Abstract

Soft-x-ray Bragg reflection from two Ru/B4C multilayers with 10 and 63 periods was used for independent determination of both real and imaginary parts of the refractive index n = 1 − δ + close to the boron K edge (~188 eV). Prior to soft x-ray measurements, the structural parameters of the multilayers were determined by x-ray reflectometry using hard x rays. For the 63-period sample, the optical properties based on the predictions made for elemental boron major deviations were found close to the K edge of boron for the 10-period sample explained by chemical bonding of boron to B4C and various boron oxides.

© 2009 Optical Society of America

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  1. S. S. Andreev, M. S. Bibishkin, N. I. Chkhalo, E. B. Kluenkov, K. A. Prokhorov, N. N. Salashchenko, M. V. Zorina, F. Schafers, and L. A. Shmaenok, “Short-period multilayer x -ray mirrors,” J. Synchrotron Radiat. 10, 358-360 (2003).
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  3. S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski-Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98, 145502 (2007).
    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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  24. J. J. Jia, J. H. Underwood, E. M. Gullikson, T. A. Callcott, and R. C. C. Perera, “Soft X-ray absorption spectroscopy in 100-1000 eV region at the ALS,” J. Electron Spectrosc. Relat. Phenom. 80, 509-512 (1996).
    [CrossRef]
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    [CrossRef]

2009 (1)

S. S. Andreev, M. M. Barysheva, N. I. Chkhalo, S. A. Gusev, A. E. Pestov, V. N. Polkovnikov, N. N. Salashchenko, L. A. Shmaenok, Yu. A. Vainer, and S. Yu. Zuev, “Multilayered mirrors based on La/B4C (B9C) for X-ray range near anomalous dispersion of boron (λ=6.7 nm),” Nucl. Instrum. Methods Phys. Res. A 603, 80-82 (2009).

2008 (1)

2007 (2)

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski-Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98, 145502 (2007).
[CrossRef]

G. S. Lodha, M. Nayak, M. H. Modi, A. K. Sinha, and R. V. Nandedkar, “Study of optical response near the absorption edge using vacuum ultraviolet/soft x-ray reflectivity beamline on Indus-1,” J. Phys.: Conf. Ser. 80, 012031 (2007).
[CrossRef]

2006 (1)

M. Watanabe, T. Ejima, N. Miyata, T. Imazono, and M. Yanagihara, “Studies of multilayer structure in depth direction by soft x-ray spectroscopy,” Nucl. Sci. Technol. 17, 257-267 (2006).

2005 (2)

C. Borel, Ch. Morawe, E. Ziegler, T. Bigault, J-Y. Massonnat, J-C. Peffen, and E. Debourg, “In situ study of multilayer reflectivity upon heat treatment under synchrotron radiation,” Proc. SPIE 5918, 591801 (2005).

J.-M. André, P. Jonnard, C. Michaelsen, J. Wiesmann, F. Bridou, M.-F. Ravet, A. Jérome, F. Delmotte, and E. O. Filatova, “La/B4C small period multilayer interferential mirror for the analysis of boron,” X-Ray Spectrom. 34, 203-206 (2005).
[CrossRef]

2003 (1)

S. S. Andreev, M. S. Bibishkin, N. I. Chkhalo, E. B. Kluenkov, K. A. Prokhorov, N. N. Salashchenko, M. V. Zorina, F. Schafers, and L. A. Shmaenok, “Short-period multilayer x -ray mirrors,” J. Synchrotron Radiat. 10, 358-360 (2003).
[CrossRef]

2001 (1)

J. Kuneš, P. M. Oppeneer, H.-Ch. Mertins, F. Schäfers, A. Gaupp, W. Gudat, and P. Novák, “X-ray Faraday effect at the L2,3 edges of Fe, Co, and Ni: theory and experiment,” Phys. Rev. B 64, 174417 (2001).

1999 (2)

T. Ejima, K. Ouchi, and M. Watanabe, “Si─K absorption spectra of Si/CaF2 and Si/LiF multilayers,” J. Electron Spectrosc. Relat. Phenom. 101-103, 833-838 (1999).
[CrossRef]

Ch. Morawe, J-Ch. Peffen, O. Hignette, and E. Ziegler, “Design and performance of graded multilayers,” Proc. SPIE 3773, 90-99 (1999).

1998 (2)

D. Windt, “IMD--Software for modeling the optical properties of multilayer films,” Comput. Phys. 12, 360-370 (1998).
[CrossRef]

L. Sève, J. M. Tonnerre, and D. Raoux, “Determination of the anomalous scattering factors in the soft-x-ray range using diffraction from a multilayer,” J. Appl. Crystallogr. 31, 700-707 (1998).
[CrossRef]

1996 (1)

J. J. Jia, J. H. Underwood, E. M. Gullikson, T. A. Callcott, and R. C. C. Perera, “Soft X-ray absorption spectroscopy in 100-1000 eV region at the ALS,” J. Electron Spectrosc. Relat. Phenom. 80, 509-512 (1996).
[CrossRef]

1993 (1)

B. L. Henke, E. M. Gullikson, and J. C. Davis. “X-ray interactions: photoabsorption, scattering, transmission, and reflection at E=50-30000 eV, Z=1-92,” At. Data Nucl. Data Tables 54, 181-342 (1993).
[CrossRef]

1990 (1)

1987 (1)

I. V. Kozhevnikov and A. V. Vinogradov, “Basic formulae of XUV multilayer optics,” Phys. Scr. t17, 137-145 (1987).
[CrossRef]

1983 (1)

U. Bonse, I. Hartmann-Lotsch, and H. Lotsch, “The x-ray-interferometer for high resolution measurement of anomalous dispersion at HASYLAB,” Nucl. Instrum. Methods 208, 603-604 (1983).
[CrossRef]

1980 (2)

G. Martens and P. Rabe, “EXAFS studies on superficial regions by means of total reflection,” Phys. Status Solidi A 58, 415-424 (1980)
[CrossRef]

E. Sobczak' and K. Persy, “XPS, SXS and isochromat investigations of electronic structures of evaporated boron,” Phys. Scr. 22, 88-90 (1980).
[CrossRef]

1977 (1)

T. Fukamachi, S. Hosoya, T. Kawamura, and J. Hastings, “Measurements of integrated intensity near the absorption edge with synchrotron radiation,” J. Appl. Crystallogr. 10, 321-324 (1977).
[CrossRef]

1967 (1)

J. A. Bearden, “X-ray wavelengths,” Rev. Mod. Phys. 39, 78-124 (1967).
[CrossRef]

André, J.-M.

J.-M. André, P. Jonnard, C. Michaelsen, J. Wiesmann, F. Bridou, M.-F. Ravet, A. Jérome, F. Delmotte, and E. O. Filatova, “La/B4C small period multilayer interferential mirror for the analysis of boron,” X-Ray Spectrom. 34, 203-206 (2005).
[CrossRef]

Andreev, S. S.

S. S. Andreev, M. M. Barysheva, N. I. Chkhalo, S. A. Gusev, A. E. Pestov, V. N. Polkovnikov, N. N. Salashchenko, L. A. Shmaenok, Yu. A. Vainer, and S. Yu. Zuev, “Multilayered mirrors based on La/B4C (B9C) for X-ray range near anomalous dispersion of boron (λ=6.7 nm),” Nucl. Instrum. Methods Phys. Res. A 603, 80-82 (2009).

S. S. Andreev, M. S. Bibishkin, N. I. Chkhalo, E. B. Kluenkov, K. A. Prokhorov, N. N. Salashchenko, M. V. Zorina, F. Schafers, and L. A. Shmaenok, “Short-period multilayer x -ray mirrors,” J. Synchrotron Radiat. 10, 358-360 (2003).
[CrossRef]

Aquila, A. L.

Bajt, S.

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski-Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98, 145502 (2007).
[CrossRef]

Baker, S.

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski-Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98, 145502 (2007).
[CrossRef]

Barysheva, M. M.

S. S. Andreev, M. M. Barysheva, N. I. Chkhalo, S. A. Gusev, A. E. Pestov, V. N. Polkovnikov, N. N. Salashchenko, L. A. Shmaenok, Yu. A. Vainer, and S. Yu. Zuev, “Multilayered mirrors based on La/B4C (B9C) for X-ray range near anomalous dispersion of boron (λ=6.7 nm),” Nucl. Instrum. Methods Phys. Res. A 603, 80-82 (2009).

Bearden, J. A.

J. A. Bearden, “X-ray wavelengths,” Rev. Mod. Phys. 39, 78-124 (1967).
[CrossRef]

Bergh, M.

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski-Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98, 145502 (2007).
[CrossRef]

Bibishkin, M. S.

S. S. Andreev, M. S. Bibishkin, N. I. Chkhalo, E. B. Kluenkov, K. A. Prokhorov, N. N. Salashchenko, M. V. Zorina, F. Schafers, and L. A. Shmaenok, “Short-period multilayer x -ray mirrors,” J. Synchrotron Radiat. 10, 358-360 (2003).
[CrossRef]

Bigault, T.

C. Borel, Ch. Morawe, E. Ziegler, T. Bigault, J-Y. Massonnat, J-C. Peffen, and E. Debourg, “In situ study of multilayer reflectivity upon heat treatment under synchrotron radiation,” Proc. SPIE 5918, 591801 (2005).

Bionta, R.

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski-Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98, 145502 (2007).
[CrossRef]

Bonse, U.

U. Bonse, I. Hartmann-Lotsch, and H. Lotsch, “The x-ray-interferometer for high resolution measurement of anomalous dispersion at HASYLAB,” Nucl. Instrum. Methods 208, 603-604 (1983).
[CrossRef]

Borel, C.

C. Borel, Ch. Morawe, E. Ziegler, T. Bigault, J-Y. Massonnat, J-C. Peffen, and E. Debourg, “In situ study of multilayer reflectivity upon heat treatment under synchrotron radiation,” Proc. SPIE 5918, 591801 (2005).

Braun, C.

C. Braun, Parratt32 program for reflectivity analysis (Hahn-Meitner-Institut Berlin, 1997).

Bridou, F.

J.-M. André, P. Jonnard, C. Michaelsen, J. Wiesmann, F. Bridou, M.-F. Ravet, A. Jérome, F. Delmotte, and E. O. Filatova, “La/B4C small period multilayer interferential mirror for the analysis of boron,” X-Ray Spectrom. 34, 203-206 (2005).
[CrossRef]

Caleman, C.

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski-Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98, 145502 (2007).
[CrossRef]

Callcott, T. A.

J. J. Jia, J. H. Underwood, E. M. Gullikson, T. A. Callcott, and R. C. C. Perera, “Soft X-ray absorption spectroscopy in 100-1000 eV region at the ALS,” J. Electron Spectrosc. Relat. Phenom. 80, 509-512 (1996).
[CrossRef]

Chapman, H. N.

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski-Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98, 145502 (2007).
[CrossRef]

Chkhalo, N. I.

S. S. Andreev, M. M. Barysheva, N. I. Chkhalo, S. A. Gusev, A. E. Pestov, V. N. Polkovnikov, N. N. Salashchenko, L. A. Shmaenok, Yu. A. Vainer, and S. Yu. Zuev, “Multilayered mirrors based on La/B4C (B9C) for X-ray range near anomalous dispersion of boron (λ=6.7 nm),” Nucl. Instrum. Methods Phys. Res. A 603, 80-82 (2009).

S. S. Andreev, M. S. Bibishkin, N. I. Chkhalo, E. B. Kluenkov, K. A. Prokhorov, N. N. Salashchenko, M. V. Zorina, F. Schafers, and L. A. Shmaenok, “Short-period multilayer x -ray mirrors,” J. Synchrotron Radiat. 10, 358-360 (2003).
[CrossRef]

Davis, J. C.

B. L. Henke, E. M. Gullikson, and J. C. Davis. “X-ray interactions: photoabsorption, scattering, transmission, and reflection at E=50-30000 eV, Z=1-92,” At. Data Nucl. Data Tables 54, 181-342 (1993).
[CrossRef]

Debourg, E.

C. Borel, Ch. Morawe, E. Ziegler, T. Bigault, J-Y. Massonnat, J-C. Peffen, and E. Debourg, “In situ study of multilayer reflectivity upon heat treatment under synchrotron radiation,” Proc. SPIE 5918, 591801 (2005).

Delmotte, F.

J.-M. André, P. Jonnard, C. Michaelsen, J. Wiesmann, F. Bridou, M.-F. Ravet, A. Jérome, F. Delmotte, and E. O. Filatova, “La/B4C small period multilayer interferential mirror for the analysis of boron,” X-Ray Spectrom. 34, 203-206 (2005).
[CrossRef]

Ejima, T.

M. Watanabe, T. Ejima, N. Miyata, T. Imazono, and M. Yanagihara, “Studies of multilayer structure in depth direction by soft x-ray spectroscopy,” Nucl. Sci. Technol. 17, 257-267 (2006).

T. Ejima, K. Ouchi, and M. Watanabe, “Si─K absorption spectra of Si/CaF2 and Si/LiF multilayers,” J. Electron Spectrosc. Relat. Phenom. 101-103, 833-838 (1999).
[CrossRef]

Fernández-Perea, M.

Filatova, E. O.

J.-M. André, P. Jonnard, C. Michaelsen, J. Wiesmann, F. Bridou, M.-F. Ravet, A. Jérome, F. Delmotte, and E. O. Filatova, “La/B4C small period multilayer interferential mirror for the analysis of boron,” X-Ray Spectrom. 34, 203-206 (2005).
[CrossRef]

Fukamachi, T.

T. Fukamachi, S. Hosoya, T. Kawamura, and J. Hastings, “Measurements of integrated intensity near the absorption edge with synchrotron radiation,” J. Appl. Crystallogr. 10, 321-324 (1977).
[CrossRef]

Gaupp, A.

J. Kuneš, P. M. Oppeneer, H.-Ch. Mertins, F. Schäfers, A. Gaupp, W. Gudat, and P. Novák, “X-ray Faraday effect at the L2,3 edges of Fe, Co, and Ni: theory and experiment,” Phys. Rev. B 64, 174417 (2001).

Gudat, W.

J. Kuneš, P. M. Oppeneer, H.-Ch. Mertins, F. Schäfers, A. Gaupp, W. Gudat, and P. Novák, “X-ray Faraday effect at the L2,3 edges of Fe, Co, and Ni: theory and experiment,” Phys. Rev. B 64, 174417 (2001).

Gullikson, E.

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski-Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98, 145502 (2007).
[CrossRef]

Gullikson, E. M.

R. Soufli, A. L. Aquila, F. Salmassi, M. Fernández-Perea, and E. M. Gullikson, “Optical constants of magnetron-sputtered boron carbide thin films from photoabsorption data in the range 30 to 770 eV,” Appl. Opt. 47, 4633-4639 (2008).
[CrossRef]

J. J. Jia, J. H. Underwood, E. M. Gullikson, T. A. Callcott, and R. C. C. Perera, “Soft X-ray absorption spectroscopy in 100-1000 eV region at the ALS,” J. Electron Spectrosc. Relat. Phenom. 80, 509-512 (1996).
[CrossRef]

B. L. Henke, E. M. Gullikson, and J. C. Davis. “X-ray interactions: photoabsorption, scattering, transmission, and reflection at E=50-30000 eV, Z=1-92,” At. Data Nucl. Data Tables 54, 181-342 (1993).
[CrossRef]

Gusev, S. A.

S. S. Andreev, M. M. Barysheva, N. I. Chkhalo, S. A. Gusev, A. E. Pestov, V. N. Polkovnikov, N. N. Salashchenko, L. A. Shmaenok, Yu. A. Vainer, and S. Yu. Zuev, “Multilayered mirrors based on La/B4C (B9C) for X-ray range near anomalous dispersion of boron (λ=6.7 nm),” Nucl. Instrum. Methods Phys. Res. A 603, 80-82 (2009).

Hartmann-Lotsch, I.

U. Bonse, I. Hartmann-Lotsch, and H. Lotsch, “The x-ray-interferometer for high resolution measurement of anomalous dispersion at HASYLAB,” Nucl. Instrum. Methods 208, 603-604 (1983).
[CrossRef]

Hastings, J.

T. Fukamachi, S. Hosoya, T. Kawamura, and J. Hastings, “Measurements of integrated intensity near the absorption edge with synchrotron radiation,” J. Appl. Crystallogr. 10, 321-324 (1977).
[CrossRef]

Hau-Riege, S. P.

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski-Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98, 145502 (2007).
[CrossRef]

Henke, B. L.

B. L. Henke, E. M. Gullikson, and J. C. Davis. “X-ray interactions: photoabsorption, scattering, transmission, and reflection at E=50-30000 eV, Z=1-92,” At. Data Nucl. Data Tables 54, 181-342 (1993).
[CrossRef]

Hignette, O.

Ch. Morawe, J-Ch. Peffen, O. Hignette, and E. Ziegler, “Design and performance of graded multilayers,” Proc. SPIE 3773, 90-99 (1999).

Hosoya, S.

T. Fukamachi, S. Hosoya, T. Kawamura, and J. Hastings, “Measurements of integrated intensity near the absorption edge with synchrotron radiation,” J. Appl. Crystallogr. 10, 321-324 (1977).
[CrossRef]

Imazono, T.

M. Watanabe, T. Ejima, N. Miyata, T. Imazono, and M. Yanagihara, “Studies of multilayer structure in depth direction by soft x-ray spectroscopy,” Nucl. Sci. Technol. 17, 257-267 (2006).

Jérome, A.

J.-M. André, P. Jonnard, C. Michaelsen, J. Wiesmann, F. Bridou, M.-F. Ravet, A. Jérome, F. Delmotte, and E. O. Filatova, “La/B4C small period multilayer interferential mirror for the analysis of boron,” X-Ray Spectrom. 34, 203-206 (2005).
[CrossRef]

Jia, J. J.

J. J. Jia, J. H. Underwood, E. M. Gullikson, T. A. Callcott, and R. C. C. Perera, “Soft X-ray absorption spectroscopy in 100-1000 eV region at the ALS,” J. Electron Spectrosc. Relat. Phenom. 80, 509-512 (1996).
[CrossRef]

Jonnard, P.

J.-M. André, P. Jonnard, C. Michaelsen, J. Wiesmann, F. Bridou, M.-F. Ravet, A. Jérome, F. Delmotte, and E. O. Filatova, “La/B4C small period multilayer interferential mirror for the analysis of boron,” X-Ray Spectrom. 34, 203-206 (2005).
[CrossRef]

Juha, L.

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski-Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98, 145502 (2007).
[CrossRef]

Kawamura, T.

T. Fukamachi, S. Hosoya, T. Kawamura, and J. Hastings, “Measurements of integrated intensity near the absorption edge with synchrotron radiation,” J. Appl. Crystallogr. 10, 321-324 (1977).
[CrossRef]

Kjornrattanawanich, B.

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski-Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98, 145502 (2007).
[CrossRef]

Kluenkov, E. B.

S. S. Andreev, M. S. Bibishkin, N. I. Chkhalo, E. B. Kluenkov, K. A. Prokhorov, N. N. Salashchenko, M. V. Zorina, F. Schafers, and L. A. Shmaenok, “Short-period multilayer x -ray mirrors,” J. Synchrotron Radiat. 10, 358-360 (2003).
[CrossRef]

Kozhevnikov, I. V.

I. V. Kozhevnikov and A. V. Vinogradov, “Basic formulae of XUV multilayer optics,” Phys. Scr. t17, 137-145 (1987).
[CrossRef]

Krzywinski, J.

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski-Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98, 145502 (2007).
[CrossRef]

Kuba, J.

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski-Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98, 145502 (2007).
[CrossRef]

Kuneš, J.

J. Kuneš, P. M. Oppeneer, H.-Ch. Mertins, F. Schäfers, A. Gaupp, W. Gudat, and P. Novák, “X-ray Faraday effect at the L2,3 edges of Fe, Co, and Ni: theory and experiment,” Phys. Rev. B 64, 174417 (2001).

Lodha, G. S.

G. S. Lodha, M. Nayak, M. H. Modi, A. K. Sinha, and R. V. Nandedkar, “Study of optical response near the absorption edge using vacuum ultraviolet/soft x-ray reflectivity beamline on Indus-1,” J. Phys.: Conf. Ser. 80, 012031 (2007).
[CrossRef]

London, R. A.

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski-Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98, 145502 (2007).
[CrossRef]

Lotsch, H.

U. Bonse, I. Hartmann-Lotsch, and H. Lotsch, “The x-ray-interferometer for high resolution measurement of anomalous dispersion at HASYLAB,” Nucl. Instrum. Methods 208, 603-604 (1983).
[CrossRef]

Martens, G.

G. Martens and P. Rabe, “EXAFS studies on superficial regions by means of total reflection,” Phys. Status Solidi A 58, 415-424 (1980)
[CrossRef]

Massonnat, J-Y.

C. Borel, Ch. Morawe, E. Ziegler, T. Bigault, J-Y. Massonnat, J-C. Peffen, and E. Debourg, “In situ study of multilayer reflectivity upon heat treatment under synchrotron radiation,” Proc. SPIE 5918, 591801 (2005).

Mertins, H.-Ch.

J. Kuneš, P. M. Oppeneer, H.-Ch. Mertins, F. Schäfers, A. Gaupp, W. Gudat, and P. Novák, “X-ray Faraday effect at the L2,3 edges of Fe, Co, and Ni: theory and experiment,” Phys. Rev. B 64, 174417 (2001).

Michaelsen, C.

J.-M. André, P. Jonnard, C. Michaelsen, J. Wiesmann, F. Bridou, M.-F. Ravet, A. Jérome, F. Delmotte, and E. O. Filatova, “La/B4C small period multilayer interferential mirror for the analysis of boron,” X-Ray Spectrom. 34, 203-206 (2005).
[CrossRef]

Miyata, N.

M. Watanabe, T. Ejima, N. Miyata, T. Imazono, and M. Yanagihara, “Studies of multilayer structure in depth direction by soft x-ray spectroscopy,” Nucl. Sci. Technol. 17, 257-267 (2006).

Modi, M. H.

G. S. Lodha, M. Nayak, M. H. Modi, A. K. Sinha, and R. V. Nandedkar, “Study of optical response near the absorption edge using vacuum ultraviolet/soft x-ray reflectivity beamline on Indus-1,” J. Phys.: Conf. Ser. 80, 012031 (2007).
[CrossRef]

Morawe, Ch.

C. Borel, Ch. Morawe, E. Ziegler, T. Bigault, J-Y. Massonnat, J-C. Peffen, and E. Debourg, “In situ study of multilayer reflectivity upon heat treatment under synchrotron radiation,” Proc. SPIE 5918, 591801 (2005).

Ch. Morawe, J-Ch. Peffen, O. Hignette, and E. Ziegler, “Design and performance of graded multilayers,” Proc. SPIE 3773, 90-99 (1999).

Nandedkar, R. V.

G. S. Lodha, M. Nayak, M. H. Modi, A. K. Sinha, and R. V. Nandedkar, “Study of optical response near the absorption edge using vacuum ultraviolet/soft x-ray reflectivity beamline on Indus-1,” J. Phys.: Conf. Ser. 80, 012031 (2007).
[CrossRef]

Nayak, M.

G. S. Lodha, M. Nayak, M. H. Modi, A. K. Sinha, and R. V. Nandedkar, “Study of optical response near the absorption edge using vacuum ultraviolet/soft x-ray reflectivity beamline on Indus-1,” J. Phys.: Conf. Ser. 80, 012031 (2007).
[CrossRef]

Nietubyc, R.

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski-Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98, 145502 (2007).
[CrossRef]

Novák, P.

J. Kuneš, P. M. Oppeneer, H.-Ch. Mertins, F. Schäfers, A. Gaupp, W. Gudat, and P. Novák, “X-ray Faraday effect at the L2,3 edges of Fe, Co, and Ni: theory and experiment,” Phys. Rev. B 64, 174417 (2001).

Oppeneer, P. M.

J. Kuneš, P. M. Oppeneer, H.-Ch. Mertins, F. Schäfers, A. Gaupp, W. Gudat, and P. Novák, “X-ray Faraday effect at the L2,3 edges of Fe, Co, and Ni: theory and experiment,” Phys. Rev. B 64, 174417 (2001).

Ouchi, K.

T. Ejima, K. Ouchi, and M. Watanabe, “Si─K absorption spectra of Si/CaF2 and Si/LiF multilayers,” J. Electron Spectrosc. Relat. Phenom. 101-103, 833-838 (1999).
[CrossRef]

Peffen, J-C.

C. Borel, Ch. Morawe, E. Ziegler, T. Bigault, J-Y. Massonnat, J-C. Peffen, and E. Debourg, “In situ study of multilayer reflectivity upon heat treatment under synchrotron radiation,” Proc. SPIE 5918, 591801 (2005).

Peffen, J-Ch.

Ch. Morawe, J-Ch. Peffen, O. Hignette, and E. Ziegler, “Design and performance of graded multilayers,” Proc. SPIE 3773, 90-99 (1999).

Perera, R. C. C.

J. J. Jia, J. H. Underwood, E. M. Gullikson, T. A. Callcott, and R. C. C. Perera, “Soft X-ray absorption spectroscopy in 100-1000 eV region at the ALS,” J. Electron Spectrosc. Relat. Phenom. 80, 509-512 (1996).
[CrossRef]

Persy, K.

E. Sobczak' and K. Persy, “XPS, SXS and isochromat investigations of electronic structures of evaporated boron,” Phys. Scr. 22, 88-90 (1980).
[CrossRef]

Pestov, A. E.

S. S. Andreev, M. M. Barysheva, N. I. Chkhalo, S. A. Gusev, A. E. Pestov, V. N. Polkovnikov, N. N. Salashchenko, L. A. Shmaenok, Yu. A. Vainer, and S. Yu. Zuev, “Multilayered mirrors based on La/B4C (B9C) for X-ray range near anomalous dispersion of boron (λ=6.7 nm),” Nucl. Instrum. Methods Phys. Res. A 603, 80-82 (2009).

Plönjes, E.

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski-Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98, 145502 (2007).
[CrossRef]

Polkovnikov, V. N.

S. S. Andreev, M. M. Barysheva, N. I. Chkhalo, S. A. Gusev, A. E. Pestov, V. N. Polkovnikov, N. N. Salashchenko, L. A. Shmaenok, Yu. A. Vainer, and S. Yu. Zuev, “Multilayered mirrors based on La/B4C (B9C) for X-ray range near anomalous dispersion of boron (λ=6.7 nm),” Nucl. Instrum. Methods Phys. Res. A 603, 80-82 (2009).

Prokhorov, K. A.

S. S. Andreev, M. S. Bibishkin, N. I. Chkhalo, E. B. Kluenkov, K. A. Prokhorov, N. N. Salashchenko, M. V. Zorina, F. Schafers, and L. A. Shmaenok, “Short-period multilayer x -ray mirrors,” J. Synchrotron Radiat. 10, 358-360 (2003).
[CrossRef]

Rabe, P.

G. Martens and P. Rabe, “EXAFS studies on superficial regions by means of total reflection,” Phys. Status Solidi A 58, 415-424 (1980)
[CrossRef]

Raoux, D.

L. Sève, J. M. Tonnerre, and D. Raoux, “Determination of the anomalous scattering factors in the soft-x-ray range using diffraction from a multilayer,” J. Appl. Crystallogr. 31, 700-707 (1998).
[CrossRef]

Ravet, M.-F.

J.-M. André, P. Jonnard, C. Michaelsen, J. Wiesmann, F. Bridou, M.-F. Ravet, A. Jérome, F. Delmotte, and E. O. Filatova, “La/B4C small period multilayer interferential mirror for the analysis of boron,” X-Ray Spectrom. 34, 203-206 (2005).
[CrossRef]

Salashchenko, N. N.

S. S. Andreev, M. M. Barysheva, N. I. Chkhalo, S. A. Gusev, A. E. Pestov, V. N. Polkovnikov, N. N. Salashchenko, L. A. Shmaenok, Yu. A. Vainer, and S. Yu. Zuev, “Multilayered mirrors based on La/B4C (B9C) for X-ray range near anomalous dispersion of boron (λ=6.7 nm),” Nucl. Instrum. Methods Phys. Res. A 603, 80-82 (2009).

S. S. Andreev, M. S. Bibishkin, N. I. Chkhalo, E. B. Kluenkov, K. A. Prokhorov, N. N. Salashchenko, M. V. Zorina, F. Schafers, and L. A. Shmaenok, “Short-period multilayer x -ray mirrors,” J. Synchrotron Radiat. 10, 358-360 (2003).
[CrossRef]

Salmassi, F.

Schafers, F.

S. S. Andreev, M. S. Bibishkin, N. I. Chkhalo, E. B. Kluenkov, K. A. Prokhorov, N. N. Salashchenko, M. V. Zorina, F. Schafers, and L. A. Shmaenok, “Short-period multilayer x -ray mirrors,” J. Synchrotron Radiat. 10, 358-360 (2003).
[CrossRef]

Schäfers, F.

J. Kuneš, P. M. Oppeneer, H.-Ch. Mertins, F. Schäfers, A. Gaupp, W. Gudat, and P. Novák, “X-ray Faraday effect at the L2,3 edges of Fe, Co, and Ni: theory and experiment,” Phys. Rev. B 64, 174417 (2001).

Sève, L.

L. Sève, J. M. Tonnerre, and D. Raoux, “Determination of the anomalous scattering factors in the soft-x-ray range using diffraction from a multilayer,” J. Appl. Crystallogr. 31, 700-707 (1998).
[CrossRef]

Shmaenok, L. A.

S. S. Andreev, M. M. Barysheva, N. I. Chkhalo, S. A. Gusev, A. E. Pestov, V. N. Polkovnikov, N. N. Salashchenko, L. A. Shmaenok, Yu. A. Vainer, and S. Yu. Zuev, “Multilayered mirrors based on La/B4C (B9C) for X-ray range near anomalous dispersion of boron (λ=6.7 nm),” Nucl. Instrum. Methods Phys. Res. A 603, 80-82 (2009).

S. S. Andreev, M. S. Bibishkin, N. I. Chkhalo, E. B. Kluenkov, K. A. Prokhorov, N. N. Salashchenko, M. V. Zorina, F. Schafers, and L. A. Shmaenok, “Short-period multilayer x -ray mirrors,” J. Synchrotron Radiat. 10, 358-360 (2003).
[CrossRef]

Sinha, A. K.

G. S. Lodha, M. Nayak, M. H. Modi, A. K. Sinha, and R. V. Nandedkar, “Study of optical response near the absorption edge using vacuum ultraviolet/soft x-ray reflectivity beamline on Indus-1,” J. Phys.: Conf. Ser. 80, 012031 (2007).
[CrossRef]

Sobczak', E.

E. Sobczak' and K. Persy, “XPS, SXS and isochromat investigations of electronic structures of evaporated boron,” Phys. Scr. 22, 88-90 (1980).
[CrossRef]

Sobierajski, R.

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski-Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98, 145502 (2007).
[CrossRef]

Sokolowski-Tinten, K.

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski-Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98, 145502 (2007).
[CrossRef]

Soufli, R.

Spiller, E.

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski-Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98, 145502 (2007).
[CrossRef]

E. Spiller, “Refractive index of amorphous carbon near its K-edge ,” Appl. Opt. 29, 19-23 (1990).
[CrossRef]

Stojanovic, N.

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski-Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98, 145502 (2007).
[CrossRef]

Toleikis, S.

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski-Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98, 145502 (2007).
[CrossRef]

Tonnerre, J. M.

L. Sève, J. M. Tonnerre, and D. Raoux, “Determination of the anomalous scattering factors in the soft-x-ray range using diffraction from a multilayer,” J. Appl. Crystallogr. 31, 700-707 (1998).
[CrossRef]

Tschentscher, T.

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski-Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98, 145502 (2007).
[CrossRef]

Underwood, J. H.

J. J. Jia, J. H. Underwood, E. M. Gullikson, T. A. Callcott, and R. C. C. Perera, “Soft X-ray absorption spectroscopy in 100-1000 eV region at the ALS,” J. Electron Spectrosc. Relat. Phenom. 80, 509-512 (1996).
[CrossRef]

Vainer, Yu. A.

S. S. Andreev, M. M. Barysheva, N. I. Chkhalo, S. A. Gusev, A. E. Pestov, V. N. Polkovnikov, N. N. Salashchenko, L. A. Shmaenok, Yu. A. Vainer, and S. Yu. Zuev, “Multilayered mirrors based on La/B4C (B9C) for X-ray range near anomalous dispersion of boron (λ=6.7 nm),” Nucl. Instrum. Methods Phys. Res. A 603, 80-82 (2009).

Vinogradov, A. V.

I. V. Kozhevnikov and A. V. Vinogradov, “Basic formulae of XUV multilayer optics,” Phys. Scr. t17, 137-145 (1987).
[CrossRef]

Watanabe, M.

M. Watanabe, T. Ejima, N. Miyata, T. Imazono, and M. Yanagihara, “Studies of multilayer structure in depth direction by soft x-ray spectroscopy,” Nucl. Sci. Technol. 17, 257-267 (2006).

T. Ejima, K. Ouchi, and M. Watanabe, “Si─K absorption spectra of Si/CaF2 and Si/LiF multilayers,” J. Electron Spectrosc. Relat. Phenom. 101-103, 833-838 (1999).
[CrossRef]

Wiesmann, J.

J.-M. André, P. Jonnard, C. Michaelsen, J. Wiesmann, F. Bridou, M.-F. Ravet, A. Jérome, F. Delmotte, and E. O. Filatova, “La/B4C small period multilayer interferential mirror for the analysis of boron,” X-Ray Spectrom. 34, 203-206 (2005).
[CrossRef]

Windt, D.

D. Windt, “IMD--Software for modeling the optical properties of multilayer films,” Comput. Phys. 12, 360-370 (1998).
[CrossRef]

Yanagihara, M.

M. Watanabe, T. Ejima, N. Miyata, T. Imazono, and M. Yanagihara, “Studies of multilayer structure in depth direction by soft x-ray spectroscopy,” Nucl. Sci. Technol. 17, 257-267 (2006).

Ziegler, E.

C. Borel, Ch. Morawe, E. Ziegler, T. Bigault, J-Y. Massonnat, J-C. Peffen, and E. Debourg, “In situ study of multilayer reflectivity upon heat treatment under synchrotron radiation,” Proc. SPIE 5918, 591801 (2005).

Ch. Morawe, J-Ch. Peffen, O. Hignette, and E. Ziegler, “Design and performance of graded multilayers,” Proc. SPIE 3773, 90-99 (1999).

Zorina, M. V.

S. S. Andreev, M. S. Bibishkin, N. I. Chkhalo, E. B. Kluenkov, K. A. Prokhorov, N. N. Salashchenko, M. V. Zorina, F. Schafers, and L. A. Shmaenok, “Short-period multilayer x -ray mirrors,” J. Synchrotron Radiat. 10, 358-360 (2003).
[CrossRef]

Zuev, S. Yu.

S. S. Andreev, M. M. Barysheva, N. I. Chkhalo, S. A. Gusev, A. E. Pestov, V. N. Polkovnikov, N. N. Salashchenko, L. A. Shmaenok, Yu. A. Vainer, and S. Yu. Zuev, “Multilayered mirrors based on La/B4C (B9C) for X-ray range near anomalous dispersion of boron (λ=6.7 nm),” Nucl. Instrum. Methods Phys. Res. A 603, 80-82 (2009).

Appl. Opt. (2)

At. Data Nucl. Data Tables (1)

B. L. Henke, E. M. Gullikson, and J. C. Davis. “X-ray interactions: photoabsorption, scattering, transmission, and reflection at E=50-30000 eV, Z=1-92,” At. Data Nucl. Data Tables 54, 181-342 (1993).
[CrossRef]

Comput. Phys. (1)

D. Windt, “IMD--Software for modeling the optical properties of multilayer films,” Comput. Phys. 12, 360-370 (1998).
[CrossRef]

J. Appl. Crystallogr. (2)

T. Fukamachi, S. Hosoya, T. Kawamura, and J. Hastings, “Measurements of integrated intensity near the absorption edge with synchrotron radiation,” J. Appl. Crystallogr. 10, 321-324 (1977).
[CrossRef]

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[CrossRef]

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http://www.bessy.de/upload/bitpdfs/reflectometer.pdf

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