R. Kasztelanic and A. Sagan, “Semiderivative real filter for micro-optical element quality control,” Opt. Rev. 16, 252–256(2009).

[CrossRef]

S. Reichelt, A. Bieber, B. Aatz, and H. Zappe, “Micro-optics metrology using advanced interferometry,” Proc. SPIE 5856, 437–446 (2005).

[CrossRef]

K. Kincaid, “Optical surface analyzers become precision manufacturing tools,” Laser Focus World 41, 89–93 (2005).

W. Zou and J. Rolland, “Iterative zonal wave-front estimation algorithm for optical testing with general-shaped pupils,” J. Opt. Soc. Am. A 22, 938–951 (2005).

[CrossRef]

S. Reichelt and H. Zappe, “Combined Twyman–Green and Mach–Zehnder interferometer for microlens testing,” Appl. Opt. 44, 5786–5792 (2005).

[CrossRef]
[PubMed]

L. Joannes, F. Dubois, and J. Legros, “Phase-shifting schlieren: High-resolution quantitative schlieren that uses the phase-shifting technique principle,” Appl. Opt. 42, 5046–5053(2003).

[CrossRef]
[PubMed]

A. Sagan, S. Nowicki, R. Buczyński, M. Kowalczyk, and T. Szoplik, “Imaging phase objects with square-root, Foucault, and Hoffman real filters: a comparison,” Appl. Opt. 42, 5816–5824 (2003).

[CrossRef]
[PubMed]

H. J. Tiziani, T. Haist, and S. Reuter, “Optical inspection and characterization of micro-optics using confocal microscopy,” Opt. Laser Eng. 36, 403–415 (2001).

[CrossRef]

J. Lancis, T. Szoplik, E. Tajahuerce, V. Climent, and M.Fernández-Alonso, “Fractional derivative Fourier plane filter for phase change visualization,” Appl. Opt. 36, 7461–7464(1997).

[CrossRef]

E. Tajahuerce, T. Szoplik, J. Lancis, V. Climent, and M. Fernández-Alonso, “Phase-object fractional differentiation using Fourier plane filters,” Pure Appl. Opt. 6, 481–490(1997).

[CrossRef]

K. Freischlad and C. Koliopoulos, “Modal estimation of a wavefront from difference measurements using the discrete Fourier transform,” J. Opt. Soc. Am. 3, 1852–1861(1986).

[CrossRef]

F. Zernike, “How I discovered phase contrast,” Science 121, 345–349 (1955).

[CrossRef]
[PubMed]

S. Reichelt, A. Bieber, B. Aatz, and H. Zappe, “Micro-optics metrology using advanced interferometry,” Proc. SPIE 5856, 437–446 (2005).

[CrossRef]

M. Davidson and M. Abramowitz, Encyclopedia of Imaging Science and Technology, J.Hornak, ed. (Wiley, 2002), Vol. II.

S. Reichelt, A. Bieber, B. Aatz, and H. Zappe, “Micro-optics metrology using advanced interferometry,” Proc. SPIE 5856, 437–446 (2005).

[CrossRef]

T. Szoplik, V. Climent, E. Tajahuerce, J. Lancis, and M. Fernández-Alonso, “Phase-change visualization in two-dimensional phase objects with a semiderivative real filter,” Appl. Opt. 37, 5472–5478 (1998).

[CrossRef]

J. Lancis, T. Szoplik, E. Tajahuerce, V. Climent, and M.Fernández-Alonso, “Fractional derivative Fourier plane filter for phase change visualization,” Appl. Opt. 36, 7461–7464(1997).

[CrossRef]

E. Tajahuerce, T. Szoplik, J. Lancis, V. Climent, and M. Fernández-Alonso, “Phase-object fractional differentiation using Fourier plane filters,” Pure Appl. Opt. 6, 481–490(1997).

[CrossRef]

L. Davidson and R. Keller, “Basics of a light microscopy imaging system and its application in biology,” in Methods in Cellular Imaging, A.Periasamy, ed. (Oxford, 2001), pp. 53–65.

M. Davidson and M. Abramowitz, Encyclopedia of Imaging Science and Technology, J.Hornak, ed. (Wiley, 2002), Vol. II.

S. Dingqiang, J. Shengtao, and S. Lianzhen, “A sort of algorithm of wavefront reconstruction for Shack–Hartmann test,” in Progress in Telescope and Instrumentation Technologies, M.H.Ulrich, eds. (European Southern Observatory, 1992), pp. 289–292.

T. Szoplik, V. Climent, E. Tajahuerce, J. Lancis, and M. Fernández-Alonso, “Phase-change visualization in two-dimensional phase objects with a semiderivative real filter,” Appl. Opt. 37, 5472–5478 (1998).

[CrossRef]

E. Tajahuerce, T. Szoplik, J. Lancis, V. Climent, and M. Fernández-Alonso, “Phase-object fractional differentiation using Fourier plane filters,” Pure Appl. Opt. 6, 481–490(1997).

[CrossRef]

J. Lancis, T. Szoplik, E. Tajahuerce, V. Climent, and M.Fernández-Alonso, “Fractional derivative Fourier plane filter for phase change visualization,” Appl. Opt. 36, 7461–7464(1997).

[CrossRef]

K. Freischlad and C. Koliopoulos, “Modal estimation of a wavefront from difference measurements using the discrete Fourier transform,” J. Opt. Soc. Am. 3, 1852–1861(1986).

[CrossRef]

H. J. Tiziani, T. Haist, and S. Reuter, “Optical inspection and characterization of micro-optics using confocal microscopy,” Opt. Laser Eng. 36, 403–415 (2001).

[CrossRef]

R. Kasztelanic and A. Sagan, “Semiderivative real filter for micro-optical element quality control,” Opt. Rev. 16, 252–256(2009).

[CrossRef]

L. Davidson and R. Keller, “Basics of a light microscopy imaging system and its application in biology,” in Methods in Cellular Imaging, A.Periasamy, ed. (Oxford, 2001), pp. 53–65.

K. Kincaid, “Optical surface analyzers become precision manufacturing tools,” Laser Focus World 41, 89–93 (2005).

K. Freischlad and C. Koliopoulos, “Modal estimation of a wavefront from difference measurements using the discrete Fourier transform,” J. Opt. Soc. Am. 3, 1852–1861(1986).

[CrossRef]

T. Szoplik, V. Climent, E. Tajahuerce, J. Lancis, and M. Fernández-Alonso, “Phase-change visualization in two-dimensional phase objects with a semiderivative real filter,” Appl. Opt. 37, 5472–5478 (1998).

[CrossRef]

J. Lancis, T. Szoplik, E. Tajahuerce, V. Climent, and M.Fernández-Alonso, “Fractional derivative Fourier plane filter for phase change visualization,” Appl. Opt. 36, 7461–7464(1997).

[CrossRef]

E. Tajahuerce, T. Szoplik, J. Lancis, V. Climent, and M. Fernández-Alonso, “Phase-object fractional differentiation using Fourier plane filters,” Pure Appl. Opt. 6, 481–490(1997).

[CrossRef]

S. Dingqiang, J. Shengtao, and S. Lianzhen, “A sort of algorithm of wavefront reconstruction for Shack–Hartmann test,” in Progress in Telescope and Instrumentation Technologies, M.H.Ulrich, eds. (European Southern Observatory, 1992), pp. 289–292.

D. Murphy, “Phase contrast microscopy,” in Fundamentals of Light Microscopy and Electronic Imaging (Wiley, 2001).

H. J. Tiziani, T. Haist, and S. Reuter, “Optical inspection and characterization of micro-optics using confocal microscopy,” Opt. Laser Eng. 36, 403–415 (2001).

[CrossRef]

R. Kasztelanic and A. Sagan, “Semiderivative real filter for micro-optical element quality control,” Opt. Rev. 16, 252–256(2009).

[CrossRef]

A. Sagan, S. Nowicki, R. Buczyński, M. Kowalczyk, and T. Szoplik, “Imaging phase objects with square-root, Foucault, and Hoffman real filters: a comparison,” Appl. Opt. 42, 5816–5824 (2003).

[CrossRef]
[PubMed]

G. Settles, Schlieren and Shadowgraph Techniques (Springer–Verlag, 2001).

[CrossRef]

S. Dingqiang, J. Shengtao, and S. Lianzhen, “A sort of algorithm of wavefront reconstruction for Shack–Hartmann test,” in Progress in Telescope and Instrumentation Technologies, M.H.Ulrich, eds. (European Southern Observatory, 1992), pp. 289–292.

E. Slayter and H. Slayter, “Imaging of phase objects,” in Light and Electron Microscopy, E.Slayter and H.Slayter, eds. (Cambridge, 1992), pp. 149–167.

E. Slayter and H. Slayter, “Imaging of phase objects,” in Light and Electron Microscopy, E.Slayter and H.Slayter, eds. (Cambridge, 1992), pp. 149–167.

A. Sagan, S. Nowicki, R. Buczyński, M. Kowalczyk, and T. Szoplik, “Imaging phase objects with square-root, Foucault, and Hoffman real filters: a comparison,” Appl. Opt. 42, 5816–5824 (2003).

[CrossRef]
[PubMed]

T. Szoplik, V. Climent, E. Tajahuerce, J. Lancis, and M. Fernández-Alonso, “Phase-change visualization in two-dimensional phase objects with a semiderivative real filter,” Appl. Opt. 37, 5472–5478 (1998).

[CrossRef]

E. Tajahuerce, T. Szoplik, J. Lancis, V. Climent, and M. Fernández-Alonso, “Phase-object fractional differentiation using Fourier plane filters,” Pure Appl. Opt. 6, 481–490(1997).

[CrossRef]

J. Lancis, T. Szoplik, E. Tajahuerce, V. Climent, and M.Fernández-Alonso, “Fractional derivative Fourier plane filter for phase change visualization,” Appl. Opt. 36, 7461–7464(1997).

[CrossRef]

T. Szoplik, V. Climent, E. Tajahuerce, J. Lancis, and M. Fernández-Alonso, “Phase-change visualization in two-dimensional phase objects with a semiderivative real filter,” Appl. Opt. 37, 5472–5478 (1998).

[CrossRef]

J. Lancis, T. Szoplik, E. Tajahuerce, V. Climent, and M.Fernández-Alonso, “Fractional derivative Fourier plane filter for phase change visualization,” Appl. Opt. 36, 7461–7464(1997).

[CrossRef]

E. Tajahuerce, T. Szoplik, J. Lancis, V. Climent, and M. Fernández-Alonso, “Phase-object fractional differentiation using Fourier plane filters,” Pure Appl. Opt. 6, 481–490(1997).

[CrossRef]

H. J. Tiziani, T. Haist, and S. Reuter, “Optical inspection and characterization of micro-optics using confocal microscopy,” Opt. Laser Eng. 36, 403–415 (2001).

[CrossRef]

F. Zernike, “How I discovered phase contrast,” Science 121, 345–349 (1955).

[CrossRef]
[PubMed]

R. Hoffman and L. Gross, “Modulation contrast microscope,” Appl. Opt. 14, 1169–1176 (1975).

[CrossRef]
[PubMed]

B. Horwitz, “Phase image differentiation with linear intensity output,” Appl. Opt. 17, 181–186 (1978).

[CrossRef]
[PubMed]

H. Kasprzak, “Differentiation of a noninteger order and its optical implementation,” Appl. Opt. 21, 3287–3291 (1982).

[CrossRef]
[PubMed]

J. Lancis, T. Szoplik, E. Tajahuerce, V. Climent, and M.Fernández-Alonso, “Fractional derivative Fourier plane filter for phase change visualization,” Appl. Opt. 36, 7461–7464(1997).

[CrossRef]

T. Szoplik, V. Climent, E. Tajahuerce, J. Lancis, and M. Fernández-Alonso, “Phase-change visualization in two-dimensional phase objects with a semiderivative real filter,” Appl. Opt. 37, 5472–5478 (1998).

[CrossRef]

S. C. West, "Interferometric Hartmann wave-front sensing for active optics at the 6.5-m conversion of the Multiple Mirror Telescope," Appl. Opt. 41, 3781–3789 (2002).

[CrossRef]
[PubMed]

L. Joannes, F. Dubois, and J. Legros, “Phase-shifting schlieren: High-resolution quantitative schlieren that uses the phase-shifting technique principle,” Appl. Opt. 42, 5046–5053(2003).

[CrossRef]
[PubMed]

A. Sagan, S. Nowicki, R. Buczyński, M. Kowalczyk, and T. Szoplik, “Imaging phase objects with square-root, Foucault, and Hoffman real filters: a comparison,” Appl. Opt. 42, 5816–5824 (2003).

[CrossRef]
[PubMed]

B. Zakharin and J. Stricker, “Schlieren systems with coherent illumination for quantitative measurements,” Appl. Opt. 43, 4786–4795 (2004).

[CrossRef]
[PubMed]

S. Reichelt and H. Zappe, “Combined Twyman–Green and Mach–Zehnder interferometer for microlens testing,” Appl. Opt. 44, 5786–5792 (2005).

[CrossRef]
[PubMed]

F. Roddier and C. Roddier, “Wavefront reconstruction using iterative Fourier transforms,” Appl. Opt. 30, 1325–1327(1991).

[CrossRef]
[PubMed]

K. Kincaid, “Optical surface analyzers become precision manufacturing tools,” Laser Focus World 41, 89–93 (2005).

H. J. Tiziani, T. Haist, and S. Reuter, “Optical inspection and characterization of micro-optics using confocal microscopy,” Opt. Laser Eng. 36, 403–415 (2001).

[CrossRef]

R. Kasztelanic and A. Sagan, “Semiderivative real filter for micro-optical element quality control,” Opt. Rev. 16, 252–256(2009).

[CrossRef]

S. Reichelt, A. Bieber, B. Aatz, and H. Zappe, “Micro-optics metrology using advanced interferometry,” Proc. SPIE 5856, 437–446 (2005).

[CrossRef]

E. Tajahuerce, T. Szoplik, J. Lancis, V. Climent, and M. Fernández-Alonso, “Phase-object fractional differentiation using Fourier plane filters,” Pure Appl. Opt. 6, 481–490(1997).

[CrossRef]

F. Zernike, “How I discovered phase contrast,” Science 121, 345–349 (1955).

[CrossRef]
[PubMed]

G. Settles, Schlieren and Shadowgraph Techniques (Springer–Verlag, 2001).

[CrossRef]

L. Davidson and R. Keller, “Basics of a light microscopy imaging system and its application in biology,” in Methods in Cellular Imaging, A.Periasamy, ed. (Oxford, 2001), pp. 53–65.

D. Murphy, “Phase contrast microscopy,” in Fundamentals of Light Microscopy and Electronic Imaging (Wiley, 2001).

M. Davidson and M. Abramowitz, Encyclopedia of Imaging Science and Technology, J.Hornak, ed. (Wiley, 2002), Vol. II.

E. Slayter and H. Slayter, “Imaging of phase objects,” in Light and Electron Microscopy, E.Slayter and H.Slayter, eds. (Cambridge, 1992), pp. 149–167.

S. Dingqiang, J. Shengtao, and S. Lianzhen, “A sort of algorithm of wavefront reconstruction for Shack–Hartmann test,” in Progress in Telescope and Instrumentation Technologies, M.H.Ulrich, eds. (European Southern Observatory, 1992), pp. 289–292.