Abstract

Through numerical simulations, we point out that introduction of an ellipsometric measurement technique to an absorption-based surface-plasmon resonance (SPR) sensor enhances precision and sensitivity in measuring the imaginary part k of the complex refractive index of the sample. By measuring a pair of ellipsometric ΔΨ parameters, instead of the conventional energy reflectance Rp of p-polarized light in the Kretschmann optical arrangement, we can detect a small change of k that is proportional to that of the concentration of the sample, especially when k1. While one has difficulty in determining the value of k uniquely by the standard technique, when the thickness of Au under the prism is thin (2030  nm), the ellipsometric technique (ET) overcomes the problem. Furthermore, the value of k and the thickness d s of the absorptive sample that is adsorbed on Au can be determined precisely. The ET based on the common-path polarization interferometer is robust against external disturbance such as mechanical vibration and intensity fluctuation of a light source. Although only the p-polarized light is responsible for the SPR phenomenon, we show that the introduction of the ET is significant for quantitative analysis.

© 2007 Optical Society of America

Full Article  |  PDF Article

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Figures (9)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Tables (1)

You do not have subscription access to this journal. Article tables are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Equations (321)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Metrics

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription