Z. Wang and B. Han, “Advanced iterative algorithm for randomly phase-shifted interferograms with intra- and inter-frame intensity variations,” Opt. Lasers Eng. 45, 274-280 (2007).

[CrossRef]

S. Zhang and S. Yau, “Generic nonsinusoidal phase error correction for three-dimensional shape measurement using a digital video projector,” Appl. Opt. 46, 36-43 (2007).

[CrossRef]

S. Zhang, X. Li, and S. Yau, “Multilevel quality-guided phase unwrapping algorithm for real-time three-dimensional shape reconstruction,” Appl. Opt. 46, 50-57 (2007).

[CrossRef]

H. Du and Z. Wang, “Three-dimensional shape measurement with arbitrarily arranged fringe projection profilometry system,” Opt. Lett. 32, 2438-2440 (2007).

[CrossRef]
[PubMed]

J. Tian and X. Peng, “Three-dimensional vision from a multisensing mechanism,” Appl. Opt. 45, 3003-3008 (2006).

[CrossRef]
[PubMed]

Z. Wang and H. Bi, “Comments on fringe projection profilometry with nonparallel illumination: a least-squares approach,” Opt. Lett. 31, 1972-1973 (2006).

[CrossRef]
[PubMed]

L. Chen and C. Quan, “Reply to comment on 'fringe projection profilometry with nonparallel illumination: a least-squares approach,'” Opt. Lett. 31, 1974-1975 (2006).

[CrossRef]

H. Guo, M. Chen, and P. Zhang, “Least-squares fitting of carrier phase distribution by using a rational function in fringe projection profilometry,” Opt. Lett. 31, 3588-3590(2006).

[CrossRef]
[PubMed]

Z. Wang, H. Du, and H. Bi, “Out-of-plane shape determination in fringe projection profilometry,” Opt. Express 14, 12122-12133 (2006).

[CrossRef]
[PubMed]

L. Chen and C. Quan, “Fringe projection profilometry with nonparallel illumination: a least-squares approach,” Opt. Lett. 30, 2101-2103 (2005).

[CrossRef]
[PubMed]

T. Peng, S. Gupta, and K. Lau, “Algorithms for constructing 3-D point clouds using multiple digital fringe patterns,” Comput. Aided Des. Appl. 2, 737-746 (2005).

J. Pan, P. Huang, and F. Chiang, “Color-coded binary fringe projection technique for 3-D shape measurement,” Opt. Eng. 44, 023606 (2005).

[CrossRef]

H. Guo, H. He, Y. Yu, and M. Chen, “Least-squares calibration method for fringe projection profilometry,” Opt. Eng. 44, 033603 (2005).

[CrossRef]

R. Legarda-Sáenz, T. Bothe, and W. Juptner, “Accurate procedure for the calibration of a structured light system,” Opt. Eng. 43, 464-471 (2004).

[CrossRef]

C. Tay, C. Quan, T. Wu, and Y. Huang, “Integrated method for 3-D rigid-body displacement measurement using fringe projection,” Opt. Eng. 43, 1152-1159 (2004).

[CrossRef]

L. Kinell, “Spatiotemporal approach for real-time absolute shape measurements by use of projected fringes,” Appl. Opt. 43, 3018-3027 (2004).

[CrossRef]
[PubMed]

Z. Wang and B. Han, “Advanced iterative algorithm for phase extraction of randomly phase-shifted interferograms,” Opt. Lett. 29, 1671-1673 (2004).

[CrossRef]
[PubMed]

L. Salas, E. Luna, J. Salinas, V. Garcia, and M. Servin, “Profilometry by fringe projection,” Opt. Eng. 42, 3307-3314(2003).

[CrossRef]

Q. Hu, P. Huang, Q. Fu, and F. Chiang, “Calibration of a three-dimensional shape measurement system,” Opt. Eng. 42, 487-493 (2003).

[CrossRef]

J. Burke, T. Bothe, W. Osten, and C. Hess, “Reverse engineering by fringe projection,” Proc. SPIE 4778, 312-324(2002).

[CrossRef]

Z. Zhang, “A flexible new technique for camera calibration,” IEEE Trans. Pattern Anal. Mach. Intell. 22, 1330-1334(2000).

[CrossRef]

F. Chen, G. Brown, and M. Song, “Overview of 3-D shape measurement using optical methods,” Opt. Eng. 39, 10-22(2000).

[CrossRef]

W. Schreiber and G. Notni, “Theory and arrangements of self-calibrating whole-body 3-D measurement systems using fringe projection technique,” Opt. Eng. 39, 159-169 (2000).

[CrossRef]

C. Wagner, W. Osten, and S. Seebacher, “Direct shape measurement by digital wavefront reconstruction and wavelength scanning,” Opt. Eng. 39, 79-85 (2000).

[CrossRef]

C. Coggrave and J. Huntley, “High-speed surface profilometer based on a spatial light modulator and pipeline image processor,” Opt. Eng. 38, 1573-1581 (1999).

[CrossRef]

C. Keferstein and M. Marxer, “Testing bench for laser triangulation sensors,” Sens. Rev. 18, 183-187 (1998).

[CrossRef]

S. McNeill, M. Sutton, Z. Miao, and J. Ma, “Measurement of surface profile using digital image correlation,” Exp. Mech. 37, 13-20 (1997).

[CrossRef]

W. Osten, W. Nadeborn, and P. Andra, “General hierarchical approach in absolute phase measurement,” Proc. SPIE 2860, 2-13 (1996).

[CrossRef]

W. Nadeborn, P. Andra, and W. Osten, “A robust procedure for absolute phase measurement,” Opt. Lasers Eng. 24, 245-260(1996).

[CrossRef]

T. Yoshizawa and T. Tomisawa, “Shadow moiré topography by means of the phase shift method,” Opt. Eng. 32, 1668-1674 (1993).

[CrossRef]

C. Fraser, “Photogrammetric measurement to one part in a million,” Photogramm. Eng. Remote Sens. 58, 305-310 (1992).

R. Tsai, “A versatile camera calibration technique for high accuracy 3D machine vision metrology using off-the-shelf TV cameras and lenses,” IEEE J. Robot. Autom. 3, 323-344(1987).

[CrossRef]

W. Osten, W. Nadeborn, and P. Andra, “General hierarchical approach in absolute phase measurement,” Proc. SPIE 2860, 2-13 (1996).

[CrossRef]

W. Nadeborn, P. Andra, and W. Osten, “A robust procedure for absolute phase measurement,” Opt. Lasers Eng. 24, 245-260(1996).

[CrossRef]

R. Legarda-Sáenz, T. Bothe, and W. Juptner, “Accurate procedure for the calibration of a structured light system,” Opt. Eng. 43, 464-471 (2004).

[CrossRef]

J. Burke, T. Bothe, W. Osten, and C. Hess, “Reverse engineering by fringe projection,” Proc. SPIE 4778, 312-324(2002).

[CrossRef]

F. Chen, G. Brown, and M. Song, “Overview of 3-D shape measurement using optical methods,” Opt. Eng. 39, 10-22(2000).

[CrossRef]

J. Burke, T. Bothe, W. Osten, and C. Hess, “Reverse engineering by fringe projection,” Proc. SPIE 4778, 312-324(2002).

[CrossRef]

F. Chen, G. Brown, and M. Song, “Overview of 3-D shape measurement using optical methods,” Opt. Eng. 39, 10-22(2000).

[CrossRef]

H. Guo, M. Chen, and P. Zhang, “Least-squares fitting of carrier phase distribution by using a rational function in fringe projection profilometry,” Opt. Lett. 31, 3588-3590(2006).

[CrossRef]
[PubMed]

H. Guo, H. He, Y. Yu, and M. Chen, “Least-squares calibration method for fringe projection profilometry,” Opt. Eng. 44, 033603 (2005).

[CrossRef]

J. Pan, P. Huang, and F. Chiang, “Color-coded binary fringe projection technique for 3-D shape measurement,” Opt. Eng. 44, 023606 (2005).

[CrossRef]

Q. Hu, P. Huang, Q. Fu, and F. Chiang, “Calibration of a three-dimensional shape measurement system,” Opt. Eng. 42, 487-493 (2003).

[CrossRef]

C. Coggrave and J. Huntley, “High-speed surface profilometer based on a spatial light modulator and pipeline image processor,” Opt. Eng. 38, 1573-1581 (1999).

[CrossRef]

H. Du and Z. Wang, “Three-dimensional shape measurement with arbitrarily arranged fringe projection profilometry system,” Opt. Lett. 32, 2438-2440 (2007).

[CrossRef]
[PubMed]

Z. Wang, H. Du, and H. Bi, “Out-of-plane shape determination in fringe projection profilometry,” Opt. Express 14, 12122-12133 (2006).

[CrossRef]
[PubMed]

H. Du and Z. Wang, “Real-time 3-D shape measurement with high accuracy and low cost,” in *Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Application System Technologies*, OSA Technical Digest Series (CD) (Optical Society of America, 2006), paper JThD49.

[PubMed]

W. Osten and P. Ferraro, “Digital holography and its application in MEMS/MOEMS inspection,” in *Optical Inspection of Microsystems*, W. Osten, ed. (CRC Press, 2006), p. 351-425.

C. Fraser, “Photogrammetric measurement to one part in a million,” Photogramm. Eng. Remote Sens. 58, 305-310 (1992).

Q. Hu, P. Huang, Q. Fu, and F. Chiang, “Calibration of a three-dimensional shape measurement system,” Opt. Eng. 42, 487-493 (2003).

[CrossRef]

L. Salas, E. Luna, J. Salinas, V. Garcia, and M. Servin, “Profilometry by fringe projection,” Opt. Eng. 42, 3307-3314(2003).

[CrossRef]

H. Guo, M. Chen, and P. Zhang, “Least-squares fitting of carrier phase distribution by using a rational function in fringe projection profilometry,” Opt. Lett. 31, 3588-3590(2006).

[CrossRef]
[PubMed]

H. Guo, H. He, Y. Yu, and M. Chen, “Least-squares calibration method for fringe projection profilometry,” Opt. Eng. 44, 033603 (2005).

[CrossRef]

T. Peng, S. Gupta, and K. Lau, “Algorithms for constructing 3-D point clouds using multiple digital fringe patterns,” Comput. Aided Des. Appl. 2, 737-746 (2005).

H. Guo, H. He, Y. Yu, and M. Chen, “Least-squares calibration method for fringe projection profilometry,” Opt. Eng. 44, 033603 (2005).

[CrossRef]

J. Burke, T. Bothe, W. Osten, and C. Hess, “Reverse engineering by fringe projection,” Proc. SPIE 4778, 312-324(2002).

[CrossRef]

Q. Hu, P. Huang, Q. Fu, and F. Chiang, “Calibration of a three-dimensional shape measurement system,” Opt. Eng. 42, 487-493 (2003).

[CrossRef]

J. Pan, P. Huang, and F. Chiang, “Color-coded binary fringe projection technique for 3-D shape measurement,” Opt. Eng. 44, 023606 (2005).

[CrossRef]

Q. Hu, P. Huang, Q. Fu, and F. Chiang, “Calibration of a three-dimensional shape measurement system,” Opt. Eng. 42, 487-493 (2003).

[CrossRef]

C. Tay, C. Quan, T. Wu, and Y. Huang, “Integrated method for 3-D rigid-body displacement measurement using fringe projection,” Opt. Eng. 43, 1152-1159 (2004).

[CrossRef]

C. Coggrave and J. Huntley, “High-speed surface profilometer based on a spatial light modulator and pipeline image processor,” Opt. Eng. 38, 1573-1581 (1999).

[CrossRef]

R. Legarda-Sáenz, T. Bothe, and W. Juptner, “Accurate procedure for the calibration of a structured light system,” Opt. Eng. 43, 464-471 (2004).

[CrossRef]

C. Keferstein and M. Marxer, “Testing bench for laser triangulation sensors,” Sens. Rev. 18, 183-187 (1998).

[CrossRef]

S. Kyle, R. Loser, and D. Warren, “Automated part positioning with the laser tracker,” in *Proceedings of the Fifth International Workshop on Accelerator Alignment*, ANL/FNAL (1997).

T. Peng, S. Gupta, and K. Lau, “Algorithms for constructing 3-D point clouds using multiple digital fringe patterns,” Comput. Aided Des. Appl. 2, 737-746 (2005).

R. Legarda-Sáenz, T. Bothe, and W. Juptner, “Accurate procedure for the calibration of a structured light system,” Opt. Eng. 43, 464-471 (2004).

[CrossRef]

S. Kyle, R. Loser, and D. Warren, “Automated part positioning with the laser tracker,” in *Proceedings of the Fifth International Workshop on Accelerator Alignment*, ANL/FNAL (1997).

L. Salas, E. Luna, J. Salinas, V. Garcia, and M. Servin, “Profilometry by fringe projection,” Opt. Eng. 42, 3307-3314(2003).

[CrossRef]

S. McNeill, M. Sutton, Z. Miao, and J. Ma, “Measurement of surface profile using digital image correlation,” Exp. Mech. 37, 13-20 (1997).

[CrossRef]

C. Keferstein and M. Marxer, “Testing bench for laser triangulation sensors,” Sens. Rev. 18, 183-187 (1998).

[CrossRef]

S. McNeill, M. Sutton, Z. Miao, and J. Ma, “Measurement of surface profile using digital image correlation,” Exp. Mech. 37, 13-20 (1997).

[CrossRef]

S. McNeill, M. Sutton, Z. Miao, and J. Ma, “Measurement of surface profile using digital image correlation,” Exp. Mech. 37, 13-20 (1997).

[CrossRef]

W. Nadeborn, P. Andra, and W. Osten, “A robust procedure for absolute phase measurement,” Opt. Lasers Eng. 24, 245-260(1996).

[CrossRef]

W. Osten, W. Nadeborn, and P. Andra, “General hierarchical approach in absolute phase measurement,” Proc. SPIE 2860, 2-13 (1996).

[CrossRef]

W. Schreiber and G. Notni, “Theory and arrangements of self-calibrating whole-body 3-D measurement systems using fringe projection technique,” Opt. Eng. 39, 159-169 (2000).

[CrossRef]

J. Burke, T. Bothe, W. Osten, and C. Hess, “Reverse engineering by fringe projection,” Proc. SPIE 4778, 312-324(2002).

[CrossRef]

C. Wagner, W. Osten, and S. Seebacher, “Direct shape measurement by digital wavefront reconstruction and wavelength scanning,” Opt. Eng. 39, 79-85 (2000).

[CrossRef]

W. Nadeborn, P. Andra, and W. Osten, “A robust procedure for absolute phase measurement,” Opt. Lasers Eng. 24, 245-260(1996).

[CrossRef]

W. Osten, W. Nadeborn, and P. Andra, “General hierarchical approach in absolute phase measurement,” Proc. SPIE 2860, 2-13 (1996).

[CrossRef]

W. Osten and P. Ferraro, “Digital holography and its application in MEMS/MOEMS inspection,” in *Optical Inspection of Microsystems*, W. Osten, ed. (CRC Press, 2006), p. 351-425.

J. Pan, P. Huang, and F. Chiang, “Color-coded binary fringe projection technique for 3-D shape measurement,” Opt. Eng. 44, 023606 (2005).

[CrossRef]

T. Peng, S. Gupta, and K. Lau, “Algorithms for constructing 3-D point clouds using multiple digital fringe patterns,” Comput. Aided Des. Appl. 2, 737-746 (2005).

L. Chen and C. Quan, “Reply to comment on 'fringe projection profilometry with nonparallel illumination: a least-squares approach,'” Opt. Lett. 31, 1974-1975 (2006).

[CrossRef]

L. Chen and C. Quan, “Fringe projection profilometry with nonparallel illumination: a least-squares approach,” Opt. Lett. 30, 2101-2103 (2005).

[CrossRef]
[PubMed]

C. Tay, C. Quan, T. Wu, and Y. Huang, “Integrated method for 3-D rigid-body displacement measurement using fringe projection,” Opt. Eng. 43, 1152-1159 (2004).

[CrossRef]

L. Salas, E. Luna, J. Salinas, V. Garcia, and M. Servin, “Profilometry by fringe projection,” Opt. Eng. 42, 3307-3314(2003).

[CrossRef]

L. Salas, E. Luna, J. Salinas, V. Garcia, and M. Servin, “Profilometry by fringe projection,” Opt. Eng. 42, 3307-3314(2003).

[CrossRef]

W. Schreiber and G. Notni, “Theory and arrangements of self-calibrating whole-body 3-D measurement systems using fringe projection technique,” Opt. Eng. 39, 159-169 (2000).

[CrossRef]

C. Wagner, W. Osten, and S. Seebacher, “Direct shape measurement by digital wavefront reconstruction and wavelength scanning,” Opt. Eng. 39, 79-85 (2000).

[CrossRef]

L. Salas, E. Luna, J. Salinas, V. Garcia, and M. Servin, “Profilometry by fringe projection,” Opt. Eng. 42, 3307-3314(2003).

[CrossRef]

F. Chen, G. Brown, and M. Song, “Overview of 3-D shape measurement using optical methods,” Opt. Eng. 39, 10-22(2000).

[CrossRef]

S. McNeill, M. Sutton, Z. Miao, and J. Ma, “Measurement of surface profile using digital image correlation,” Exp. Mech. 37, 13-20 (1997).

[CrossRef]

C. Tay, C. Quan, T. Wu, and Y. Huang, “Integrated method for 3-D rigid-body displacement measurement using fringe projection,” Opt. Eng. 43, 1152-1159 (2004).

[CrossRef]

T. Yoshizawa and T. Tomisawa, “Shadow moiré topography by means of the phase shift method,” Opt. Eng. 32, 1668-1674 (1993).

[CrossRef]

R. Tsai, “A versatile camera calibration technique for high accuracy 3D machine vision metrology using off-the-shelf TV cameras and lenses,” IEEE J. Robot. Autom. 3, 323-344(1987).

[CrossRef]

C. Wagner, W. Osten, and S. Seebacher, “Direct shape measurement by digital wavefront reconstruction and wavelength scanning,” Opt. Eng. 39, 79-85 (2000).

[CrossRef]

H. Du and Z. Wang, “Three-dimensional shape measurement with arbitrarily arranged fringe projection profilometry system,” Opt. Lett. 32, 2438-2440 (2007).

[CrossRef]
[PubMed]

Z. Wang and B. Han, “Advanced iterative algorithm for randomly phase-shifted interferograms with intra- and inter-frame intensity variations,” Opt. Lasers Eng. 45, 274-280 (2007).

[CrossRef]

Z. Wang and H. Bi, “Comments on fringe projection profilometry with nonparallel illumination: a least-squares approach,” Opt. Lett. 31, 1972-1973 (2006).

[CrossRef]
[PubMed]

Z. Wang, H. Du, and H. Bi, “Out-of-plane shape determination in fringe projection profilometry,” Opt. Express 14, 12122-12133 (2006).

[CrossRef]
[PubMed]

Z. Wang and B. Han, “Advanced iterative algorithm for phase extraction of randomly phase-shifted interferograms,” Opt. Lett. 29, 1671-1673 (2004).

[CrossRef]
[PubMed]

H. Du and Z. Wang, “Real-time 3-D shape measurement with high accuracy and low cost,” in *Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Application System Technologies*, OSA Technical Digest Series (CD) (Optical Society of America, 2006), paper JThD49.

[PubMed]

S. Kyle, R. Loser, and D. Warren, “Automated part positioning with the laser tracker,” in *Proceedings of the Fifth International Workshop on Accelerator Alignment*, ANL/FNAL (1997).

C. Tay, C. Quan, T. Wu, and Y. Huang, “Integrated method for 3-D rigid-body displacement measurement using fringe projection,” Opt. Eng. 43, 1152-1159 (2004).

[CrossRef]

T. Yoshizawa and T. Tomisawa, “Shadow moiré topography by means of the phase shift method,” Opt. Eng. 32, 1668-1674 (1993).

[CrossRef]

H. Guo, H. He, Y. Yu, and M. Chen, “Least-squares calibration method for fringe projection profilometry,” Opt. Eng. 44, 033603 (2005).

[CrossRef]

Z. Zhang, “A flexible new technique for camera calibration,” IEEE Trans. Pattern Anal. Mach. Intell. 22, 1330-1334(2000).

[CrossRef]

J. Tian and X. Peng, “Three-dimensional vision from a multisensing mechanism,” Appl. Opt. 45, 3003-3008 (2006).

[CrossRef]
[PubMed]

L. Kinell, “Spatiotemporal approach for real-time absolute shape measurements by use of projected fringes,” Appl. Opt. 43, 3018-3027 (2004).

[CrossRef]
[PubMed]

S. Zhang and S. Yau, “Generic nonsinusoidal phase error correction for three-dimensional shape measurement using a digital video projector,” Appl. Opt. 46, 36-43 (2007).

[CrossRef]

S. Zhang, X. Li, and S. Yau, “Multilevel quality-guided phase unwrapping algorithm for real-time three-dimensional shape reconstruction,” Appl. Opt. 46, 50-57 (2007).

[CrossRef]

T. Peng, S. Gupta, and K. Lau, “Algorithms for constructing 3-D point clouds using multiple digital fringe patterns,” Comput. Aided Des. Appl. 2, 737-746 (2005).

S. McNeill, M. Sutton, Z. Miao, and J. Ma, “Measurement of surface profile using digital image correlation,” Exp. Mech. 37, 13-20 (1997).

[CrossRef]

R. Tsai, “A versatile camera calibration technique for high accuracy 3D machine vision metrology using off-the-shelf TV cameras and lenses,” IEEE J. Robot. Autom. 3, 323-344(1987).

[CrossRef]

Z. Zhang, “A flexible new technique for camera calibration,” IEEE Trans. Pattern Anal. Mach. Intell. 22, 1330-1334(2000).

[CrossRef]

F. Chen, G. Brown, and M. Song, “Overview of 3-D shape measurement using optical methods,” Opt. Eng. 39, 10-22(2000).

[CrossRef]

W. Schreiber and G. Notni, “Theory and arrangements of self-calibrating whole-body 3-D measurement systems using fringe projection technique,” Opt. Eng. 39, 159-169 (2000).

[CrossRef]

L. Salas, E. Luna, J. Salinas, V. Garcia, and M. Servin, “Profilometry by fringe projection,” Opt. Eng. 42, 3307-3314(2003).

[CrossRef]

Q. Hu, P. Huang, Q. Fu, and F. Chiang, “Calibration of a three-dimensional shape measurement system,” Opt. Eng. 42, 487-493 (2003).

[CrossRef]

R. Legarda-Sáenz, T. Bothe, and W. Juptner, “Accurate procedure for the calibration of a structured light system,” Opt. Eng. 43, 464-471 (2004).

[CrossRef]

C. Tay, C. Quan, T. Wu, and Y. Huang, “Integrated method for 3-D rigid-body displacement measurement using fringe projection,” Opt. Eng. 43, 1152-1159 (2004).

[CrossRef]

T. Yoshizawa and T. Tomisawa, “Shadow moiré topography by means of the phase shift method,” Opt. Eng. 32, 1668-1674 (1993).

[CrossRef]

C. Wagner, W. Osten, and S. Seebacher, “Direct shape measurement by digital wavefront reconstruction and wavelength scanning,” Opt. Eng. 39, 79-85 (2000).

[CrossRef]

J. Pan, P. Huang, and F. Chiang, “Color-coded binary fringe projection technique for 3-D shape measurement,” Opt. Eng. 44, 023606 (2005).

[CrossRef]

H. Guo, H. He, Y. Yu, and M. Chen, “Least-squares calibration method for fringe projection profilometry,” Opt. Eng. 44, 033603 (2005).

[CrossRef]

C. Coggrave and J. Huntley, “High-speed surface profilometer based on a spatial light modulator and pipeline image processor,” Opt. Eng. 38, 1573-1581 (1999).

[CrossRef]

W. Nadeborn, P. Andra, and W. Osten, “A robust procedure for absolute phase measurement,” Opt. Lasers Eng. 24, 245-260(1996).

[CrossRef]

Z. Wang and B. Han, “Advanced iterative algorithm for randomly phase-shifted interferograms with intra- and inter-frame intensity variations,” Opt. Lasers Eng. 45, 274-280 (2007).

[CrossRef]

Z. Wang and H. Bi, “Comments on fringe projection profilometry with nonparallel illumination: a least-squares approach,” Opt. Lett. 31, 1972-1973 (2006).

[CrossRef]
[PubMed]

L. Chen and C. Quan, “Reply to comment on 'fringe projection profilometry with nonparallel illumination: a least-squares approach,'” Opt. Lett. 31, 1974-1975 (2006).

[CrossRef]

H. Guo, M. Chen, and P. Zhang, “Least-squares fitting of carrier phase distribution by using a rational function in fringe projection profilometry,” Opt. Lett. 31, 3588-3590(2006).

[CrossRef]
[PubMed]

H. Du and Z. Wang, “Three-dimensional shape measurement with arbitrarily arranged fringe projection profilometry system,” Opt. Lett. 32, 2438-2440 (2007).

[CrossRef]
[PubMed]

Z. Wang and B. Han, “Advanced iterative algorithm for phase extraction of randomly phase-shifted interferograms,” Opt. Lett. 29, 1671-1673 (2004).

[CrossRef]
[PubMed]

L. Chen and C. Quan, “Fringe projection profilometry with nonparallel illumination: a least-squares approach,” Opt. Lett. 30, 2101-2103 (2005).

[CrossRef]
[PubMed]

C. Fraser, “Photogrammetric measurement to one part in a million,” Photogramm. Eng. Remote Sens. 58, 305-310 (1992).

W. Osten, W. Nadeborn, and P. Andra, “General hierarchical approach in absolute phase measurement,” Proc. SPIE 2860, 2-13 (1996).

[CrossRef]

J. Burke, T. Bothe, W. Osten, and C. Hess, “Reverse engineering by fringe projection,” Proc. SPIE 4778, 312-324(2002).

[CrossRef]

C. Keferstein and M. Marxer, “Testing bench for laser triangulation sensors,” Sens. Rev. 18, 183-187 (1998).

[CrossRef]

H. Du and Z. Wang, “Real-time 3-D shape measurement with high accuracy and low cost,” in *Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Application System Technologies*, OSA Technical Digest Series (CD) (Optical Society of America, 2006), paper JThD49.

[PubMed]

S. Kyle, R. Loser, and D. Warren, “Automated part positioning with the laser tracker,” in *Proceedings of the Fifth International Workshop on Accelerator Alignment*, ANL/FNAL (1997).

W. Osten and P. Ferraro, “Digital holography and its application in MEMS/MOEMS inspection,” in *Optical Inspection of Microsystems*, W. Osten, ed. (CRC Press, 2006), p. 351-425.