Abstract

A method for 3D mapping of scattering particle concentration in a gaseous medium based on the backscattered light in a single direction has been demonstrated. The technique is originally developed for microscopy but now implemented on larger-scale samples. The technique used is known as structured illumination, where a sinusoidal grid pattern is projected onto the medium, thus marking the in-focus plane. This makes it possible to discriminate against light originating from the out-of-focus parts of the sample, which usually makes it difficult to detect inner structures of the medium. In this study a flow of nitrogen was introduced into a flow of water droplets, with the aim to optically select only the plane where nitrogen was present. The results indicate that the technique could be used to study, e.g., combustion devices with limited optical access.

© 2008 Optical Society of America

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