Abstract

The 2007 Measurement Problem comprised measurements of the transmission and reflectance spectra and the determination of optical constants for a single oxide layer on fused silica. The angle of incidence was 45°.

© 2008 Optical Society of America

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References

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  1. A. Duparré and D. Ristau, "2004 OIC Measurement Problem," in OIC Proceedings 2004 (Optical Society of America, 2004), paper WD 1.
  2. ISO 13696:2002, "Optics and optical instruments: test methods for radiation scattered by optical components" (International Organization for Standardization, 2002).

2004 (1)

A. Duparré and D. Ristau, "2004 OIC Measurement Problem," in OIC Proceedings 2004 (Optical Society of America, 2004), paper WD 1.

2002 (1)

ISO 13696:2002, "Optics and optical instruments: test methods for radiation scattered by optical components" (International Organization for Standardization, 2002).

Duparré, A.

A. Duparré and D. Ristau, "2004 OIC Measurement Problem," in OIC Proceedings 2004 (Optical Society of America, 2004), paper WD 1.

Ristau, D.

A. Duparré and D. Ristau, "2004 OIC Measurement Problem," in OIC Proceedings 2004 (Optical Society of America, 2004), paper WD 1.

Other (2)

A. Duparré and D. Ristau, "2004 OIC Measurement Problem," in OIC Proceedings 2004 (Optical Society of America, 2004), paper WD 1.

ISO 13696:2002, "Optics and optical instruments: test methods for radiation scattered by optical components" (International Organization for Standardization, 2002).

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Figures (19)

Fig. 1
Fig. 1

(Color online) Schematic of sample and measurement logistics.

Fig. 2
Fig. 2

(Color online) Locations of participating laboratories.

Fig. 3
Fig. 3

(Color online) Sample comparability check: R spectra (AOI of 6°) after deposition and after return of the samples.

Fig. 4
Fig. 4

(Color online) Same as Fig. 3 but a zoom version.

Fig. 5
Fig. 5

(Color online) Sample comparability check: R spectra (AOI of 45°) after deposition.

Fig. 6
Fig. 6

(Color online) Same as Fig. 5 but a zoom version.

Fig. 7
Fig. 7

T spectra (AOI of 45°) submitted by the participants (without sample #4).

Fig. 8
Fig. 8

(Color online) T deviations calculated from the data in Fig. 7 with respect to average T results of the participating laboratoriess at selected wavelengths.

Fig. 9
Fig. 9

R spectra (AOI of 45°) submitted by the participants (without sample #4).

Fig. 10
Fig. 10

Zoom version for the curves of Fig. 9.

Fig. 11
Fig. 11

(Color online) R deviations calculated from the data in Fig. 9 with respect to the average R results of the participating laboratories at selected wavelengths.

Fig. 12
Fig. 12

(Color online) Layer thicknesses determined by the participants; average of 204.8 n m .

Fig. 13
Fig. 13

n spectra determined by the participants: full wavelength range and zoom version.

Fig. 14
Fig. 14

k spectra determined by the participants.

Fig. 15
Fig. 15

(Color online) n deviations with respect to average n results of the participating laboratories.

Fig. 16
Fig. 16

(Color online) k deviations with respect to average n results of the participating laboratories.

Fig. 17
Fig. 17

(Color online) k values, average k, and range of theoretical detection limits.

Fig. 18
Fig. 18

(Color online) Averaged n and k spectra and data for selected wavelengths.

Fig. 19
Fig. 19

(Color online) Additional submissions: total backscattering measurements performed at ENEA: wavelength dependent; Fraunhofer IOF: mapping at 532 n m (average TS: 29 ppm); Laser Zentrum Hannover: line scan at 632.8 n m (average TS, 89 ppm).

Tables (1)

Tables Icon

Table 1 Participating Laboratories

Metrics