T. Anna, S. K. Dubey, C. Shakher, A. Roy, and D. S. Mehta, “Sinusoidal fringe projection system based on compact and non-mechanical scanning low coherence Michelson interferometer for three-dimensional shape measurement,” Opt. Commun. 282, 1237-1242 (2009).

[CrossRef]

E. Stoykova, J. Harizanova, and V. Sainov, “Pattern projection with a sinusoidal phase grating,” EURASIP J. Adv. Signal Process. 2009, 351626 (2009).

S. K. Dubey, D. S. Mehta, A. Roy, and C. Shakher, “Wavelength scanning Talbot effect: Wavelength-scanning Talbot effect and its application for arbitrary threedimensional step-height measurement,” Opt. Commun. 279, 13-19(2007).

[CrossRef]

S. Teng, X. Chen, T. Zhou, and C. Cheng, “Quasi-Talbot effect of a grating in the deep Fresnel diffraction region,” J. Opt. Soc. Am. A 24, 1656-1665 (2007).

[CrossRef]

R. Langoju, A. Patil, and P. Rastogi, “Phase-shifting interferometry in the presence of nonlinear phase steps, harmonics and noise,” Opt. Lett. 31, 1058-1060 (2006).

[CrossRef]

Y. Hu, J. Xi, E. Li, J. Chicharo, and Z. Yang, “Three-dimensional profilometry based on shift estimation of projected fringe patterns,” Appl. Opt. 45, 678-687 (2006).

[CrossRef]

J. Harizanova and A. Kolev, “Comparative study of fringe generation in two-spacing phase-shifting profilometry,” Proc. SPIE 6252, 625223 (2005).

D. S. Mehta, S. K. Dubey, M. M. Hossain, and C. Shakher, “Simple multifrequency and phase-shifting fringe-projection system based on two-wavelength lateral shearing interferometry for three-dimensional profilometry,” Appl. Opt. 44, 7515-7521 (2005).

[CrossRef]

X. Peng, J. Tian, P. Zhang, L. Wei, W. Qiu, E. Li, and D. Zhang, “Three-dimensional vision with dual acousto-optic deflection encoding,” Opt. Lett. 30, 1965-1967 (2005).

[CrossRef]

C. Tay, M. Thakur, and C. Quan, “Grating projection system for surface contour measurement,” Appl. Opt. 44, 1393-1400(2005).

[CrossRef]

A. Patil and P. Rastogi, “Approaches in generalized phase shifting interferometry,” Opt. Lasers Eng. 43, 475-490(2005).

S. Teng, L. Liu, J. Zu, Z. Luan, and D. Liu, “Uniform theory of the Talbot effect with partially coherent light illumination,” J. Opt. Soc. Am. A 20, 1747-1754 (2003).

[CrossRef]

S. Yoneyama, Y. Morimoto, M. Fujigaki, and Y. Ikeda, “Three-dimensional surface profile measurement of a moving object by a spatial-offset phase stepping method,” Opt. Eng. 42, 137-142 (2003).

C. Quan, C. J. Tay, X. Kang, X. Y. He, and H. M. Shang, “Shape measurement by use of liquid-crystal display fringe projection with two-step phase shifting,” Appl. Opt. 42, 2329-2335(2003).

[CrossRef]

P. S. Huang, C. Zhang, and F.-P. Chiang, “High-speed 3-D shape measurement based on digital fringe projection,” Opt. Eng. 42, 163-168 (2003).

C. Quan, X. Y. He, C. F. Wang, C. J. Tay, and H. M. Shang, “Shape measurement of small objects using LCD fringe projection with phase-shifting,” Opt. Commun. 189, 21-29 (2001).

[CrossRef]

M. T. Flores-Arias, M. V. Perez, C. Gomez-Reino, C. Bao, and C. R. Fernandez-Pousa, “Talbot effect interpreted by number theory,” J. Opt. Soc. Am. A 18, 2707-2716 (2001).

[CrossRef]

T. Xian and X. Su, “Area modulation grating for sinusoidal structure illumination on phase-measuring profilometry,” Appl. Opt. 40, 1201-1206 (2001).

[CrossRef]

F. Chen, G. Brown, and M. Song, “Overview of three-dimensional shape measurement using optical methods,” Opt. Eng. 39, 10-22 (2000).

P. Latimer and R. F. Crouse, “Talbot effect reinterpreted,” Appl. Opt. 31, 80-89 (1992).

[CrossRef]

K. G. Larkin and B. F. Oreb, “Design and assessment of symmetrical phase-shifting algorithms,” J. Opt. Soc. Am. A 9, 1740-1748 (1992).

[CrossRef]

X. Su, W.-S. Zhou, G. von Bally, and D. Vukicevic, “Automated phase-measuring profilometry using defocused projection of a Ronchi grating,” Opt. Commun. 94, 561-573 (1992).

[CrossRef]

T. Anna, S. K. Dubey, C. Shakher, A. Roy, and D. S. Mehta, “Sinusoidal fringe projection system based on compact and non-mechanical scanning low coherence Michelson interferometer for three-dimensional shape measurement,” Opt. Commun. 282, 1237-1242 (2009).

[CrossRef]

F. Chen, G. Brown, and M. Song, “Overview of three-dimensional shape measurement using optical methods,” Opt. Eng. 39, 10-22 (2000).

F. Chen, G. Brown, and M. Song, “Overview of three-dimensional shape measurement using optical methods,” Opt. Eng. 39, 10-22 (2000).

P. S. Huang, C. Zhang, and F.-P. Chiang, “High-speed 3-D shape measurement based on digital fringe projection,” Opt. Eng. 42, 163-168 (2003).

K. Creath, “Phase-measurement interferometry techniques,” Prog. Opt. 26, 349-393 (1988).

[CrossRef]

B. Dorrio and J. Fernandez, “Phase-evaluation methods in whole-field optical measurement techniques,” Meas. Sci. Technol. 10, R33-R55 (1999).

[CrossRef]

T. Anna, S. K. Dubey, C. Shakher, A. Roy, and D. S. Mehta, “Sinusoidal fringe projection system based on compact and non-mechanical scanning low coherence Michelson interferometer for three-dimensional shape measurement,” Opt. Commun. 282, 1237-1242 (2009).

[CrossRef]

S. K. Dubey, D. S. Mehta, A. Roy, and C. Shakher, “Wavelength scanning Talbot effect: Wavelength-scanning Talbot effect and its application for arbitrary threedimensional step-height measurement,” Opt. Commun. 279, 13-19(2007).

[CrossRef]

D. S. Mehta, S. K. Dubey, M. M. Hossain, and C. Shakher, “Simple multifrequency and phase-shifting fringe-projection system based on two-wavelength lateral shearing interferometry for three-dimensional profilometry,” Appl. Opt. 44, 7515-7521 (2005).

[CrossRef]

B. Dorrio and J. Fernandez, “Phase-evaluation methods in whole-field optical measurement techniques,” Meas. Sci. Technol. 10, R33-R55 (1999).

[CrossRef]

S. Yoneyama, Y. Morimoto, M. Fujigaki, and Y. Ikeda, “Three-dimensional surface profile measurement of a moving object by a spatial-offset phase stepping method,” Opt. Eng. 42, 137-142 (2003).

K. J. Gasvik, *Optical Metrology* (Wiley, 2002).

D. Ghiglia and M. Pritt, *Two-Dimensional Phase Unwrapping: Theory, Algorithms and Software* (Wiley, 1998).

J. Goodman, *Introduction to Fourier Optics* (McGraw-Hill, 1996).

E. Stoykova, J. Harizanova, and V. Sainov, “Pattern projection with a sinusoidal phase grating,” EURASIP J. Adv. Signal Process. 2009, 351626 (2009).

J. Harizanova and A. Kolev, “Comparative study of fringe generation in two-spacing phase-shifting profilometry,” Proc. SPIE 6252, 625223 (2005).

E. Stoykova, J. Harizanova, and V. Sainov, “Pattern projection profilometry for 3D coordinates measurement of dynamic scenes,” in *Three Dimensional Television*, H. M. Ozaktas and L. Onural, eds. (Springer, 2008), pp. 85-164.

C. Quan, C. J. Tay, X. Kang, X. Y. He, and H. M. Shang, “Shape measurement by use of liquid-crystal display fringe projection with two-step phase shifting,” Appl. Opt. 42, 2329-2335(2003).

[CrossRef]

C. Quan, X. Y. He, C. F. Wang, C. J. Tay, and H. M. Shang, “Shape measurement of small objects using LCD fringe projection with phase-shifting,” Opt. Commun. 189, 21-29 (2001).

[CrossRef]

P. S. Huang, C. Zhang, and F.-P. Chiang, “High-speed 3-D shape measurement based on digital fringe projection,” Opt. Eng. 42, 163-168 (2003).

S. Yoneyama, Y. Morimoto, M. Fujigaki, and Y. Ikeda, “Three-dimensional surface profile measurement of a moving object by a spatial-offset phase stepping method,” Opt. Eng. 42, 137-142 (2003).

Y. Ishii, “Laser-diode interferometry,” Prog. Opt. 46, 243-309(2004).

J. Harizanova and A. Kolev, “Comparative study of fringe generation in two-spacing phase-shifting profilometry,” Proc. SPIE 6252, 625223 (2005).

Y. Hu, J. Xi, E. Li, J. Chicharo, and Z. Yang, “Three-dimensional profilometry based on shift estimation of projected fringe patterns,” Appl. Opt. 45, 678-687 (2006).

[CrossRef]

X. Peng, J. Tian, P. Zhang, L. Wei, W. Qiu, E. Li, and D. Zhang, “Three-dimensional vision with dual acousto-optic deflection encoding,” Opt. Lett. 30, 1965-1967 (2005).

[CrossRef]

S. Teng, L. Liu, J. Zu, Z. Luan, and D. Liu, “Uniform theory of the Talbot effect with partially coherent light illumination,” J. Opt. Soc. Am. A 20, 1747-1754 (2003).

[CrossRef]

L. Liu, “Talbot and Lau effects on incident beams of arbitrary wavefront, and their use,” Appl. Opt. 28, 4668-4678(1989).

[CrossRef]

T. Anna, S. K. Dubey, C. Shakher, A. Roy, and D. S. Mehta, “Sinusoidal fringe projection system based on compact and non-mechanical scanning low coherence Michelson interferometer for three-dimensional shape measurement,” Opt. Commun. 282, 1237-1242 (2009).

[CrossRef]

S. K. Dubey, D. S. Mehta, A. Roy, and C. Shakher, “Wavelength scanning Talbot effect: Wavelength-scanning Talbot effect and its application for arbitrary threedimensional step-height measurement,” Opt. Commun. 279, 13-19(2007).

[CrossRef]

D. S. Mehta, S. K. Dubey, M. M. Hossain, and C. Shakher, “Simple multifrequency and phase-shifting fringe-projection system based on two-wavelength lateral shearing interferometry for three-dimensional profilometry,” Appl. Opt. 44, 7515-7521 (2005).

[CrossRef]

S. Yoneyama, Y. Morimoto, M. Fujigaki, and Y. Ikeda, “Three-dimensional surface profile measurement of a moving object by a spatial-offset phase stepping method,” Opt. Eng. 42, 137-142 (2003).

D. Ghiglia and M. Pritt, *Two-Dimensional Phase Unwrapping: Theory, Algorithms and Software* (Wiley, 1998).

C. Tay, M. Thakur, and C. Quan, “Grating projection system for surface contour measurement,” Appl. Opt. 44, 1393-1400(2005).

[CrossRef]

C. Quan, C. J. Tay, X. Kang, X. Y. He, and H. M. Shang, “Shape measurement by use of liquid-crystal display fringe projection with two-step phase shifting,” Appl. Opt. 42, 2329-2335(2003).

[CrossRef]

C. Quan, X. Y. He, C. F. Wang, C. J. Tay, and H. M. Shang, “Shape measurement of small objects using LCD fringe projection with phase-shifting,” Opt. Commun. 189, 21-29 (2001).

[CrossRef]

T. Anna, S. K. Dubey, C. Shakher, A. Roy, and D. S. Mehta, “Sinusoidal fringe projection system based on compact and non-mechanical scanning low coherence Michelson interferometer for three-dimensional shape measurement,” Opt. Commun. 282, 1237-1242 (2009).

[CrossRef]

S. K. Dubey, D. S. Mehta, A. Roy, and C. Shakher, “Wavelength scanning Talbot effect: Wavelength-scanning Talbot effect and its application for arbitrary threedimensional step-height measurement,” Opt. Commun. 279, 13-19(2007).

[CrossRef]

E. Stoykova, J. Harizanova, and V. Sainov, “Pattern projection with a sinusoidal phase grating,” EURASIP J. Adv. Signal Process. 2009, 351626 (2009).

E. Stoykova, J. Harizanova, and V. Sainov, “Pattern projection profilometry for 3D coordinates measurement of dynamic scenes,” in *Three Dimensional Television*, H. M. Ozaktas and L. Onural, eds. (Springer, 2008), pp. 85-164.

J. Schwider, “Advanced evaluation techniques in interferometry,” Prog. Opt. 28, 271-359 (1990).

[CrossRef]

T. Anna, S. K. Dubey, C. Shakher, A. Roy, and D. S. Mehta, “Sinusoidal fringe projection system based on compact and non-mechanical scanning low coherence Michelson interferometer for three-dimensional shape measurement,” Opt. Commun. 282, 1237-1242 (2009).

[CrossRef]

S. K. Dubey, D. S. Mehta, A. Roy, and C. Shakher, “Wavelength scanning Talbot effect: Wavelength-scanning Talbot effect and its application for arbitrary threedimensional step-height measurement,” Opt. Commun. 279, 13-19(2007).

[CrossRef]

D. S. Mehta, S. K. Dubey, M. M. Hossain, and C. Shakher, “Simple multifrequency and phase-shifting fringe-projection system based on two-wavelength lateral shearing interferometry for three-dimensional profilometry,” Appl. Opt. 44, 7515-7521 (2005).

[CrossRef]

C. Quan, C. J. Tay, X. Kang, X. Y. He, and H. M. Shang, “Shape measurement by use of liquid-crystal display fringe projection with two-step phase shifting,” Appl. Opt. 42, 2329-2335(2003).

[CrossRef]

C. Quan, X. Y. He, C. F. Wang, C. J. Tay, and H. M. Shang, “Shape measurement of small objects using LCD fringe projection with phase-shifting,” Opt. Commun. 189, 21-29 (2001).

[CrossRef]

F. Chen, G. Brown, and M. Song, “Overview of three-dimensional shape measurement using optical methods,” Opt. Eng. 39, 10-22 (2000).

E. Stoykova, J. Harizanova, and V. Sainov, “Pattern projection with a sinusoidal phase grating,” EURASIP J. Adv. Signal Process. 2009, 351626 (2009).

E. Stoykova, J. Harizanova, and V. Sainov, “Pattern projection profilometry for 3D coordinates measurement of dynamic scenes,” in *Three Dimensional Television*, H. M. Ozaktas and L. Onural, eds. (Springer, 2008), pp. 85-164.

C. Quan, C. J. Tay, X. Kang, X. Y. He, and H. M. Shang, “Shape measurement by use of liquid-crystal display fringe projection with two-step phase shifting,” Appl. Opt. 42, 2329-2335(2003).

[CrossRef]

C. Quan, X. Y. He, C. F. Wang, C. J. Tay, and H. M. Shang, “Shape measurement of small objects using LCD fringe projection with phase-shifting,” Opt. Commun. 189, 21-29 (2001).

[CrossRef]

S. Teng, X. Chen, T. Zhou, and C. Cheng, “Quasi-Talbot effect of a grating in the deep Fresnel diffraction region,” J. Opt. Soc. Am. A 24, 1656-1665 (2007).

[CrossRef]

S. Teng, L. Liu, J. Zu, Z. Luan, and D. Liu, “Uniform theory of the Talbot effect with partially coherent light illumination,” J. Opt. Soc. Am. A 20, 1747-1754 (2003).

[CrossRef]

X. Su, W.-S. Zhou, G. von Bally, and D. Vukicevic, “Automated phase-measuring profilometry using defocused projection of a Ronchi grating,” Opt. Commun. 94, 561-573 (1992).

[CrossRef]

X. Su, W.-S. Zhou, G. von Bally, and D. Vukicevic, “Automated phase-measuring profilometry using defocused projection of a Ronchi grating,” Opt. Commun. 94, 561-573 (1992).

[CrossRef]

C. Quan, X. Y. He, C. F. Wang, C. J. Tay, and H. M. Shang, “Shape measurement of small objects using LCD fringe projection with phase-shifting,” Opt. Commun. 189, 21-29 (2001).

[CrossRef]

S. Yoneyama, Y. Morimoto, M. Fujigaki, and Y. Ikeda, “Three-dimensional surface profile measurement of a moving object by a spatial-offset phase stepping method,” Opt. Eng. 42, 137-142 (2003).

P. S. Huang, C. Zhang, and F.-P. Chiang, “High-speed 3-D shape measurement based on digital fringe projection,” Opt. Eng. 42, 163-168 (2003).

X. Su, W.-S. Zhou, G. von Bally, and D. Vukicevic, “Automated phase-measuring profilometry using defocused projection of a Ronchi grating,” Opt. Commun. 94, 561-573 (1992).

[CrossRef]

D. Joyeux and Y. Cohen-Sabban, “High magnification self-imaging,” Appl. Opt. 21, 625-627 (1982).

[CrossRef]

P. Chavel and T. C. Strand, “Range measurement using Talbot diffraction imaging of gratings,” Appl. Opt. 23, 862-871(1984).

[CrossRef]

K. G. Harding and S. L. Cartwright, “Phase grating use in moire interferometry,” Appl. Opt. 23, 1517-1520 (1984).

[CrossRef]

K. A. Stetson and W. R. Brohinsky, “Electrooptic holography and its application to hologram interferometry,” Appl. Opt. 24, 3631-3637 (1985).

[CrossRef]

L. Liu, “Talbot and Lau effects on incident beams of arbitrary wavefront, and their use,” Appl. Opt. 28, 4668-4678(1989).

[CrossRef]

A. W. Lohmann and J. A. Thomas, “Making an array illuminator based on the Talbot effect,” Appl. Opt. 29, 4337-4340(1990).

[CrossRef]

P. Latimer and R. F. Crouse, “Talbot effect reinterpreted,” Appl. Opt. 31, 80-89 (1992).

[CrossRef]

B. F. Oreb and R. G. Dorsch, “Profilometry by phase-shifted Talbot images,” Appl. Opt. 33, 7955-7962 (1994).

[CrossRef]

Y. Hao, Y. Zhao, and D. Li, “Multifrequency grating projection profilometry based on the nonlinear excess fraction method,” Appl. Opt. 38, 4106-4111 (1999).

[CrossRef]

J.-C. Terrillon, “Image preprocessing for rotation-invariant pattern recognition in the presence of signal-dependent noise,” Appl. Opt. 35, 1879-1893 (1996).

[CrossRef]

Y. Surrel, “Design of algorithms for phase measurements by the use of phase stepping,” Appl. Opt. 35, 51-60(1996).

[CrossRef]

M. Testorf and J. Jahns, “Planar-integrated Talbot array illuminators,” Appl. Opt. 37, 5399-5407 (1998).

[CrossRef]

T. Xian and X. Su, “Area modulation grating for sinusoidal structure illumination on phase-measuring profilometry,” Appl. Opt. 40, 1201-1206 (2001).

[CrossRef]

C. Quan, C. J. Tay, X. Kang, X. Y. He, and H. M. Shang, “Shape measurement by use of liquid-crystal display fringe projection with two-step phase shifting,” Appl. Opt. 42, 2329-2335(2003).

[CrossRef]

H. Guo, H. He, and M. Chen, “Gamma correction for digital fringe projection profilometry,” Appl. Opt. 43, 2906-2914(2004).

[CrossRef]

C. Tay, M. Thakur, and C. Quan, “Grating projection system for surface contour measurement,” Appl. Opt. 44, 1393-1400(2005).

[CrossRef]

D. S. Mehta, S. K. Dubey, M. M. Hossain, and C. Shakher, “Simple multifrequency and phase-shifting fringe-projection system based on two-wavelength lateral shearing interferometry for three-dimensional profilometry,” Appl. Opt. 44, 7515-7521 (2005).

[CrossRef]

Y. Hu, J. Xi, E. Li, J. Chicharo, and Z. Yang, “Three-dimensional profilometry based on shift estimation of projected fringe patterns,” Appl. Opt. 45, 678-687 (2006).

[CrossRef]

E. Stoykova, J. Harizanova, and V. Sainov, “Pattern projection with a sinusoidal phase grating,” EURASIP J. Adv. Signal Process. 2009, 351626 (2009).

S. Teng, L. Liu, J. Zu, Z. Luan, and D. Liu, “Uniform theory of the Talbot effect with partially coherent light illumination,” J. Opt. Soc. Am. A 20, 1747-1754 (2003).

[CrossRef]

K. Hibino, B. Oreb, D. Farrant, and K. Larkin, “Phase-shifting algorithms for nonlinear and spatially nonuniform phase shifts,” J. Opt. Soc. Am. A 14, 918-930 (1997).

[CrossRef]

K. Patorski and S. Kozak, “Self-imaging with nonparabolic approximation of spherical wave fronts,” J. Opt. Soc. Am. A 5, 1322-1327 (1988).

[CrossRef]

G. Lai and T. Yatagai, “Generalized phase-shifting interferometry,” J. Opt. Soc. Am. A 8, 822-827 (1991).

[CrossRef]

K. G. Larkin and B. F. Oreb, “Design and assessment of symmetrical phase-shifting algorithms,” J. Opt. Soc. Am. A 9, 1740-1748 (1992).

[CrossRef]

M. T. Flores-Arias, M. V. Perez, C. Gomez-Reino, C. Bao, and C. R. Fernandez-Pousa, “Talbot effect interpreted by number theory,” J. Opt. Soc. Am. A 18, 2707-2716 (2001).

[CrossRef]

S. Teng, X. Chen, T. Zhou, and C. Cheng, “Quasi-Talbot effect of a grating in the deep Fresnel diffraction region,” J. Opt. Soc. Am. A 24, 1656-1665 (2007).

[CrossRef]

B. Dorrio and J. Fernandez, “Phase-evaluation methods in whole-field optical measurement techniques,” Meas. Sci. Technol. 10, R33-R55 (1999).

[CrossRef]

S. K. Dubey, D. S. Mehta, A. Roy, and C. Shakher, “Wavelength scanning Talbot effect: Wavelength-scanning Talbot effect and its application for arbitrary threedimensional step-height measurement,” Opt. Commun. 279, 13-19(2007).

[CrossRef]

T. Anna, S. K. Dubey, C. Shakher, A. Roy, and D. S. Mehta, “Sinusoidal fringe projection system based on compact and non-mechanical scanning low coherence Michelson interferometer for three-dimensional shape measurement,” Opt. Commun. 282, 1237-1242 (2009).

[CrossRef]

C. Quan, X. Y. He, C. F. Wang, C. J. Tay, and H. M. Shang, “Shape measurement of small objects using LCD fringe projection with phase-shifting,” Opt. Commun. 189, 21-29 (2001).

[CrossRef]

X. Su, W.-S. Zhou, G. von Bally, and D. Vukicevic, “Automated phase-measuring profilometry using defocused projection of a Ronchi grating,” Opt. Commun. 94, 561-573 (1992).

[CrossRef]

P. S. Huang, C. Zhang, and F.-P. Chiang, “High-speed 3-D shape measurement based on digital fringe projection,” Opt. Eng. 42, 163-168 (2003).

F. Chen, G. Brown, and M. Song, “Overview of three-dimensional shape measurement using optical methods,” Opt. Eng. 39, 10-22 (2000).

S. Yoneyama, Y. Morimoto, M. Fujigaki, and Y. Ikeda, “Three-dimensional surface profile measurement of a moving object by a spatial-offset phase stepping method,” Opt. Eng. 42, 137-142 (2003).

A. Patil and P. Rastogi, “Approaches in generalized phase shifting interferometry,” Opt. Lasers Eng. 43, 475-490(2005).

R. Langoju, A. Patil, and P. Rastogi, “Phase-shifting interferometry in the presence of nonlinear phase steps, harmonics and noise,” Opt. Lett. 31, 1058-1060 (2006).

[CrossRef]

X. Peng, J. Tian, P. Zhang, L. Wei, W. Qiu, E. Li, and D. Zhang, “Three-dimensional vision with dual acousto-optic deflection encoding,” Opt. Lett. 30, 1965-1967 (2005).

[CrossRef]

J. Harizanova and A. Kolev, “Comparative study of fringe generation in two-spacing phase-shifting profilometry,” Proc. SPIE 6252, 625223 (2005).

K. Creath, “Phase-measurement interferometry techniques,” Prog. Opt. 26, 349-393 (1988).

[CrossRef]

J. Schwider, “Advanced evaluation techniques in interferometry,” Prog. Opt. 28, 271-359 (1990).

[CrossRef]

Y. Ishii, “Laser-diode interferometry,” Prog. Opt. 46, 243-309(2004).

K. J. Gasvik, *Optical Metrology* (Wiley, 2002).

E. Stoykova, J. Harizanova, and V. Sainov, “Pattern projection profilometry for 3D coordinates measurement of dynamic scenes,” in *Three Dimensional Television*, H. M. Ozaktas and L. Onural, eds. (Springer, 2008), pp. 85-164.

J. Goodman, *Introduction to Fourier Optics* (McGraw-Hill, 1996).

D. Ghiglia and M. Pritt, *Two-Dimensional Phase Unwrapping: Theory, Algorithms and Software* (Wiley, 1998).