S. Zhang and T. Bosch, “Orthogonally polarized lasers and their applications,” Opt. Photon. News 18, 38-43 (2007).

[Crossref]

X. Zong, W. Liu, and S. Zhang, “Measurement of retardations of arbitrary wave plates by laser frequency splitting,” Opt. Eng. 45, 033602 (2006).

[Crossref]

S. Zhang and T. Xu, “Orthogonally linear polarized lasers (I)--principle and devices,” Prog. Nat. Sci. 15, 586-595 (2005).

[Crossref]

S. Zhang and G. Liu, “Orthogonal linear polarized lasers (II)--study on the physical phenomena,” Prog. Nat. Sci. 15, 865-876 (2005).

[Crossref]

S. Zhang, W. Du, and G. Liu, “Orthogonal linear polarized lasers (III)--applications in self-sensing,” Prog. Nat. Sci. 15, 961-971 (2005).

[Crossref]

Y. Zhang, S. Zhang, Y. Han, Y. Li, and X. Xu, “Method for the measurement of retardation of wave plates based on laser frequency-splitting technology,” Opt. Eng. 40, 1071-1075 (2001).

[Crossref]

W. Holzapfel, S. Neuschaefer-Rube, and M. Kobusch, “High-resolution, very broadband force measurements by solid-state laser transducers,” Measurement 28, 277-291(2000).

[Crossref]

S. Zhang, H. Guo, K. Li, and Y. Han, “Laser longitudinal mode splitting phenomenon and its applications in laser physics and active metrology sensors,” Opt. Lasers Eng. 23, 1-28 (1995).

[Crossref]

H. Aben and C. Guillemet, *Photoelasiticity of Glass* (Springer-Verlag, 1993).

S. Zhang and T. Bosch, “Orthogonally polarized lasers and their applications,” Opt. Photon. News 18, 38-43 (2007).

[Crossref]

S. Zhang, W. Du, and G. Liu, “Orthogonal linear polarized lasers (III)--applications in self-sensing,” Prog. Nat. Sci. 15, 961-971 (2005).

[Crossref]

H. Aben and C. Guillemet, *Photoelasiticity of Glass* (Springer-Verlag, 1993).

S. Zhang, H. Guo, K. Li, and Y. Han, “Laser longitudinal mode splitting phenomenon and its applications in laser physics and active metrology sensors,” Opt. Lasers Eng. 23, 1-28 (1995).

[Crossref]

Y. Zhang, S. Zhang, Y. Han, Y. Li, and X. Xu, “Method for the measurement of retardation of wave plates based on laser frequency-splitting technology,” Opt. Eng. 40, 1071-1075 (2001).

[Crossref]

S. Zhang, H. Guo, K. Li, and Y. Han, “Laser longitudinal mode splitting phenomenon and its applications in laser physics and active metrology sensors,” Opt. Lasers Eng. 23, 1-28 (1995).

[Crossref]

W. Holzapfel, S. Neuschaefer-Rube, and M. Kobusch, “High-resolution, very broadband force measurements by solid-state laser transducers,” Measurement 28, 277-291(2000).

[Crossref]

W. Holzapfel and M. Finnemann, “High-resolution force sensing by diode-pumped Nd:YAG laser,” Opt. Lett. 18, 2062-2064 (1993).

W. Holzapfel and U. Riss, “Computer-based high resolution transmission ellipsometry,” Appl. Opt. 26, 145-153 (1987).

W. Holzapfel, L. Hou, and S. Neuschaefer-Rube, “Error effects in microlaser sensors,” *Proceedings of XVI IMEKO World Congress*, Vol. 3, Vienna, Austria (Australian Society for Measurement and Automation, 2000), pp. 85-90.

W. Holzapfel, L. Hou, and S. Neuschaefer-Rube, “Error effects in microlaser sensors,” *Proceedings of XVI IMEKO World Congress*, Vol. 3, Vienna, Austria (Australian Society for Measurement and Automation, 2000), pp. 85-90.

A. Kuske and G. Robertson, *Photoelastic Stress Analysis* (Wiley, 1974), pp. 88 and 108-110.

S. Zhang, H. Guo, K. Li, and Y. Han, “Laser longitudinal mode splitting phenomenon and its applications in laser physics and active metrology sensors,” Opt. Lasers Eng. 23, 1-28 (1995).

[Crossref]

Y. Zhang, S. Zhang, Y. Han, Y. Li, and X. Xu, “Method for the measurement of retardation of wave plates based on laser frequency-splitting technology,” Opt. Eng. 40, 1071-1075 (2001).

[Crossref]

S. Zhang, W. Du, and G. Liu, “Orthogonal linear polarized lasers (III)--applications in self-sensing,” Prog. Nat. Sci. 15, 961-971 (2005).

[Crossref]

S. Zhang and G. Liu, “Orthogonal linear polarized lasers (II)--study on the physical phenomena,” Prog. Nat. Sci. 15, 865-876 (2005).

[Crossref]

X. Zong, W. Liu, and S. Zhang, “Measurement of retardations of arbitrary wave plates by laser frequency splitting,” Opt. Eng. 45, 033602 (2006).

[Crossref]

J. Lu, *Handbook of Measurement of Residual Stresses* (Fairmont, 1996), pp. 225-231.

T. S. Narasimhamurty, *Photoelastic and Electro-Optic Properties of Crystals* (Plenum, 1981).

W. Holzapfel, S. Neuschaefer-Rube, and M. Kobusch, “High-resolution, very broadband force measurements by solid-state laser transducers,” Measurement 28, 277-291(2000).

[Crossref]

W. Holzapfel, L. Hou, and S. Neuschaefer-Rube, “Error effects in microlaser sensors,” *Proceedings of XVI IMEKO World Congress*, Vol. 3, Vienna, Austria (Australian Society for Measurement and Automation, 2000), pp. 85-90.

A. Kuske and G. Robertson, *Photoelastic Stress Analysis* (Wiley, 1974), pp. 88 and 108-110.

S. Zhang and T. Xu, “Orthogonally linear polarized lasers (I)--principle and devices,” Prog. Nat. Sci. 15, 586-595 (2005).

[Crossref]

Y. Zhang, S. Zhang, Y. Han, Y. Li, and X. Xu, “Method for the measurement of retardation of wave plates based on laser frequency-splitting technology,” Opt. Eng. 40, 1071-1075 (2001).

[Crossref]

S. Zhang and T. Bosch, “Orthogonally polarized lasers and their applications,” Opt. Photon. News 18, 38-43 (2007).

[Crossref]

X. Zong, W. Liu, and S. Zhang, “Measurement of retardations of arbitrary wave plates by laser frequency splitting,” Opt. Eng. 45, 033602 (2006).

[Crossref]

S. Zhang and G. Liu, “Orthogonal linear polarized lasers (II)--study on the physical phenomena,” Prog. Nat. Sci. 15, 865-876 (2005).

[Crossref]

S. Zhang, W. Du, and G. Liu, “Orthogonal linear polarized lasers (III)--applications in self-sensing,” Prog. Nat. Sci. 15, 961-971 (2005).

[Crossref]

S. Zhang and T. Xu, “Orthogonally linear polarized lasers (I)--principle and devices,” Prog. Nat. Sci. 15, 586-595 (2005).

[Crossref]

Y. Zhang, S. Zhang, Y. Han, Y. Li, and X. Xu, “Method for the measurement of retardation of wave plates based on laser frequency-splitting technology,” Opt. Eng. 40, 1071-1075 (2001).

[Crossref]

S. Zhang, H. Guo, K. Li, and Y. Han, “Laser longitudinal mode splitting phenomenon and its applications in laser physics and active metrology sensors,” Opt. Lasers Eng. 23, 1-28 (1995).

[Crossref]

S. Zhang, *Orthogonally Polarized Laser Principles* (Tsinghua University, 2005).

Y. Zhang, S. Zhang, Y. Han, Y. Li, and X. Xu, “Method for the measurement of retardation of wave plates based on laser frequency-splitting technology,” Opt. Eng. 40, 1071-1075 (2001).

[Crossref]

X. Zong, W. Liu, and S. Zhang, “Measurement of retardations of arbitrary wave plates by laser frequency splitting,” Opt. Eng. 45, 033602 (2006).

[Crossref]

W. Holzapfel, S. Neuschaefer-Rube, and M. Kobusch, “High-resolution, very broadband force measurements by solid-state laser transducers,” Measurement 28, 277-291(2000).

[Crossref]

Y. Zhang, S. Zhang, Y. Han, Y. Li, and X. Xu, “Method for the measurement of retardation of wave plates based on laser frequency-splitting technology,” Opt. Eng. 40, 1071-1075 (2001).

[Crossref]

X. Zong, W. Liu, and S. Zhang, “Measurement of retardations of arbitrary wave plates by laser frequency splitting,” Opt. Eng. 45, 033602 (2006).

[Crossref]

S. Zhang, H. Guo, K. Li, and Y. Han, “Laser longitudinal mode splitting phenomenon and its applications in laser physics and active metrology sensors,” Opt. Lasers Eng. 23, 1-28 (1995).

[Crossref]

S. Zhang and T. Bosch, “Orthogonally polarized lasers and their applications,” Opt. Photon. News 18, 38-43 (2007).

[Crossref]

S. Zhang and T. Xu, “Orthogonally linear polarized lasers (I)--principle and devices,” Prog. Nat. Sci. 15, 586-595 (2005).

[Crossref]

S. Zhang and G. Liu, “Orthogonal linear polarized lasers (II)--study on the physical phenomena,” Prog. Nat. Sci. 15, 865-876 (2005).

[Crossref]

S. Zhang, W. Du, and G. Liu, “Orthogonal linear polarized lasers (III)--applications in self-sensing,” Prog. Nat. Sci. 15, 961-971 (2005).

[Crossref]

S. Zhang, *Orthogonally Polarized Laser Principles* (Tsinghua University, 2005).

T. S. Narasimhamurty, *Photoelastic and Electro-Optic Properties of Crystals* (Plenum, 1981).

A. Kuske and G. Robertson, *Photoelastic Stress Analysis* (Wiley, 1974), pp. 88 and 108-110.

H. Aben and C. Guillemet, *Photoelasiticity of Glass* (Springer-Verlag, 1993).

J. Lu, *Handbook of Measurement of Residual Stresses* (Fairmont, 1996), pp. 225-231.

W. Holzapfel, L. Hou, and S. Neuschaefer-Rube, “Error effects in microlaser sensors,” *Proceedings of XVI IMEKO World Congress*, Vol. 3, Vienna, Austria (Australian Society for Measurement and Automation, 2000), pp. 85-90.