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[Crossref]

C. Quan, H. Niu, and C. J. Tay, “An improved windowed Fourier transform for fringe demodulation,” Opt. Laser Technol. 42, 126–131 (2010).

[Crossref]

Z. Zhang, D. P. Towers, and C. E. Towers, “Snapshot color fringe projection for absolute three-dimensional metrology of video sequences,” Appl. Opt. 49, 5947–5953 (2010).

[Crossref]

T. Anna, S. K. Dubey, C. Shakher, A. Roy, and D. S. Mehta, “Sinusoidal fringe projection system based on compact and non-mechanical scanning low-coherence Michelson interferometer for three-dimensional shape measurement,” Opt. Commun. 282, 1237–1242 (2009).

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[Crossref]

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[Crossref]

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[Crossref]

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[Crossref]

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[Crossref]

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[Crossref]

S. Mirza and C. Shakher, “Surface profiling using phase shifting Talbot interferometric technique,” Opt. Eng. 44, 013601 (2005).

[Crossref]

H. C. Hsu, C. H. Tung, C. F. Kao, and C. C. Chang, “A white-light profiling algorithm adopting the multiwavelength interferometric technique,” Proc. SPIE 5531, 244–249 (2004).

[Crossref]

P. de Groot, X. C. D. Lega, J. Kramer, and M. Turzhitsky, “Determination of fringe order in white-light interference microscopy,” Appl. Opt. 41, 4571–4578 (2002).

[Crossref]
[PubMed]

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[Crossref]

J. Schmit and A. Olszak, “High-precision shape measurement by white-light interferometry with real-time scanner error correction,” Appl. Opt. 41, 5943–5950 (2002).

[Crossref]
[PubMed]

J. M. Desse, F. Albe, and J. L. Tribillon, “Real-time color holographic interferometry,” Appl. Opt. 41, 5326–5333 (2002).

[Crossref]
[PubMed]

M. C. Park and S. W. Kim, “Direct quadratic polynomial fitting for fringe peak detection of white light scanning interferograms,” Opt. Eng. 39, 952–959 (2000).

[Crossref]

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[Crossref]

T. Anna, S. K. Dubey, C. Shakher, A. Roy, and D. S. Mehta, “Sinusoidal fringe projection system based on compact and non-mechanical scanning low-coherence Michelson interferometer for three-dimensional shape measurement,” Opt. Commun. 282, 1237–1242 (2009).

[Crossref]

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[Crossref]

Z. Buchta, P. Jedlička, M. Matějka, V. Kolařík, B. Mikel, J. Lazar, and O. Číp, “White-light interference fringe detection using color CCD camera,” in the Proceedings of IEEE AFRICON 2009 (IEEE, 2009), pp. 1–5.

[Crossref]

H. C. Hsu, C. H. Tung, C. F. Kao, and C. C. Chang, “A white-light profiling algorithm adopting the multiwavelength interferometric technique,” Proc. SPIE 5531, 244–249 (2004).

[Crossref]

S. Ma, C. Quan, R. Zhu, C. J. Tay, L. Chen, and Z. Gao, “Micro-profile measurement based on windowed Fourier transform in white-light scanning interferometry,” Opt. Commun. 284, 2488–2493 (2011).

[Crossref]

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[Crossref]

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[Crossref]

T. Anna, S. K. Dubey, C. Shakher, A. Roy, and D. S. Mehta, “Sinusoidal fringe projection system based on compact and non-mechanical scanning low-coherence Michelson interferometer for three-dimensional shape measurement,” Opt. Commun. 282, 1237–1242 (2009).

[Crossref]

L. Bruno, G. Felice, and A. Poggialini, “Design and calibration of a piezoelectric actuator for interferometric applications,” Opt. Lasers Eng. 45, 1148–1156 (2007).

[Crossref]

S. Ma, C. Quan, R. Zhu, C. J. Tay, L. Chen, and Z. Gao, “Micro-profile measurement based on windowed Fourier transform in white-light scanning interferometry,” Opt. Commun. 284, 2488–2493 (2011).

[Crossref]

H. C. Hsu, C. H. Tung, C. F. Kao, and C. C. Chang, “A white-light profiling algorithm adopting the multiwavelength interferometric technique,” Proc. SPIE 5531, 244–249 (2004).

[Crossref]

Z. Buchta, P. Jedlička, M. Matějka, V. Kolařík, B. Mikel, J. Lazar, and O. Číp, “White-light interference fringe detection using color CCD camera,” in the Proceedings of IEEE AFRICON 2009 (IEEE, 2009), pp. 1–5.

[Crossref]

H. C. Hsu, C. H. Tung, C. F. Kao, and C. C. Chang, “A white-light profiling algorithm adopting the multiwavelength interferometric technique,” Proc. SPIE 5531, 244–249 (2004).

[Crossref]

Z. Buchta, P. Jedlička, M. Matějka, V. Kolařík, B. Mikel, J. Lazar, and O. Číp, “White-light interference fringe detection using color CCD camera,” in the Proceedings of IEEE AFRICON 2009 (IEEE, 2009), pp. 1–5.

[Crossref]

Z. Buchta, P. Jedlička, M. Matějka, V. Kolařík, B. Mikel, J. Lazar, and O. Číp, “White-light interference fringe detection using color CCD camera,” in the Proceedings of IEEE AFRICON 2009 (IEEE, 2009), pp. 1–5.

[Crossref]

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[Crossref]

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S. Ma, C. Quan, R. Zhu, C. J. Tay, L. Chen, and Z. Gao, “Micro-profile measurement based on windowed Fourier transform in white-light scanning interferometry,” Opt. Commun. 284, 2488–2493 (2011).

[Crossref]

Z. Buchta, P. Jedlička, M. Matějka, V. Kolařík, B. Mikel, J. Lazar, and O. Číp, “White-light interference fringe detection using color CCD camera,” in the Proceedings of IEEE AFRICON 2009 (IEEE, 2009), pp. 1–5.

[Crossref]

T. Anna, S. K. Dubey, C. Shakher, A. Roy, and D. S. Mehta, “Sinusoidal fringe projection system based on compact and non-mechanical scanning low-coherence Michelson interferometer for three-dimensional shape measurement,” Opt. Commun. 282, 1237–1242 (2009).

[Crossref]

Z. Buchta, P. Jedlička, M. Matějka, V. Kolařík, B. Mikel, J. Lazar, and O. Číp, “White-light interference fringe detection using color CCD camera,” in the Proceedings of IEEE AFRICON 2009 (IEEE, 2009), pp. 1–5.

[Crossref]

S. Mirza and C. Shakher, “Surface profiling using phase shifting Talbot interferometric technique,” Opt. Eng. 44, 013601 (2005).

[Crossref]

M. Pawlowski, Y. Sakano, Y. Miyamoto, and M. Takeda, “Phase-crossing algorithm for white-light fringes analysis,” Opt. Commun. 260, 68–72 (2006).

[Crossref]

M. Pawlowski, Y. Sakano, Y. Miyamoto, and M. Takeda, “Multi-spectral phase-crossing white-light interferometry,” Proc. SPIE 5776, 88–93 (2005).

[Crossref]

C. Quan, H. Niu, and C. J. Tay, “An improved windowed Fourier transform for fringe demodulation,” Opt. Laser Technol. 42, 126–131 (2010).

[Crossref]

M. C. Park and S. W. Kim, “Direct quadratic polynomial fitting for fringe peak detection of white light scanning interferograms,” Opt. Eng. 39, 952–959 (2000).

[Crossref]

M. Pawlowski, Y. Sakano, Y. Miyamoto, and M. Takeda, “Phase-crossing algorithm for white-light fringes analysis,” Opt. Commun. 260, 68–72 (2006).

[Crossref]

M. Pawlowski, Y. Sakano, Y. Miyamoto, and M. Takeda, “Multi-spectral phase-crossing white-light interferometry,” Proc. SPIE 5776, 88–93 (2005).

[Crossref]

L. Bruno, G. Felice, and A. Poggialini, “Design and calibration of a piezoelectric actuator for interferometric applications,” Opt. Lasers Eng. 45, 1148–1156 (2007).

[Crossref]

S. Ma, C. Quan, R. Zhu, C. J. Tay, L. Chen, and Z. Gao, “Micro-profile measurement based on windowed Fourier transform in white-light scanning interferometry,” Opt. Commun. 284, 2488–2493 (2011).

[Crossref]

C. Quan, H. Niu, and C. J. Tay, “An improved windowed Fourier transform for fringe demodulation,” Opt. Laser Technol. 42, 126–131 (2010).

[Crossref]

M. Li, C. Quan, and C. J. Tay, “Continuous wavelet transform for micro-component profile measurement using vertical scanning interferometry,” Opt. Laser Technol. 40, 920–929(2008).

[Crossref]

T. Anna, S. K. Dubey, C. Shakher, A. Roy, and D. S. Mehta, “Sinusoidal fringe projection system based on compact and non-mechanical scanning low-coherence Michelson interferometer for three-dimensional shape measurement,” Opt. Commun. 282, 1237–1242 (2009).

[Crossref]

M. Pawlowski, Y. Sakano, Y. Miyamoto, and M. Takeda, “Phase-crossing algorithm for white-light fringes analysis,” Opt. Commun. 260, 68–72 (2006).

[Crossref]

M. Pawlowski, Y. Sakano, Y. Miyamoto, and M. Takeda, “Multi-spectral phase-crossing white-light interferometry,” Proc. SPIE 5776, 88–93 (2005).

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[Crossref]

S. Mirza and C. Shakher, “Surface profiling using phase shifting Talbot interferometric technique,” Opt. Eng. 44, 013601 (2005).

[Crossref]

M. Pawlowski, Y. Sakano, Y. Miyamoto, and M. Takeda, “Phase-crossing algorithm for white-light fringes analysis,” Opt. Commun. 260, 68–72 (2006).

[Crossref]

M. Pawlowski, Y. Sakano, Y. Miyamoto, and M. Takeda, “Multi-spectral phase-crossing white-light interferometry,” Proc. SPIE 5776, 88–93 (2005).

[Crossref]

S. Ma, C. Quan, R. Zhu, C. J. Tay, L. Chen, and Z. Gao, “Micro-profile measurement based on windowed Fourier transform in white-light scanning interferometry,” Opt. Commun. 284, 2488–2493 (2011).

[Crossref]

C. Quan, H. Niu, and C. J. Tay, “An improved windowed Fourier transform for fringe demodulation,” Opt. Laser Technol. 42, 126–131 (2010).

[Crossref]

M. Li, C. Quan, and C. J. Tay, “Continuous wavelet transform for micro-component profile measurement using vertical scanning interferometry,” Opt. Laser Technol. 40, 920–929(2008).

[Crossref]

H. C. Hsu, C. H. Tung, C. F. Kao, and C. C. Chang, “A white-light profiling algorithm adopting the multiwavelength interferometric technique,” Proc. SPIE 5531, 244–249 (2004).

[Crossref]

M. Born and E. Wolf, Principles of Optics, 6th ed.(Pergamon, 1980).

J. C. Wyant, “White light interferometry,” Proc. SPIE 4737, 98–107 (2002).

[Crossref]

J. C. Wyant and K. Creath, “Advances in interferometric optical profiling,” Int. J. Mach. Tools Manuf. 32, 5–10 (1992).

[Crossref]

S. Ma, C. Quan, R. Zhu, C. J. Tay, L. Chen, and Z. Gao, “Micro-profile measurement based on windowed Fourier transform in white-light scanning interferometry,” Opt. Commun. 284, 2488–2493 (2011).

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[Crossref]
[PubMed]

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[Crossref]
[PubMed]

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[Crossref]
[PubMed]

P. de Groot, X. C. D. Lega, J. Kramer, and M. Turzhitsky, “Determination of fringe order in white-light interference microscopy,” Appl. Opt. 41, 4571–4578 (2002).

[Crossref]
[PubMed]

Z. Zhang, D. P. Towers, and C. E. Towers, “Snapshot color fringe projection for absolute three-dimensional metrology of video sequences,” Appl. Opt. 49, 5947–5953 (2010).

[Crossref]

J. M. Desse, F. Albe, and J. L. Tribillon, “Real-time color holographic interferometry,” Appl. Opt. 41, 5326–5333 (2002).

[Crossref]
[PubMed]

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[Crossref]

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[Crossref]
[PubMed]

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[Crossref]

J. C. Wyant and K. Creath, “Advances in interferometric optical profiling,” Int. J. Mach. Tools Manuf. 32, 5–10 (1992).

[Crossref]

P. Sandoz, “An algorithm for profilometry by white-light phase-shifting interferometry,” J. Mod. Opt. 43, 1545–1554(1996).

P. de Groot and L. Deck, “Surface profiling by analysis of white-light interferograms in the spatial frequency domain,” J. Mod. Opt. 42, 389–401 (1995).

[Crossref]

T. Anna, S. K. Dubey, C. Shakher, A. Roy, and D. S. Mehta, “Sinusoidal fringe projection system based on compact and non-mechanical scanning low-coherence Michelson interferometer for three-dimensional shape measurement,” Opt. Commun. 282, 1237–1242 (2009).

[Crossref]

S. Ma, C. Quan, R. Zhu, C. J. Tay, L. Chen, and Z. Gao, “Micro-profile measurement based on windowed Fourier transform in white-light scanning interferometry,” Opt. Commun. 284, 2488–2493 (2011).

[Crossref]

M. Pawlowski, Y. Sakano, Y. Miyamoto, and M. Takeda, “Phase-crossing algorithm for white-light fringes analysis,” Opt. Commun. 260, 68–72 (2006).

[Crossref]

M. C. Park and S. W. Kim, “Direct quadratic polynomial fitting for fringe peak detection of white light scanning interferograms,” Opt. Eng. 39, 952–959 (2000).

[Crossref]

S. Mirza and C. Shakher, “Surface profiling using phase shifting Talbot interferometric technique,” Opt. Eng. 44, 013601 (2005).

[Crossref]

M. Li, C. Quan, and C. J. Tay, “Continuous wavelet transform for micro-component profile measurement using vertical scanning interferometry,” Opt. Laser Technol. 40, 920–929(2008).

[Crossref]

C. Quan, H. Niu, and C. J. Tay, “An improved windowed Fourier transform for fringe demodulation,” Opt. Laser Technol. 42, 126–131 (2010).

[Crossref]

L. Bruno, G. Felice, and A. Poggialini, “Design and calibration of a piezoelectric actuator for interferometric applications,” Opt. Lasers Eng. 45, 1148–1156 (2007).

[Crossref]

K. Qian, “Two-dimensional windowed Fourier transform for fringe pattern analysis: principles, applications and implementations,” Opt. Lasers Eng. 45, 304–317 (2007).

[Crossref]

H. C. Hsu, C. H. Tung, C. F. Kao, and C. C. Chang, “A white-light profiling algorithm adopting the multiwavelength interferometric technique,” Proc. SPIE 5531, 244–249 (2004).

[Crossref]

M. Pawlowski, Y. Sakano, Y. Miyamoto, and M. Takeda, “Multi-spectral phase-crossing white-light interferometry,” Proc. SPIE 5776, 88–93 (2005).

[Crossref]

J. C. Wyant, “White light interferometry,” Proc. SPIE 4737, 98–107 (2002).

[Crossref]

Z. Buchta, P. Jedlička, M. Matějka, V. Kolařík, B. Mikel, J. Lazar, and O. Číp, “White-light interference fringe detection using color CCD camera,” in the Proceedings of IEEE AFRICON 2009 (IEEE, 2009), pp. 1–5.

[Crossref]

M. Li, “Development of fringe analysis techniques in white light interferometry for micro-component measurement,” Ph.D. thesis (National University of Singapore, 2008).

M. Born and E. Wolf, Principles of Optics, 6th ed.(Pergamon, 1980).