Abstract

A simple method is proposed for the refractive index measurement of thick solid and liquid layers. In contrast to interferometric methods, no mirrors are used, and the experimental setup is undemanding and simple. The method is based on the variation of transmission caused by optical interference within the layer as a function of incidence angle. A new equation is derived for the positions of the interference extrema versus incidence angle. Scattering at the surfaces and within the sample, as well as weak absorption, do not play important roles. The method is illustrated by the refractive index measurements of sapphire, window glass, and water.

© 2009 Optical Society of America

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