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[CrossRef]

B. Pan, Q. Kemao, L. Huang, and A. Asundi, “Phase error analysis and compensation for nonsinusoidal waveforms in phase-shifting digital fringe projection profilometry,” Opt. Lett. 34, 416-418 (2009).

[CrossRef]
[PubMed]

A. Maurel, P. Cobelli, V. Pagneux, and P. Petitjeans, “Experimental and theoretical inspection of the phase-to-height relation in Fourier transform profilometry,” Appl. Opt. 48, 380-392 (2009).

[CrossRef]
[PubMed]

S. Zhang and P. S. Huang, “High-resolution, real-time three-dimensional shape measurement,” Opt. Eng. 45, 123601-123608 (2006).

[CrossRef]

Z. Wang and H. Ma, “Advanced continuous wavelet transform algorithm for digital interferogram analysis and processing,” Opt. Eng. 45, 045601 (2006).

[CrossRef]

Q. Zhang, X. Su, Y. Cao, Y. Li, L. Xiang, and W. Chen, “Optical 3-D shape and deformation measurement of rotating blades using stroboscopic structured illumination,” Opt. Eng. 44, 113601-113607 (2005).

[CrossRef]

L.-C. Chen and C.-C. Liao, “Calibration of 3D surface profilometry using digital fringe projection,” Meas. Sci. Technol. 16, 1554-1566 (2005).

[CrossRef]

H. Guo, H. He, Y. Yu, and M. Chen, “Least-squares calibration method for fringe projection profilometry,” Opt. Eng. 44, 033603-033609 (2005).

[CrossRef]

X. Su and W. Chen, “Reliability-guided phase unwrapping algorithm: a review,” Opt. Lasers Eng. 42, 245-261 (2004).

[CrossRef]

X. Su, W. Song, Y. Cao, and L. Xiang, “Phase-height mapping and coordinate calibration simultaneously in phase-measuring profilometry,” Opt. Eng. 43, 708-712 (2004).

[CrossRef]

H. Liu, W. H. Su, K. Reichard, and S. Yin, “Calibration-based phase-shifting projected fringe profilometry for accurate absolute 3D surface profile measurement,” Opt. Commun. 216, 65-80 (2003).

[CrossRef]

Q. Hu, P. S. Huang, Q. Fu, and F.-P. Chiang, “Calibration of a three-dimensional shape measurement system,” Opt. Eng. 42, 487-493 (2003).

[CrossRef]

X. Su and W. Chen, “Fourier transform profilometry: a review,” Opt. Lasers Eng. 35, 263-284 (2001).

[CrossRef]

Z. Zhang, “A flexible new technique for camera calibration,” IEEE Trans. Pattern Anal. Machine Intell. 22, 1330-1334(2000).

[CrossRef]

J. Y. Bouguet, “Camera calibration toolbox for MATLAB,” http://www.vision.caltech.edu/bouguetj/calib_doc.

Q. Zhang, X. Su, Y. Cao, Y. Li, L. Xiang, and W. Chen, “Optical 3-D shape and deformation measurement of rotating blades using stroboscopic structured illumination,” Opt. Eng. 44, 113601-113607 (2005).

[CrossRef]

X. Su, W. Song, Y. Cao, and L. Xiang, “Phase-height mapping and coordinate calibration simultaneously in phase-measuring profilometry,” Opt. Eng. 43, 708-712 (2004).

[CrossRef]

L.-C. Chen and C.-C. Liao, “Calibration of 3D surface profilometry using digital fringe projection,” Meas. Sci. Technol. 16, 1554-1566 (2005).

[CrossRef]

H. Guo, H. He, Y. Yu, and M. Chen, “Least-squares calibration method for fringe projection profilometry,” Opt. Eng. 44, 033603-033609 (2005).

[CrossRef]

Q. Zhang, X. Su, Y. Cao, Y. Li, L. Xiang, and W. Chen, “Optical 3-D shape and deformation measurement of rotating blades using stroboscopic structured illumination,” Opt. Eng. 44, 113601-113607 (2005).

[CrossRef]

X. Su and W. Chen, “Reliability-guided phase unwrapping algorithm: a review,” Opt. Lasers Eng. 42, 245-261 (2004).

[CrossRef]

X. Su and W. Chen, “Fourier transform profilometry: a review,” Opt. Lasers Eng. 35, 263-284 (2001).

[CrossRef]

Q. Hu, P. S. Huang, Q. Fu, and F.-P. Chiang, “Calibration of a three-dimensional shape measurement system,” Opt. Eng. 42, 487-493 (2003).

[CrossRef]

Q. Hu, P. S. Huang, Q. Fu, and F.-P. Chiang, “Calibration of a three-dimensional shape measurement system,” Opt. Eng. 42, 487-493 (2003).

[CrossRef]

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[CrossRef]

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[CrossRef]

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[CrossRef]

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[CrossRef]

Q. Hu, P. S. Huang, Q. Fu, and F.-P. Chiang, “Calibration of a three-dimensional shape measurement system,” Opt. Eng. 42, 487-493 (2003).

[CrossRef]

S. Zhang and P. S. Huang, “High-resolution, real-time three-dimensional shape measurement,” Opt. Eng. 45, 123601-123608 (2006).

[CrossRef]

Q. Hu, P. S. Huang, Q. Fu, and F.-P. Chiang, “Calibration of a three-dimensional shape measurement system,” Opt. Eng. 42, 487-493 (2003).

[CrossRef]

B. Pan, Q. Kemao, L. Huang, and A. Asundi, “Phase error analysis and compensation for nonsinusoidal waveforms in phase-shifting digital fringe projection profilometry,” Opt. Lett. 34, 416-418 (2009).

[CrossRef]
[PubMed]

Q. Kemao, W. Gao, and H. Wang, “Windowed Fourier-filtered and quality-guided phase-unwrapping algorithm,” Appl. Opt. 47, 5408 (2008).

[CrossRef]
[PubMed]

Q. Zhang, X. Su, Y. Cao, Y. Li, L. Xiang, and W. Chen, “Optical 3-D shape and deformation measurement of rotating blades using stroboscopic structured illumination,” Opt. Eng. 44, 113601-113607 (2005).

[CrossRef]

L.-C. Chen and C.-C. Liao, “Calibration of 3D surface profilometry using digital fringe projection,” Meas. Sci. Technol. 16, 1554-1566 (2005).

[CrossRef]

H. Liu, W. H. Su, K. Reichard, and S. Yin, “Calibration-based phase-shifting projected fringe profilometry for accurate absolute 3D surface profile measurement,” Opt. Commun. 216, 65-80 (2003).

[CrossRef]

Z. Wang and H. Ma, “Advanced continuous wavelet transform algorithm for digital interferogram analysis and processing,” Opt. Eng. 45, 045601 (2006).

[CrossRef]

M. Fujigaki, A. Takagishi, T. Matui, and Y. Morimoto, “Development of real-time shape measurement system using whole-space tabulation method,” in *Two- and Three-Dimensional Methods for Inspection and Metrology VI* (SPIE, 2008), pp. 706606-706608.

M. Fujigaki, A. Takagishi, T. Matui, and Y. Morimoto, “Development of real-time shape measurement system using whole-space tabulation method,” in *Two- and Three-Dimensional Methods for Inspection and Metrology VI* (SPIE, 2008), pp. 706606-706608.

H. Liu, W. H. Su, K. Reichard, and S. Yin, “Calibration-based phase-shifting projected fringe profilometry for accurate absolute 3D surface profile measurement,” Opt. Commun. 216, 65-80 (2003).

[CrossRef]

J. Heikkila and O. Silven, “A four-step camera calibration procedure with implicit image correction,” in *1997 IEEE Computer Society Conference on Computer Vision and Pattern Recognition* (IEEE, 1997), pp. 1106-1112.

[CrossRef]

X. Su, W. Song, Y. Cao, and L. Xiang, “Phase-height mapping and coordinate calibration simultaneously in phase-measuring profilometry,” Opt. Eng. 43, 708-712 (2004).

[CrossRef]

H. Liu, W. H. Su, K. Reichard, and S. Yin, “Calibration-based phase-shifting projected fringe profilometry for accurate absolute 3D surface profile measurement,” Opt. Commun. 216, 65-80 (2003).

[CrossRef]

Q. Zhang, X. Su, Y. Cao, Y. Li, L. Xiang, and W. Chen, “Optical 3-D shape and deformation measurement of rotating blades using stroboscopic structured illumination,” Opt. Eng. 44, 113601-113607 (2005).

[CrossRef]

X. Su and W. Chen, “Reliability-guided phase unwrapping algorithm: a review,” Opt. Lasers Eng. 42, 245-261 (2004).

[CrossRef]

X. Su, W. Song, Y. Cao, and L. Xiang, “Phase-height mapping and coordinate calibration simultaneously in phase-measuring profilometry,” Opt. Eng. 43, 708-712 (2004).

[CrossRef]

X. Su and W. Chen, “Fourier transform profilometry: a review,” Opt. Lasers Eng. 35, 263-284 (2001).

[CrossRef]

M. Fujigaki, A. Takagishi, T. Matui, and Y. Morimoto, “Development of real-time shape measurement system using whole-space tabulation method,” in *Two- and Three-Dimensional Methods for Inspection and Metrology VI* (SPIE, 2008), pp. 706606-706608.

Z. Wang, H. Du, S. Park, and H. Xie, “Three-dimensional shape measurement with a fast and accurate approach,” Appl. Opt. 48, 1052-1061 (2009).

[CrossRef]

H. Du and Z. Wang, “Three-dimensional shape measurement with an arbitrarily arranged fringe projection profilometry system,” Opt. Lett. 32, 2438-2440 (2007).

[CrossRef]
[PubMed]

Z. Wang and H. Ma, “Advanced continuous wavelet transform algorithm for digital interferogram analysis and processing,” Opt. Eng. 45, 045601 (2006).

[CrossRef]

Q. Zhang, X. Su, Y. Cao, Y. Li, L. Xiang, and W. Chen, “Optical 3-D shape and deformation measurement of rotating blades using stroboscopic structured illumination,” Opt. Eng. 44, 113601-113607 (2005).

[CrossRef]

X. Su, W. Song, Y. Cao, and L. Xiang, “Phase-height mapping and coordinate calibration simultaneously in phase-measuring profilometry,” Opt. Eng. 43, 708-712 (2004).

[CrossRef]

H. Liu, W. H. Su, K. Reichard, and S. Yin, “Calibration-based phase-shifting projected fringe profilometry for accurate absolute 3D surface profile measurement,” Opt. Commun. 216, 65-80 (2003).

[CrossRef]

H. Guo, H. He, Y. Yu, and M. Chen, “Least-squares calibration method for fringe projection profilometry,” Opt. Eng. 44, 033603-033609 (2005).

[CrossRef]

Q. Zhang, X. Su, Y. Cao, Y. Li, L. Xiang, and W. Chen, “Optical 3-D shape and deformation measurement of rotating blades using stroboscopic structured illumination,” Opt. Eng. 44, 113601-113607 (2005).

[CrossRef]

S. Zhang and P. S. Huang, “High-resolution, real-time three-dimensional shape measurement,” Opt. Eng. 45, 123601-123608 (2006).

[CrossRef]

Z. Zhang, “A flexible new technique for camera calibration,” IEEE Trans. Pattern Anal. Machine Intell. 22, 1330-1334(2000).

[CrossRef]

Z. Wang, H. Du, S. Park, and H. Xie, “Three-dimensional shape measurement with a fast and accurate approach,” Appl. Opt. 48, 1052-1061 (2009).

[CrossRef]

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[CrossRef]
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[CrossRef]
[PubMed]

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[CrossRef]
[PubMed]

Q. Kemao, W. Gao, and H. Wang, “Windowed Fourier-filtered and quality-guided phase-unwrapping algorithm,” Appl. Opt. 47, 5408 (2008).

[CrossRef]
[PubMed]

A. Maurel, P. Cobelli, V. Pagneux, and P. Petitjeans, “Experimental and theoretical inspection of the phase-to-height relation in Fourier transform profilometry,” Appl. Opt. 48, 380-392 (2009).

[CrossRef]
[PubMed]

Z. Zhang, “A flexible new technique for camera calibration,” IEEE Trans. Pattern Anal. Machine Intell. 22, 1330-1334(2000).

[CrossRef]

L.-C. Chen and C.-C. Liao, “Calibration of 3D surface profilometry using digital fringe projection,” Meas. Sci. Technol. 16, 1554-1566 (2005).

[CrossRef]

K. Harding, “Industrial metrology: engineering precision,” Nat. Photon. 2, 667-669 (2008).

[CrossRef]

H. Liu, W. H. Su, K. Reichard, and S. Yin, “Calibration-based phase-shifting projected fringe profilometry for accurate absolute 3D surface profile measurement,” Opt. Commun. 216, 65-80 (2003).

[CrossRef]

H. Guo, H. He, Y. Yu, and M. Chen, “Least-squares calibration method for fringe projection profilometry,” Opt. Eng. 44, 033603-033609 (2005).

[CrossRef]

Z. Wang and H. Ma, “Advanced continuous wavelet transform algorithm for digital interferogram analysis and processing,” Opt. Eng. 45, 045601 (2006).

[CrossRef]

Q. Hu, P. S. Huang, Q. Fu, and F.-P. Chiang, “Calibration of a three-dimensional shape measurement system,” Opt. Eng. 42, 487-493 (2003).

[CrossRef]

X. Su, W. Song, Y. Cao, and L. Xiang, “Phase-height mapping and coordinate calibration simultaneously in phase-measuring profilometry,” Opt. Eng. 43, 708-712 (2004).

[CrossRef]

S. Zhang and P. S. Huang, “High-resolution, real-time three-dimensional shape measurement,” Opt. Eng. 45, 123601-123608 (2006).

[CrossRef]

Q. Zhang, X. Su, Y. Cao, Y. Li, L. Xiang, and W. Chen, “Optical 3-D shape and deformation measurement of rotating blades using stroboscopic structured illumination,” Opt. Eng. 44, 113601-113607 (2005).

[CrossRef]

X. Su and W. Chen, “Fourier transform profilometry: a review,” Opt. Lasers Eng. 35, 263-284 (2001).

[CrossRef]

X. Su and W. Chen, “Reliability-guided phase unwrapping algorithm: a review,” Opt. Lasers Eng. 42, 245-261 (2004).

[CrossRef]

M. Fujigaki, A. Takagishi, T. Matui, and Y. Morimoto, “Development of real-time shape measurement system using whole-space tabulation method,” in *Two- and Three-Dimensional Methods for Inspection and Metrology VI* (SPIE, 2008), pp. 706606-706608.

J. Y. Bouguet, “Camera calibration toolbox for MATLAB,” http://www.vision.caltech.edu/bouguetj/calib_doc.

J. Heikkila and O. Silven, “A four-step camera calibration procedure with implicit image correction,” in *1997 IEEE Computer Society Conference on Computer Vision and Pattern Recognition* (IEEE, 1997), pp. 1106-1112.

[CrossRef]