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Continuous wave terahertz spectrometer as a noncontact thickness measuring device

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Abstract

We present a low cost terahertz (THz) spectrometer with coherent detection based on two simple and robust dipole antennas driven by two laser diodes. The spectrometer covers frequencies up to 1THz, with a peak signal-to-noise ratio exceeding 40dB for a lock-in integration time of 30ms. We demonstrate that the thickness profile of a sample can be reconstructed from an acquired THz image.

© 2008 Optical Society of America

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