Abstract

A method is described for the calibration of a nonexact quarter-wave plate. This method makes use of the sensitive dependence on the retardation angle, for retardation angles near 90°, of the functional relation between the orientation of the quarter-wave plate optical axis and the orientation of the polarization ellipse major axis, both with respect to the axis of the initial linear polarizer.

© 1966 Optical Society of America

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References

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  1. M. Richartz, Hsien-Yu Hau, J. Opt. Soc. Am. 39, 136 (1949).
    [Crossref]
  2. H. G. Jerrard, J. Opt. Soc. Am. 38, 35 (1948).
    [Crossref]
  3. H. G. Jerrard, J. Opt. Soc. Am. 44, 634 (1954).
    [Crossref]
  4. R. C. Plumb, J. Opt. Soc. Am. 50, 892 (1960).
    [Crossref]

1960 (1)

1954 (1)

1949 (1)

1948 (1)

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Figures (5)

Fig. 1
Fig. 1

Orientation parameters for optical elements used in measuring retardation angle α, showing intensity pattern determined by analyzer when α = 95.6°, β = 42.5°, and θ = 66.5°.

Fig. 2
Fig. 2

Graphs of post analyzer intensity patterns for monochromatic wave for β = 42.5° and various values of α slightly larger than 90°.

Fig. 3
Fig. 3

Ellipse major axis orientation θ as a function of quarter-wave plate axis orientation β calculated for various values of retardation angle α.

Fig. 4
Fig. 4

Ellipse major axis orientation θ as a function of quarter-wave plate axis orientation β calculated for values of retardation angle α slightly larger than 90°.

Fig. 5
Fig. 5

Ellipse major axis orientation θ as a function of quarter-wave plate axis orientation β. Measured values for two samples of retardation sheet are compared with graphs of values calculated for retardation angles of 97.2° and 98.8°. ▽ Sample 1: 98.0° ±0.3°. ○ Sample 2: 96.9° ± 0.3°.

Equations (2)

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I = 1 / 2 [ cos 2 ϕ + sin 2 β sin 2 ( ϕ - β ) sin 2 α / 2 ] ,
tan 2 θ = sin 4 β / [ ctn 2 α / 2 + cos 4 β ] ,

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