Abstract

A goniofluorometer has been built that is capable of measuring in various viewing angles ranging from 10° to 90°. The incident angle can be varied from 0° to 8°. The goniofluorometer can measure bispectral luminescent radiance factors in the wavelength range of 250800nm. To our knowledge, there are no other reported results of similar devices capable of spectral measurements in various measurement geometries.

© 2008 Optical Society of America

Full Article  |  PDF Article

Corrections

Silja Holopainen, Farshid Manoocheri, and Erkki Ikonen, "Goniofluorometer for characterization of fluorescent materials: erratum," Appl. Opt. 47, 6880-6880 (2008)
https://www.osapublishing.org/ao/abstract.cfm?uri=ao-47-36-6880

References

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  1. ASTM International Standards on Color and Appearance, 7th ed. (ASTM, 2004).
  2. J. C. Zwinkels and F. Gauthier, “Instrumentation, standards, and procedures used at the National Research Council of Canada for high-accuracy fluorescence measurements,” Anal. Chim. Acta 380, 193-209 (1999).
    [CrossRef]
  3. C. Monte, W. Pilz, and U. Resch-Genger, “Linking fluorescence spectroscopy to the scale of spectral sensitivity--the BAM reference fluorometer,” Proc. SPIE 5880, 1-10 (2005).
  4. P. C. DeRose, E. A. Early, and G. W. Kramer, “Qualification of a fluorescence spectrometer for measuring true fluorescence spectra,” Rev. Sci. Instrum. 78, 033107 (2007).
    [CrossRef] [PubMed]
  5. S. Nevas, F. Manoocheri, and E. Ikonen, “Gonioreflectometer for measuring spectral diffuse reflectance,” Appl. Opt. 43, 6391-6399 (2004).
    [CrossRef] [PubMed]
  6. S. Holopainen, F. Manoocheri, S. Nevas, and E. Ikonen, “Effect of light scattering from source optics in goniometric diffuse reflectance measurements,” Metrologia 44, 167-170 (2007).
    [CrossRef]
  7. DTMc300 Monochromator, Bentham Instruments, Ltd., Berkshire, England.
  8. P. Ka¨rha¨, A. Lassila, H. Ludvigsen, F. Manoocheri, H. Fagerlund, and E. Ikonen, “Optical power and transmittance measurements and their use in detector-based realization of the luminous intensity scale,” Opt. Eng. 34, 2611-2618 (1995).
    [CrossRef]
  9. Monochromator MuLTImode4, Analytische Messtechnik AMKO GmbH, Tornesch, Germany.
  10. ANDOR iDus DV420A-OE, Andor Technology, Ltd., Belfast, Ireland.
  11. One-circle goniometer 420, Huber Diffraktionstechnik GmbH & Co. KG, Rimsting, Germany.
  12. Spectralon Fluorescence Standards, Labsphere, N.H., USA.
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    [CrossRef]
  14. P. Barritault, S. Gétin, P. Chaton, F. Vinet, and B. Fouqué, “Determination of surface-bound-fluorophore orientation by goniometric fluorescence polarization: application to quantification of DNA-chip readouts,” Appl. Opt. 41, 4732-4738(2002).
    [CrossRef] [PubMed]
  15. M. J. Shaw, P. J. Clarke, and T. A. Burnitt, “The design of the new NPL reference spectrofluorimeter,” Proc. SPIE 5192, 30-35 (2003).
    [CrossRef]

2007 (2)

P. C. DeRose, E. A. Early, and G. W. Kramer, “Qualification of a fluorescence spectrometer for measuring true fluorescence spectra,” Rev. Sci. Instrum. 78, 033107 (2007).
[CrossRef] [PubMed]

S. Holopainen, F. Manoocheri, S. Nevas, and E. Ikonen, “Effect of light scattering from source optics in goniometric diffuse reflectance measurements,” Metrologia 44, 167-170 (2007).
[CrossRef]

2005 (1)

C. Monte, W. Pilz, and U. Resch-Genger, “Linking fluorescence spectroscopy to the scale of spectral sensitivity--the BAM reference fluorometer,” Proc. SPIE 5880, 1-10 (2005).

2004 (1)

2003 (1)

M. J. Shaw, P. J. Clarke, and T. A. Burnitt, “The design of the new NPL reference spectrofluorimeter,” Proc. SPIE 5192, 30-35 (2003).
[CrossRef]

2002 (1)

1999 (1)

J. C. Zwinkels and F. Gauthier, “Instrumentation, standards, and procedures used at the National Research Council of Canada for high-accuracy fluorescence measurements,” Anal. Chim. Acta 380, 193-209 (1999).
[CrossRef]

1995 (2)

P. Ka¨rha¨, A. Lassila, H. Ludvigsen, F. Manoocheri, H. Fagerlund, and E. Ikonen, “Optical power and transmittance measurements and their use in detector-based realization of the luminous intensity scale,” Opt. Eng. 34, 2611-2618 (1995).
[CrossRef]

F. Manoocheri and E. Ikonen, “High-accuracy spectrometer for measurement of regular spectral transmittance,” Appl. Opt. 34, 3686-3692 (1995).
[CrossRef]

Barritault, P.

Burnitt, T. A.

M. J. Shaw, P. J. Clarke, and T. A. Burnitt, “The design of the new NPL reference spectrofluorimeter,” Proc. SPIE 5192, 30-35 (2003).
[CrossRef]

Chaton, P.

Clarke, P. J.

M. J. Shaw, P. J. Clarke, and T. A. Burnitt, “The design of the new NPL reference spectrofluorimeter,” Proc. SPIE 5192, 30-35 (2003).
[CrossRef]

DeRose, P. C.

P. C. DeRose, E. A. Early, and G. W. Kramer, “Qualification of a fluorescence spectrometer for measuring true fluorescence spectra,” Rev. Sci. Instrum. 78, 033107 (2007).
[CrossRef] [PubMed]

Early, E. A.

P. C. DeRose, E. A. Early, and G. W. Kramer, “Qualification of a fluorescence spectrometer for measuring true fluorescence spectra,” Rev. Sci. Instrum. 78, 033107 (2007).
[CrossRef] [PubMed]

Fagerlund, H.

P. Ka¨rha¨, A. Lassila, H. Ludvigsen, F. Manoocheri, H. Fagerlund, and E. Ikonen, “Optical power and transmittance measurements and their use in detector-based realization of the luminous intensity scale,” Opt. Eng. 34, 2611-2618 (1995).
[CrossRef]

Fouqué, B.

Gauthier, F.

J. C. Zwinkels and F. Gauthier, “Instrumentation, standards, and procedures used at the National Research Council of Canada for high-accuracy fluorescence measurements,” Anal. Chim. Acta 380, 193-209 (1999).
[CrossRef]

Gétin, S.

Holopainen, S.

S. Holopainen, F. Manoocheri, S. Nevas, and E. Ikonen, “Effect of light scattering from source optics in goniometric diffuse reflectance measurements,” Metrologia 44, 167-170 (2007).
[CrossRef]

Ikonen, E.

S. Holopainen, F. Manoocheri, S. Nevas, and E. Ikonen, “Effect of light scattering from source optics in goniometric diffuse reflectance measurements,” Metrologia 44, 167-170 (2007).
[CrossRef]

S. Nevas, F. Manoocheri, and E. Ikonen, “Gonioreflectometer for measuring spectral diffuse reflectance,” Appl. Opt. 43, 6391-6399 (2004).
[CrossRef] [PubMed]

F. Manoocheri and E. Ikonen, “High-accuracy spectrometer for measurement of regular spectral transmittance,” Appl. Opt. 34, 3686-3692 (1995).
[CrossRef]

P. Ka¨rha¨, A. Lassila, H. Ludvigsen, F. Manoocheri, H. Fagerlund, and E. Ikonen, “Optical power and transmittance measurements and their use in detector-based realization of the luminous intensity scale,” Opt. Eng. 34, 2611-2618 (1995).
[CrossRef]

Ka¨rha¨, P.

P. Ka¨rha¨, A. Lassila, H. Ludvigsen, F. Manoocheri, H. Fagerlund, and E. Ikonen, “Optical power and transmittance measurements and their use in detector-based realization of the luminous intensity scale,” Opt. Eng. 34, 2611-2618 (1995).
[CrossRef]

Kramer, G. W.

P. C. DeRose, E. A. Early, and G. W. Kramer, “Qualification of a fluorescence spectrometer for measuring true fluorescence spectra,” Rev. Sci. Instrum. 78, 033107 (2007).
[CrossRef] [PubMed]

Lassila, A.

P. Ka¨rha¨, A. Lassila, H. Ludvigsen, F. Manoocheri, H. Fagerlund, and E. Ikonen, “Optical power and transmittance measurements and their use in detector-based realization of the luminous intensity scale,” Opt. Eng. 34, 2611-2618 (1995).
[CrossRef]

Ludvigsen, H.

P. Ka¨rha¨, A. Lassila, H. Ludvigsen, F. Manoocheri, H. Fagerlund, and E. Ikonen, “Optical power and transmittance measurements and their use in detector-based realization of the luminous intensity scale,” Opt. Eng. 34, 2611-2618 (1995).
[CrossRef]

Manoocheri, F.

S. Holopainen, F. Manoocheri, S. Nevas, and E. Ikonen, “Effect of light scattering from source optics in goniometric diffuse reflectance measurements,” Metrologia 44, 167-170 (2007).
[CrossRef]

S. Nevas, F. Manoocheri, and E. Ikonen, “Gonioreflectometer for measuring spectral diffuse reflectance,” Appl. Opt. 43, 6391-6399 (2004).
[CrossRef] [PubMed]

P. Ka¨rha¨, A. Lassila, H. Ludvigsen, F. Manoocheri, H. Fagerlund, and E. Ikonen, “Optical power and transmittance measurements and their use in detector-based realization of the luminous intensity scale,” Opt. Eng. 34, 2611-2618 (1995).
[CrossRef]

F. Manoocheri and E. Ikonen, “High-accuracy spectrometer for measurement of regular spectral transmittance,” Appl. Opt. 34, 3686-3692 (1995).
[CrossRef]

Monte, C.

C. Monte, W. Pilz, and U. Resch-Genger, “Linking fluorescence spectroscopy to the scale of spectral sensitivity--the BAM reference fluorometer,” Proc. SPIE 5880, 1-10 (2005).

Nevas, S.

S. Holopainen, F. Manoocheri, S. Nevas, and E. Ikonen, “Effect of light scattering from source optics in goniometric diffuse reflectance measurements,” Metrologia 44, 167-170 (2007).
[CrossRef]

S. Nevas, F. Manoocheri, and E. Ikonen, “Gonioreflectometer for measuring spectral diffuse reflectance,” Appl. Opt. 43, 6391-6399 (2004).
[CrossRef] [PubMed]

Pilz, W.

C. Monte, W. Pilz, and U. Resch-Genger, “Linking fluorescence spectroscopy to the scale of spectral sensitivity--the BAM reference fluorometer,” Proc. SPIE 5880, 1-10 (2005).

Resch-Genger, U.

C. Monte, W. Pilz, and U. Resch-Genger, “Linking fluorescence spectroscopy to the scale of spectral sensitivity--the BAM reference fluorometer,” Proc. SPIE 5880, 1-10 (2005).

Shaw, M. J.

M. J. Shaw, P. J. Clarke, and T. A. Burnitt, “The design of the new NPL reference spectrofluorimeter,” Proc. SPIE 5192, 30-35 (2003).
[CrossRef]

Vinet, F.

Zwinkels, J. C.

J. C. Zwinkels and F. Gauthier, “Instrumentation, standards, and procedures used at the National Research Council of Canada for high-accuracy fluorescence measurements,” Anal. Chim. Acta 380, 193-209 (1999).
[CrossRef]

Anal. Chim. Acta (1)

J. C. Zwinkels and F. Gauthier, “Instrumentation, standards, and procedures used at the National Research Council of Canada for high-accuracy fluorescence measurements,” Anal. Chim. Acta 380, 193-209 (1999).
[CrossRef]

Appl. Opt. (3)

Metrologia (1)

S. Holopainen, F. Manoocheri, S. Nevas, and E. Ikonen, “Effect of light scattering from source optics in goniometric diffuse reflectance measurements,” Metrologia 44, 167-170 (2007).
[CrossRef]

Opt. Eng. (1)

P. Ka¨rha¨, A. Lassila, H. Ludvigsen, F. Manoocheri, H. Fagerlund, and E. Ikonen, “Optical power and transmittance measurements and their use in detector-based realization of the luminous intensity scale,” Opt. Eng. 34, 2611-2618 (1995).
[CrossRef]

Proc. SPIE (2)

C. Monte, W. Pilz, and U. Resch-Genger, “Linking fluorescence spectroscopy to the scale of spectral sensitivity--the BAM reference fluorometer,” Proc. SPIE 5880, 1-10 (2005).

M. J. Shaw, P. J. Clarke, and T. A. Burnitt, “The design of the new NPL reference spectrofluorimeter,” Proc. SPIE 5192, 30-35 (2003).
[CrossRef]

Rev. Sci. Instrum. (1)

P. C. DeRose, E. A. Early, and G. W. Kramer, “Qualification of a fluorescence spectrometer for measuring true fluorescence spectra,” Rev. Sci. Instrum. 78, 033107 (2007).
[CrossRef] [PubMed]

Other (6)

DTMc300 Monochromator, Bentham Instruments, Ltd., Berkshire, England.

Monochromator MuLTImode4, Analytische Messtechnik AMKO GmbH, Tornesch, Germany.

ANDOR iDus DV420A-OE, Andor Technology, Ltd., Belfast, Ireland.

One-circle goniometer 420, Huber Diffraktionstechnik GmbH & Co. KG, Rimsting, Germany.

Spectralon Fluorescence Standards, Labsphere, N.H., USA.

ASTM International Standards on Color and Appearance, 7th ed. (ASTM, 2004).

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Figures (6)

Fig. 1
Fig. 1

Schematic of the goniofluorometer setup: OSF, order-sorting filter; DMC, excitation monochromator; A, aperture; OPM, off-axis parabolic mirror; M, flat mirror; MD, monitor detector; BS, beam splitter; CCD, charge-coupled device; and EMC, emission monochromator.

Fig. 2
Fig. 2

Sample holder system.

Fig. 3
Fig. 3

Collection system responsivities at the center wavelength (both monochromators at the same wavelength) relative to the responsivity at 500 nm .

Fig. 4
Fig. 4

Responsivities relative to the center wavelength (both monochromators at the same wavelength) for p polarization as a function of the EMC wavelength. The symbols 350, 550, and 650 indicate the excitation monochromator wavelength in nanometers.

Fig. 5
Fig. 5

Measurement procedure.

Fig. 6
Fig. 6

Bispectral luminescent radiance factors for three excitation wavelengths measured in 0 ° / 10 ° geometry.

Tables (1)

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Table 1 Relative Standard Uncertainties in the Measurement of the Bispectral Luminescent Radiance Factor, β L μ ( λ ) , in Fig. 6

Equations (1)

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β L μ ( λ ) = L f μ ( λ ) / Δ λ L r ( μ ) / β r ( μ ) = L f μ ( λ ) β r ( μ ) L r ( μ ) Δ λ ,

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