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[Crossref]

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[Crossref]

R. Kasztelanic and A. Sagan, “Semiderivative real filter for micro-optical element quality control,” Opt. Rev. 16, 252–256(2009).

[Crossref]

S. Reichelt, A. Bieber, B. Aatz, and H. Zappe, “Micro-optics metrology using advanced interferometry,” Proc. SPIE 5856, 437–446 (2005).

[Crossref]

E. Tajahuerce, T. Szoplik, J. Lancis, V. Climent, and M. Fernández-Alonso, “Phase-object fractional differentiation using Fourier plane filters,” Pure Appl. Opt. 6, 481–490(1997).

[Crossref]

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[Crossref]
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[Crossref]

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M. Davidson and M. Abramowitz, Encyclopedia of Imaging Science and Technology, J.Hornak, ed. (Wiley, 2002), Vol. II.

E. Slayter and H. Slayter, “Imaging of phase objects,” in Light and Electron Microscopy, E.Slayter and H.Slayter, eds. (Cambridge, 1992), pp. 149–167.

S. Dingqiang, J. Shengtao, and S. Lianzhen, “A sort of algorithm of wavefront reconstruction for Shack–Hartmann test,” in Progress in Telescope and Instrumentation Technologies, M.H.Ulrich, eds. (European Southern Observatory, 1992), pp. 289–292.