Abstract

We describe the development of passive millimeter wave imaging sensors, operating at W band, that are currently being manufactured for commercial markets using standard automated assembly processes. A description of HRL Laboratories’ millimeter wave imaging chipset is presented, focusing on parameters that limit sensor performance, such as detector 1/f noise, low noise amplifier noise figure, and gain drift. We conclude with a discussion of ongoing research and development in passive millimeter wave imaging and performance improvements that can be expected for future imaging sensors.

© 2010 Optical Society of America

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