H. Guo, M. Chen, and H. He, "A frequency encoding method for fringe projection profilometry," in Third International Conference on Experimental Mechanics and Third Conference of the Asian Committee on Experimental Mechanics, C. Quan, F. S. Chau, A. Asundi, B. S. Wong, and C. T. Lim, eds., Proc. SPIE 5852, 908-913 (2005).

[CrossRef]

H. Guo and M. Chen, "Least-squares algorithm for phase-stepping interferometry with an unknown relative step," Appl. Opt. 44, 4854-4859 (2005).

[CrossRef]
[PubMed]

Y. Arai, S. Yokozeki, K. Shiraki, and T. Yamada, "High precision two-dimensional spatial fringe analysis method," J. Mod. Opt. 44, 739-751 (1997).

[CrossRef]

M. Servin and F. J. Cuevas, "A novel technique for spatial phase-shifting interferometry," J. Mod. Opt. 42, 1853-1862 (1995).

[CrossRef]

M. Pirga and M. Kujawinska, "Two directional spatial-carrier phase-shifting method for analysis of crossed and closed fringe patterns," Opt. Eng. 34, 2459-2466 (1995).

[CrossRef]

J.-F. Lin and X.-Y. Su, "Two-dimensional Fourier transform profilometry for the automatic measurement of three-dimensional object shapes," Opt. Eng. 34, 3297-3302 (1995).

[CrossRef]

P. H. Chan and P. J. Bryanston-Cross, "Spatial phase stepping method of fringe-pattern analysis," Opt. Lasers Eng. 23, 343-354 (1995).

[CrossRef]

R. Józwicki, M. Kujawinska, and L. Salbut, "New contra old wavefront measurement concepts for interferometric optical testing," Opt. Eng. 31, 422-433 (1992).

[CrossRef]

M. Kujawinska and J. Wójciak, "Spatial-carrier phase-shifting technique of fringe pattern analysis," in Industrial Applications of Holographic and Speckle Measuring Techniques, W. P. Jueptner, ed., Proc. SPIE 1508, 61-67 (1991).

D. C. Williams, N. S. Nassar, J. E. Banyard, and M. S. Virdee, "Digital phase-step interferometry: a simplified approach," Opt. Laser Technol. 23, 147-150 (1991).

[CrossRef]

S. Toyooka and Y. Iwaasa, "Automatic profilometry of 3D diffuse by spatial phase detection," Appl. Opt. 25, 1630-1633 (1986).

[CrossRef]
[PubMed]

D. J. Bone, H.-A. Bachor, and R. J. Sandeman, "Fringe-pattern analysis using a 2D Fourier transform," Appl. Opt. 25, 1653-1660 (1986).

[CrossRef]
[PubMed]

P. L. Ransom and J. V. Kokal, "Interferogram analysis by a modified sinusoid fitting technique," Appl. Opt. 25, 4199-4204 (1986).

[CrossRef]
[PubMed]

J. E. Greivenkamp, "Generalized data reduction for heterodyne interferometry," Opt. Eng. 23, 350-352 (1984).

K. H. Womack, "Interferometric phase measurement using spatial synchronous detection," Opt. Eng. 23, 391-395 (1984).

R. J. Marks II, "Gerchberg's extrapolation algorithm in two dimensions," Appl. Opt. 20, 1816-1820 (1981).

Y. Arai, S. Yokozeki, K. Shiraki, and T. Yamada, "High precision two-dimensional spatial fringe analysis method," J. Mod. Opt. 44, 739-751 (1997).

[CrossRef]

D. C. Williams, N. S. Nassar, J. E. Banyard, and M. S. Virdee, "Digital phase-step interferometry: a simplified approach," Opt. Laser Technol. 23, 147-150 (1991).

[CrossRef]

P. H. Chan and P. J. Bryanston-Cross, "Spatial phase stepping method of fringe-pattern analysis," Opt. Lasers Eng. 23, 343-354 (1995).

[CrossRef]

P. H. Chan and P. J. Bryanston-Cross, "Spatial phase stepping method of fringe-pattern analysis," Opt. Lasers Eng. 23, 343-354 (1995).

[CrossRef]

H. Guo, M. Chen, and H. He, "A frequency encoding method for fringe projection profilometry," in Third International Conference on Experimental Mechanics and Third Conference of the Asian Committee on Experimental Mechanics, C. Quan, F. S. Chau, A. Asundi, B. S. Wong, and C. T. Lim, eds., Proc. SPIE 5852, 908-913 (2005).

[CrossRef]

H. Guo and M. Chen, "Least-squares algorithm for phase-stepping interferometry with an unknown relative step," Appl. Opt. 44, 4854-4859 (2005).

[CrossRef]
[PubMed]

M. Servin and F. J. Cuevas, "A novel technique for spatial phase-shifting interferometry," J. Mod. Opt. 42, 1853-1862 (1995).

[CrossRef]

J. E. Greivenkamp, "Generalized data reduction for heterodyne interferometry," Opt. Eng. 23, 350-352 (1984).

H. Guo and M. Chen, "Least-squares algorithm for phase-stepping interferometry with an unknown relative step," Appl. Opt. 44, 4854-4859 (2005).

[CrossRef]
[PubMed]

H. Guo, M. Chen, and H. He, "A frequency encoding method for fringe projection profilometry," in Third International Conference on Experimental Mechanics and Third Conference of the Asian Committee on Experimental Mechanics, C. Quan, F. S. Chau, A. Asundi, B. S. Wong, and C. T. Lim, eds., Proc. SPIE 5852, 908-913 (2005).

[CrossRef]

H. Guo, M. Chen, and H. He, "A frequency encoding method for fringe projection profilometry," in Third International Conference on Experimental Mechanics and Third Conference of the Asian Committee on Experimental Mechanics, C. Quan, F. S. Chau, A. Asundi, B. S. Wong, and C. T. Lim, eds., Proc. SPIE 5852, 908-913 (2005).

[CrossRef]

R. Józwicki, M. Kujawinska, and L. Salbut, "New contra old wavefront measurement concepts for interferometric optical testing," Opt. Eng. 31, 422-433 (1992).

[CrossRef]

Q. Kemao, "Two-dimensional windowed Fourier transform for fringe pattern analysis: principles, applications, and implementations," Opt. Lasers Eng. 45, 304-317 (2007).

M. Pirga and M. Kujawinska, "Two directional spatial-carrier phase-shifting method for analysis of crossed and closed fringe patterns," Opt. Eng. 34, 2459-2466 (1995).

[CrossRef]

R. Józwicki, M. Kujawinska, and L. Salbut, "New contra old wavefront measurement concepts for interferometric optical testing," Opt. Eng. 31, 422-433 (1992).

[CrossRef]

M. Kujawinska and J. Wójciak, "Spatial-carrier phase-shifting technique of fringe pattern analysis," in Industrial Applications of Holographic and Speckle Measuring Techniques, W. P. Jueptner, ed., Proc. SPIE 1508, 61-67 (1991).

J.-F. Lin and X.-Y. Su, "Two-dimensional Fourier transform profilometry for the automatic measurement of three-dimensional object shapes," Opt. Eng. 34, 3297-3302 (1995).

[CrossRef]

R. J. Marks II, "Gerchberg's extrapolation algorithm in two dimensions," Appl. Opt. 20, 1816-1820 (1981).

D. C. Williams, N. S. Nassar, J. E. Banyard, and M. S. Virdee, "Digital phase-step interferometry: a simplified approach," Opt. Laser Technol. 23, 147-150 (1991).

[CrossRef]

M. Pirga and M. Kujawinska, "Two directional spatial-carrier phase-shifting method for analysis of crossed and closed fringe patterns," Opt. Eng. 34, 2459-2466 (1995).

[CrossRef]

R. Józwicki, M. Kujawinska, and L. Salbut, "New contra old wavefront measurement concepts for interferometric optical testing," Opt. Eng. 31, 422-433 (1992).

[CrossRef]

M. Servin and F. J. Cuevas, "A novel technique for spatial phase-shifting interferometry," J. Mod. Opt. 42, 1853-1862 (1995).

[CrossRef]

Y. Arai, S. Yokozeki, K. Shiraki, and T. Yamada, "High precision two-dimensional spatial fringe analysis method," J. Mod. Opt. 44, 739-751 (1997).

[CrossRef]

J.-F. Lin and X.-Y. Su, "Two-dimensional Fourier transform profilometry for the automatic measurement of three-dimensional object shapes," Opt. Eng. 34, 3297-3302 (1995).

[CrossRef]

D. C. Williams, N. S. Nassar, J. E. Banyard, and M. S. Virdee, "Digital phase-step interferometry: a simplified approach," Opt. Laser Technol. 23, 147-150 (1991).

[CrossRef]

D. C. Williams, N. S. Nassar, J. E. Banyard, and M. S. Virdee, "Digital phase-step interferometry: a simplified approach," Opt. Laser Technol. 23, 147-150 (1991).

[CrossRef]

M. Kujawinska and J. Wójciak, "Spatial-carrier phase-shifting technique of fringe pattern analysis," in Industrial Applications of Holographic and Speckle Measuring Techniques, W. P. Jueptner, ed., Proc. SPIE 1508, 61-67 (1991).

K. H. Womack, "Interferometric phase measurement using spatial synchronous detection," Opt. Eng. 23, 391-395 (1984).

Y. Arai, S. Yokozeki, K. Shiraki, and T. Yamada, "High precision two-dimensional spatial fringe analysis method," J. Mod. Opt. 44, 739-751 (1997).

[CrossRef]

Y. Arai, S. Yokozeki, K. Shiraki, and T. Yamada, "High precision two-dimensional spatial fringe analysis method," J. Mod. Opt. 44, 739-751 (1997).

[CrossRef]

K. A. Nugent, "Interferogram analysis using an accurate fully automatic algorithm," Appl. Opt. 24, 3101-3105 (1985).

[CrossRef]
[PubMed]

D. J. Bone, H.-A. Bachor, and R. J. Sandeman, "Fringe-pattern analysis using a 2D Fourier transform," Appl. Opt. 25, 1653-1660 (1986).

[CrossRef]
[PubMed]

C. Roddier and F. Roddier, "Interferogram analysis using Fourier transform techniques," Appl. Opt. 26, 1668-1673 (1987).

[CrossRef]
[PubMed]

J. H. Massig and J. Heppner, "Fringe-pattern analysis with high accuracy by use of the Fourier-transform method: theory and experimental tests," Appl. Opt. 40, 2081-2088 (2001).

[CrossRef]

M. Takeda and K. Mutoh, "Fourier transform profilometry for the automatic measurement of 3-D object shapes," Appl. Opt. 22, 3977-3982 (1983).

[CrossRef]
[PubMed]

S. Tang and Y. Y. Hung, "Fast profilometer for the automatic measurement of 3-D object shapes," Appl. Opt. 29, 3012-3018 (1990).

[CrossRef]
[PubMed]

L. Mertz, "Real-time fringe-pattern analysis," Appl. Opt. 22, 1535-1539 (1983).

[CrossRef]
[PubMed]

W. W. Macy, "Two-dimensional fringe-pattern analysis," Appl. Opt. 22, 3898-3901 (1983).

[CrossRef]
[PubMed]

S. Toyooka and Y. Iwaasa, "Automatic profilometry of 3D diffuse by spatial phase detection," Appl. Opt. 25, 1630-1633 (1986).

[CrossRef]
[PubMed]

R. J. Marks II, "Gerchberg's extrapolation algorithm in two dimensions," Appl. Opt. 20, 1816-1820 (1981).

Y. Ichioka and M. Inuiya, "Direct phase detecting system," Appl. Opt. 11, 1507-1514 (1972).

[CrossRef]
[PubMed]

P. L. Ransom and J. V. Kokal, "Interferogram analysis by a modified sinusoid fitting technique," Appl. Opt. 25, 4199-4204 (1986).

[CrossRef]
[PubMed]

J. Zhong and J. Weng, "Spatial carrier-fringe pattern analysis by means of wavelet transform: wavelet transform profilometry," Appl. Opt. 43, 4993-4998 (2004).

[CrossRef]
[PubMed]

H. Guo and M. Chen, "Least-squares algorithm for phase-stepping interferometry with an unknown relative step," Appl. Opt. 44, 4854-4859 (2005).

[CrossRef]
[PubMed]

P. Hariharan, B. Oreb, and T. Eiju, "Digital phase-shifting interferometry: a simple error-compensating phase calculation algorithm," Appl. Opt. 26, 2504-2506 (1987).

[CrossRef]
[PubMed]

Y. Arai, S. Yokozeki, K. Shiraki, and T. Yamada, "High precision two-dimensional spatial fringe analysis method," J. Mod. Opt. 44, 739-751 (1997).

[CrossRef]

M. Servin and F. J. Cuevas, "A novel technique for spatial phase-shifting interferometry," J. Mod. Opt. 42, 1853-1862 (1995).

[CrossRef]

K. H. Womack, "Interferometric phase measurement using spatial synchronous detection," Opt. Eng. 23, 391-395 (1984).

R. Józwicki, M. Kujawinska, and L. Salbut, "New contra old wavefront measurement concepts for interferometric optical testing," Opt. Eng. 31, 422-433 (1992).

[CrossRef]

J.-F. Lin and X.-Y. Su, "Two-dimensional Fourier transform profilometry for the automatic measurement of three-dimensional object shapes," Opt. Eng. 34, 3297-3302 (1995).

[CrossRef]

J. E. Greivenkamp, "Generalized data reduction for heterodyne interferometry," Opt. Eng. 23, 350-352 (1984).

M. Pirga and M. Kujawinska, "Two directional spatial-carrier phase-shifting method for analysis of crossed and closed fringe patterns," Opt. Eng. 34, 2459-2466 (1995).

[CrossRef]

D. C. Williams, N. S. Nassar, J. E. Banyard, and M. S. Virdee, "Digital phase-step interferometry: a simplified approach," Opt. Laser Technol. 23, 147-150 (1991).

[CrossRef]

P. H. Chan and P. J. Bryanston-Cross, "Spatial phase stepping method of fringe-pattern analysis," Opt. Lasers Eng. 23, 343-354 (1995).

[CrossRef]

Q. Kemao, "Two-dimensional windowed Fourier transform for fringe pattern analysis: principles, applications, and implementations," Opt. Lasers Eng. 45, 304-317 (2007).

H. Guo, M. Chen, and H. He, "A frequency encoding method for fringe projection profilometry," in Third International Conference on Experimental Mechanics and Third Conference of the Asian Committee on Experimental Mechanics, C. Quan, F. S. Chau, A. Asundi, B. S. Wong, and C. T. Lim, eds., Proc. SPIE 5852, 908-913 (2005).

[CrossRef]

M. Kujawinska and J. Wójciak, "Spatial-carrier phase-shifting technique of fringe pattern analysis," in Industrial Applications of Holographic and Speckle Measuring Techniques, W. P. Jueptner, ed., Proc. SPIE 1508, 61-67 (1991).