High-resolution digital holography utilized by the subpixel sampling method

Daniel Claus; Marco Fritzsche; Daciana Iliescu; Brenda Timmerman; Peter Bryanston-Cross

doi:10.1364/AO.50.004711

High-resolution digital holography utilized by the subpixel sampling method

Daniel Claus, Marco Fritzsche, Daciana Iliescu, Brenda Timmerman, and Peter Bryanston-Cross

Applied Optics
Vol. 50,
Issue 24,
pp. 4711-4719
(2011)
•doi: 10.1364/AO.50.004711

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Daniel Claus, Marco Fritzsche, Daciana Iliescu, Brenda Timmerman, and Peter Bryanston-Cross, "High-resolution digital holography utilized by the subpixel sampling method," Appl. Opt. 50, 4711-4719 (2011)

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Abstract

A novel (to our knowledge) approach for resolution improvement in digital holography is presented in this paper. The proposed method is based on recording the incoming interference field on a complementary metal-oxide semiconductor (CMOS) camera with subpixel resolution. The method takes advantage of the small pixel size of the CMOS sensor, while overcoming the reduced fill factor. This paper describes the experimental and numerical procedures. The improvement of the obtainable optical resolution, image quality, and phase measurement accuracy are demonstrated within this paper.

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Reconstruction	$3000 \times 3000$ at $295 mm$	$6000 \times 6000$ at $185 mm$	$5000 \times 5000$ from Ref. [14]	$8000 \times 8000$ from Ref. [7]
Maximum theoretical resolution ( $μm$ )	17.8 @ $632 nm$	11.2 @ $632 nm$	—	6.7 @ $632 nm$
Achieved vertical resolution ( $μm$ )	17.5	8.7	2.6	6.2
Achieved horizontal resolution ( $μm$ )	17.5	8.7	2.6	7.8
Field of view ( ${mm}^{2}$ )	$9.0 \times 12.1$	$11.7 \times 11.7$	$4 \times 4$	$30 \times 23$
SBP ( $10^{6}$ )	0.36	1.79	2.37	14.27
η (%)	3.96	4.95	9.5	22.3

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