Abstract

Periodic high-/low-index film stacks composed of Y2O3:Eu were grown by glancing angle deposition on silicon and fused silica substrates. Postdeposition annealing at temperatures from 600 to 1000°C for 1   h in air was performed to activate photoluminescence. Absolute photoluminescence spectra were obtained as a function of observation angle. The angular emission distribution was non-Lambertian, with peak emission at angles of 50° to 60° with respect to substrate normal. Spectroscopic transmittance and ellipsometry measurements were performed to characterize the films. Using this description, we were able to reproduce the angular photoluminescence patterns of the films.

© 2008 Optical Society of America

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