Abstract

A novel (to our knowledge) approach for resolution improvement in digital holography is presented in this paper. The proposed method is based on recording the incoming interference field on a complementary metal-oxide semiconductor (CMOS) camera with subpixel resolution. The method takes advantage of the small pixel size of the CMOS sensor, while overcoming the reduced fill factor. This paper describes the experimental and numerical procedures. The improvement of the obtainable optical resolution, image quality, and phase measurement accuracy are demonstrated within this paper.

© 2011 Optical Society of America

High resolution digital holographic synthetic aperture applied to deformation measurement and extended depth of field method

Daniel Claus
Appl. Opt. 49(16) 3187-3198 (2010)

Quantitative space-bandwidth product analysis in digital holography

Daniel Claus, Daciana Iliescu, and Peter Bryanston-Cross
Appl. Opt. 50(34) H116-H127 (2011)

High resolution digital holographic microscopy with a wide field of view based on a synthetic aperture technique and use of linear CCD scanning

Jianglei Di, Jianlin Zhao, Hongzhen Jiang, Peng Zhang, Qi Fan, and Weiwei Sun
Appl. Opt. 47(30) 5654-5659 (2008)

Evaluation and benchmarking of a pixel-shifting camera for superresolution lensless digital holography

Yan Li, Francis Lilley, David Burton, and Michael Lalor
Appl. Opt. 49(9) 1643-1650 (2010)

Resolution analysis of a digital holography system

Yan Hao and Anand Asundi
Appl. Opt. 50(2) 183-193 (2011)