Abstract

A method for determination of refractive indices which may be applied to thin flat plates of optical materials is considered. It is particularly suited for use with materials whose refractive indices are large (>1.8), but is not limited in the range of refractive index it can determine. The method uses an interferometer to measure the optical pathlength through a sample, and is shown to have moderate accuracy: ±2 × 10−4 in refractive index for a sample 0.5 mm thick. The effect of a nonideal sample is considered, and is shown to have only a small effect on the accuracy. The method has been applied to single-crystal barium titanate in the visible spectrum, and tabulated results are given.

© 1966 Optical Society of America

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  1. F. D. Bloss, An Introduction to the Methods of Optical Crystallography (Holt, New York, 1961), p. 48.
  2. Harshaw Scientific Co., Cleveland, Ohio.
  3. M. S. Shumate, Scientific Rept. No. 5, (Quantum Electronics Lab., California Institute of Technology, Pasadena, Calif., 1964.
  4. M. S. Shumate, Appl. Phys. Letters 5, 178 (1964).
    [CrossRef]
  5. E. R. von Nardroff, Science 17, 861 (1903).
    [CrossRef]
  6. C. A. Proctor, Phys. Rev. 24, 195 (1907).
  7. M. Born, E. Wolf, Principles of Optics (Pergamon, New York, 1959), p. 290.
  8. R. Hoffman, Helv. Phys. Acta 35, 532 (1962).
  9. W. N. Lawless, R. C. DeVries, J. Appl. Phys. 35, 638 (1964).
  10. W. N. Lawless, R. C. DeVries, J. Opt. Soc. Am. 54, 1225 (1964).
    [CrossRef]
  11. R. C. DeVries, private communication.

1964 (3)

M. S. Shumate, Appl. Phys. Letters 5, 178 (1964).
[CrossRef]

W. N. Lawless, R. C. DeVries, J. Appl. Phys. 35, 638 (1964).

W. N. Lawless, R. C. DeVries, J. Opt. Soc. Am. 54, 1225 (1964).
[CrossRef]

1962 (1)

R. Hoffman, Helv. Phys. Acta 35, 532 (1962).

1907 (1)

C. A. Proctor, Phys. Rev. 24, 195 (1907).

1903 (1)

E. R. von Nardroff, Science 17, 861 (1903).
[CrossRef]

Bloss, F. D.

F. D. Bloss, An Introduction to the Methods of Optical Crystallography (Holt, New York, 1961), p. 48.

Born, M.

M. Born, E. Wolf, Principles of Optics (Pergamon, New York, 1959), p. 290.

DeVries, R. C.

W. N. Lawless, R. C. DeVries, J. Appl. Phys. 35, 638 (1964).

W. N. Lawless, R. C. DeVries, J. Opt. Soc. Am. 54, 1225 (1964).
[CrossRef]

R. C. DeVries, private communication.

Hoffman, R.

R. Hoffman, Helv. Phys. Acta 35, 532 (1962).

Lawless, W. N.

W. N. Lawless, R. C. DeVries, J. Appl. Phys. 35, 638 (1964).

W. N. Lawless, R. C. DeVries, J. Opt. Soc. Am. 54, 1225 (1964).
[CrossRef]

Proctor, C. A.

C. A. Proctor, Phys. Rev. 24, 195 (1907).

Shumate, M. S.

M. S. Shumate, Appl. Phys. Letters 5, 178 (1964).
[CrossRef]

M. S. Shumate, Scientific Rept. No. 5, (Quantum Electronics Lab., California Institute of Technology, Pasadena, Calif., 1964.

von Nardroff, E. R.

E. R. von Nardroff, Science 17, 861 (1903).
[CrossRef]

Wolf, E.

M. Born, E. Wolf, Principles of Optics (Pergamon, New York, 1959), p. 290.

Appl. Phys. Letters (1)

M. S. Shumate, Appl. Phys. Letters 5, 178 (1964).
[CrossRef]

Helv. Phys. Acta (1)

R. Hoffman, Helv. Phys. Acta 35, 532 (1962).

J. Appl. Phys. (1)

W. N. Lawless, R. C. DeVries, J. Appl. Phys. 35, 638 (1964).

J. Opt. Soc. Am. (1)

Phys. Rev. (1)

C. A. Proctor, Phys. Rev. 24, 195 (1907).

Science (1)

E. R. von Nardroff, Science 17, 861 (1903).
[CrossRef]

Other (5)

F. D. Bloss, An Introduction to the Methods of Optical Crystallography (Holt, New York, 1961), p. 48.

Harshaw Scientific Co., Cleveland, Ohio.

M. S. Shumate, Scientific Rept. No. 5, (Quantum Electronics Lab., California Institute of Technology, Pasadena, Calif., 1964.

M. Born, E. Wolf, Principles of Optics (Pergamon, New York, 1959), p. 290.

R. C. DeVries, private communication.

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