Abstract

A method is described that permits the quantitative measurement of light scattered by the bulk material and individual scattering centers in transparent crystals and photographic recording with an ultramicroscope. The bulk scattering observed in sodium chloride single crystals is proved to be Brillouin scattering. This suggests the use of Brillouin scattering as a reference for the measurement of the intensity of light scattered by individual centers.

© 1966 Optical Society of America

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References

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  1. L. Taurel, J. Phys. Radium 20, 919 (1959).
    [CrossRef]
  2. K. G. Bansigir, E. E. Schneider, J. Appl. Phys. Suppl. 33, 383 (1962).
    [CrossRef]
  3. G. Heilmann, Z. Angew. Phys. 17, 482 (1964).
  4. G. Heilmann, Appl. Opt. 4, 1201 (1965).
    [CrossRef]
  5. C. A. Plint, W. A. Sibley, J. Appl. Phys. 33, 3167 (1962).
    [CrossRef]
  6. C. A. Plint, M. L. Breig, J. Appl. Phys. 35, 2745 (1964).
    [CrossRef]
  7. C. A. Plint, W. A. Sibley, J. Chem. Phys. 42, 1378 (1965).
    [CrossRef]
  8. G. Heilmann, E. E. Schneider, in International Conference on Electron Diffraction and Crystal Defects, Melbourne, 1965 (Australian Academy of Science, Melbourne, 1965), Vol. II, p. 4.
  9. O. Theimer, C. A. Plint, Ann. Phys. 3, 408 (1958).
    [CrossRef]
  10. L. Brillouin, Ann. Phys. 17, 88 (1922); M. Leontowitsch, S. Mandelstam, Physik Z. Sowjetunion 1, 317 (1931).
  11. G. Heilmann, Nature 208, 884 (1965).
    [CrossRef]

1965 (3)

C. A. Plint, W. A. Sibley, J. Chem. Phys. 42, 1378 (1965).
[CrossRef]

G. Heilmann, Nature 208, 884 (1965).
[CrossRef]

G. Heilmann, Appl. Opt. 4, 1201 (1965).
[CrossRef]

1964 (2)

G. Heilmann, Z. Angew. Phys. 17, 482 (1964).

C. A. Plint, M. L. Breig, J. Appl. Phys. 35, 2745 (1964).
[CrossRef]

1962 (2)

C. A. Plint, W. A. Sibley, J. Appl. Phys. 33, 3167 (1962).
[CrossRef]

K. G. Bansigir, E. E. Schneider, J. Appl. Phys. Suppl. 33, 383 (1962).
[CrossRef]

1959 (1)

L. Taurel, J. Phys. Radium 20, 919 (1959).
[CrossRef]

1958 (1)

O. Theimer, C. A. Plint, Ann. Phys. 3, 408 (1958).
[CrossRef]

1922 (1)

L. Brillouin, Ann. Phys. 17, 88 (1922); M. Leontowitsch, S. Mandelstam, Physik Z. Sowjetunion 1, 317 (1931).

Bansigir, K. G.

K. G. Bansigir, E. E. Schneider, J. Appl. Phys. Suppl. 33, 383 (1962).
[CrossRef]

Breig, M. L.

C. A. Plint, M. L. Breig, J. Appl. Phys. 35, 2745 (1964).
[CrossRef]

Brillouin, L.

L. Brillouin, Ann. Phys. 17, 88 (1922); M. Leontowitsch, S. Mandelstam, Physik Z. Sowjetunion 1, 317 (1931).

Heilmann, G.

G. Heilmann, Appl. Opt. 4, 1201 (1965).
[CrossRef]

G. Heilmann, Nature 208, 884 (1965).
[CrossRef]

G. Heilmann, Z. Angew. Phys. 17, 482 (1964).

G. Heilmann, E. E. Schneider, in International Conference on Electron Diffraction and Crystal Defects, Melbourne, 1965 (Australian Academy of Science, Melbourne, 1965), Vol. II, p. 4.

Plint, C. A.

C. A. Plint, W. A. Sibley, J. Chem. Phys. 42, 1378 (1965).
[CrossRef]

C. A. Plint, M. L. Breig, J. Appl. Phys. 35, 2745 (1964).
[CrossRef]

C. A. Plint, W. A. Sibley, J. Appl. Phys. 33, 3167 (1962).
[CrossRef]

O. Theimer, C. A. Plint, Ann. Phys. 3, 408 (1958).
[CrossRef]

Schneider, E. E.

K. G. Bansigir, E. E. Schneider, J. Appl. Phys. Suppl. 33, 383 (1962).
[CrossRef]

G. Heilmann, E. E. Schneider, in International Conference on Electron Diffraction and Crystal Defects, Melbourne, 1965 (Australian Academy of Science, Melbourne, 1965), Vol. II, p. 4.

Sibley, W. A.

C. A. Plint, W. A. Sibley, J. Chem. Phys. 42, 1378 (1965).
[CrossRef]

C. A. Plint, W. A. Sibley, J. Appl. Phys. 33, 3167 (1962).
[CrossRef]

Taurel, L.

L. Taurel, J. Phys. Radium 20, 919 (1959).
[CrossRef]

Theimer, O.

O. Theimer, C. A. Plint, Ann. Phys. 3, 408 (1958).
[CrossRef]

Ann. Phys. (2)

O. Theimer, C. A. Plint, Ann. Phys. 3, 408 (1958).
[CrossRef]

L. Brillouin, Ann. Phys. 17, 88 (1922); M. Leontowitsch, S. Mandelstam, Physik Z. Sowjetunion 1, 317 (1931).

Appl. Opt. (1)

J. Appl. Phys. (2)

C. A. Plint, W. A. Sibley, J. Appl. Phys. 33, 3167 (1962).
[CrossRef]

C. A. Plint, M. L. Breig, J. Appl. Phys. 35, 2745 (1964).
[CrossRef]

J. Appl. Phys. Suppl. (1)

K. G. Bansigir, E. E. Schneider, J. Appl. Phys. Suppl. 33, 383 (1962).
[CrossRef]

J. Chem. Phys. (1)

C. A. Plint, W. A. Sibley, J. Chem. Phys. 42, 1378 (1965).
[CrossRef]

J. Phys. Radium (1)

L. Taurel, J. Phys. Radium 20, 919 (1959).
[CrossRef]

Nature (1)

G. Heilmann, Nature 208, 884 (1965).
[CrossRef]

Z. Angew. Phys. (1)

G. Heilmann, Z. Angew. Phys. 17, 482 (1964).

Other (1)

G. Heilmann, E. E. Schneider, in International Conference on Electron Diffraction and Crystal Defects, Melbourne, 1965 (Australian Academy of Science, Melbourne, 1965), Vol. II, p. 4.

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Figures (3)

Fig. 1
Fig. 1

General disposition of optical arrangement (the microscope that is mounted with its axis vertical is not shown). S light source, L1 condenser, F filter, SL stop, L0 field lens, BS beam splitter, L2 illuminating lens, SP specimen, C calibrating unit, A attenuator.

Fig. 2
Fig. 2

Pencils of illuminating and observed light. F surface element in the focal plane of microscope, a and b depth and width of illuminated cross section, S0 and S unit vectors in the directions of the pencils of illuminating and observed light.

Fig. 3
Fig. 3

Beam splitter and attenuator with camera. Angle of reflection 56.5°—close to Brewster angle.

Equations (3)

Equations on this page are rendered with MathJax. Learn more.

I = I 0 Ω 0 F Ω 0 Ω P + V d Ω 0 d Ω ,
I = I 0 A P + , with A = ( a Ω / M 2 ) ( 1 - K ( u i ; u k ) ) .
K = sin 2 u i 2 ( 1 + cos 2 u k 2 cos u k ) .

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