Abstract

A novel bidirectional thickness profilometer based on transmission densitometry was designed to measure the localized thickness of semitransparent films on a dynamic manufacturing line. The densitometer model shows that, for materials with extinction coefficients between 0.3 and 2.9D/mm, 100500μm measurements can be recorded with less than ±5% error at more than 10,000 locations in real time. As a demonstration application, the thickness profiles of 75mm×100mm regions of polymer electrolyte membrane (PEM) were determined by converting the optical density of the sample to thickness with the Beer–Lambert law. The PEM extinction coefficient was determined to be 1.4D/mm, with an average thickness error of 4.7%.

© 2010 Optical Society of America

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