Abstract

A test was made of the ability of Kramers–Kronig-constrained variational dielectric fitting to extract the optical conductivity of a thin film from reflectance data containing structure due to both thin film and substrate. The reflectance of a series of well-characterized thin films of SrRuxMg1xO3 and SrRuxO3 with a variety of thicknesses (56300nm) and dc resistivities (2502200μΩcm) was measured. The low frequency values of the extracted optical conductivities agree with the dc measurements, however, removal of features due to the substrate improves with increasing film thickness.

© 2008 Optical Society of America

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