Abstract

Photogrammetry is a science with many fields of application in civil engineering where image processing is used for different purposes. In most cases, the use of multiple images simultaneously for the reconstruction of 3D scenes is commonly used. However, the use of isolated images is becoming more and more frequent, for which it is necessary to calculate the orientation of the image with respect to the object space (exterior orientation), which is usually made through three rotations through known points in the object space (Euler angles). We describe the resolution of this problem by means of a single rotation through the vanishing line of the image space and completely external to the object, to be more precise, without any contact with it. The results obtained appear to be optimal, and the procedure is simple and of great utility, since no points over the object are required, which is very useful in situations where access is difficult.

© 2008 Optical Society of America

Full Article  |  PDF Article

References

  • View by:
  • |
  • |
  • |

  1. Elcovision, Product information on the internet at http://www.elcovison.com (accessed January 2008).
  2. Iwitnessphoto, Product information on the internet at http://www.iwitnessphoto.com (accessed January 2008).
  3. Photomedeler, Product information on the internet at http:// (accessed January 2008).
  4. U. Ethrog, “Non-metric camera calibration and photo orientation using parallel and perpendicular lines of the photographed objects,” Photogrammetria 39, 13-22 (1984).
    [CrossRef]
  5. D. C. Mulawa and E. M. Mikhail, “Photogrammetric treatment of linear features,” in International Archives of Photogrammetry and Remote Sensing (International Society for Photogrammetry and Remote Sensing, 1988), pp. 383-393.
  6. F. A. Van Den Heuvel, “3D reconstruction from a single image using geometric constraints,” ISPRS J. Photogramm. Remote Sens. 53, 354-368 (1998).
    [CrossRef]
  7. R. M. Haralick, “Determining camera parameters from the perspectiva projection of a rectangle,” Pattern Recogn. 22, 225-230 (1989).
    [CrossRef]
  8. P. Arias, C. Ordóñez, H. Lorenzo, and J. Herráez, “Documentation for the preservation of traditional agro-industrial buildings in N.W. Spain using simple close range photogrammetry,” Surv. Rev. 38, 525-540 (2006).
  9. A. M. G. Tommaselli and M. L. Lopes Reiss, “A photogrammetric method for single orientation and measurement,” Photogramm. Eng. Remote Sens. 71, 727-732 (2005).
  10. T. Ohdake and H. Chikatsu, “Evaluation of image based integrated measurement system and its application to topographic survey,” International Archives of Photogrammetry and Remote Sensing (International Society for Photogrammetry and Remote Sensing, 2006).
  11. P. R. Wolf, ed., Elements of Photogrammetry, with Air Photo Interpretation and Remote Sensing (McGraw-Hill, 1983).
  12. F. A. Van Den Heuvel, “Exterior orientation using coplanar parallel lines,” Proccedings of the 10th Scandinavian Conference on Image Analysis (Lappeenranta, 1997), pp. 71-78.
  13. A. Criminisi, I. Reid, and A. Zisserman, “Single view metrology,” in Proccedings of the 11th International Conference on Computer Vision (Kerkyra, 1999), pp. 434-441.
  14. F. Schaffalitzky and A. Zisserman, “Planar grouping for automatic detection of vanishing lines and points,” Image Vision Comput. 18, 647-658 (2000).
  15. W. Zhizhuo, “Principles of Photogrammetry (with remote sensing),” in Press of Wuhan Tecnical University of Surveying and Mapping (Publishing House of Surveying and Mapping, 1991).

2006 (1)

P. Arias, C. Ordóñez, H. Lorenzo, and J. Herráez, “Documentation for the preservation of traditional agro-industrial buildings in N.W. Spain using simple close range photogrammetry,” Surv. Rev. 38, 525-540 (2006).

2005 (1)

A. M. G. Tommaselli and M. L. Lopes Reiss, “A photogrammetric method for single orientation and measurement,” Photogramm. Eng. Remote Sens. 71, 727-732 (2005).

2000 (1)

F. Schaffalitzky and A. Zisserman, “Planar grouping for automatic detection of vanishing lines and points,” Image Vision Comput. 18, 647-658 (2000).

1998 (1)

F. A. Van Den Heuvel, “3D reconstruction from a single image using geometric constraints,” ISPRS J. Photogramm. Remote Sens. 53, 354-368 (1998).
[CrossRef]

1989 (1)

R. M. Haralick, “Determining camera parameters from the perspectiva projection of a rectangle,” Pattern Recogn. 22, 225-230 (1989).
[CrossRef]

1984 (1)

U. Ethrog, “Non-metric camera calibration and photo orientation using parallel and perpendicular lines of the photographed objects,” Photogrammetria 39, 13-22 (1984).
[CrossRef]

Arias, P.

P. Arias, C. Ordóñez, H. Lorenzo, and J. Herráez, “Documentation for the preservation of traditional agro-industrial buildings in N.W. Spain using simple close range photogrammetry,” Surv. Rev. 38, 525-540 (2006).

Chikatsu, H.

T. Ohdake and H. Chikatsu, “Evaluation of image based integrated measurement system and its application to topographic survey,” International Archives of Photogrammetry and Remote Sensing (International Society for Photogrammetry and Remote Sensing, 2006).

Criminisi, A.

A. Criminisi, I. Reid, and A. Zisserman, “Single view metrology,” in Proccedings of the 11th International Conference on Computer Vision (Kerkyra, 1999), pp. 434-441.

Ethrog, U.

U. Ethrog, “Non-metric camera calibration and photo orientation using parallel and perpendicular lines of the photographed objects,” Photogrammetria 39, 13-22 (1984).
[CrossRef]

Haralick, R. M.

R. M. Haralick, “Determining camera parameters from the perspectiva projection of a rectangle,” Pattern Recogn. 22, 225-230 (1989).
[CrossRef]

Herráez, J.

P. Arias, C. Ordóñez, H. Lorenzo, and J. Herráez, “Documentation for the preservation of traditional agro-industrial buildings in N.W. Spain using simple close range photogrammetry,” Surv. Rev. 38, 525-540 (2006).

Lorenzo, H.

P. Arias, C. Ordóñez, H. Lorenzo, and J. Herráez, “Documentation for the preservation of traditional agro-industrial buildings in N.W. Spain using simple close range photogrammetry,” Surv. Rev. 38, 525-540 (2006).

Mikhail, E. M.

D. C. Mulawa and E. M. Mikhail, “Photogrammetric treatment of linear features,” in International Archives of Photogrammetry and Remote Sensing (International Society for Photogrammetry and Remote Sensing, 1988), pp. 383-393.

Mulawa, D. C.

D. C. Mulawa and E. M. Mikhail, “Photogrammetric treatment of linear features,” in International Archives of Photogrammetry and Remote Sensing (International Society for Photogrammetry and Remote Sensing, 1988), pp. 383-393.

Ohdake, T.

T. Ohdake and H. Chikatsu, “Evaluation of image based integrated measurement system and its application to topographic survey,” International Archives of Photogrammetry and Remote Sensing (International Society for Photogrammetry and Remote Sensing, 2006).

Ordóñez, C.

P. Arias, C. Ordóñez, H. Lorenzo, and J. Herráez, “Documentation for the preservation of traditional agro-industrial buildings in N.W. Spain using simple close range photogrammetry,” Surv. Rev. 38, 525-540 (2006).

Reid, I.

A. Criminisi, I. Reid, and A. Zisserman, “Single view metrology,” in Proccedings of the 11th International Conference on Computer Vision (Kerkyra, 1999), pp. 434-441.

Reiss, M. L. Lopes

A. M. G. Tommaselli and M. L. Lopes Reiss, “A photogrammetric method for single orientation and measurement,” Photogramm. Eng. Remote Sens. 71, 727-732 (2005).

Schaffalitzky, F.

F. Schaffalitzky and A. Zisserman, “Planar grouping for automatic detection of vanishing lines and points,” Image Vision Comput. 18, 647-658 (2000).

Tommaselli, A. M. G.

A. M. G. Tommaselli and M. L. Lopes Reiss, “A photogrammetric method for single orientation and measurement,” Photogramm. Eng. Remote Sens. 71, 727-732 (2005).

Van Den Heuvel, F. A.

F. A. Van Den Heuvel, “3D reconstruction from a single image using geometric constraints,” ISPRS J. Photogramm. Remote Sens. 53, 354-368 (1998).
[CrossRef]

F. A. Van Den Heuvel, “Exterior orientation using coplanar parallel lines,” Proccedings of the 10th Scandinavian Conference on Image Analysis (Lappeenranta, 1997), pp. 71-78.

Zhizhuo, W.

W. Zhizhuo, “Principles of Photogrammetry (with remote sensing),” in Press of Wuhan Tecnical University of Surveying and Mapping (Publishing House of Surveying and Mapping, 1991).

Zisserman,

F. Schaffalitzky and A. Zisserman, “Planar grouping for automatic detection of vanishing lines and points,” Image Vision Comput. 18, 647-658 (2000).

Zisserman, A.

A. Criminisi, I. Reid, and A. Zisserman, “Single view metrology,” in Proccedings of the 11th International Conference on Computer Vision (Kerkyra, 1999), pp. 434-441.

Image Vision Comput. (1)

F. Schaffalitzky and A. Zisserman, “Planar grouping for automatic detection of vanishing lines and points,” Image Vision Comput. 18, 647-658 (2000).

ISPRS J. Photogramm. Remote Sens. (1)

F. A. Van Den Heuvel, “3D reconstruction from a single image using geometric constraints,” ISPRS J. Photogramm. Remote Sens. 53, 354-368 (1998).
[CrossRef]

Pattern Recogn. (1)

R. M. Haralick, “Determining camera parameters from the perspectiva projection of a rectangle,” Pattern Recogn. 22, 225-230 (1989).
[CrossRef]

Photogramm. Eng. Remote Sens. (1)

A. M. G. Tommaselli and M. L. Lopes Reiss, “A photogrammetric method for single orientation and measurement,” Photogramm. Eng. Remote Sens. 71, 727-732 (2005).

Photogrammetria (1)

U. Ethrog, “Non-metric camera calibration and photo orientation using parallel and perpendicular lines of the photographed objects,” Photogrammetria 39, 13-22 (1984).
[CrossRef]

Surv. Rev. (1)

P. Arias, C. Ordóñez, H. Lorenzo, and J. Herráez, “Documentation for the preservation of traditional agro-industrial buildings in N.W. Spain using simple close range photogrammetry,” Surv. Rev. 38, 525-540 (2006).

Other (9)

W. Zhizhuo, “Principles of Photogrammetry (with remote sensing),” in Press of Wuhan Tecnical University of Surveying and Mapping (Publishing House of Surveying and Mapping, 1991).

D. C. Mulawa and E. M. Mikhail, “Photogrammetric treatment of linear features,” in International Archives of Photogrammetry and Remote Sensing (International Society for Photogrammetry and Remote Sensing, 1988), pp. 383-393.

Elcovision, Product information on the internet at http://www.elcovison.com (accessed January 2008).

Iwitnessphoto, Product information on the internet at http://www.iwitnessphoto.com (accessed January 2008).

Photomedeler, Product information on the internet at http:// (accessed January 2008).

T. Ohdake and H. Chikatsu, “Evaluation of image based integrated measurement system and its application to topographic survey,” International Archives of Photogrammetry and Remote Sensing (International Society for Photogrammetry and Remote Sensing, 2006).

P. R. Wolf, ed., Elements of Photogrammetry, with Air Photo Interpretation and Remote Sensing (McGraw-Hill, 1983).

F. A. Van Den Heuvel, “Exterior orientation using coplanar parallel lines,” Proccedings of the 10th Scandinavian Conference on Image Analysis (Lappeenranta, 1997), pp. 71-78.

A. Criminisi, I. Reid, and A. Zisserman, “Single view metrology,” in Proccedings of the 11th International Conference on Computer Vision (Kerkyra, 1999), pp. 434-441.

Cited By

OSA participates in CrossRef's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (7)

Fig. 1
Fig. 1

Calculation of the vanishing line.

Fig. 2
Fig. 2

Image and object coordinate systems. Geometric determination of the vanishing line.

Fig. 3
Fig. 3

Image orientation: (a) change of coordinate system in the image space, rotation ψ and (b) image spatial orientation, rotation ξ.

Fig. 4
Fig. 4

Photographic shot at a distance of approximately 3 m with a slope of approximately 4 0 g over a rectangular panel of known dimensions.

Fig. 5
Fig. 5

Cumulative frequency of absolute error in panel measurement.

Fig. 6
Fig. 6

Photographic shots at a distance of approximately 7 m from different slopes over a rectangular panel of known dimensions.

Fig. 7
Fig. 7

Optimal interval of inclination of the shots in a theoretical horizontal plane with respect to the perpendicular from the object (α decreases with distance).

Tables (2)

Tables Icon

Table 1 Comparison of the Dimensions of a Calibrated Panel with the Proposal Method for Different Definitions of the Vanishing Line in the Same Image (in Meters)

Tables Icon

Table 2 Comparison of the Dimensions of a Calibrated Panel with the Proposed Method for Different Definitions of the Vanishing Line from Different Inclination Angles (α) (in Meters)

Equations (7)

Equations on this page are rendered with MathJax. Learn more.

( X Y Z ) = ( cos ϕ cos χ cos ω sin χ + sin ω sin ϕ cos χ sin ω sin χ cos ω sin ϕ cos χ cos ϕ sin χ cos ω cos χ sin ω sin ϕ sin χ sin ω cos χ + cos ω sin ϕ sin χ sin ϕ sin ω cos ϕ cos ω cos ϕ ) ( x y c ) ,
( y y a ) = ( x x a ) ( y b y a ) ( x b x a ) ,
δ = ( x x 1 ) ( x 2 x 1 ) = ( y y 1 ) ( y 2 y 1 ) ,
ψ = arctan ( x a x b ) ( y a y b ) .
ξ = arctan c d ,
d = | y a x b y b x a | ( x b x a ) 2 + ( y b y a ) 2 .
( X Y Z ) = λ ( R ξ ) ( x y c ) = λ ( R ξ ) ( R ψ ) ( x y c ) ,

Metrics