T. Anna, S. K. Dubey, C. Shakher, A. Roy, and D. S. Mehta, “Sinusoidal fringe projection system based on compact and non-mechanical scanning low coherence Michelson interferometer for three-dimensional shape measurement,” Opt. Commun. 282, 1237-1242 (2009).

[Crossref]

E. Stoykova, J. Harizanova, and V. Sainov, “Pattern projection with a sinusoidal phase grating,” EURASIP J. Adv. Signal Process. 2009, 351626 (2009).

S. K. Dubey, D. S. Mehta, A. Roy, and C. Shakher, “Wavelength scanning Talbot effect: Wavelength-scanning Talbot effect and its application for arbitrary threedimensional step-height measurement,” Opt. Commun. 279, 13-19(2007).

[Crossref]

S. Teng, X. Chen, T. Zhou, and C. Cheng, “Quasi-Talbot effect of a grating in the deep Fresnel diffraction region,” J. Opt. Soc. Am. A 24, 1656-1665 (2007).

[Crossref]

R. Langoju, A. Patil, and P. Rastogi, “Phase-shifting interferometry in the presence of nonlinear phase steps, harmonics and noise,” Opt. Lett. 31, 1058-1060 (2006).

[Crossref]

Y. Hu, J. Xi, E. Li, J. Chicharo, and Z. Yang, “Three-dimensional profilometry based on shift estimation of projected fringe patterns,” Appl. Opt. 45, 678-687 (2006).

[Crossref]

J. Harizanova and A. Kolev, “Comparative study of fringe generation in two-spacing phase-shifting profilometry,” Proc. SPIE 6252, 625223 (2005).

D. S. Mehta, S. K. Dubey, M. M. Hossain, and C. Shakher, “Simple multifrequency and phase-shifting fringe-projection system based on two-wavelength lateral shearing interferometry for three-dimensional profilometry,” Appl. Opt. 44, 7515-7521 (2005).

[Crossref]

X. Peng, J. Tian, P. Zhang, L. Wei, W. Qiu, E. Li, and D. Zhang, “Three-dimensional vision with dual acousto-optic deflection encoding,” Opt. Lett. 30, 1965-1967 (2005).

[Crossref]

C. Tay, M. Thakur, and C. Quan, “Grating projection system for surface contour measurement,” Appl. Opt. 44, 1393-1400(2005).

[Crossref]

A. Patil and P. Rastogi, “Approaches in generalized phase shifting interferometry,” Opt. Lasers Eng. 43, 475-490(2005).

S. Teng, L. Liu, J. Zu, Z. Luan, and D. Liu, “Uniform theory of the Talbot effect with partially coherent light illumination,” J. Opt. Soc. Am. A 20, 1747-1754 (2003).

[Crossref]

S. Yoneyama, Y. Morimoto, M. Fujigaki, and Y. Ikeda, “Three-dimensional surface profile measurement of a moving object by a spatial-offset phase stepping method,” Opt. Eng. 42, 137-142 (2003).

C. Quan, C. J. Tay, X. Kang, X. Y. He, and H. M. Shang, “Shape measurement by use of liquid-crystal display fringe projection with two-step phase shifting,” Appl. Opt. 42, 2329-2335(2003).

[Crossref]

P. S. Huang, C. Zhang, and F.-P. Chiang, “High-speed 3-D shape measurement based on digital fringe projection,” Opt. Eng. 42, 163-168 (2003).

C. Quan, X. Y. He, C. F. Wang, C. J. Tay, and H. M. Shang, “Shape measurement of small objects using LCD fringe projection with phase-shifting,” Opt. Commun. 189, 21-29 (2001).

[Crossref]

M. T. Flores-Arias, M. V. Perez, C. Gomez-Reino, C. Bao, and C. R. Fernandez-Pousa, “Talbot effect interpreted by number theory,” J. Opt. Soc. Am. A 18, 2707-2716 (2001).

[Crossref]

T. Xian and X. Su, “Area modulation grating for sinusoidal structure illumination on phase-measuring profilometry,” Appl. Opt. 40, 1201-1206 (2001).

[Crossref]

F. Chen, G. Brown, and M. Song, “Overview of three-dimensional shape measurement using optical methods,” Opt. Eng. 39, 10-22 (2000).

P. Latimer and R. F. Crouse, “Talbot effect reinterpreted,” Appl. Opt. 31, 80-89 (1992).

[Crossref]

K. G. Larkin and B. F. Oreb, “Design and assessment of symmetrical phase-shifting algorithms,” J. Opt. Soc. Am. A 9, 1740-1748 (1992).

[Crossref]

X. Su, W.-S. Zhou, G. von Bally, and D. Vukicevic, “Automated phase-measuring profilometry using defocused projection of a Ronchi grating,” Opt. Commun. 94, 561-573 (1992).

[Crossref]

T. Anna, S. K. Dubey, C. Shakher, A. Roy, and D. S. Mehta, “Sinusoidal fringe projection system based on compact and non-mechanical scanning low coherence Michelson interferometer for three-dimensional shape measurement,” Opt. Commun. 282, 1237-1242 (2009).

[Crossref]

F. Chen, G. Brown, and M. Song, “Overview of three-dimensional shape measurement using optical methods,” Opt. Eng. 39, 10-22 (2000).

F. Chen, G. Brown, and M. Song, “Overview of three-dimensional shape measurement using optical methods,” Opt. Eng. 39, 10-22 (2000).

P. S. Huang, C. Zhang, and F.-P. Chiang, “High-speed 3-D shape measurement based on digital fringe projection,” Opt. Eng. 42, 163-168 (2003).

K. Creath, “Phase-measurement interferometry techniques,” Prog. Opt. 26, 349-393 (1988).

[Crossref]

B. Dorrio and J. Fernandez, “Phase-evaluation methods in whole-field optical measurement techniques,” Meas. Sci. Technol. 10, R33-R55 (1999).

[Crossref]

T. Anna, S. K. Dubey, C. Shakher, A. Roy, and D. S. Mehta, “Sinusoidal fringe projection system based on compact and non-mechanical scanning low coherence Michelson interferometer for three-dimensional shape measurement,” Opt. Commun. 282, 1237-1242 (2009).

[Crossref]

S. K. Dubey, D. S. Mehta, A. Roy, and C. Shakher, “Wavelength scanning Talbot effect: Wavelength-scanning Talbot effect and its application for arbitrary threedimensional step-height measurement,” Opt. Commun. 279, 13-19(2007).

[Crossref]

D. S. Mehta, S. K. Dubey, M. M. Hossain, and C. Shakher, “Simple multifrequency and phase-shifting fringe-projection system based on two-wavelength lateral shearing interferometry for three-dimensional profilometry,” Appl. Opt. 44, 7515-7521 (2005).

[Crossref]

B. Dorrio and J. Fernandez, “Phase-evaluation methods in whole-field optical measurement techniques,” Meas. Sci. Technol. 10, R33-R55 (1999).

[Crossref]

S. Yoneyama, Y. Morimoto, M. Fujigaki, and Y. Ikeda, “Three-dimensional surface profile measurement of a moving object by a spatial-offset phase stepping method,” Opt. Eng. 42, 137-142 (2003).

K. J. Gasvik, *Optical Metrology* (Wiley, 2002).

D. Ghiglia and M. Pritt, *Two-Dimensional Phase Unwrapping: Theory, Algorithms and Software* (Wiley, 1998).

J. Goodman, *Introduction to Fourier Optics* (McGraw-Hill, 1996).

E. Stoykova, J. Harizanova, and V. Sainov, “Pattern projection with a sinusoidal phase grating,” EURASIP J. Adv. Signal Process. 2009, 351626 (2009).

J. Harizanova and A. Kolev, “Comparative study of fringe generation in two-spacing phase-shifting profilometry,” Proc. SPIE 6252, 625223 (2005).

E. Stoykova, J. Harizanova, and V. Sainov, “Pattern projection profilometry for 3D coordinates measurement of dynamic scenes,” in *Three Dimensional Television*, H. M. Ozaktas and L. Onural, eds. (Springer, 2008), pp. 85-164.

C. Quan, C. J. Tay, X. Kang, X. Y. He, and H. M. Shang, “Shape measurement by use of liquid-crystal display fringe projection with two-step phase shifting,” Appl. Opt. 42, 2329-2335(2003).

[Crossref]

C. Quan, X. Y. He, C. F. Wang, C. J. Tay, and H. M. Shang, “Shape measurement of small objects using LCD fringe projection with phase-shifting,” Opt. Commun. 189, 21-29 (2001).

[Crossref]

P. S. Huang, C. Zhang, and F.-P. Chiang, “High-speed 3-D shape measurement based on digital fringe projection,” Opt. Eng. 42, 163-168 (2003).

S. Yoneyama, Y. Morimoto, M. Fujigaki, and Y. Ikeda, “Three-dimensional surface profile measurement of a moving object by a spatial-offset phase stepping method,” Opt. Eng. 42, 137-142 (2003).

Y. Ishii, “Laser-diode interferometry,” Prog. Opt. 46, 243-309(2004).

J. Harizanova and A. Kolev, “Comparative study of fringe generation in two-spacing phase-shifting profilometry,” Proc. SPIE 6252, 625223 (2005).

Y. Hu, J. Xi, E. Li, J. Chicharo, and Z. Yang, “Three-dimensional profilometry based on shift estimation of projected fringe patterns,” Appl. Opt. 45, 678-687 (2006).

[Crossref]

X. Peng, J. Tian, P. Zhang, L. Wei, W. Qiu, E. Li, and D. Zhang, “Three-dimensional vision with dual acousto-optic deflection encoding,” Opt. Lett. 30, 1965-1967 (2005).

[Crossref]

S. Teng, L. Liu, J. Zu, Z. Luan, and D. Liu, “Uniform theory of the Talbot effect with partially coherent light illumination,” J. Opt. Soc. Am. A 20, 1747-1754 (2003).

[Crossref]

L. Liu, “Talbot and Lau effects on incident beams of arbitrary wavefront, and their use,” Appl. Opt. 28, 4668-4678(1989).

[Crossref]

T. Anna, S. K. Dubey, C. Shakher, A. Roy, and D. S. Mehta, “Sinusoidal fringe projection system based on compact and non-mechanical scanning low coherence Michelson interferometer for three-dimensional shape measurement,” Opt. Commun. 282, 1237-1242 (2009).

[Crossref]

S. K. Dubey, D. S. Mehta, A. Roy, and C. Shakher, “Wavelength scanning Talbot effect: Wavelength-scanning Talbot effect and its application for arbitrary threedimensional step-height measurement,” Opt. Commun. 279, 13-19(2007).

[Crossref]

D. S. Mehta, S. K. Dubey, M. M. Hossain, and C. Shakher, “Simple multifrequency and phase-shifting fringe-projection system based on two-wavelength lateral shearing interferometry for three-dimensional profilometry,” Appl. Opt. 44, 7515-7521 (2005).

[Crossref]

S. Yoneyama, Y. Morimoto, M. Fujigaki, and Y. Ikeda, “Three-dimensional surface profile measurement of a moving object by a spatial-offset phase stepping method,” Opt. Eng. 42, 137-142 (2003).

D. Ghiglia and M. Pritt, *Two-Dimensional Phase Unwrapping: Theory, Algorithms and Software* (Wiley, 1998).

C. Tay, M. Thakur, and C. Quan, “Grating projection system for surface contour measurement,” Appl. Opt. 44, 1393-1400(2005).

[Crossref]

C. Quan, C. J. Tay, X. Kang, X. Y. He, and H. M. Shang, “Shape measurement by use of liquid-crystal display fringe projection with two-step phase shifting,” Appl. Opt. 42, 2329-2335(2003).

[Crossref]

C. Quan, X. Y. He, C. F. Wang, C. J. Tay, and H. M. Shang, “Shape measurement of small objects using LCD fringe projection with phase-shifting,” Opt. Commun. 189, 21-29 (2001).

[Crossref]

T. Anna, S. K. Dubey, C. Shakher, A. Roy, and D. S. Mehta, “Sinusoidal fringe projection system based on compact and non-mechanical scanning low coherence Michelson interferometer for three-dimensional shape measurement,” Opt. Commun. 282, 1237-1242 (2009).

[Crossref]

S. K. Dubey, D. S. Mehta, A. Roy, and C. Shakher, “Wavelength scanning Talbot effect: Wavelength-scanning Talbot effect and its application for arbitrary threedimensional step-height measurement,” Opt. Commun. 279, 13-19(2007).

[Crossref]

E. Stoykova, J. Harizanova, and V. Sainov, “Pattern projection with a sinusoidal phase grating,” EURASIP J. Adv. Signal Process. 2009, 351626 (2009).

E. Stoykova, J. Harizanova, and V. Sainov, “Pattern projection profilometry for 3D coordinates measurement of dynamic scenes,” in *Three Dimensional Television*, H. M. Ozaktas and L. Onural, eds. (Springer, 2008), pp. 85-164.

J. Schwider, “Advanced evaluation techniques in interferometry,” Prog. Opt. 28, 271-359 (1990).

[Crossref]

T. Anna, S. K. Dubey, C. Shakher, A. Roy, and D. S. Mehta, “Sinusoidal fringe projection system based on compact and non-mechanical scanning low coherence Michelson interferometer for three-dimensional shape measurement,” Opt. Commun. 282, 1237-1242 (2009).

[Crossref]

S. K. Dubey, D. S. Mehta, A. Roy, and C. Shakher, “Wavelength scanning Talbot effect: Wavelength-scanning Talbot effect and its application for arbitrary threedimensional step-height measurement,” Opt. Commun. 279, 13-19(2007).

[Crossref]

D. S. Mehta, S. K. Dubey, M. M. Hossain, and C. Shakher, “Simple multifrequency and phase-shifting fringe-projection system based on two-wavelength lateral shearing interferometry for three-dimensional profilometry,” Appl. Opt. 44, 7515-7521 (2005).

[Crossref]

C. Quan, C. J. Tay, X. Kang, X. Y. He, and H. M. Shang, “Shape measurement by use of liquid-crystal display fringe projection with two-step phase shifting,” Appl. Opt. 42, 2329-2335(2003).

[Crossref]

C. Quan, X. Y. He, C. F. Wang, C. J. Tay, and H. M. Shang, “Shape measurement of small objects using LCD fringe projection with phase-shifting,” Opt. Commun. 189, 21-29 (2001).

[Crossref]

F. Chen, G. Brown, and M. Song, “Overview of three-dimensional shape measurement using optical methods,” Opt. Eng. 39, 10-22 (2000).

E. Stoykova, J. Harizanova, and V. Sainov, “Pattern projection with a sinusoidal phase grating,” EURASIP J. Adv. Signal Process. 2009, 351626 (2009).

E. Stoykova, J. Harizanova, and V. Sainov, “Pattern projection profilometry for 3D coordinates measurement of dynamic scenes,” in *Three Dimensional Television*, H. M. Ozaktas and L. Onural, eds. (Springer, 2008), pp. 85-164.

C. Quan, C. J. Tay, X. Kang, X. Y. He, and H. M. Shang, “Shape measurement by use of liquid-crystal display fringe projection with two-step phase shifting,” Appl. Opt. 42, 2329-2335(2003).

[Crossref]

C. Quan, X. Y. He, C. F. Wang, C. J. Tay, and H. M. Shang, “Shape measurement of small objects using LCD fringe projection with phase-shifting,” Opt. Commun. 189, 21-29 (2001).

[Crossref]

S. Teng, X. Chen, T. Zhou, and C. Cheng, “Quasi-Talbot effect of a grating in the deep Fresnel diffraction region,” J. Opt. Soc. Am. A 24, 1656-1665 (2007).

[Crossref]

S. Teng, L. Liu, J. Zu, Z. Luan, and D. Liu, “Uniform theory of the Talbot effect with partially coherent light illumination,” J. Opt. Soc. Am. A 20, 1747-1754 (2003).

[Crossref]

X. Su, W.-S. Zhou, G. von Bally, and D. Vukicevic, “Automated phase-measuring profilometry using defocused projection of a Ronchi grating,” Opt. Commun. 94, 561-573 (1992).

[Crossref]

X. Su, W.-S. Zhou, G. von Bally, and D. Vukicevic, “Automated phase-measuring profilometry using defocused projection of a Ronchi grating,” Opt. Commun. 94, 561-573 (1992).

[Crossref]

C. Quan, X. Y. He, C. F. Wang, C. J. Tay, and H. M. Shang, “Shape measurement of small objects using LCD fringe projection with phase-shifting,” Opt. Commun. 189, 21-29 (2001).

[Crossref]

S. Yoneyama, Y. Morimoto, M. Fujigaki, and Y. Ikeda, “Three-dimensional surface profile measurement of a moving object by a spatial-offset phase stepping method,” Opt. Eng. 42, 137-142 (2003).

P. S. Huang, C. Zhang, and F.-P. Chiang, “High-speed 3-D shape measurement based on digital fringe projection,” Opt. Eng. 42, 163-168 (2003).

X. Su, W.-S. Zhou, G. von Bally, and D. Vukicevic, “Automated phase-measuring profilometry using defocused projection of a Ronchi grating,” Opt. Commun. 94, 561-573 (1992).

[Crossref]

Y. Surrel, “Design of algorithms for phase measurements by the use of phase stepping,” Appl. Opt. 35, 51-60(1996).

[Crossref]

D. S. Mehta, S. K. Dubey, M. M. Hossain, and C. Shakher, “Simple multifrequency and phase-shifting fringe-projection system based on two-wavelength lateral shearing interferometry for three-dimensional profilometry,” Appl. Opt. 44, 7515-7521 (2005).

[Crossref]

C. Quan, C. J. Tay, X. Kang, X. Y. He, and H. M. Shang, “Shape measurement by use of liquid-crystal display fringe projection with two-step phase shifting,” Appl. Opt. 42, 2329-2335(2003).

[Crossref]

Y. Hao, Y. Zhao, and D. Li, “Multifrequency grating projection profilometry based on the nonlinear excess fraction method,” Appl. Opt. 38, 4106-4111 (1999).

[Crossref]

C. Tay, M. Thakur, and C. Quan, “Grating projection system for surface contour measurement,” Appl. Opt. 44, 1393-1400(2005).

[Crossref]

T. Xian and X. Su, “Area modulation grating for sinusoidal structure illumination on phase-measuring profilometry,” Appl. Opt. 40, 1201-1206 (2001).

[Crossref]

H. Guo, H. He, and M. Chen, “Gamma correction for digital fringe projection profilometry,” Appl. Opt. 43, 2906-2914(2004).

[Crossref]

K. A. Stetson and W. R. Brohinsky, “Electrooptic holography and its application to hologram interferometry,” Appl. Opt. 24, 3631-3637 (1985).

[Crossref]

Y. Hu, J. Xi, E. Li, J. Chicharo, and Z. Yang, “Three-dimensional profilometry based on shift estimation of projected fringe patterns,” Appl. Opt. 45, 678-687 (2006).

[Crossref]

B. F. Oreb and R. G. Dorsch, “Profilometry by phase-shifted Talbot images,” Appl. Opt. 33, 7955-7962 (1994).

[Crossref]

K. G. Harding and S. L. Cartwright, “Phase grating use in moire interferometry,” Appl. Opt. 23, 1517-1520 (1984).

[Crossref]

D. Joyeux and Y. Cohen-Sabban, “High magnification self-imaging,” Appl. Opt. 21, 625-627 (1982).

[Crossref]

L. Liu, “Talbot and Lau effects on incident beams of arbitrary wavefront, and their use,” Appl. Opt. 28, 4668-4678(1989).

[Crossref]

P. Chavel and T. C. Strand, “Range measurement using Talbot diffraction imaging of gratings,” Appl. Opt. 23, 862-871(1984).

[Crossref]

A. W. Lohmann and J. A. Thomas, “Making an array illuminator based on the Talbot effect,” Appl. Opt. 29, 4337-4340(1990).

[Crossref]

P. Latimer and R. F. Crouse, “Talbot effect reinterpreted,” Appl. Opt. 31, 80-89 (1992).

[Crossref]

M. Testorf and J. Jahns, “Planar-integrated Talbot array illuminators,” Appl. Opt. 37, 5399-5407 (1998).

[Crossref]

J.-C. Terrillon, “Image preprocessing for rotation-invariant pattern recognition in the presence of signal-dependent noise,” Appl. Opt. 35, 1879-1893 (1996).

[Crossref]

E. Stoykova, J. Harizanova, and V. Sainov, “Pattern projection with a sinusoidal phase grating,” EURASIP J. Adv. Signal Process. 2009, 351626 (2009).

K. Patorski and S. Kozak, “Self-imaging with nonparabolic approximation of spherical wave fronts,” J. Opt. Soc. Am. A 5, 1322-1327 (1988).

[Crossref]

S. Teng, X. Chen, T. Zhou, and C. Cheng, “Quasi-Talbot effect of a grating in the deep Fresnel diffraction region,” J. Opt. Soc. Am. A 24, 1656-1665 (2007).

[Crossref]

M. T. Flores-Arias, M. V. Perez, C. Gomez-Reino, C. Bao, and C. R. Fernandez-Pousa, “Talbot effect interpreted by number theory,” J. Opt. Soc. Am. A 18, 2707-2716 (2001).

[Crossref]

S. Teng, L. Liu, J. Zu, Z. Luan, and D. Liu, “Uniform theory of the Talbot effect with partially coherent light illumination,” J. Opt. Soc. Am. A 20, 1747-1754 (2003).

[Crossref]

K. G. Larkin and B. F. Oreb, “Design and assessment of symmetrical phase-shifting algorithms,” J. Opt. Soc. Am. A 9, 1740-1748 (1992).

[Crossref]

K. Hibino, B. Oreb, D. Farrant, and K. Larkin, “Phase-shifting algorithms for nonlinear and spatially nonuniform phase shifts,” J. Opt. Soc. Am. A 14, 918-930 (1997).

[Crossref]

G. Lai and T. Yatagai, “Generalized phase-shifting interferometry,” J. Opt. Soc. Am. A 8, 822-827 (1991).

[Crossref]

B. Dorrio and J. Fernandez, “Phase-evaluation methods in whole-field optical measurement techniques,” Meas. Sci. Technol. 10, R33-R55 (1999).

[Crossref]

T. Anna, S. K. Dubey, C. Shakher, A. Roy, and D. S. Mehta, “Sinusoidal fringe projection system based on compact and non-mechanical scanning low coherence Michelson interferometer for three-dimensional shape measurement,” Opt. Commun. 282, 1237-1242 (2009).

[Crossref]

C. Quan, X. Y. He, C. F. Wang, C. J. Tay, and H. M. Shang, “Shape measurement of small objects using LCD fringe projection with phase-shifting,” Opt. Commun. 189, 21-29 (2001).

[Crossref]

X. Su, W.-S. Zhou, G. von Bally, and D. Vukicevic, “Automated phase-measuring profilometry using defocused projection of a Ronchi grating,” Opt. Commun. 94, 561-573 (1992).

[Crossref]

S. K. Dubey, D. S. Mehta, A. Roy, and C. Shakher, “Wavelength scanning Talbot effect: Wavelength-scanning Talbot effect and its application for arbitrary threedimensional step-height measurement,” Opt. Commun. 279, 13-19(2007).

[Crossref]

P. S. Huang, C. Zhang, and F.-P. Chiang, “High-speed 3-D shape measurement based on digital fringe projection,” Opt. Eng. 42, 163-168 (2003).

S. Yoneyama, Y. Morimoto, M. Fujigaki, and Y. Ikeda, “Three-dimensional surface profile measurement of a moving object by a spatial-offset phase stepping method,” Opt. Eng. 42, 137-142 (2003).

F. Chen, G. Brown, and M. Song, “Overview of three-dimensional shape measurement using optical methods,” Opt. Eng. 39, 10-22 (2000).

A. Patil and P. Rastogi, “Approaches in generalized phase shifting interferometry,” Opt. Lasers Eng. 43, 475-490(2005).

X. Peng, J. Tian, P. Zhang, L. Wei, W. Qiu, E. Li, and D. Zhang, “Three-dimensional vision with dual acousto-optic deflection encoding,” Opt. Lett. 30, 1965-1967 (2005).

[Crossref]

R. Langoju, A. Patil, and P. Rastogi, “Phase-shifting interferometry in the presence of nonlinear phase steps, harmonics and noise,” Opt. Lett. 31, 1058-1060 (2006).

[Crossref]

J. Harizanova and A. Kolev, “Comparative study of fringe generation in two-spacing phase-shifting profilometry,” Proc. SPIE 6252, 625223 (2005).

K. Creath, “Phase-measurement interferometry techniques,” Prog. Opt. 26, 349-393 (1988).

[Crossref]

J. Schwider, “Advanced evaluation techniques in interferometry,” Prog. Opt. 28, 271-359 (1990).

[Crossref]

Y. Ishii, “Laser-diode interferometry,” Prog. Opt. 46, 243-309(2004).

D. Ghiglia and M. Pritt, *Two-Dimensional Phase Unwrapping: Theory, Algorithms and Software* (Wiley, 1998).

J. Goodman, *Introduction to Fourier Optics* (McGraw-Hill, 1996).

K. J. Gasvik, *Optical Metrology* (Wiley, 2002).

E. Stoykova, J. Harizanova, and V. Sainov, “Pattern projection profilometry for 3D coordinates measurement of dynamic scenes,” in *Three Dimensional Television*, H. M. Ozaktas and L. Onural, eds. (Springer, 2008), pp. 85-164.