high resolution with fewer photo-sensors with a fast scanning speed of several seconds. The real time measurement results of solar images projected by mirrors with dielectric thicknesses, i.e., 3mm, 4mm, 5mm and 6mm, have been performed to analyze their surface qualities.

© 2011 Optical Society of America

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